Selected publications

  1. A Fully Integrated Sequential Synchronized Switch Harvesting on Capacitors Rectifier Based on Split-Electrode for Piezoelectric Energy Harvesting
    Xinling Yue; Jiarui Mo; Zhiyuan Chen; Sten Vollebregt; Guoqi Zhang; Sijun Du;
    IEEE Transactions on Power Electronics,
    Volume 39, Issue 6, pp. 7643-7653, 2024. DOI: 10.1109/TPEL.2024.3369728

  2. Measuring residual stresses in individual on-chip interconnects using synchrotron nanodiffraction
    Yaqian Zhang; Leiming Du; Olof Bäcke; Sebastian Kalbfleisch; Guoqi Zhang; Sten Vollebregt; Magnus Hörnqvist Colliander;
    Applied Physics Letters,
    Volume 124, pp. 083501-1-6, 2024. DOI: 10.1063/5.0192672

  3. Surface modification of multilayer graphene neural electrodes by local printing of platinum nanoparticles using spark ablation
    Nasim Bakhshaee Babaroud; Samantha J. Rice; Maria Camarena Perez; Wouter A. Serdijn; Sten Vollebregt; Vasiliki Giagka;
    Nanoscale,
    2024. DOI: 10.1039/D3NR05523J

  4. Highly-sensitive wafer-scale transfer-free graphene MEMS condenser microphones
    Roberto Pezone; Sebastian Anzinger; Gabriele Baglioni; Hutomo Suryo Wasisto; Lina Sarro; Peter Steeneken; Sten Vollebregt;
    Microsystems & Nanoengineering,
    Volume 10, Issue 27, pp. 1-9, 2024. DOI: 10.1038/s41378-024-00656-x

  5. Effect of air-loading on the performance limits of graphene microphones
    R. Pezone; G. Baglioni; C. Van Ruiten; S. Anzinger; H. S. Wasisto; P. M. Sarro; P. G. Steeneken; S. Vollebregt;
    Applied Physics Letters,
    Volume 124, Issue 12, 2024. DOI: 10.1063/5.0191939

  6. A high aspect ratio surface micromachined accelerometer based on a SiC-CNT composite material
    Jiarui Mo; Shreyas Shankar; Roberto Pezone; Guoqi Zhang; Sten Vollebregt;
    Microsystems & Nanoengineering,
    Volume 10, Issue 42, 2024. DOI: 10.1038/s41378-024-00672-x

  7. An Analog to Digital Converter in a SiC CMOS Technology for High-temperature Applications
    Jiarui Mo; Yunfan Niu; Alexander May; Mathias Rommel; Chiara Rossi; Joost Romijn; Guoqi Zhang; Sten Vollebregt;
    Applied Physics Letters,
    Volume 124, Issue 15, 2024. DOI: 10.1063/5.0195013

  8. Investigating Mechanical Properties of Silicon Carbide Coated Carbon Nanotube Composite at Elevated Temperatures
    Jiarui Mo; Gerald J.K. Schaffar; Leiming Du; Verena Maier-Kiener; Daniel Kiener; Sten Vollebregt; Guoqi Zhang;
    In IEEE 37th Intl. Conf. on Micro Electro Mechanical Systems (MEMS2024),
    2024.

  9. Printed spark ablation nanoparticle films for microelectronic applications
    Joost van Ginkel;
    PhD thesis, Delft University Technology, 2024. DOI: 10.4233/uuid:17b83ad6-3179-4a10-8194-90c4e6c768b2

  10. Optimization of multilayer graphene-based gas sensors by ultraviolet photoactivation
    Álvaro Peña; Daniel Matatagui; Filiberto Ricciardella; Leandro Sacco; Sten Vollebregt; Daniel Otero; JesúsLópez-Sánchez; Pilar Marína; M.Carmen Horrillo;
    Applied Surface Science,
    Volume 610, pp. 155393, 2023. DOI: 10.1016/j.apsusc.2022.155393

  11. Manufacturing thin ionic polymer metal composite for sensing at the microscale
    Paul Motreuil-Ragot; Andres Hunt; Leandro N. Sacco; Pasqualina M. Sarro; Massimo Mastrangeli;
    Smart Materials and Structures,
    Volume 32, pp. 035006, 2023. DOI: 10.1088/1361-665X/acb305

  12. Overview of Engineering Carbon Nanomaterials such as Carbon Nanotubes (CNTs), Carbon Nanofibers (CNFs), Graphene and Nanodiamonds and Other Carbon Allotropes inside Porous Anodic Alumina (PAA) Templates
    Leandro Sacco; Sten Vollebregt;
    MDPI Nanomaterials,
    Volume 13, Issue 2, pp. 260, 2023. DOI: 10.3390/nano13020260

  13. Transient thermal measurement on nano-metallic sintered die-attach joints using a thermal test chip
    R. Sattari; Dong Hu; Xu Liu; H. van Zeijl; S. Vollebregt; GuoQi Zhang;
    Applied Thermal Engineering,
    Volume 221, pp. 119503, 2023. DOI: 10.1016/j.applthermaleng.2022.119503

  14. Coupling Model of Electromigration and Experimental Verification – Part I: Effect of Atomic Concentration Gradient
    Zhen Cui; Xuejun Fan; Yaqian Zhang; Sten Vollebregt; Jiajie Fan; Guoqi Zhang;
    Journal of the Mechanics and Physics of Solids,
    Volume 174, pp. 105257, 2023. DOI: 10.1016/j.jmps.2023.105257

  15. Coupling Model of Electromigration and Experimental Verification – Part II: Impact of Thermomigration
    Zhen Cui; Xuejun Fan; Yaqian Zhang; Sten Vollebregt; Jiajie Fan; Guoqi Zhang;
    Journal of the Mechanics and Physics of Solids,
    Volume 174, pp. 105256, 2023. DOI: 10.1016/j.jmps.2023.105256

  16. Ultra-sensitive graphene membranes for microphone applications
    Gabriele Baglioni; Roberto Pezone; Sten Vollebregt; Katarina Cvetanović Zobenica; Marko Spasenović; Dejan Todorovic; Hanqing Liu; Gerard Verbiest; Herre S.J. van der Zant; Peter Gerard Steeneken;
    Nanoscale,
    Volume 15, pp. 6343-6352, 2023. DOI: 10.1039/D2NR05147H

  17. Microfabricated albedo insensitive sun position sensor system in silicon carbide with integrated 3D optics and CMOS electronics
    Joost Romijn; Sten Vollebregt; Vincent G. de Bie; Luke M. Middelburg; Brahim El Mansouri; Henk W. van Zeijl; Alexander May; Tobias Erlbacher; Johan Leijtens; Guoqi Zhang; Pasqualina M. Sarro;
    Sensors and Actuators A: Physical,
    Volume 354, pp. 114268, 2023. DOI: 10.1016/j.sna.2023.114268

  18. The sensitivity enhancement of TiO2-based VOCs sensor decorated by gold at room temperature
    Mostafa Shooshtari; Sten Vollebregt; Yas Vaseghi; Mahshid Rajati; Saeideh Pahlavan;
    IOP Nanotechnology,
    Volume 34, Issue 25, pp. 255501, 2023. DOI: 10.1088/1361-6528/acc6d7

  19. Modeling and Characterization of Pre-Charged Collapse-Mode CMUTs
    M. Saccher; S. Kawasaki; J. H. Klootwijk; R. Van Schaijk; R. Dekker;
    IEEE Open Journal of Ultrasonics, Ferroelectrics, and Frequency Control,
    Volume 3, pp. 14-28, 2023. DOI: 10.1109/OJUFFC.2023.3240699

  20. A Highly Linear Temperature Sensor Operating up to 600°C in a 4H-SiC CMOS Technology
    Jiarui Mo; Jinglin Li; Yaqian Zhang; Joost Romijn; Alexander May; Tobias Erlbacher; Guoqi Zhang; Sten Vollebregt;
    IEEE Electron Device Letters,
    Volume 44, Issue 6, pp. 995-998, 2023. DOI: 10.1109/LED.2023.3268334

  21. An organ-on-chip device with integrated charge sensors and recording microelectrodes
    Hande Aydogmus; Michel Hu; Lovro Ivancevic; Jean-Philippe Frimat; Arn M. J. M. van den Maagdenberg; Pasqualina M. Sarro; Massimo Mastrangeli;
    Scientific Reports,
    Volume 13, Issue 8062, 2023. DOI: https://doi.org/10.1038/s41598-023-34786-5

  22. Study on the controllability of the fabrication of single-crystal silicon nanopores/nanoslits with a fast-stop ionic current-monitored TSWE method
    Hao Hong; Jiangtao Wei; Xin Lei; Haiyun Chen; Pasqualina M. Sarro; Guoqi Zhang; Zewen Liu;
    Microsystems & Nanoengineering,
    Volume 9, pp. 63, 2023. DOI: 10.1038/s41378-023-00532-0

  23. Optical self-cooling of a membrane oscillator in a cavity optomechanical experiment at room temperature
    P. Vezio; M. Bonaldi; A. Borrielli; F. Marino; B. Morana; P.M. Sarro; E. Serra; F. Marin;
    Physical Review A,
    Volume 108, pp. 063508, 2023. DOI: 10.1103/PhysRevA.108.063508

  24. Nanostructured Thermoelectric Films Synthesised by Spark Ablation and Their Oxidation Behaviour
    Joost van Ginkel; Lisa Mitterhuber; Marijn Willem van de Putte; Mark Huijben; Sten Vollebregt; Guoqi Zhang;
    Nanomaterials,
    Volume 13, Issue 11, pp. 1778, 2023. DOI: 10.3390/nano13111778

  25. Low Noise Opto-Electro-Mechanical Modulator for RF-to-Optical Transduction in Quantum Communications
    Michele Bonaldi; Antonio Borrielli; Giovanni Di Giuseppe; Nicola Malossi; Bruno Morana; Riccardo Natali; Paolo Piergentili; Pasqualina Maria Sarro; Enrico Serra; David Vitali;
    Entropy,
    Volume 25, Issue 7, 2023. DOI: 10.3390/e25071087

  26. Automated assessment of human engineered heart tissues using deep learning and template matching for segmentation and tracking
    J. M. Rivera‐Arbeláez; D. Keekstra; C. Cofiño‐Fabres; Tom Boonen; M. Dostanic; S. A. Ten Den; K. Vermeul; M. Mastrangeli; A. van den Berg; L. I. Segerink; M. C. Ribeiro; N. Strisciuglio; R. Passier;
    Bioengineering & Translational Medicine,
    Volume 8, Issue 3, pp. e10513, 2023. DOI: 10.1002/btm2.10513

  27. Centimeter-scale nanomechanical resonators with low dissipation
    Andrea Cupertino; Dongil Shin; Leo Guo; Peter G. Steeneken; Miguel A. Bessa; Richard A. Norte;
    arXiv,
    2023. DOI: 10.48550/arXiv.2308.00611

  28. Copper Nanoparticle Sintering Enabled Hermetic Packaging With Fine Sealing Ring for MEMS Application
    Dong Hu; Mustafeez Bashir Shah; Jiajie Fan; Sten Vollebregt; Guoqi Zhang;
    IEEE Transactions on Electron Devices,
    Volume 70, Issue 11, pp. 5818-5823, 2023. DOI: 10.1109/TED.2023.3312066

  29. Miniaturized engineered heart tissues from hiPSC-derived triple cell type co-cultures to study human cardiac function
    L Windt; M. Wiendels; M. Dostanic; M. Bellin; P. M. Sarro; M. Mastrangeli; C. L. Mummery; B. J. van Meer;
    Biochemical and Biophysical Research Communications,
    2023. DOI: 10.1016/j.bbrc.2023.09.034

  30. Quantifying stress distribution in ultra-large graphene drums through mode shape imaging
    Ali Sarafraz; Hanqing Liu; Katarina Cvetanović; Marko Spasenović; Sten Vollebregt; Tomas Manzaneque Garcia; Peter G. Steeneken; Farbod Alijani;
    arXiv,
    2023. DOI: 10.48550/arXiv.2311.00443

  31. Integrated Electrochemical and Optical Biosensing in Organs-on-Chip
    Pratik Tawade; Massimo Mastrangeli;
    ChemBioChem,
    2023. DOI: 10.1002/cbic.202300560

  32. Design and Characterization of a Data Converter in a SiC CMOS Technology for Harsh Environment Sensing Applications
    Yunfan Niu; Jiarui Mo; Alexander May; Mathias Rommel; Chiara Rossi; Joost Romijn; Guoqi Zhang; Sten Vollebregt;
    In Proc. of IEEE Sensors,
    2023.

  33. Highly reproducible tissue positioning with tapered pillar design in engineered heart tissue platforms
    M. Dostanic; L. M. Windt; M. Wiendels; B. J. van Meer; C. L. Mummery; P. M. Sarro; M. Mastrangeli;
    In IEEE 36th Intl. Conf. on Micro Electro Mechanical Systems (MEMS2023),
    2023. DOI: 10.1109/MEMS49605.2023.10052166

  34. High-performance wafer-scale transfer-free graphene microphones
    Roberto Pezone; Gabriele Baglioni; Pasqualina M. Sarro; Peter G. Steeneken; Sten Vollebregt;
    In IEEE 36th Intl. Conf. on Micro Electro Mechanical Systems (MEMS2023),
    2023. DOI: 10.1109/MEMS49605.2023.10052360

  35. Silicon carbide reinforced vertically aligned carbon nanotube composite for harsh environment MEMS
    Jiarui Mo; Shreyas Shankar; Guoqi Zhang; Sten Vollebregt;
    In IEEE 36th Intl. Conf. on Micro Electro Mechanical Systems (MEMS2023),
    2023. DOI: 10.1109/MEMS49605.2023.10052162

  36. Manufacturing of an In-Package Relative Humidity Sensor for Epoxy Molding Compound Packages
    Romina Sattari; Henk van Zeijl; GuoQi Zhang;
    In 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    2023. DOI: 10.1109/EuroSimE56861.2023.10100771

  37. Study on Sintering Mechanism and Mechanical Properties of Nano-Cu based on Molecular Dynamics Simulation
    Cheng Qian; Dong Hu; Xu Liu; Xuejun Fan; Guoqi Zhang; Jiajie Fan;
    In 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    2023. DOI: 10.1109/EuroSimE56861.2023.10100810

  38. Effect of Thermomigration on Electromigration in SWEAT Structures
    Zhen Cui; Xuejun Fan; GuoQi Zhang;
    In 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    2023. DOI: 10.1109/EuroSimE56861.2023.10100774

  39. Temperature Field Simulation and optimization for Horizontal 6-inch 4H-SiC Epitaxial CVD Reactor by Induction Heating
    Zhuorui Tang; Jing Tian; Chaobin Mao; Nan Zhang; Jiyu Huang; Jiajie Fan; Guoqi Zhang;
    In 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    2023. DOI: 10.1109/EuroSimE56861.2023.10100813

  40. Hydrolysis Mechanism Analysis of (Ca, Sr)AlSiN₃:Eu²⁺ Red Phosphor Aged Under Pressure Cooker Test and 85°C&85%RH Test: Kinetics Modeling and First-principles Calculation
    Minzhen Wen; Baotong Guo; Shanghuan Chen; Xiao Hu; Xuejun Fan; Guoqi Zhang; Jiajie Fan;
    In 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    2023. DOI: 10.1109/EuroSimE56861.2023.10100750

  41. Electromigration-induced local dewetting in Cu films
    Yaqian Zhang; Jiarui Mo; Zhen Cui; Sten Vollebregt; GuoQi Zhang;
    In Proc. of the IEEE International Interconnect Technology Conference,
    2023. DOI: 10.1109/IITC/MAM57687.2023.10154761

  42. Effect of Passivation and Mechanical Constraint on Electromigration in Interconnect
    Xuejun Fan; Zhen Cui; GuoQi Zhang;
    In Proc. of Electronic Components and Technology Conference (ECTC),
    2023.

