dr. Jianlin Huang

PhD student
Electronic Components, Technology and Materials (ECTM), Department of Microelectronics

PhD thesis (Dec 2016): Optical degradation mechanisms and accelerated reliability evaluation for LEDs
Promotor: GuoQi Zhang

Themes: Micro/Nano System Integration and Reliability

Projects history

Quick reliability assessment for mid-power white-light LED packages

  1. Degradation Mechanism Decoupling of Mid-Power White-Light LEDs by SPD Simulation
    Jianlin Huang; D. S. Golubović; S. Koh; D. Yang; X. Li; X. Fan; GuoQi Zhang;
    IEEE Transactions on Electron Devices,
    Volume 63, pp. 2807-2814, 2016.

  2. Optical degradation mechanisms and accelerated reliability evaluation for LEDs
    Jianlin Huang;
    PhD thesis, Delft University of Technology, 2016.

  3. Degradation modeling of mid-power white-light LEDs by using Wiener process
    Jianlin Huang; D. S. Golubović; S. Koh; D. Yang; X. Li; X. Fan; GuoQi Zhang;
    Optics Express,
    Volume 23, pp. A966-A978, 2015.

  4. Degradation Mechanisms of Mid-power White-light LEDs under High Temperature-Humidity Conditions
    Jianlin Huang; D.S. Golubović; S. Koh; D. Yang; X. Li; X. Fan; GuoQi Zhang;
    IEEE Transactions on Device and Materials Reliability,
    Volume 15, Issue 2, pp. 220-228, 2015.

  5. Investigation of lumen degradation mechanisms of mid-power LED by HAST
    Jianlin Huang; Koh, SW; Xueming Li; GuoQi Zhang;
    In Proceedings of the 15th International Conference on Electronic Packaging Technology,
    pp. 1437-1441, 2014.

BibTeX support

Last updated: 1 Nov 2016

Jianlin Huang

Alumnus
  • Left in 2016