dr. Pengfei Sun

PhD student
Electronic Components, Technology and Materials (ECTM), Department of Microelectronics

PhD thesis (Sep 2016): Flexible CMOS Single-Photon Avalanche Diode Image Sensor Technology
Promotor: Lina Sarro, Ryoichi Ishihara, Eduardo Charbon

Biography

Mr. Pengfei Sun was born in Jingdezhen, China in1986. He received his B.S. degree in Microelectronics from Nankai University, Tianjin, China, in 2007 and M.S. degree in 2010. He has broad interests in active matrix display, image sensor, flexible electronics and three-dimensional integration. From May, 2009, he worked with Prof. Hoi-Sing Kwok as research assistant on high-performance poly-Silicon TFT circuit in Department of Electronic and Computer Engineering, Hong Kong University of Science and Technology (HKUST). In June, 2010, he joined in the Center for Display Research, HKUST as full-time research assistant. He worked on full-integration poly-Si AMOLED panel and OLED on silicon (Micro-display) technology.

Since April, 2012, he joined in Delft Institute of Microsystems and Nanoelectronics, Delft University of Technology, the Netherlands, as PhD candidate. Now he is working on the project of novel single-photon avalanche diode technology for flexible electronics and three-dimension CMOS integration.

Publications

  1. Flexible CMOS Single-Photon Avalanche Diode Image Sensor Technology
    Pengfei Sun;
    PhD thesis, Delft University of Technology, 2016.
    document

  2. A Flexible 32�32 SPAD Image Sensor with Integrated Microlenses
    Pengfei Sun; E. Charbon; R.Ishihara;
    In International Image Sensor Workshop,
    2015.

  3. A Flexible Ultrathin-Body Single-Photon Avalanche Diode With Dual-Side Illumination
    Pengfei Sun; Charbon, E.; Ishihara, R.;
    IEEE Journal of Selected Topics in Quantum Electronics,
    Volume 20, Issue 6, pp. 1-8, Nov 2014.
    document

  4. A Flexible Ultra-Thin-Body SOI Single-Photon Avalanche Diode
    Pengfei Sun; Benjamin Mimoun; Edoardo Charbon; Ryoichi Ishihara;
    In IEEE International Electron Device Meeting (IEDM),
    Washington, DC, USA, 2013.

  5. Improvement on MIS Properties of Single-Grain Germanium by Pulsed-Laser Annealing
    Pengfei Sun; M. van der Zwan; A. Arslan; E. Charbon; R. Ishihara;
    In 44th IEEE Semiconductor Interface Specialists Conference,
    Arlington, USA, 2013.

BibTeX support

Last updated: 9 Mar 2019

Pengfei Sun

Alumnus
  • Left in 2016
  • Now: X-Fab