  43. Low Temperature Fine Pitch All-Copper Interconnects Combining Photopatternable Underfill Films
    Xinrui Ji; Henk Van Zeijl; Weiping Jiao; Shan He; Leiming Du; Guoqi Zhang;
    In Proc. of Electronic Components and Technology Conference (ECTC),
    2023.

  44. Reliability Analysis on Ag and Cu Nanoparticles Sintered Discrete Power Devices with Various Frontside and Backside Interconnects
    Dong Hu; Xu Liu; Sten Vollebregt; Jiajie Fan; Guoqi Zhang; Ali Roshanghias; Xing Liu; Thomas Basler; Emiel De Bruin;
    In Proc. of Electronic Components and Technology Conference (ECTC),
    2023.

  45. A Thin-Film Reconfigurable SiC Thermal Test Chip for Reliability Monitoring in Harsh Environments
    Romina Sattari; Henk van Zeijl; GuoQi Zhang;
    In Proc. of Electronic Components and Technology Conference (ECTC),
    2023.

  46. Simulation, Prediction, and Verification of the Corrosion Behavior of Cu-Ag Composite Sintered Paste for Power Semiconductor Die-Attach Applications
    Xinyue Wang; Zhoudong Yang; Pan Liu; Guoqi Zhang; Jing Zhang;
    In Proc. of Electronic Components and Technology Conference (ECTC),
    2023.

  47. Thermal-Mechanical-Electrical Co-Design of Fan-Out Panel-Level SiC MOSFET Packaging with a Multi-Objective Optimization Algorithm
    Wei Chen; Xuyang Yan; Jiajie Fan; Mesfin S. Ibrahim; Jing Jiang; Xuejun Fan; Guoqi Zhang;
    In Proc. of Electronic Components and Technology Conference (ECTC),
    2023.

  48. Impact of Temperature Cycling Conditions on Board Level Vibration for Automotive Applications
    Varun Thukral; Irene Bacquet; Michiel Soestbergen; Jeroen Zaal; Romuald Roucou; Rene Rongen; Willem van Driel; GuoQi Zhang;
    In Proc. of Electronic Components and Technology Conference (ECTC),
    2023.

  49. Heterogeneous Integration of Diamond Heat Spreaders for Power Electronics Application
    Henry Antony Martin; Marcia Reintjes; Xiao Tang; Dave Reijs; Sander Dorrestein; Martien Kengen; Sebastien Libon; Edsger Smits; Marco Koelink; Rene Poelma; Willem Van Driel; GuoQi Zhang;
    In Proc. of Electronic Components and Technology Conference (ECTC),
    2023.

  50. High-Temperature Creep Properties of a Novel Solder Material and Its Thermal Fatigue Properties Under Potting Material
    Leiming Du; Guoqi Zhang; Xiujuan Zhao; Willem Van Driel; Rene Poelma;
    In Proc. of Electronic Components and Technology Conference (ECTC),
    2023.

  51. High-performance Silicon Carbide-on-insulator Thermoresistive High-temperature Sensor Up To 750 C
    Baoyun Sun; Jiarui Mo; Willem D. van Driel; GuoQi Zhang;
    In 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS 2023),
    2023.

  52. MOSFET-based And P-N Diode Based Temperature Sensors In A 4H-sSiC CMOS Technology
    Jiarui Mo; Jinglin Li; Yaqian Zhang; Alexander May; Tobias Erlbacher; Guoqi Zhang; Sten Vollebregt;
    In 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS 2023),
    2023.

  53. A Highly Sensitive Capacitive Displacement Sensor For Force Measurement Integrated In An Engineered Heart Tissue Platform
    Milica Dostanic; Filippo Pfaiffer; Mahdieh Shojaei-Baghini; Laura M. Windt; Maury Wiendels; Berend J. van Meer; Christine L. Mummery; Pasqualina M. Sarro; Massimo Mastrangeli;
    In 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS 2023),
    2023.

  54. Wafer-scale Transfer-free Graphene MEMS Condenser Microphones
    Roberto Pezone; Gabriele Baglioni; Leonardo di Paola; Pasqualina M. Sarro; Peter G. Steeneken; Sten Vollebregt;
    In 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS 2023),
    2023.

  55. Design And Fabrication Of A Smart Vaporasing Liquid Microthruster For Cubesat Applications
    Georgios Spernovasilis; Henk W. van Zeijl; Pasqualina M. Sarro;
    In 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS 2023),
    2023.

  56. Silicon Carbide-on-Insulator Thermal-Piezoresistive Resonator for Harsh Environment Application
    Baoyun Sun; Jiarui Mo; Hemin Zhang; Henk W. van Zeijl; Willem D. van Driel; GuoQi Zhang;
    In IEEE 36th Intl. Conf. on Micro Electro Mechanical Systems (MEMS2023),
    2023. DOI: 10.1109/MEMS49605.2023.10052401

  57. Bayesian optimization with Gaussian process regression: a multi-fidelity review
    Leo Guo;
    In 15th World Congress of Structural and Multidisciplinary Optimisation,
    2023.

  58. Graphene gas sensors monolithically integrated on microhotplates by using a transfer-free approach
    Leandro Sacco; Sten Vollebregt;
    In Graphene Week,
    2023.
    document

  59. High aspect-ratio multi-layer graphene MEMS condenser microphones
    Roberto Pezone; Gabriele Baglioni; Pasqualina M. Sarro; Peter G. Steeneken; Sten Vollebregt;
    In Graphene Week,
    2023.
    document

  60. Time Dependent Dielectric Breakdown of 4H-SiC MOSFETs in CMOS technology
    Yaqian Zhang; Jiarui Mo; Sten Vollebregt; GuoQi Zhang;
    In 24th International Conference on Electronic Packaging Technology (ICEPT),
    2023.

  61. Dielectric spectroscopy for non-invasive sensing of multi-layered organ-on-chip devices
    T. Hosman; M. Spirito; M. Mastrangeli;
    In XXXV Eurosensors Conference,
    2023.

  62. An acoustically-transparent electrical cap for piezoelectric ultrasound transducers on silicon
    G. Wardhana; T. Costa; M. Mastrangeli;
    In XXXV Eurosensors Conference,
    2023.

  63. Pressure-assisted Cu sintering for SiC Die-attachment application
    Xu Liu;
    PhD thesis, Delft University Technology, 2023. DOI: 10.4233/uuid:291baefe-c4b9-46ea-b250-a6c8f4e6ece8

  64. Understanding the Fundament of Virus Inactivation via Modeling
    Chunjian Tan;
    PhD thesis, Delft University Technology, 2023. DOI: 10.4233/uuid:14351363-b5d1-41ec-ac32-8efb4817481b

  65. Miniature sensorized platform for engineered heart tissues
    Milica Dostanic;
    PhD thesis, Delft University Technology, 2023. DOI: 10.4233/uuid:0f61f871-7c9c-47fc-a542-10883fb2d4de

  66. Ionic electroactive polymer for organs-on-chip applications
    Paul Motreuil-Ragot;
    PhD thesis, Delft University Technology, 2023. DOI: 10.4233/uuid:5f72b863-c05f-4bfb-82e6-b75dc63923cd

  67. Multilayer CVD graphene electrodes using a transfer-free process for the next generation of optically transparent and MRI-compatible neural interfaces
    Nasim Bakhshaee Babaroud; Merlin Palmar; Andrada Iulia Velea; Chiara Coletti; Sebastian Weingärtner; Frans Vos; Wouter A. Serdijn; Sten Vollebregt; Vasiliki Giagka;
    Nature Microsystems & Nanoengineering,
    Volume 8, pp. 107, 2022. (featured article). DOI: 10.1038/s41378-022-00430-x

  68. Integrated Digital and Analog Circuit Blocks in a Scalable Silicon Carbide CMOS Technology
    Joost Romijn; Sten Vollebregt; Luke M. Middelburg; Brahim El Mansouri; Henk W. van Zeijl; Alexander May; Tobias Erlbacher; Guoqi Zhang; Pasqualina M. Sarro;
    IEEE Transactions on Electron Devices,
    Volume 69, Issue 1, pp. 4-10, 2022. DOI: 10.1109/TED.2021.3125279

  69. Technology Development for MEMS: A Tutorial
    Paddy J French; Gijs JM Krijnen; Sten Vollebregt; Massimo Mastrangeli;
    IEEE Sensors Journal,
    Volume 22, Issue 11, 2022. DOI: 10.1109/JSEN.2021.3104715

  70. Mass and density determination of porous nanoparticle films using a quartz crystal microbalance
    Hendrik Joost van Ginkel; Sten Vollebregt; GuoQi Zhang; Andreas Schmidt-Ott;
    IOP Nanotechnology,
    Volume 33, Issue 48, 2022. DOI: 10.1088/1361-6528/ac7811

  71. Characterization of low-loss hydrogenated amorphous silicon films for superconducting resonators
    Bruno T. Buijtendorp; Juan Bueno; David J. Thoen; Vignesh Murugesan; Paolo M. Sberna; Jochem J. A. Baselmans; Sten Vollebregt; Akira Endo;
    J. of Astronomical Telescopes, Instruments, and Systems,
    Volume 8, Issue 2, pp. 028006, 2022. DOI: 10.1117/1.JATIS.8.2.028006

  72. Rapid Prototyping of Organ-on-a-Chip Devices Using Maskless Photolithography
    Dhanesh G. Kasi; Mees N. S. de Graaf; Paul A. Motreuil-Ragot; Jean-Phillipe M. S. Frimat; Michel D. Ferrari; Pasqualina M. Sarro; Massimo Mastrangeli; Arn M. J. M. van den Maagdenberg; Christine L. Mummery; Valeria V. Orlova;
    Micromachines,
    Volume 13, pp. 49, 2022. DOI: 10.3390/mi13010049

  73. Effects of Temperature and Grain Size on Diffusivity of Aluminium: Electromigration Experiment and Molecular Dynamic Simulation
    Zhen Cui; Yaqian Zhang; Dong Hu; Sten Vollebregt; Jiajie Fan, Xuejun Fan; Guoqi Zhang;
    Journal of Physics: Condensed Matter,
    Volume 34, pp. 175401, 2022. DOI: 10.1088/1361-648X/ac4b7f

  74. Enhancement of Room Temperature Ethanol Sensing by Optimizing the Density of Vertically Aligned Carbon Nanofibers Decorated with Gold Nanoparticles
    Mostafa Shooshtari; Leandro Nicolas Sacco; Joost Van Ginkel; Sten Vollebregt; Alireza Salehi;
    MDPI Materials,
    Volume 15, Issue 4, pp. 1383, 2022. DOI: 10.3390/ma15041383

  75. Sensitive Transfer-Free Wafer-Scale Graphene Microphones
    Roberto Pezone; Gabriele Baglioni; Pasqualina M. Sarro; Peter G. Steeneken; Sten Vollebregt;
    ACS Applied Materials & Interfaces,
    Volume 14, Issue 18, pp. 21705-21712, 2022. DOI: 10.1021/acsami.2c03305

  76. Direct Wafer-Scale CVD Graphene Growth under Platinum Thin-Films
    Yelena Hagendoorn; Gregory Pandraud; Sten Vollebregt; Bruno Morana; Pasqualina M. Sarro; Peter G. Steeneken;
    MDPI Materials,
    Volume 15, Issue 10, pp. 3723, 2022.
    document

  77. Angle Sensitive Optical Sensor for Light Source Tracker Miniaturization
    Joost Romijn; Secil Sanseven; Guoqi Zhang; Sten Vollebregt; Pasqualina M. Sarro;
    IEEE Sensors Letters,
    Volume 6, Issue 6, pp. 1-4, 2022. DOI: 10.1109/LSENS.2022.3175607

  78. Hydrogenated amorphous silicon carbide: A low-loss deposited dielectric for microwave to submillimeter-wave superconducting circuits
    B. T. Buijtendorp; S. Vollebregt; K. Karatsu; D. J. Thoen; V. Murugesan; K. Kouwenhoven; S. Hähnle; J. J. A. Baselmans; A. Endo;
    Physical Review Applied,
    Volume 18, pp. 064003, 2022. DOI: 10.1103/PhysRevApplied.18.064003

  79. Board level vibration test method of components for automotive electronics: State-of-the-art approaches and challenges
    V. Thukral; M. van Soestbergen; J.J.M. Zaal; R. Roucou; R.T.H. Rongen; W.D. van Driel; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 139, pp. 114830, 2022. DOI: 10.1016/j.microrel.2022.114830

  80. Biodegradable sensors are ready to transform autonomous ecological monitoring
    Sarab S. Sethi; Mirko Kovac; Fabian Wiesemüller; Aslan Miriyev; Clementine M. Boutry;
    Nature Ecology & Evolution,
    Volume 6, pp. 1245-1247, 2022. DOI: 10.1038/s41559-022-01824-w

  81. Ultra-thin corrugated metamaterial film as large-area transmission dynode
    H.W. Chan; V. Prodanović; A.M.M.G. Theulings; T. ten Bruggencate; C.W. Hagen; P.M. Sarro; H. v.d. Graaf;
    Journal of Instrumentation,
    Volume 17, pp. P09027, 2022. DOI: 10.1088/1748-0221/17/09/P09027

  82. 25.8 Gb/s Submillimeter Optical Data Link Module for Smart Catheters
    Jian Li; Chenhui Li; Vincent Henneken; Marcus Louwerse; Jeannet Van Rens; Paul Dijkstra; Oded Raz; Ronald Dekker;
    Journal of Lightwave Technology,
    Volume 40, Issue 8, pp. 2456-2464, 2022. DOI: 10.1109/JLT.2021.3137981

  83. A Microfluidic Cancer-on-Chip Platform Predicts Drug Response Using Organotypic Tumor Slice Culture
    Sanjiban Chakrabarty; William F. Quiros-Solano; Maayke M.P. Kuijten; Ben Haspels; Sandeep Mallya; Calvin Shun Yu Lo; Amr Othman; Cinzia Silvestri; Anja van de Stolpe; Nikolas Gaio; Hanny Odijk; Marieke van de Ven; Corrina M.A. de Ridder; Wytske M. van Weerden; Jos Jonkers and Ronald Dekker; Nitika Taneja; Roland Kanaar; Dik C. van Gent;
    Cancer Research,
    Volume 82, Issue 3, pp. 510-520, 2022. DOI: 10.1158/0008-5472.CAN-21-0799

  84. Reliability of LED-based systems
    Willem D. van Driel; B. Jacobs; P. Watte; X. Zhao;
    Microelectronics Reliability,
    Volume 129, pp. 114477, 2022. DOI: 10.1016/j.microrel.2022.114477

  85. Focused ultrasound neuromodulation on a multiwell MEA
    Marta Saccher; Shinnosuke Kawasaki; Martina Proietti Onori; Geeske M. van Woerden; Vasiliki Giagka; Ronald Dekker;
    Bioelectronic Medicine,
    Volume 8, 2022. DOI: 10.1186/s42234-021-00083-7

  86. Integrated 64 pixel UV image sensor and readout in a silicon carbide CMOS technology
    Joost Romijn; Sten Vollebregt; Luke M. Middelburg; Brahim El Mansouri; Henk W. van Zeijl; Alexander May; Tobias Erlbacher; Johan Leijtens; Guoqi Zhang; Pasqualina M. Sarro;
    Nature Microsystems & Nanoengineering,
    Volume 8, pp. 114, 2022. DOI: 10.1038/s41378-022-00446-3

  87. A -121.5-dB THD Class-D Audio Amplifier With 49-dB LC Filter Nonlinearity Suppression
    Huajun Zhang; Marco Berkhout; Kofi A. A. Makinwa; Qinwen Fan;
    {IEEE} Journal of Solid-State Circuits,
    Volume 57, Issue 4, pp. 1153--1161, April 2022. DOI: 10.1109/jssc.2021.3125526
    document

  88. A 4-$\upmu$W Bandwidth/Power Scalable Delta\textendashSigma Modulator Based on Swing-Enhanced Floating Inverter Amplifiers
    Menglian Zhao; Yibo Zhao; Huajun Zhang; Yaopeng Hu; Yuanxin Bao; Le Ye; Wanyuan Qu; Zhichao Tan;
    {IEEE} Journal of Solid-State Circuits,
    Volume 57, Issue 3, pp. 709-718, March 2022. DOI: 10.1109/jssc.2021.3123261
    document

  89. A 121.4-dB DR Capacitively Coupled Chopper Class-D Audio Amplifier
    Huajun Zhang; Marco Berkhout; Kofi A. A. Makinwa; Qinwen Fan;
    {IEEE} Journal of Solid-State Circuits,
    Volume 57, Issue 12, pp. 3736--3745, December 2022. DOI: 10.1109/jssc.2022.3207907
    document

  90. A Chopper Class-D Amplifier for PSRR Improvement Over the Entire Audio Band
    Huajun Zhang; Nuriel N. M. Rozsa; Marco Berkhout; Qinwen Fan;
    {IEEE} Journal of Solid-State Circuits,
    Volume 57, Issue 7, pp. 2035--2044, July 2022. DOI: 10.1109/jssc.2022.3161136
    document

  91. A -121.5-dB THD Class-D Audio Amplifier With 49-dB LC Filter Nonlinearity Suppression
    Huajun Zhang; Marco Berkhout; Kofi A. A. Makinwa; Qinwen Fan;
    {IEEE} Journal of Solid-State Circuits,
    Volume 57, Issue 4, pp. 1153--1161, April 2022. DOI: 10.1109/jssc.2021.3125526
    document

  92. Reliability of Organic Compounds in Microelectronics and Optoelectronics
    Willem Dirk van Driel; Maryam Yazdan Mehr; Xuejun Fan; GuoQi Zhang (Ed.);
    Springer, , 2022. DOI: 10.1007/978-3-030-81576-9

  93. Reliability and Failures in Solid State Lighting Systems
    W. D. van Driel; B. J. C. Jacobs; G. Onushkin; P. Watte; X. Zhao; J. Lynn Davis;
    Springer, , 2022. DOI: 10.1007/978-3-030-81576-9_7

  94. Degradation and Failures of Polymers Used in Light-Emitting Diodes
    Maryam Yazdan Mehr; W. D. van Driel; GuoQi Zhang;
    Springer, , 2022. DOI: 10.1007/978-3-030-81576-9_8

  95. Outlook: From Physics of Failure to Physics of Degradation
    W. D. van Driel; Maryam Yazdan Mehr; X. J. Fan; GuoQi Zhang;
    Springer, , 2022. DOI: 10.1007/978-3-030-81576-9_17

  96. Patterning of Fine-Features in Nanoporous Films Synthesized by Spark Ablation
    Xinrui Ji; Joost van Ginkel; Dong Hu; Andreas Schmidt-Ott; Henk van Zeijl; Sten Vollebregt; GuoQi Zhang;
    In Proc. IEEE Nano,
    pp. 238-241, 2022. DOI: 10.1109/NANO54668.2022.9928705

  97. Recording neuronal activity on chip with segmented 3D microelectrode arrays
    Nele Revyn; Michel. H. Y. Hu; Jean-Philippe M. S. Frimat; B. de Wagenaar; Arn M. J. M. van den Maagdenberg; Pasqualina M. Sarro; Massimo Mastrangeli;
    In 35th Intl. Conf. on Micro Electro Mechanical Systems (MEMS 2022),
    January 9-13 2022. DOI: 10.1109/MEMS51670.2022.9699597

  98. Bulk Acoustic Wave Based Microfluidic Particle Sorting With Capacitive Micromachined Ultrasonic Transducers
    Shinnosuke Kawasaki; Jia-Jun Yeh; Marta Saccher; Jian Li; Ronald Dekker;
    In 35th Intl. Conf. on Micro Electro Mechanical Systems (MEMS 2022),
    2022. DOI: 10.1109/MEMS51670.2022.9699807

  99. Visible Blind Quadrant Sun Position Sensor in a Silicon Carbide Technology
    Joost Romijn; Sten Vollebregt; Alexander May; Tobias Erlbacher; Henk W. van Zeijl; Johan Leijtens; GuoQi Zhang; Pasqualina M. Sarro;
    In 35th Intl. Conf. on Micro Electro Mechanical Systems (MEMS 2022),
    2022. DOI: 10.1109/MEMS51670.2022.9699533

  100. Synthesis of Carbon Nanofibers (CNFs) by PECVD Using Ni Catalyst Printed by Spark Ablation
    Leandro Sacco; Joost van Ginkel; Sten Vollebregt;
    In Proc. IEEE Nano,
    pp. 128-131, 2022. DOI: 10.1109/NANO54668.2022.9928632

  101. ZnO Nanoparticle Printing for UV Sensor Fabrication
    Hendrik Joost van Ginkel; Mattia Orvietani; Joost Romijn; GuoQi Zhang; Sten Vollebregt;
    In Proc. of IEEE Sensors,
    2022. DOI: 10.1109/SENSORS52175.2022.9967053

  102. Humidity Sensor Based on Multi-Layer Graphene (MLG) Integrated Onto a Micro-Hotplate (MHP)
    Leandro Sacco; Hanxing Meng; Sten Vollebregt;
    In Proc. of IEEE Sensors,
    2022. DOI: 10.1109/SENSORS52175.2022.9967039

  103. Transfer-free multi-layer graphene as a platform for NEMS/MEMS sensors
    Sten Vollebregt;
    In MNE-ES conference (plenary),
    2022.

  104. Transfer-free multi-layered graphene (MLG) on integrated microheaters: an attractive platform for gas sensing
    Leandro Sacco; Hanxing Meng; Sten Vollebregt;
    In MNE-ES conference,
    2022.

  105. Wafer-Scale Transfer-Free Sensitive Graphene Microphones
    Roberto Pezone; G. Baglioni; P.M. Sarro; P.G. Steeneken; S. Vollebregt;
    In Graphene Week,
    2022.
    document

  106. Characterization of ultra-sensitive graphene membranes for microphone applications
    Gabriele Baglioni; Roberto Pezone; Sten Vollebregt; Katarina Cvetanović; Marko Spasenović; Dejan Todorović; Hanqing Liu; Gerard J. Verbiest; Herre S.J. van der Zant; Peter G. Steeneken;
    In Graphene Week,
    2022.
    document

  107. Low-loss a-SiC:H for superconducting microstrip lines for (sub-)millimeter astronomy
    Bruno T. Buijtendorp; Akira Endo; Kenichi Karatsu; David Thoen; Vignesh Murugesan; Kevin Kouwenhoven; Sebastian Hähnle; Jochem J. A. Baselmans; Sten Vollebregt;
    In Proc. SPIE PC12190, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy XI,
    pp. PC121900W, 2022. DOI: 10.1117/12.2630107

  108. In-situ reliability monitoring of power packages using a Thermal Test Chip
    H. A. Martin; R. Sattari; E. C. P. Smits; H. W. van Zeijl; W. D. van Driel; GuoQi Zhang;
    In 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    2022. DOI: 10.1109/EuroSimE54907.2022.9758913

  109. Maximization of transmitted acoustic intensity from silicon integrated piezoelectric ultrasound transducers
    Gandhika Wardhana; Massimo Mastrangeli; Tiago L. Costa;
    In IEEE International Ultrasonics Symposium,
    10-13 October 2022. DOI: 10.1109/IUS54386.2022.9957646

  110. Ionic polymer metal composite-based microfluidic flow sensor for bio-MEMS applications
    P. Motreuil-Ragot; G. Turcan; B. de Wagenaar; A. Hunt; P. M. Sarro; M. Mastrangeli;
    In IEEE SENSORS 2022,
    30 October - 2 November 2022. DOI: 10.1109/SENSORS52175.2022.9967281

  111. Analysis of Platinum Distribution within a Nafion 212 Membrane during Electroless Deposition
    P. Motreuil-Ragot; A. Hunt; L. N. Sacco; P. M. Sarro; M. Mastrangeli;
    In 242nd Electro Chemical Society Meeting,
    9-13 October 2022.

  112. Tapered pillars increase tissue position reproducibility in engineered heart tissue platforms
    M. Dostanic; L. M. Windt; J. M. Stein; B. J. Van Meer; C. L. Mummery; P. M. Sarro; M. Mastrangeli;
    In EUROoCS Conference 2022,
    4-5 July 2022.

  113. A Brain-on-chip Platform to Study the Optimal Parameters of Focused Ultrasound Neuromodulation
    G. Wardhana; M. Hu; J.-P. Frimat; A. M. J. M. Van den Maagdenberg; T. Costa; M. Mastrangeli;
    In EUROoCS Conference 2022,
    4-5 July 2022.

  114. Ionic polymer metal composite (IPMC)-based micropump for organs-on-chip
    P. Motreuil-Ragot; D. Kasi; B. de Wagenaar; A. Hunt; V. Orlova; A. M. J. M. van den Maagdenberg; P. M. SARRO; M. Mastrangeli;
    In EUROoCS Conference 2022,
    4-5 July 2022.

  115. Hybrid Silicon-Polymer Multi-Modal Sensing Device for Organ-on-Chip
    H. Aydogmus; M. Hu; J.-P. Frimat; A. M. J. M. van den Maagdenberg; P. M. Sarro; M Mastrangeli;
    In EUROoCS Conference 2022,
    4-5 July 2022.

  116. Integrated and tubeless pumping in an organ-on-chip multi-well plate
    B. de Wagenaar; S. Meucci; A. Bußman; M. Wackerle; J. Scheer; S. Kersjes; M. Mastrangeli;
    In EUROoCS Conference 2022,
    4-5 July 2022.

  117. Smart Multi-Well Plate: an autonomous, modular and scalable OoC platform
    S. Meucci; B. de Wagenaar; A. Bußmann; J. Meents; N. Gaio; R. Monge; R. Klemm; A. Breemen; J. Scheer; T. de Moura; S. Kersjes; M. Mastrangeli;
    In EUROoCS Conference 2022,
    4-5 July 2022.

  118. Brain-on-Chip Platform for Studying the Optimum Parameters of Ultrasound Neuromodulation
    G. Wardhana; M. Mastrangeli; T. Costa;
    In MRS Spring Meeting 2022,
    online, 23 May 2022.

  119. A 121.4dB DR, -109.8dB THD+N Capacitively-Coupled Chopper Class-D Audio Amplifier
    Huajun Zhang; Marco Berkhout; Kofi A. A. Makinwa; Qinwen Fan;
    In Fujino, {Laura C. } (Ed.), 2022 IEEE International Solid- State Circuits Conference (ISSCC),
    United States, IEEE, pp. 484--486, 2022. Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this wo. DOI: 10.1109/ISSCC42614.2022.9731737
    Abstract: ... Class-D amplifiers (CDAs) are often used in audio applications due to their superior power efficiency. Due to the sensitivity of the human ear, a large dynamic range (DR) is desired, and audio DACs with up to 130dB DR are commercially available [1]. However, the DR of the CDAs they drive is typically much lower [2]-[4], mainly due to the thermal noise introduced by the input resistors of their resistive feedback networks. Reducing this resistance is difficult, as it reduces the CDA's input impedance and increases the required loop-filter capacitance. Alternatively, the CDA could be configured as a capacitively coupled chopper amplifier (CCCA), whose capacitive feedback network could then achieve low noise without reducing input impedance. However, the large PWM component present at its output would then saturate its input stage. By exploiting the inherent PWM filtering present in a feedback-after-LC architecture, this paper presents a capacitively coupled chopper CDA, resulting in significantly improved DR and THD+N. The prototype achieves 8V_RMS of integrated output noise (A-weighted), a 121.4dB DR, and -1 09.8dB THD+N while delivering a maximum of 15/26W into an 8/4Omega load with 93%/88% efficiency.

  120. Time-efficient low power time/phase-reversal beamforming for the tracking of ultrasound implantable devices
    M. Saccher; S.S. Lolla; S. Kawasaki; R. Dekker;
    In IEEE International Ultrasonics Symposium (IUS),
    2022. DOI: 10.1109/IUS54386.2022.9957652

  121. Functional materials for MEMS based gas sensors
    Manjunath Ramachandrappa Venkatesh;
    PhD thesis, Delft University Technology, 2022. DOI: 10.4233/uuid:5bef3e79-1cab-411d-86dd-b9a518628824

  122. Technology platform for advanced neurostimulation implants
    Marta Kluba;
    PhD thesis, Delft University Technology, 2022. DOI: 10.4233/uuid:9dd9701b-343e-4f25-8d49-02652e839e32

  123. Integrated silicon carbide sun position sensor system-on-chip for space applications
    Joost Romijn;
    PhD thesis, Delft University Technology, 2022. DOI: 10.4233/uuid:0dbff3c1-752b-4211-ab1d-c8ec71ffed9d

  124. Quasi-vertical Gallium Nitride Diodes for Microwave Power Applications
    Yue Sun;
    PhD thesis, Delft University Technology, 2022. DOI: 10.4233/uuid:e6e7ddf2-96cf-4d43-aa94-243c52acc4e1

  125. Light Dosage Optimization by Data-driven and Dynamic Modeling
    Tianfeng Wang;
    PhD thesis, Delft University Technology, 2022. DOI: 10.4233/uuid:d3a84a3a-ba8d-4e1e-b6f7-4d3d2d7ac0c1

  126. Highly-Conformal Sputtered Through-Silicon Vias with Sharp Superconducting Transition
    J. A. Alfaro-Barrantes; M. Mastrangeli; D. J. Thoen; S. Visser; J. Bueno; J. J. A. Baselmans; P. M. Sarro;
    Journal of Microelectromechanical Systems,
    Volume 30, Issue 2, pp. 253-261, 2021. DOI: 10.1109/JMEMS.2021.3049822

  127. Multi-Layer Graphene Pirani Pressure Sensors
    Romijn, Joost; Dolleman, Robin; Singh, Manvika; van der Zant, Herre; Steeneken, Peter; Sarro, Pasqualina; Vollebregt, Sten;
    IOP Nanotechnology,
    Volume 32, Issue 33, pp. 335501, 2021. DOI: 10.1088/1361-6528/abff8e

  128. Effect of Temperature and Humidity on the Sensing Performance of TiO2 Nanowire-based Ethanol Vapor Sensors
    Mostafa Shooshtari; Alireza Salehi; Sten Vollebregt;
    IOP Nanotechnology,
    Volume 32, Issue 32, pp. 325501, 2021. DOI: 10.1088/1361-6528/abfd54

  129. Surface-micromachined Silicon Carbide Pirani Gauges for Harsh Environments
    Jiarui Mo; Luke Middelburg; Bruno Morana; H.W. Van Zeijl; Sten Vollebregt; GuoQi Zhang;
    IEEE Sensors Letters,
    Volume 21, Issue 2, pp. 1350-1358, 2021. DOI: 10.1109/JSEN.2020.3019711

  130. Monolithic Integration of a Smart Temperature Sensor on a Modular Silicon-based Organ-on-a-chip Device
    Ronaldo Martins da Ponte; Nikolas Gaio; Henk van Zeijl; Sten Vollebregt; Paul Dijkstra; Ronald Dekker; Wouter A. Serdijn; Vasiliki Giagka;
    Sensors and Actuators A: Physical,
    Volume 317, pp. 112439, 2021. DOI: 10.1016/j.sna.2020.112439
    document

  131. Influence of defect density on the gas sensing properties of multi-layered graphene grown by chemical vapor deposition
    Filiberto Ricciardella; Sten Vollebregt; Rita Tilmann; Oliver Hartwig; Cian Bartlam; Pasqualina M. Sarro; Hermann Sachdev; Georg S.Duesberg;
    Carbon Trends,
    Volume 3, pp. 100024, 2021.
    document

  132. A Review of Modification Methods of Solid Electrolytes for All-Solid-State Sodium-Ion Batteries
    Dai, Hanqing; Chen, Yuanyuan; Xu, Wenqian; Hu, Zhe; Gu, Jing; Wei, Xian; Xie, Fengxian; Zhang, Wanlu; Wei, Wei; Guo, Ruiqian; Zhang, Guoqi;
    Energy Technology,
    Volume 9, Issue 1, pp. 2000682, 2021. DOI: 10.1002/ente.202000682
    document

  133. Insights into the high-sulphur aging of sintered silver nanoparticles: An experimental and ReaxFF study
    Dong Hu; Tijian Gu; Zhen Cui; Sten Vollebregt; Xuejun Fan; Guoqi Zhang; Jiajie Fan;
    Corrosion Science,
    pp. 109846, 2021. DOI: 10.1016/j.corsci.2021.109846

  134. Co-Reduction of Common Mode Noise and Loop Current of Three-Level Active Neutral Point Clamped Inverters
    Wang, Jianing; Liu, Xiaohui; Peng, Qiang; Xun, Yuanwu; Yu, Shaolin; Jiang, Nan; Wang, Wenbo; Hou, Fengze;
    IEEE Journal of Emerging and Selected Topics in Power Electronics,
    Volume 9, Issue 1, pp. 1088-1103, 2021. DOI: 10.1109/JESTPE.2020.3043018

  135. Optical ventricular cardioversion by local optogenetic targeting and LED implantation in a cardiomyopathic rat model
    Emile C. A. Nyns; Tianyi Jin; Magda S Fontes; Titus van den Heuvel; Vincent Portero; Catilin Ramsey; Cindy I. Bart; Katja Zeppenfeld; Martin J. Schalij; Thomas J. van Brakel; Arti A. Ramkisoensing; GuoQi Zhang; René H. Poelma; Balazs Ördög; Antoine A. F. de Vries; Daniël A. Pijnappels;
    Cardiovascular Research,
    September 2021. DOI: 10.1093/cvr/cvab294

  136. Organs-on-chip: The way forward
    M. Mastrangeli; J. van den Eijnden-van Raaij;
    Stem Cell Reports,
    Volume 16, pp. 2037-2043, July 2021. DOI: 10.1016/j.stemcr.2021.06.015

  137. Hydrogenated Amorphous Silicon Carbide: A Low-loss Deposited Dielectric for Microwave to Submillimeter Wave Superconducting Circuits
    B. T. Buijtendorp; S. Vollebregt; K. Karatsu; D. J. Thoen; V. Murugesan; K. Kouwenhoven; S. Hähnle; J. J. A. Baselmans, A. Endo;
    arXiv,
    2021.
    document

  138. Enhanced Sensitivity Pt/AlGaN/GaN Heterostructure NO₂ Sensor Using a Two-Step Gate Recess Technique
    Jianwen Sun; Teng Zhan; Robert Sokolovskij; Zewen Liu; Pasqualina M. Sarro; Guoqi Zhang;
    IEEE Sensors Journal,
    Volume 21, Issue 15, pp. 16475-16483, 2021. DOI: 10.1109/JSEN.2021.3082205

  139. Design of a Fan-Out Panel-Level SiC MOSFET Power Module Using Ant Colony Optimization-Back Propagation Neural Network
    Qian, Yichen; Hou, Fengze; Fan, Jiajie; Lv, Quanya; Fan, Xuejun; Zhang, Guoqi;
    IEEE Transactions on Electron Devices,
    Volume 68, Issue 7, pp. 3460-3467, 2021. DOI: 10.1109/TED.2021.3077209

  140. Ultrasound-Guided Optogenetic Gene Delivery for Shock-Free Ventricular Rhythm Restoration
    Emile C.A. Nyns, Tianyi Jin, Cindy I. Bart, Wilhelmina H. Bax, Guoqi Zhang, René H. Poelma, Antoine A.F. de Vries, Daniël A. Pijnappels;
    Circulation: Arrhythmia and Electrophysiology,
    December 23 2021. DOI: 10.1161/CIRCEP.121.009886

  141. Room temperature ppt-level NO2 gas sensor based on SnOx/SnS nanostructures with rich oxygen vacancies
    Hongyu Tang; Chenshan Gao; Huiru Yang; Leandro Nicolas Sacco; Robert Sokolovskij; Hongze Zheng; Huaiyu Ye; Sten Vollebregt; Hongyu Yu; Xuejun Fan; Guoqi Zhang;
    2D Materials,
    2021. DOI: 10.1088/2053-1583/ac13c1

  142. A DFT study of As doped WSe2: A NO2 sensing material with ultra-high selectivity in the atmospheric environment
    Zhaokun Wang; Chenshan Gao; Shuhan Hou; Huiru Yang; Ziyuan Shao; Siyuan Xu; Huaiyu Ye;
    Materials Today Communications,
    Volume 28, pp. 102654, 2021. DOI: 10.1016/j.mtcomm.2021.102654
    document

  143. Cavity-BOX SOI: Advanced Silicon Substrate with Pre-Patterned BOX for Monolithic MEMS Fabrication
    Kluba, Marta Maria; Li, Jian; Parkkinen, Katja; Louwerse, Marcus; Snijder, Jaap; Dekker, Ronald;
    Micromachines 2021, 12(4), 414;,
    Volume 12, Issue 4, 2021. DOI: 10.3390/mi12040414
    document

  144. Active feedback cooling of a SiN membrane resonator by electrostatic actuation
    A. Borrielli; M. Bonaldi; E. Serra; P. M. Sarro; B. Morana;
    Journal of Applied Physics,
    Volume 130, pp. 014502, 2021.
    document

  145. System level reliability assessment for high power light-emitting diode lamp based on a Bayesian network method
    Mesfin Seid Ibrahim; Jiajie Fan; Winco K.C. Yung; Zhou Jing; Xuejun Fan; Willem van Driel; Guoqi Zhang;
    Measurement,
    Volume 176, pp. 109191, 2021. DOI: 10.1016/j.measurement.2021.109191
    document

  146. Low Leakage and High Forward Current Density Quasi-Vertical GaN Schottky Barrier Diode With Post-Mesa Nitridation
    X. Kang; Y. Sun; Y. Zheng; K. Wei; H. Wu; Y. Zhao; Xu Liu; GuoQi Zhang;
    IEEE Transactions on Electron Devices,
    Volume 68, Issue 3, pp. 1369-1373, 2021. DOI: 10.1109/TED.2021.3050739

  147. Prediction of software reliability
    W. van Driel; J.W. Bikker; M. Tijink;
    Microelectronics Reliability,
    Volume 119, pp. 114074, 2021. DOI: 10.1016/j.microrel.2021.114074
    document

  148. Investigating the Electrochemical Performance of Smart Self-Powered Bionic Skin Fragment Based on Bioelectricity Generation
    Dai, H.; Chen, Y.; Dai, W.; Hu, Z.; Xie, F.; Xu, W.; Cui, Z.; Wei, X.; Chen, Z.; Yang, B.; Zhang, W.; Wei, W.; Guo, R.; Zhang, GuoQi;
    Advanced Materials Technologies,
    Volume 6, Issue 3, 2021. DOI: 10.1002/admt.202000848
    document

  149. Facile Synthesis of Ag Nanowire/TiO2 and Ag Nanowire/TiO2/GO Nanocomposites for Photocatalytic Degradation of Rhodamine B
    Hajipour, Pejman; Bahrami, Abbas; Mehr, Maryam Yazdan; van Driel, Willem Dirk; Zhang, GuoQi;
    Materials,
    Volume 14, Issue 4, 2021. DOI: 10.3390/ma14040763
    document

  150. Correction: The inactivation mechanism of chemical disinfection against SARS-CoV-2: from MD and DFT perspectives
    Tan, Chunjian; Gao, Chenshan; Zhou, Quan; Van Driel, Willem; Ye, Huaiyu; Zhang, GuoQi;
    RSC Adv.,
    Volume 11, pp. 3509-3509, 2021. DOI: 10.1039/D0RA90127J
    document

  151. Effects of Defect and Temperature on the Mechanical Performance of WS2: A Multiscale Analysis
    Hongyu Tang; Dong Hu; Zhen Cui; Huaiyu Ye; GuoQi Zhang;
    Journal of Physical Chemistry C,
    2021.
    document

  152. Simple and rapid gas sensing using a single-walled carbon nanotube field-effect transistor-based logic inverter
    Salomé Forel; Leandro Sacco; Alice Castan; Ileana Florea; Costel Sorin Cojocaru;
    Nanoscale Advances,
    2021.

  153. Exploring water and ion transport process at silicone/copper interfaces using in-situ electrochemical and Kelvin probe approaches
    B. Munirathinam; J.P.B. van Dam; A. Herrmann; W.D. van Driel; F. De Buyl; S.J.F. Erich; L.G.J. van der Ven; O.C.G. Adan; J.M.C. Mol;
    Journal of Materials Science & Technology,
    Volume 64, pp. 203 - 213, 2021. SI: Advanced Corrosion-Resistant Materials and Emerging Applications. DOI: 10.1016/j.jmst.2019.07.044
    document

  154. Power-Efficiency Evolution of Capacitive Sensor Interfaces
    Zhichao Tan; Hui Jiang; Huajun Zhang; Xiyuan Tang; Haoming Xin; Stoyan Nihtianov;
    {IEEE} Sensors Journal,
    Volume 21, Issue 11, pp. 12457--12468, June 2021. DOI: 10.1109/jsen.2020.3035109
    document

  155. A High-Linearity and Low-EMI Multilevel Class-D Amplifier
    Huajun Zhang; Shoubhik Karmakar; Lucien J. Breems; Quino Sandifort; Marco Berkhout; Kofi A. A. Makinwa; Qinwen Fan;
    {IEEE} Journal of Solid-State Circuits,
    Volume 56, Issue 4, pp. 1176--1185, April 2021. DOI: 10.1109/jssc.2020.3043815
    document

  156. A microwatt telemetry protocol for targeting deep implants
    S. Kawasaki; I. Subramaniam; M. Saccher; R. Dekker;
    In Proc. IEEE International Ultrasonics Symposium,
    2021. DOI: 10.1109/IUS52206.2021.9593603

  157. A 25A Hybrid Magnetic Current Sensor with 64mA Resolution, 1.8MHz Bandwidth, and a Gain Drift Compensation Scheme
    A. Jouyaeian; Qinwen Fan; M. Motz; U. Ausserlechner; K. A. A. Makinwa;
    In Dig. Techn. Papers IEEE International Solid-State Circuits Conference (ISSCC),
    February 2021. DOI: 10.1109/ISSCC42613.2021.9365767

  158. A −121.5 dB THD Class-D Audio Amplifier with 49 dB Suppression of LC Filter Nonlinearity and Robust to +/−30% LC Filter Spread
    H. Zhang; M. Berkhout; K. Makinwa; Qinwen Fan;
    In Dig. Techn. Paper IEEE Symposium on VLSI Circuits (VLSI),
    June 2021. DOI: 10.23919/VLSICircuits52068.2021.9492441

  159. Transfer-free multi-layer graphene: a platform for NEMS/MEMS sensors
    Sten Vollebregt;
    In Graphene Conference,
    2021. (invited).

  160. Wafer-scale graphene: a transfer-free approach
    Sten Vollebregt;
    In Graphene Online,
    2021. (invited).
    document

  161. Towards a Scalable Sun Position Sensor with Monolithic Integration of the 3d Optics for Miniaturized Satellite Attitude Control
    J. Romijn; S. Vollebregt; H. W. van Zeijl; G. Zhang; J. Leijtens; P. M. Sarro;
    In 2021 IEEE 34th International Conference on Micro Electro Mechanical Systems (MEMS),
    pp. 642-645, Jan 2021. DOI: 10.1109/MEMS51782.2021.9375434

  162. Resistive and PTAT Temperature Sensors in a Silicon Carbide CMOS Technology
    Joost Romijn; Luke M. Middelburg; Sten Vollebregt; Brahim El Mansouri; Henk W. van Zeijl; Alexander May; Tobias Erlbacher; Guoqi Zhang; and Pasqualina M. Sarro;
    In Proc. of IEEE Sensors,
    2021.

  163. Recording 3D neuronal activity on chip with segmented 3D microelectrode arrays
    N. Revyn; M. H. Y. Hu; J.-P. Frimat; A. M. J. M. van den Maagdenberg; P. M. Sarro; M. Mastrangeli;
    In EUROoCS Conference 2021,
    online, 1-2 July, 2021.

  164. FET-based integrated charge sensing in a MEM organ-on-chip platform
    H. Aydogmus; H. J. van Ginkel; A.-D. Galiti; M. H. Y. Hu; J.-P. Frimat; A. M. J. M. van den Maagdenberg; G.Q. Zhang; M. Mastrangeli; P. M. Sarro;
    In EUROoCS Conference 2021,
    online, 1-2 July, 2021.

  165. Dual-gate FET-based charge sensor enhanced by in-situ electrode decoration in a MEMS organs-on-chip platform
    H. Aydogmus; H. J. van Ginkel; A.-D. Galiti; M. Hu; J.-P. Frimat; A. van den Maagdenberg; G.Q. Zhang; M. Mastrangeli; P. M. Sarro;
    In 21st Int. Conf. on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS 2021),
    online, 20-25 June, 2021.

  166. An engineered heart tissue platform with integrated pacing microelectrodes
    M. Dostanic; L. Windt; J. Stein; B. van Meer; A. Diakou; C. L. Mummery; P. M. Sarro; M. Mastrangeli;
    In EUROoCS Conference 2021,
    online, 1-2 July, 2021.

  167. ForceTracker: A versatile tool for contractile force assessment in 3D organ-on-chip platforms
    J. M. Rivera-Arbelaez; M. Dostanic; J. M. Stein; A. van den Berg; L. I. Segerink; C. L. Mummery; P. M. Sarro; M. Mastrangeli; M. C. Ribeiro; R. Passier;
    In EUROoCS Conference 2021,
    online, 1-2 July, 2021.

  168. Microelectronmechanical organs-on-chip
    Massimo Mastrangeli; Hande Aydogmus; Milica Dostanic; Paul Motreuil-Ragot; Nele Revyn; Bjorn de Wagenaar; Ronald Dekker; Pasqualina M. Sarro;
    In 21st Int. Conf. on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS 2021),
    online, 20-25 June, 2021.

  169. Constitutive Modeling of Sintered Nano-silver Particles: A Variable-order Fractional Model versus an Anand Model
    Fan, Jiajie; Gu, Tijian; Wang, Ping; Cai, Wei; Fan, Xuejun; Zhang, Guoqi;
    In 2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    pp. 1-4, 2021. DOI: 10.1109/EuroSimE52062.2021.9410807

  170. High step coverage interconnects by printed nanoparticles
    Hendrik Joost van Ginkel; Joost Romijn; Sten Vollebregt; GuoQi Zhang;
    In Proc. of the 23rd European Microelectronics and Packaging Conference & Exhibition (EMPC),
    2021.

  171. The long-term reliability of pre-charged CMUTs for the powering of deep implanted devices
    M. Saccher; S. Kawasaki; R. Dekker;
    In Proc. IEEE International Ultrasonics Symposium,
    2021. DOI: 10.1109/IUS52206.2021.9593683

  172. Pre-charged collapse-mode capacitive micromachined ultrasonic transducer (CMUT) for broadband ultrasound power transfer
    S. Kawasaki; Y. Westhoek; I. Subramaniam; M. Saccher; R. Dekker;
    In Proc. IEEE Wireless Power Transfer Conference,
    2021. DOI: 10.1109/WPTC51349.2021.9458104

  173. Design and Fabrication of a Multi-Functional Programmable Thermal Test Chip
    R. Sattari; H. van Zeijl; GuoQi Zhang;
    In 23rd European Microelectronics and Packaging Conference & Exhibition (EMPC),
    2021. DOI: 10.23919/EMPC53418.2021.9584984

  174. A -109.1 dB/-98 dB THD/THD+N Chopper Class-D Amplifier with >83.7 dB PSRR Over the Entire Audio Band
    Huajun Zhang; Nuriel Rozsa; Marco Berkhout; Qinwen Fan;
    In ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC),
    United States, IEEE, pp. 395--398, 2021. Accepted author manuscript; ESSCIRC 2021 : IEEE 47th European Solid State Circuits Conference ; Conference date: 06-09-2021 Through 09-09-2021. DOI: 10.1109/ESSCIRC53450.2021.9567786
    Keywords: ... Class-D amplifier, PSRR, PWM, chopping, intermodulation.

    Abstract: ... This paper reports a chopper Class-D audio amplifier that obtains high PSRR over the entire audio band. A chopping scheme is proposed to minimize intermodulation distortion between pulse-width modulation (PWM) and chopping in the audio band. A high-voltage chopper is developed to handle a 14.4 V PWM signal. Timing matching techniques are proposed to minimize chopping nonidealities which ensure good PSRR and THD. Fabricated in a 180nm BCD process, the prototype obtains a PSRR >109 dB at 217 Hz and >83.7 dB over the entire audio band. It also achieves -109.1 dB/-98 dB THD/THD+N and can deliver a maximum of 13 W to an 8-Ω load.

  175. A 94.1 dB DR 4.1 nW/Hz Bandwidth/Power Scalable DTDSM for IoT Sensing Applications Based on Swing-Enhanced Floating Inverter Amplifiers
    Yibo Zhao; Huajun Zhang; Yaopeng Hu; Yuanxin Bao; Le Ye; Wanyuan Qu; Menglian Zhao; Zhichao Tan;
    In 2021 IEEE Custom Integrated Circuits Conference, CICC 2021 - Proceedings,
    United States, Institute of Electrical and Electronics Engineers (IEEE), 2021. 2021 IEEE Custom Integrated Circuits Conference, CICC 2021 ; Conference date: 25-04-2021 Through 30-04-2021. DOI: 10.1109/CICC51472.2021.9431415
    Abstract: ... IoT sensing applications operating from batteries or harvested energy require microwatt data converters. To accurately measure small signals, they often need to achieve a high DR (>90dB) and better linearity than the transducers themselves (>14b) with a BW in the kHz range. IoT systems also often consist of multiple sensing modalities with different BW requirements and are often heavily duty-cycled to reduce power consumption. This paper presents a fully dynamic discrete-time delta-sigma modulator (DTDSM) that supports 4x bandwidth/power scaling without any programming overhead except for changing fs, using a capacitively biased swing-enhanced floating inverter amplifier (SEFIA). The prototype, fabricated in 180nm CMOS, consumes only 4μW at 800Hz BW and achieves >87dB SNDR over 2 octaves of fs, between 100 kHz and 400 kHz, and a DR of 94.1 dB while operating with an OSR of 125.

  176. A-121.5 dB THD Class-D Audio Amplifier with 49 dB Suppression of LC Filter Nonlinearity and Robust to +/-30% LC Filter Spread
    Huajun Zhang; Marco Berkhout; Kofi Makinwa; Qinwen Fan;
    In 2021 Symposium on VLSI Circuits,
    United States, IEEE, 2021. Green Open Access added to TU Delft Institutional Repository {\textquoteleft}You share, we take care!{\textquoteright} – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher i. DOI: 10.23919/VLSICircuits52068.2021.9492441
    Abstract: ... This paper reports a Class-D audio amplifier that uses multiloop feedback to suppress output LC filter nonlinearity by 49 dB, enabling the use of small, low-cost LC filters with ±30% spread while maintaining low distortion. Fabricated in a 180 nm BCD process, the prototype achieves a THD of-121.5 dB and a THD+N of-107.1 dB. It delivers 12W/21W into an 8-Ω/4-Ω load with 91%/87% efficiency.

  177. Low-loss dielectric for high frequency cryogenic applications
    J.J.A. Baselmans; B.T. Buijtendorp; A. Endo; S. Vollebregt;
    Patent, NL2024742B1; WO2021150101, 2021.

  178. Design and processing of silicon and silicon carbide sensors
    Brahim Mansouri;
    PhD thesis, Delft University Technology, 2021.
    document

  179. Superconducting Funnelled Through-Silicon Vias for Quantum Applications
    Juan Alfaro Barrantes;
    PhD thesis, Delft University Technology, 2021.
    document

  180. Prognostics and health management of safety relevant electronics for autonomous driving
    Alexandru Prisacaru;
    PhD thesis, Delft University Technology, 2021.
    document

  181. Multi-Physics Driven Electromigration Study: Multi-Scale Modeling and Experiment
    Zhen Cui;
    PhD thesis, Delft University Technology, 2021.
    document

  182. Low-friction, wear-resistant, and electrically homogeneous multilayer graphene grown by chemical vapor deposition on molybdenum
    Borislav Vasic; Uros Ralevic; Katarina Cvetanovic Zobenica; Milce Smiljanic; Rados Gajic; Marko Spasenovic; Sten Vollebregt;
    Applied Surface Science,
    Volume 509, pp. 144792, 2020. DOI: 10.1016/j.apsusc.2019.144792

  183. A High-Linearity and Low-EMI Multilevel Class-D Amplifier
    H. Zhang; S. Karmakar; L. J. Breems; Q. Sandifort; M. Berkhout; K. A. A. Makinwa; Qinwen Fan;
    IEEE Journal of Solid-State Circuits,
    Volume 56, pp. 1176-1185, December 2020. DOI: 10.1109/JSSC.2020.3043815
    Abstract: ... This article presents a Class-D audio amplifier for automotive applications. Low electromagnetic interference (EMI) and, hence, smaller LC filter size are obtained by employing a fully differential multilevel output stage switching at 4.2 MHz. A modulation scheme with minimal switching activity at zero input reduces idle power, which is further assisted by a gate-charge reuse scheme. It also achieves high linearity due to the high loop gain realized by a third-order feedback loop with a bandwidth of 800 kHz. The prototype, fabricated in a 180-nm high-voltage BCD process, achieves a minimum THD+N of −107.8 dB/−102 dB and a peak efficiency of 91%/87% with 8- and 4- Ω loads, respectively, while drawing 7-mA quiescent current from a 14.4-V supply. The prototype meets the CISPR 25 Class 5 EMI standard with a 5.7-dB margin using an LC filter with a cutoff frequency of 580 kHz.

  184. A 28-W, -102.2-dB THD+N Class-D Amplifier Using a Hybrid Δ Σ M-PWM Scheme
    S. Karmakar; H. Zhang; R. van Veldhoven; L. J. Breems; M. Berkhout; Qinwen Fan; K. A. A. Makinwa;
    IEEE Journal of Solid-State Circuits,
    September 2020. DOI: 10.1109/JSSC.2020.3023874
    Abstract: ... This article presents a 28-W class-D amplifier for automotive applications. The combination of a high switching frequency and a hybrid multibit Δ ΣM-PWM scheme results in high linearity over a wide range of output power, as well as low AM-band EMI. As a result, only a small (150-kHz cutoff frequency), and thus low-cost, LC filter is needed to meet the CISPR-25 EMI average limit (150 kHz-30 MHz) with 10-dB margin. At 28-W output power, the proposed amplifier achieves 91% efficiency while driving a 4-Ω load from a 14.4-V supply. It attains a peak THD+N of 0.00077% (-102.2 dB) for a 1-kHz input signal.

  185. Fan-out Panel-level PCB Embedded SiC Power MOSFETs Packaging
    Fengze Hou; W. Wang; R. Ma; Y. Li; Z. Han; M. Su; J. Li; Z. Yu; Y. Song; Q. Wang; M. Chen; L. Cao; GuoQi Zhang; J.A. Ferreira;
    IEEE Journal of Emerging and Selected Topics in Power Electronics,
    Volume 8, Issue 1, pp. 367-380, 2020.

  186. Review of Packaging Schemes for Power Module
    Fengze Hou; W. Wang; L. Cao; M. Su; J. Li; GuoQi Zhang; J.A. Ferreira;
    IEEE Journal of Emerging and Selected Topics in Power Electronics,
    Volume 8, Issue 1, pp. 223-238, 2020.

  187. The influence of phosphor particles on the water transport in optical silicones for LEDs
    A. Herrmann; S.J.F. Erich; L.G.J. v.d. Ven; H.P. Huinink; W.D. van Driel; M.van Soestbergen; A. Mavinkurve; F. Deuyl; J.M.C. Mol; O.C.G. Adan;
    Optical Materials: X,
    Volume 6, pp. 100047, 2020. DOI: 10.1016/j.omx.2020.100047

  188. Microchannel Thermal Management System with Two-Phase Flow for Power Electronics over 500 W/cm2 Heat Dissipation
    Fengze Hou; Hengyun Zhang; Dezhu Huang; Jiajie Fan; Fengman Liu; Tingyu Lin; Liqiang Cao; Xuejun Fan; Braham Ferreira; GuoQi Zhang;
    IEEE Transactions on Power Electronics,
    Volume 35, Issue 10, pp. 10592-10600, 2020. DOI: 10.1109/TPEL.2020.2985117

  189. Ultra-sensitive NO2 gas sensors based on single-wall carbon nanotube field effect transistors: Monitoring from ppm to ppb level
    Leandro Sacco; Salomé Forel; Ileana Florea; Costel-Sorin Cojocaru;
    Carbon,
    Volume 157, pp. 631-639, 2020.

  190. Exploring the response of a resistive soot sensor to AC electric excitation
    L.M. Middelburg; M. Ghaderi; D. Bilby; J.H. Visser; R.F. Wolffenbuttel;
    Journal of Aerosol Science,
    2020. DOI: 10.1016/j.jaerosci.2020.105568

  191. Quantum Signature of a Squeezed Mechanical Oscillator
    A. Chowdhury; P. Vezio; M. Bonaldi; A. Borrielli; F. Marino; B. Morana; G. A. Prodi; P. M. Sarro; E. Serra; F. Marin;
    Physical Review Letters,
    Volume 124, pp. 023601, 2020. DOI: 10.1103/PhysRevLett.124.023601

  192. Towards Multi-Functional SiO2@YAG:Ce Core–Shell Optical Nanoparticles for Solid State Lighting Applications
    Mahdi Kiani Khouzani; Abbas Bahrami; Maryam Yazdan Mehr; Willem Dirk van Driel; GuoQi Zhang;
    Nanomaterials,
    Volume 10, Issue 1, pp. 153, 2020. DOI: 10.3390/nano10010153

  193. Low-Impedance PEDOT:PSS MEA Integrated in a Stretchable Organ-on-Chip Device
    Affan K. Waafi; Nikolas Gaio; William F. Quiros-Solano; Paul Dijkstra; Pasqualina M. Sarro; Ronald Dekker;
    IEEE Sensors,
    Volume 20, Issue 3, pp. 1150-1157, 2020. DOI: 10.1109/JSEN.2019.2946854

  194. From bioethanol containing fuels towards a fuel economy that includes methanol derived from renewable sources and the impact on European Union decision-making on transition pathways
    T. B. Bonenkamp; L. M. Middelburg; M. O. Hosli; R. F. Wolffenbuttel;
    Renewable and Sustainable Energy Review,
    Volume 120, pp. 109667, 2020. DOI: 10.1016/j.rser.2019.109667

  195. From bioethanol containing fuels towards a fuel economy that includes methanol derived from renewable sources and the impact on European Union decision-making on transition pathways
    T. B. Bonenkamp, L. M. Middelburg, M. O. Hosliand, R. F. Wolffenbuttel;
    Renewable and Sustainable Energy Reviews,
    Volume 120, pp. 109667, 2020. DOI: 10.1016/j.rser.2019.109667

  196. Maintaining Transparency of a Heated MEMS Membrane for Enabling Long-Term Optical Measurements on Soot-Containing Exhaust Gas
    Luke M. Middelburg; Mohammadamir Ghaderi; David Bilby; Jaco H. Visser; GuoQi Zhang; Per Lundgren; Peter Enoksson; Reinoud F. Wolffenbuttel;
    MDPI Sensors,
    Volume 20, 2020. DOI: 10.3390/s20010003

  197. Self-aligned micro-optic integrated photonic platform
    A. Jovic; N. Sanchez Losilla; J. Sancho Durá; K. Zinoviev; J. L. Rubio Guivernau; E. Margallo-Balbás; M. Mastrangeli; G. Pandraud; P. M. Sarro;
    Applied Optics,
    Volume 59, Issue 1, pp. 180-189, 2020. DOI: 10.1364/AO.59.000180

  198. The interface adhesion of CaAlSiN3: Eu2+ phosphor/silicone used in light-emitting diode packaging: a first principles study
    Zhen Cui; Jiajie Fan; Hendrik Joost van Ginkel; Xuejun Fan; GuoQi Zhang;
    Applied Surface Science,
    2020. DOI: 10.1016/j.apsusc.2020.145251

  199. Controlling the pinning time of a receding contact line under forced wetting conditions
    J-C. Fernández-Toledano; C. Rigaut; M. Mastrangeli; J. De Coninck;
    Journal of Colloid and Interface Science,
    Volume 565, pp. 449-457, 2020. DOI: 10.1016/j.jcis.2020.01.054

  200. Bottom-up assembly of micro/nanostructures
    M. Mastrangeli; M. Perego;
    Advanced Materials Interfaces,
    Volume 7, Issue 5, pp. 2000182, 2020. DOI: 10.1002/admi.202000182

  201. Infrared absorbance of vertically-aligned multi-walled CNT forest as a function of synthesis temperature and time
    Amir Mirza Gheytaghia; Amir Ghaderi; Sten Vollebregt; Majid Ahmadic; Reinoud Wolffenbuttel; GuoQi Zhang;
    Materials Research Bulletin,
    2020. DOI: 10.1016/j.materresbull.2020.110821

  202. Toward a Self-Sensing Piezoresistive Pressure Sensor for all-SiC Monolithic Integration
    L.M. Middelburg; H.W. van Zeijl; S. Vollebregt; B. Morana; GuoQi Zhang;
    IEEE Sensors,
    Volume 20, Issue 19, pp. 11265-11274, 2020. DOI: 10.1109/JSEN.2020.2998915

  203. Low-Humidity Sensing Properties of Multi-Layered Graphene Grown by Chemical Vapor Deposition
    Filiberto Ricciardella; Sten Vollebregt; Tiziana Polichetti; Pasqualina M. Sarro; Georg S. Duesberg;
    MDPI Sensors,
    Volume 20, Issue 11, pp. 3174, 2020.
    document

  204. Wafer-scale transfer-free process of multi-layered graphene grown by chemical vapor deposition
    Filiberto Ricciardella; Sten Vollebregt; Bart Boshuizen; F.J.K. Danzl; Ilkay Cesar; Pierpaolo Spinelli; Pasqualina Maria Sarro;
    Material Research Express,
    2020. DOI: 10.1088/2053-1591/ab771e

  205. Software Reliability for Agile Testing
    Willem Dirk van Driel; Jan Willem Bikker; Matthijs Tijink; Alessandro Di Bucchianico;
    Mathematics,
    Volume 8, Issue 5, pp. 791, 2020. DOI: 10.3390/math8050791

  206. Three-dimensional self-assembly using dipolar interaction
    L. Abelmann; T. A.G. Hageman; P. A. Loethman; M. Mastrangeli; M. Elwenspoek;
    Science Advances,
    Volume 6, Issue 19, pp. eaba2007, 2020. DOI: 10.1126/sciadv.aba2007

  207. Statistical reprogramming of macroscopic self-assembly with dynamic boundaries
    U. Culha; Z. S. Davidson; M. Mastrangeli; M. Sitti;
    Proceedings of the National Academy of Sciences of the USA,
    Volume 117, Issue 21, pp. 11306-11313, 2020. DOI: 10.1073/pnas.2001272117

  208. Vertically-Aligned Multi-Walled Carbon Nano Tube Pillars with Various Diameters under Compression: Pristine and NbTiN Coated
    Amir Mirza Gheitaghy; René H. Poelma; Leandro Sacco; Sten Vollebregt; GuoQi Zhang;
    MDPI Nanomaterials,
    Volume 10, Issue 6, pp. 1189, 2020. DOI: 10.3390/nano10061189

  209. The Impact of Gate Recess on the H2 Detection Properties of Pt-AlGaN/GaN HEMT Sensors
    Robert Sokolovskij; Jian Zhang; Hongze Zheng; Wenmao Li; Yang Jiang; Gaiying Yang; Hongyu Yu; Pasqualina M. Sarro; Guoqi Zhang;
    IEEE Sensors,
    Volume 20, Issue 16, pp. 8947-8955, 2020.
    document

  210. Superconducting High-Aspect Ratio Through-Silicon Vias with DC-Sputtered Al for Quantum 3D integration
    J. A. Alfaro-Barrantes; M. Mastrangeli; D. J. Thoen; S. Visser; J. Bueno; J. J. A. Baselmans; P. M. Sarro;
    IEEE Electron Device Letters,
    Volume 41, Issue 7, pp. 1114-1117, 2020. DOI: 10.1109/LED.2020.2994862

  211. A miniaturized EHT platform for accurate measurements of tissue contractile properties
    M. Dostanic; L. M. Windt; J. M. Stein; B. J. van Meer; M. Bellin; V. Orlova; M. Mastrangeli; C. L. Mummery; P. M. Sarro;
    Journal of Microelectromechanical Systems,
    Volume 29, Issue 5, pp. 881-887, July 2020. DOI: 10.1109/JMEMS.2020.3011196

  212. The influence of H2 and NH3 on catalyst nanoparticle formation and carbon nanotube growth
    R. Pezone; S. Vollebregt; P.M. Sarro; Sandeep Unnikrishnan;
    Carbon,
    Volume 170, pp. 384-393, 2020.
    document

  213. Low power AlGaN/GaN MEMS pressure sensor for high vacuum application
    Jianwen Sun; Dong Hu; Zewen Liu; Luke Middelburg; Sten Vollebregt; Pasqualina M. Sarro; Guoqi Zhang;
    Sensors and Actuators A: Physical,
    Volume 314, pp. 112217, 2020.
    document

  214. Effect of Humidity on Gas Sensing Performance of Carbon Nanotube Gas Sensors Operated at Room Temperature
    Mostafa Shooshtari; Alireza Salehi; Sten Vollebregt;
    IEEE Sensors,
    2020.
    document

  215. Thermal kinetic and mechanical behaviors of pressure-assisted Cu nanoparticles sintering: A molecular dynamics study
    Dong Hu; Zhen Cui; Jiajie Fan; Xuejun Fan; Guoqi Zhang;
    Results in Physics,
    2020.
    document

  216. Quantum motion of a squeezed mechanical oscillator attained via an optomechanical experiment
    P. Vezio; A. Chowdhury; M. Bonaldi; A. Borrielli; F. Marino; B. Morana; G. A. Prodi; P. M. Sarro; E. Serra; F. Marin;
    Physical Review A,
    Volume 102, pp. 053505, 2020.
    document

  217. Recent advances in 2D/nanostructured metal sulfide-based gas sensors: mechanisms, applications, and perspectives
    Hongyu Tang; Leandro Sacco; Sten Vollebregt; Huaiyu Ye; Xuejun; Fan; GuoQi Zhang;
    Journal of Materials Chemistry A,
    Volume 8, pp. 24943-24976, 2020.
    document

  218. A high responsivity and controllable recovery ultraviolet detector based on a WO3 gate AlGaN/GaN heterostructure with an integrated micro-heater
    Sun, Jianwen; Zhang, Shuo; Zhan Teng; Liu, Zewen; Wang Junxi; Yi Xiaoyan; Li Jinmin; P. M. Sarro; GuoQi Zhang;
    Journal of Materials Chemistry C,
    Volume 8, Issue 16, pp. 5409-5416, 2020. DOI: 10.1039/D0TC00553C
    document

  219. An effective optics-electrochemistry approach to random packing density of non-equiaxed ellipsoids
    Hanqing Dai; Wenqian Xu; Zhe Hu; Yuanyuan Chen; Bobo Yang; Zhiyong Xiong; Danlu Su; Xian Wei; Shiliang Mei; Zhihao Chen; Min Li; Wanlu Zhang; Fengxian Xie; Wei Wei; Ruiqian Guo; GuoQi Zhang;
    Materialia,
    Volume 12, pp. 100750, 2020. DOI: 10.1016/j.mtla.2020.100750
    document

  220. Dynamic prediction of optical and chromatic performances for a light-emitting diode array based on a thermal-electrical-spectral model
    Jiajie Fan; Wei Chen; Weiyi Yuan; Xuejun Fan; Guoqi Zhang;
    Opt. Express,
    Volume 28, Issue 9, pp. 13921--13937, Apr 2020. DOI: 10.1364/OE.387660
    document

  221. Effect of porous Cu addition on the microstructure and mechanical properties of SnBi-xAg solder joints
    Yang Liu; Boqiao Ren; Min Zhou; Yuxiong Xue; Xianghua Zeng; Fenglian Sun; Xuejun Fan; GuoQi Zhang;
    Applied Physics A,
    Volume 126, Issue 9, pp. 735, August 2020. DOI: 10.1007/s00339-020-03926-3
    document

  222. Blue light therapy to treat candida vaginitis with comparisons of three wavelengths: An in vitro study
    Tianfeng Wang; Jianfei Dong; Huancai Yin; GuoQi Zhang;
    Lasers in Medical Science,
    Volume 35, Issue 6, pp. 1329--1339, 2020. DOI: 10.1007/s10103-019-02928-9

  223. Effective Approaches of Improving the Performance of Chalcogenide Solid Electrolytes for All-Solid-State Sodium-Ion Batteries
    Dai, Hanqing; Xu, Wenqian; Hu, Zhe; Chen, Yuanyuan; Wei, Xian; Yang, Bobo; Chen, Zhihao; Gu, Jing; Yang, Dan; Xie, Fengxian; Zhang, Wanlu; Guo, Ruiqian; Zhang, Guoqi; Wei, Wei;
    Frontiers in Energy Research,
    Volume 8, pp. 97, 2020. DOI: 10.3389/fenrg.2020.00097
    document

  224. Entropy generation methodology for defect analysis of electronic and mechanical components-A review
    Miao Cai; Peng Cui; Yikang Qin; Daoshuang Geng; Qiqin Wei; Xiyou Wang; Daoguo Yang; Guoqi Zhang;
    Entropy: international and interdisciplinary journal of entropy and information studies,
    Volume 22, Issue 2, February 2020. DOI: 10.3390/e22020254

  225. Experimental Investigation on the Sintering Kinetics of Nanosilver Particles Used in High-Power Electronic Packaging
    Jiajie Fan; D. Xu; H. Zhang; C. Qian; X. Fan; GuoQi Zhang;
    IEEE Transactions on Components, Packaging and Manufacturing Technology,
    Volume 10, Issue 7, pp. 1101-1109, July 2020. DOI: 10.1109/TCPMT.2020.2995634

  226. Machine Learning and Digital Twin Driven Diagnostics and Prognostics of Light‐Emitting Diodes
    Mesfin Seid Ibrahim; Jiajie Fan; Winco K. C. Yung; Alexandru Prisacaru; Willem D. van Driel; Xuejun Fan; GuoQi Zhang;
    Laser and Photonics Reviews,
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  227. Machine-Learning Assisted Prediction of Spectral Power Distribution for Full-Spectrum White Light-Emitting Diode
    Jiajie Fan; Yutong Li; Irena Fryc; Cheng Qian; Xuejun Fan; GuoQi Zhang;
    IEEE Photonics Journal,
    Volume 12, Issue 1, pp. 1-18, Feb 2020. DOI: 10.1109/JPHOT.2019.2962818

  228. Lifetime Prediction of Ultraviolet Light-Emitting Diodes Using a Long Short-Term Memory Recurrent Neural Network
    Zhou Jing; Jie Liu; Mesfin Seid Ibrahim; Jiajie Fan; Xuejun Fan; GuoQi Zhang;
    IEEE Electron Device Letters,
    Volume 41, Issue 12, pp. 1817-1820, 2020. DOI: 10.1109/LED.2020.3034567

  229. Optimization of Mesa Etch for a Quasi-Vertical GaN Schottky Barrier Diode (SBD) by Inductively Coupled Plasma (ICP) and Device Characteristics
    Yue Sun; Xuanwu Kang; Yingkui Zheng; Ke Wei; Pengfei Li; Wenbo Wang; Xinyu Liu; GuoQi Zhang;
    Nanomaterials,
    Volume 10, Issue 4, pp. 657, Apr 2020. DOI: 10.3390/nano10040657
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  230. The inactivation mechanism of chemical disinfection against SARS-CoV-2: from MD and DFT perspectives
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  231. Multi-axial electro-mechanical testing methodology for highly stretchable freestanding micron-sized structures
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    Volume 30, Issue 5, pp. 1--17, 2020. DOI: 10.1088/1361-6439/ab748f

  232. Soft, flexible and transparent graphene-based active spinal cord implants for optogenetic studies
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    13th International Symposium on Flexible Organic Electronics (ISFOE20),
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  233. Functionalisation of Multi-Layer Graphene-Based Gas Sensor by Au Nanoparticles
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  234. P-type β-Ga2O3 metal-semiconductor-metal solar-blind photodetectors with extremely high responsivity and gain-bandwidth product
    Z.X. Jiang; Z.Y. Wu; C.C. Ma; J.N. Deng; H. Zhang; Y. Xu; J.D. Ye; Z.L. Fang; GuoQi Zhang; J.Y. Kang; T.-Y. Zhang;
    Materials Today Physics,
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  235. Recent Advances in the Critical Heat Flux Amelioration of Pool Boiling Surfaces Using Metal Oxide Nanoparticle Deposition
    Hesam Moghadasi; Navid Malekian; Hamid Saffari; Amir Mirza Gheytaghi; GuoQi Zhang;
    Energies,
    Volume 13, Issue 15, pp. 4026, Aug 2020. DOI: 10.3390/en13154026
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  236. A 28-W, -102.2-dB THD$\mathplus$N Class-D Amplifier Using a Hybrid $\upDelta$$\upSigma$M-PWM Scheme
    Shoubhik Karmakar; Huajun Zhang; Robert van Veldhoven; Lucien J. Breems; Marco Berkhout; Qinwen Fan; Kofi A. A. Makinwa;
    {IEEE} Journal of Solid-State Circuits,
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  237. Sensor Systems Simulations: From Concept to Solution
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    Springer, , 2020. DOI: 10.1007/978-3-030-16577-2

  238. Health Monitoring for Lighting Applications
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    Springer, , 2020.

  239. Ultraviolet Sensing in WBG: SiC
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    Springer, , pp. 397-425, 2020.

  240. From Si Towards SiC Technology for Harsh Environment Sensing
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  241. Research On FOPLP Package of multi-chip Power Module
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    pp. 1-6, Sep. 2020. DOI: 10.1109/ESTC48849.2020.9229816

  242. FET-based charge sensor for organs-on-chip with in-situ electrode decoration
    H. Aydogmus; H. J. van Ginkel; M. Mastrangeli; GuoQi Zhang; P.M. Sarro;
    In International MicroNanoConference,
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  243. Wafer Scale Flexible Interconnect Transfer for Hetrogeneous Integration
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    In 2020 IEEE 70th Electronic Components and Technology Conference (ECTC),
    United States, IEEE, pp. 817--823, 06 2020. DOI: 10.1109/ECTC32862.2020.00133

  244. A DFT Model Study about Structure Sensitivity for Benzotriazole Adsorption on Copper Surfaces and Nano Cluster
    Weihong Zhang; Quan Zhou; Honghao Tang; Xu Liu; Huaiyu Ye; Sau Wee Koh; GuoQi Zhang;
    In 2020 21st International Conference on Electronic Packaging Technology (ICEPT),
    Guangzhou, China, IEEE, pp. 1-4, Aug 2020. DOI: 10.1109/ICEPT50128.2020.9202975

  245. Functionalization of multi-layer graphene-based gas sensor by Au nanoparticles
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  246. 3D-impaction printing of porous layers
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    In European Aerosol Conference,
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  247. Implementation of General Coupling Model of Electromigration in ANSYS
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    In IEEE 70th Electronic Components and Technology Conference (ECTC),
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  248. Enabling Actuation and Sensing in Organs-On-Chip Using Electroactive Polymers
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    In IEEE 3rd International Conference on Soft Robotics (RoboSoft 2020),
    2020. DOI: 10.1109/RoboSoft48309.2020.9115977

  249. Wafer-scale Graphene-based Soft Implant with Optogenetic Compatibility
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    In IEEE Int. Conf. on Micro Electro Mechanical Systems (MEMS 2020),
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  250. Fabrication of Al-based superconducting high-aspect ratio TSVs for quantum 3D integration
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    In IEEE Int. Conf. on Micro Electro Mechanical Systems (MEMS 2020),
    2020. DOI: 10.1109/MEMS46641.2020.9056165

  251. A 28W -108.9dB/-102.2dB THD/THD+N Hybrid ΔΣ−PWM Class-D Audio Amplifier with 91% Peak Efficiency and Reduced EMI Emission
    S. Karmakar; H. Zhang; R.Van Veldhoven; L. Breems; M. Berkhout; Qinwen Fan; K.A.A Makinwa;
    In Dig. Techn. Papers IEEE International Solid-State Circuits Conference (ISSCC),
    pp. 350-352, 2 2020. DOI: 10.1109/ISSCC19947.2020.9063001

  252. A −107.8 dB THD+N Low-EMI Multi-Level Class-D Audio Amplifier
    H. Zhang; S. Karmakar; L. Breems; Q. Sandifort; M. Berkhout; K. Makinwa; Qinwen Fan;
    In Dig. Techn. Paper IEEE Symposium on VLSI Circuits (VLSI),
    June 2020. DOI: 10.1109/VLSICircuits18222.2020.9162793

  253. Impedance Spectroscopy for Enhanced Data Collection of Conductometric Soot Sensors
    Middelburg, L. M.; Ghaderi, M.; Bilby, D.; Visser, J. H.; GuoQi Zhang; Wolffenbuttel, R. F.;
    In IEEE 29th International Symposium on Industrial Electronics (ISIE),
    pp. 1099-1103, 2020. DOI: 10.1109/ISIE45063.2020.9152484

  254. Miniaturized engineered heart tissues from human induced pluripotent cell-derived co-culture
    L. Windt; M. Dostanic; J. Stein; V. Meraviglia; G. Campostrini; M. Bellin; V. Orlova; M. Mastrangeli; P. M. Sarro; B. van Meer; C. Mummery;
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  255. Self-Cleaning Micro-Windows for In-Tailpipe Optical Exhaust Gas Measurements
    Ghaderi, A.; Middelburg, L. M.; Bilby, D.; Visser, J. H.; Lundgren, P.; Enoksson, P.; Wolffenbuttel, R. F.;
    In IEEE 29th International Symposium on Industrial Electronics (ISIE),
    pp. 1104-1108, 2020. DOI: 10.1109/ISIE45063.2020.9152437

  256. A 3D microelectrode array to record neural activity at different tissue depths
    T. de Rijk; M. Hu; J.-P. Frimat; A. M. J. M. van den Maagdenberg; P. M. Sarro; M. Mastrangeli;
    In EUROoCS Conference 2020,
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  257. FET-based integrated charge sensor for organ-on-chip applications
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    In IEEE Sensors 2020,
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  258. Characterization of low-loss hydrogenated amorphous silicon films for superconducting resonators
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  259. Embedded High-Density Trench Capacitors for Smart Catheters
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    pp. 1-5, Sep. 2020. DOI: 10.1109/ESTC48849.2020.9229800

  260. System Software Reliability
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  261. Study on the effect of mixing proportion of micro- and nano-copper particles on sintering properties
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    In 2020 21st International Conference on Electronic Packaging Technology (ICEPT),
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  262. PDMS-Parylene Adhesion Improvement via Ceramic Interlayers to Strengthen the Encapsulation of Active Neural Implants
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  263. A -107.8 dB THD+N Low-EMI Multi-Level Class-D Audio Amplifier
    Huajun Zhang; Shoubhik Karmakar; Lucien Breems; Quino Sandifort; Marco Berkhout; Kofi Makinwa; Qinwen Fan;
    In 2020 IEEE Symposium on VLSI Circuits,
    United States, IEEE, pp. 1--2, 2020. Green Open Access added to TU Delft Institutional Repository {\textquoteleft}You share, we take care!{\textquoteright} – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher i. DOI: 10.1109/VLSICircuits18222.2020.9162793
    Abstract: ... This paper describes a class-D audio amplifier with a multilevel output stage that reduces both EMI and idle power. High loop gain, and thus high linearity, are enabled by a relatively high (4.2 MHz) switching frequency, which relaxes the requirements on its output LC filter. Fabricated in a 180nm BCD technology, it can drive 14 W into an 8-Ω load with state-of-the-art performance: -107.8 dB THD+N, 91% peak efficiency, and 7 mA quiescent current. It meets the CISPR 25 Class 5 radiated emission standard with a low-cost 580 kHz LC filter, improving the state-of-the-art by 5.8x.

  264. A 28W -108.9dB/-102.2dB THD/THD+N Hybrid ΔΣ-PWM Class-D Audio Amplifier with 91% Peak Efficiency and Reduced EMI Emission
    Shoubhik Karmakar; Huajun Zhang; {Van Veldhoven}, Robert; Lucien Breems; Marco Berkhout; Qinwen Fan; Kofi A. A. Makinwa;
    In 2020 IEEE International Solid-State Circuits Conference, ISSCC 2020,
    United States, IEEE, pp. 350--352, 2020. Green Open Access added to TU Delft Institutional Repository {\textquoteleft}You share, we take care!{\textquoteright} – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher i. DOI: 10.1109/ISSCC19947.2020.9063001
    Abstract: ... Class-D amplifiers are often used in high-power audio applications due to their high power efficiency. They typically employ pulse-width modulation (PWM) at a fixed carrier frequency, which may cause electromagnetic interference (EMI). Setting this frequency fPWM) below the AM band (535 to 1605kHz) helps mitigate this, but its harmonics still contain substantial energy and must be filtered out by bulky LC filters with low cut-off frequencies (fc = 20 to 40 kHz), significantly increasing system cost and size. Stability considerations also constrain the amplifier's unity-gain frequency to be < mathrm{f} {mathrm{PWM}}/pi [1], compromising the audio-band loop gain required to suppress output-stage nonlinearity. Setting fPWM above the AM band helps increase fc and allows a higher loop gain [2]. However, this results in narrower pulses at higher power levels (higher modulation index), which cannot be faithfully produced by the output stage, thus exacerbating its non-linearity. Delta-sigma modulation (DeltaSigma M) has fixed pulse widths and does not suffer from these narrow-pulse artefacts. However, the out-of-band noise of 1bit modulators then requires larger LC filters. Moreover, high-order loop filters must be used to achieve sufficient SQNR, which then require additional techniques to maintain stability as the modulation range approaches 100% [3].

  265. Microelectromechanical organs-on-chip
    M. Mastrangeli;
    Keynote lecture, presented at 4th Annual hDMT Consortium Meeting, Rotterdam (NL), 14 February 2020.

  266. Unmet needs, key challenges and market perspectives in organs-on-chip
    M. Mastrangeli;
    Presented at ORCHID final meeting, Leiden (NL), 23 September 2020.

  267. Self-assembly across scales and interfaces
    M. Mastrangeli;
    Seminar, presented at the Department of Micro and Nanosystems, KTH Royal Institute of Technology, 3 April 2020.

  268. Microengineering organs-on-chip
    M. Mastrangeli;
    Invited talk, presented at the Workshop on Applications of Micro-Nanorobotics, IEEE International Conference on Robotics and Automation (ICRA 2020), 3 June 2020.
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  269. From Silicon toward Silicon Carbide Smart Integrated Sensors
    Luke Middelburg;
    PhD thesis, Delft University Technology, 2020.
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  270. Fan-Out SiC MOSFET Power Module in an Organic Substrate
    Fengzhe Hou;
    PhD thesis, Delft University Technology, 2020.
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  271. MEMS Solutions For More Than Illumination
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  272. Design, Fabrication and Characterization of AlGaN/GaN Heterostructure Sensors
    Jianwen Sun;
    PhD thesis, Delft University Technology, 2020.

  273. Through Package Via: A bottom-up approach
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  274. Metal sulfides for gas sensing applications: devices and mechanisms
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  275. Low Temperature Sintering of Cu Nanoparticle Paste: Mechanism and die attach application
    Boyao Zhang;
    PhD thesis, Delft University Technology, 2020.
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  276. Building Blocks for a European Organ-on-Chip Roadmap
    M. Mastrangeli; S. Millet; C. Mummery; P. Loskill; D. Braeken; W. Eberle; M. Cipriano; L. Fernandez; M. Graef; X. Gidrol; N. Picollet-D'Hahan; B. van Meer; I. Ochoa; M. Schutte; J. van den Eijnden-van Raaij;
    ALTEX - Alternatives to Animal Experimentation,
    Volume 36, Issue 3, pp. 481-492, 2019. DOI: 10.14573/altex.1905221

  277. Metal and Polymeric Strain Gauges for Si-Based, Monolithically Fabricated Organs-on-Chips
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    Micromachines,
    Volume 10, Issue 8, pp. 536, Aug 2019. DOI: 10.3390/mi10080536
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  278. Hydrolysis kinetic study of CaAlSiN3:Eu2+ red phosphor with both water immersion test and first-principles calculation
    Jiajie Fan; Ling Zhou; Zhen Cui; Shanghuan Chen; Xuejun Fan; GuoQi Zhang;
    Journal of Luminescence,
    Volume 219, pp. 116874, 2019. DOI: 10.1016/j.jlumin.2019.116874
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  279. Spark plasma sintering of Ni 3 Al-xB-1wt% CNT (0.0 < x < 1.5 at%) nanocomposite
    Mohammadnejad, A.; Bahrami, A.; Sajadi, M.; Mehr, M. Y.;
    Journal of Alloys and Compounds,
    2019. DOI: 10.1016/j.jallcom.2019.02.225

  280. A Reliability Prediction Methodology for LED Arrays
    Bo Sun; Jiajie Fan; Xuejun Fan; GuoQi Zhang; Guohao Zhang;
    IEEE Access,
    Volume 7, pp. 8127-8134, 2019.

  281. Analysis of a calibration method for non-stationary CVD multi-layered graphene-based gas sensors
    Filiberto Ricciardella; Tiziana Polichetti; Sten Vollebregt; Brigida Alfano; Ettore Massera; Lina Sarro;
    IOP Nanotechnology,
    Volume 30, pp. 385501-1-8, 2019. DOI: 10.1088/1361-6528/ab2aac
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  282. Effects of sintering pressure on the densification and mechanical properties of nanosilver double side sintered power module
    Hao Zhang; Yang Liu; Lingen Wang; Fenglian Sun; Jiajie Fan; Mark D. Placette; Xuejun Fan; GuoQi Zhang;
    IEEE Transactions on Components, Packaging and Manufacturing Technology,
    2019. DOI: 10.1109/TCPMT.2018.2884032

  283. Evolution of the Microstructure of Sn58Bi Solder Paste with Sn-3.0Ag-0.5Cu Addition During Isothermal Aging
    Ruisheng Xu; Yang Liu; Hao Zhang; Zhao Li; Fenglian Sun; GuoQi Zhang;
    Journal of Electronic Materials,
    Volume 48, Issue 3, pp. 1758-1765, 2019. DOI: 10.1007/s11664-018-06865-1

  284. Characterization of an Acetone Detector based on a Suspended WO3-Gate AlGaN/GaN HEMT Integrated with Micro-heater
    Jianwen Sun; Robert Sokolovskij; Elina Iervolino; Fabio Santagata; Zewen Liu; Pasqualina M. Sarro; GuoQi Zhang;
    IEEE Transactions on Electron Devices,
    2019. DOI: 10.1109/TED.2019.2936912
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  285. A thermodynamic description of turbulence as a source of stochastic kinetic energy for 3D self-assembly
    P. A. Loethman; T. A. Hageman; M. C. Elwenspoek; G. J. M. Krijnen; M. Mastrangeli; A. Manz; L. Abelmann;
    Advanced Materials Interfaces,
    Volume 7, Issue 5, pp. 1900963, 2019. DOI: 10.1002/admi.201900963

  286. Growth of multi-layered graphene on molybdenum catalyst by solid phase reaction with amorphous carbon
    Filiberto Ricciardella; Sten Vollebregt; Evgenia Kurganova; A.J.M. Giesbers; Majid Ahmadi; Lina Sarro;
    2D Materials,
    Volume 6, pp. 035012, 2019. DOI: 10.1088/2053-1583/ab1518

  287. Root cause analysis of surface cracks in heavy steel plates during the hot rolling process
    Bahrami, A.; Khouzani, M. K.; Mokhtari, S. A.; Zareh, S.; Mehr, M. Y.;
    Metals,
    2019. DOI: 10.3390/met9070801

  288. First principles study of gas molecules adsorption on monolayered β-SnSe
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    Coatings,
    2019. DOI: 10.3390/COATINGS9060390

  289. Tunable electronic and optical properties of the WS2/IGZO heterostructure via an external electric field and strain: A theoretical study
    Hongyu Tang; Chunjian Tan; Huiru Yang; Kai Zheng; Yutao Li; Huaiyu Ye; Xianping Chen; Xuejun Fan; Tianling Ren; Kuochi Zhang;
    Physical Chemistry Chemical Physics,
    pp. 14713-14721, 2019. DOI: 10.1039/c9cp02084e

  290. Spark plasma sintering of Stellite®-6 superalloy
    M. Kiani Khouzani; A. Bahrami; M. Yazdan Mehr;
    Journal of Alloys and Compounds,
    Volume 782, pp. 461-468, 2019.

  291. Effects of Thermal Reflowing Stress on Mechanical Properties of Novel SMT-SREKs
    Cai, M.; Liang, Y.; Yun, M.; Chen, X-Y.; Yan, H.; Yu, Z.; Yang, D.; GuoQi Zhang;
    IEEE Access,
    2019. DOI: 10.1109/ACCESS.2019.2900361

  292. Adhesive elastocapillary force on a cantilever beam
    T. Gilet; S. M. Gernay; L. Aquilante; M. Mastrangeli; P. Lambert;
    Soft Matter,
    Volume 15, pp. 3999-4007, 2019. DOI: 10.1039/C9SM00217K

  293. A Low-Power MEMS IDE Capacitor with Integrated Microhotplate: Application as Methanol Sensor using a Metal-Organic Framework Coating as Affinity Layer
    Venkatesh, M.R.; Sachdeva, S.; El Mansouri, B.; Wei, J.; Bossche, A.; Bosma, D.; de Smet; L. C. P. M.; Sudhölter, E. J. R.; GuoQi Zhang;
    Sensors (Basel, Switzerland),
    2019. DOI: 10.3390/s19040888

  294. High-resolution MEMS inertial sensor combining large-displacement buckling behaviour with integrated capacitive readout
    Brahim El Mansouri; Luke M. Middelburg; Rene H. Poelma; GuoQi Zhang; Henk W. van Zeijl; Jia Wei; Hui Jiang; Johan G. Vogel; Willem D. van Driel;
    Microsystems & Nanoengineering,
    Volume 5, 2019.
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  295. A first-principles study: Adsorption of small gas molecules on GeP3 monolayer
    Niu, F.; Cai, M.; Pang, J.; Li, X.; GuoQi Zhang, G.; Yang, D.;
    Surface Science,
    2019. DOI: 10.1016/j.susc.2019.02.008

  296. A multi-step etch method for fabricating slightly tapered through-silicon vias based on modified Bosch process
    Lin, P.; Xie, X.; Wang, Y.; Lian, B.; GuoQi Zhang;
    Microsystem Technologies,
    2019. DOI: 10.1007/s00542-018-4249-8

  297. Degradation of optical materials in solid-state lighting systems
    Yazdan Mehr, M.; Bahrami, A.; van Driel, W. D.; Fan, X. J.; Davis, J. L.; GuoQi Zhang;
    International Materials Reviews,
    2019. DOI: 10.1080/09506608.2019.1565716

  298. Effect of Nano-SnS and Nano-MoS2 on the corrosion protection performance of the polyvinylbutyral and zinc-rich polyvinylbutyral coatings
    Qu, Z.; Wang, L.; Hongyu Tang; Ye, H.; Li, M.;
    Nanomaterials,
    2019. DOI: 10.3390/nano9070956

  299. Effects of humidity and phosphor on silicone/phosphor composite in white light-emitting diode package
    Hoque, M. A.; Bradley, R. K.; Fan, J.; Fan, X.;
    Journal of Materials Science: Materials in Electronics,
    2019. DOI: 10.1007/s10854-019-02393-8

  300. First-principles investigation of the adsorption behaviors of CH 2 O on BN, AlN, GaN, InN, BP, and P monolayers
    Feng, C.; Qin, H.; Yang, D.; GuoQi Zhang;
    Materials,
    2019. DOI: 10.3390/ma12040676

  301. Experimental evaluation of a compact two-phase cooling system for high heat flux electronic packages
    Fengze Hou; Wang, W.; Zhang, H.; Chen, C.; Chen, C.; Lin, T.; Cao, L.; GuoQi Zhang; Ferreira, J. A.;
    Applied Thermal Engineering,
    Volume 163, pp. 114338, 2019. DOI: 10.1016/j.applthermaleng.2019.1143

  302. SnSe monolayer: A promising candidate of SO 2 sensor with high adsorption quantity
    Ye, H.; Liu, L.; Xu, Y.; Wang, L.; Chen, X.; Zhang, K.; Liu, Y.; Koh, S.; GuoQi Zhang;
    Applied Surface Science,
    2019. DOI: 10.1016/j.apsusc.2019.03.346

  303. High performance mixed potential type NO2 gas sensor based on porous YSZ layer formed with graphite doping
    Hong, H.; Jianwen Sun; Wu, C.; Liu, Z.;
    Sensors (Switzerland),
    2019. DOI: 10.3390/s19153337

  304. Fabrication of porous anodic alumina (PAA) templates with straight pores and with hierarchical structures through exponential voltage decrease technique
    Sacco, L.; Florea, I.; Cojocaru, C-S.;
    Surface and Coatings Technology,
    2019. DOI: 10.1016/j.surfcoat.2019.02.086

  305. High moisture accelerated mechanical behavior degradation of phosphor/silicone composites used in white light-emitting diodes
    Fan, J.; Wang, Z.; Zhang, X.; Deng, Z.; Fan, X.; GuoQi Zhang;
    Polymers,
    2019. DOI: 10.3390/polym11081277

  306. Root Cause Analysis of Failure in Superheater Tubes in a Power Plant
    Bahrami, A.; Rafiaei, S. M.; Yazdan Mehr, M.;
    Metallography, Microstructure, and Analysis,
    2019. DOI: 10.1007/s13632-019-00533-4

  307. Terahertz radiation enhancement in dipole photoconductive antenna on LT-GaAs using a gold plasmonic nanodisk array
    Bashirpour, M.; Poursafar, J.; Kolahdouz, M.; Hajari, M.; Forouzmehr, M.; Neshat, M.; Hajihoseini, H.; Fathipour, M.; Kolahdouz, Z.; GuoQi Zhang;
    Optics and Laser Technology,
    2019. DOI: 10.1016/j.optlastec.2019.105726

  308. Oxygen-based digital etching of AlGaN/GaN structures with AlN as etch-stop layers
    Wu, J.; Lei, S.; Cheng, W-C.; Sokolovskij, R.; Wang, Q.; Xia, G. M.; Yu, H.;
    Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films,
    2019. DOI: 10.1116/1.5115427

  309. Reliability Assessment of Light-Emitting Diode Packages with Both Luminous Flux Response Surface Model and Spectral Power Distribution Method
    Chen, W.; Fan, J.; Qian, C.; Pu, B.; Fan, X.; GuoQi Zhang;
    IEEE Access,
    2019. DOI: 10.1109/ACCESS.2019.2916878

  310. Novel method of alignment to buried cavities in cavity-SOI wafers for advanced MEMS devices
    Mountain, C.; Kluba, M.; Bergers, L.; Snijder, J.; Dekker, R.;
    Micro and Nano Engineering,
    2019. DOI: 10.1016/j.mne.2019.100043

  311. Liquid-phase exfoliated SnS as a semiconductor coating filler to enhance corrosion protection performance
    Hongyu Tang; Qu, Z.,; Wang, L.; Ye, H.; GuoQi Zhang; Fan, X.;
    Physical Chemistry Chemical Physics,
    2019. DOI: 10.1039/c9cp03381e

  312. Modeling electrical resistivity of naturally aged Al–Mg–Si Alloys
    Bahrami, A.; Mehr, M. Y.;
    Metals,
    2019. DOI: 10.3390/met9030310

  313. Review of the recent progress on GaN-based vertical power Schottky barrier diodes (SBDs)
    Yue Sun; Kang, X.; Zheng, Y.; Lu, J.; Tian, X.; Wei, K.; Wu, H.; Wang, W.; Liu, X. an GuoQi Zhang;
    Electronics (Switzerland),
    2019. DOI: 10.3390/electronics8050575

  314. Continuous shock-free termination of atrial fibrillation by local optogenetic therapy and arrhythmia-triggered activation of an implanted light source
    E C A Nyns; R H Poelma; L Volkers; C I Bart; T J Van Brakel; K Zeppenfeld; M J Schalij; GuoQi Zhang; A A F De Vries; D A Pijnappels;
    European Heart Journal,
    Volume 40, Issue 1, 2019. DOI: 10.1093/eurheartj/ehz748.0090

  315. Impact of high temperature H2 pre-treatment on Pt-AlGaN/GaN HEMT sensor for H2S detection
    Jian Zhang; Robert Sokolovskij; Ganhui Chen; Yumeng Zhu; Yongle Qi; Xinpeng Lin; Wenmao Li; GuoQi Zhang; Yu-Long Jiang; Hongyu Yu;
    Sensors and Actuators, B: Chemical,
    Volume 280, pp. 138-143, 2019. DOI: 10.1016/j.snb.2018.10.052

  316. An automated hybrid bioelectronic system for autogenous restoration of sinus rhythm in atrial fibrillation
    Emile C. A. Nyns; René H. Poelma; Linda Volkers; Jaap J. Plomp; Cindy I. Bart; Annemarie M. Kip; Thomas J. van Brakel; Katja Zeppenfeld; Martin J. Schalij; GuoQi Zhang; Antoine A. F. de Vries; Daniël A. Pijnappels;
    Science Translational Medicine,
    Volume 11, Issue 481, 2019. DOI: 10.1126/scitranslmed.aau6447

  317. PVP-Mediated Galvanic Replacement Synthesis of Smart Elliptic Cu− Ag Nanoflakes for Electrically Conductive Pastes
    Yu Zhang; Pengli Zhu; Gang Li; Zhen Cui; Chengqiang Cui; Kai Zhang; Jian Gao; Xin Chen; GuoQi Zhang; Rong Sun; Chingping Wong;
    ACS Applied Materials & Interfaces,
    2019.

  318. Ultra-High Sensitive NO2 Gas Sensor Based on Tunable Polarity Transport in CVD-WS2/IGZO p-N Heterojunction
    Hongyu Tang; Yutao Li; Robert Sokolovskij; Leandro Sacco; Hongze Zheng; Huaiyu Ye; Hongyu Yu; Xuejun Fan; He Tian; Tian-Ling Ren; GuoQi Zhang;
    ACS Applied Materials and Interfaces,
    pp. 40850-40859, 2019. DOI: 10.1021/acsami.9b13773

  319. 循环电载荷下大功率LED金引线疲劳断裂寿命预测
    Fan, J.; Li, L.; Qian, C.; Hu, A.; Fan, X.; GuoQi Zhang;
    Journal of Beijing University of Aeronautics and Astronautics,
    2019. DOI: 10.13700/j.bh.1001-5965.2018.0401

  320. Calibrated quantum thermometry in cavity optomechanics
    Chowdhury, Avishek; Vezio, Paolo; Bonaldi, Michele; Borrielli, Antonio; Marino, Francesco; Morana, Bruno; Pandraud, Gregory; Pontin, Antonio; Prodi, Giovanni; Sarro, Lina; Serra, Enrico; Marin, Francesco;
    Quantum Science and Technology,
    2019.

  321. Characterization of PCB Embedded Package Materials for SiC MOSFETs
    Fengze Hou; Wang, W.; Lin, T.; Cao, L.; GuoQi Zhang; Ferreira, J. A.;
    IEEE Transactions on Components, Packaging and Manufacturing Technology,
    Volume 9, Issue 6, pp. 1054-1061, 2019. DOI: 10.1109/TCPMT.2019.2904533

  322. Suspended tungsten trioxide (WO3) gate AlGaN/GaN heterostructure deep ultraviolet detectors with integrated micro-heater
    Jianwen Sun; Teng Zhan; Zewen Liu; Junxi Wang; Xiaoyan Yi; Lina Sarro; GuoQi Zhang;
    Optics Express,
    Volume 27, Issue 25, 2019.
    document

  323. A DFT study of In doped Tl2O: a superior NO2 gas sensor with selective adsorption and distinct optical response
    Chenshan Gao; Yingying Zhang; Huiru Yang; Yang Liu; Yufei Liu; Jihe Dua; Huaiyu Ye; GuoQi Zhang;
    Applied Surface Science,
    2019. DOI: 10.1016/j.apsusc.2019.07.067

  324. Self-folding using capillary forces
    K. S. Kwok; Q. Huang; M. Mastrangeli; D. H. Gracias;
    Advanced Materials Interfaces,
    Volume 7, Issue 5, pp. 1901677, 2019. DOI: 10.1002/admi.201901677

  325. Organ-on-Chip in Development: Towards a roadmap for organs-on-chip
    M. Mastrangeli; S. Millet; the ORCHID partners; J. van den Eijnden-van Raaij;
    ALTEX-Alternatives to Animal Experimentation,
    Volume 36, Issue 4, pp. 650-668, 2019. DOI: 10.14573/altex.1908271

  326. Suspended AlGaN/GaN HEMT NO2 Gas Sensor Integrated with Micro-heater
    Jianwen Sun; Robert Sokolovskija; Elina Iervolino; Zewen Liu; Pasqualina M. Sarro; GuoQi Zhang;
    Journal of Microelectromechanical Systems,
    2019.
    document

  327. Metal and Polymeric Strain Gauges for Si-Based, Monolithically Fabricated Organs-on-Chips
    W. F. Quirós-Solano, N. Gaio, C. Silvestri, G. Pandraud, R. Dekker, P. M. Sarro;
    Micromachines,
    Volume 10, Issue 8, pp. 536, 2019. DOI: 10.3390/mi10080536

  328. Stress analysis of pressure-assisted sintering for the double-side assembly of power module
    Yang Liu; Hao Zhang; Lingen Wang; Xuejun Fan; GuoQi Zhang; Fenglian Sun;
    Soldering and Surface Mount Technology,
    2019. DOI: 10.1108/SSMT-01-2018-0005

  329. Indentation hardness, plasticity and initial creep properties of nanosilver sintered joint
    Hao Zhang; Yang Liu; Lingen Wang; Fenglian Sun; Xuejun Fan; GuoQi Zhang;
    Results in Physics,
    Volume 12, pp. 712-717, 2019. DOI: 10.1016/j.rinp.2018.12.026

  330. High-performance humidity sensor using Schottky-contacted SnS nanoflakes for noncontact healthcare monitoring
    Hongyu Tang; Yutao Li; Huaiyu Ye; Fafei Hu; Chenshan Gao; Luqi Tao; Tao Tu; Guangyang Gou; Xianping Chen; Xuejun Fan; Tianling Ren; GuoQi Zhang;
    Nanotechnology,
    Volume 31, Issue 5, pp. 055501, Nov 2019. DOI: 10.1088/1361-6528/ab414e
    document

  331. Mass measurement of graphene using quartz crystal microbalances
    Robin J Dolleman; Mick Hsu; Sten Vollebregt; John E Sader; Herre SJ van der Zant; Peter G Steeneken; Murali K Ghatkesar;
    Applied Physics Letters,
    Volume 115, Issue 5, pp. 053102, 2019. DOI: 10.1063/1.5111086
    document

  332. General coupling model for electromigration and one-dimensional numerical solutions
    Zhen Cui; Xuejun Fan; GuoQi Zhang;
    Journal of Applied Physics,
    Volume 125, pp. 105101-1-9, 2019. DOI: 10.1063/1.5065376

  333. A 6 \textdollar\textbackslashmu\textdollar W 95 dB SNDR Inverter Based \textdollar\textbackslashSigma\textbackslashDelta\textdollar Modulator With Subtractive Dithering and SAR Quantizer
    Huajun Zhang; Zhichao Tan; Yi Zhang; Baozhen Chen; Roberto Maurino; Robert Adams; Khiem Nguyen;
    {IEEE} Transactions on Circuits and Systems {II}: Express Briefs,
    Volume 66, Issue 4, pp. 552--556, April 2019. DOI: 10.1109/tcsii.2018.2869103
    document

  334. A 1-V 560-nW SAR ADC With 90-dB SNDR for IoT Sensing Applications
    Huajun Zhang; Zhichao Tan; Chao Chu; Baozhen Chen; Hongxing Li; Michael Coln; Khiem Nguyen;
    {IEEE} Transactions on Circuits and Systems {II}: Express Briefs,
    Volume 66, Issue 12, pp. 1967--1971, December 2019. DOI: 10.1109/tcsii.2019.2898365
    document

  335. A 6 $\mu$W 95 dB SNDR Inverter Based $\Sigma\Delta$ Modulator With Subtractive Dithering and SAR Quantizer
    Huajun Zhang; Zhichao Tan; Yi Zhang; Baozhen Chen; Roberto Maurino; Robert Adams; Khiem Nguyen;
    {IEEE} Transactions on Circuits and Systems {II}: Express Briefs,
    Volume 66, Issue 4, pp. 552--556, April 2019. DOI: 10.1109/tcsii.2018.2869103
    document

  336. Microscale surface tension and its applications
    P. Lambert; M. Mastrangeli (Ed.);
    MDPI, , 2019. DOI: 10.3390/mi10080526

  337. MEMS Enabled Fast Time-Resolved X-Ray Diffraction Characterization Platform for Copper Nanoparticle Sintering in Heterogeneous Integration Applications
    Boyao Zhang; Jia Wei; Bottger, A. J.; van Zeijl, H. W.; Sarro, P. M.; GuoQi Zhang;
    In 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII): Proceedings. Danvers: IEEE,
    2019. DOI: 10.1109/TRANSDUCERS.2019.8808192

  338. Design Considerations for a Mems Coriolis Mass Flow Sensing System
    A.C. de Oliveira; T. Schut; J. Groenesteijn; Qinwen Fan; R.Wiegerink; K.A.A. Makinwa;
    In MFHS,
    2019.

  339. A MEMS Coriolis Mass Flow Sensing System with Combined Drive and Sense Interface
    A. de Oliveira; T. Schut; J. Groenesteijn; Qinwen Fan; R. Wiegerink; K. Makinwa;
    In Proc. IEEE Sensors,
    October 2019.

  340. A MEMS Coriolis Mass Flow Sensing System with Combined Drive and Sense Interface
    A.C. de Oliveira; T. Schut; J. Groenesteijn; Qinwen Fan; R.Wiegerink; K.A.A. Makinwa;
    In Proc. IEEE SENSORS,
    10 2019. DOI: 10.1109/SENSORS43011.2019.8956695

  341. Pressure measurement of geometrically curved ultrasound transducer array for spatially specific stimulation of the vagus nerve
    Kawasaki, S.; Giagka, V.; de Haas, M.; Louwerse, M.; Henneken, V.; van Heesch, C.; Dekker, R.;
    In 9th International IEEE/EMBS Conference on Neural Engineering. IEEE,
    2019. DOI: 10.1109/NER.2019.8717064

  342. Degradation Prediction of Electronic Packages using Machine Learning
    Prisacaru, A.; Guerrero, E. O.; Gromala, P. J.; Han, B.; GuoQi Zhang;
    In International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019,
    2019. DOI: 10.1109/EuroSimE.2019.8724523

  343. Towards an Active Graphene-PDMS Implant
    Wardhana, G. K.; Serdijn, W.; Vollebregt, S.; Giagka, V.;
    In Abstract from 7th Dutch Bio-Medical Engineering Conference,
    2019.
    document

  344. Micro- and nanosystems assembly via fluid joints (Plenary talk)
    M. Mastrangeli;
    In 4th Int. Conf. on Manipulation, Automation and Robotics at Small Scales (MARSS 2019),
    4 July 2019.

  345. Compressive response of pristine and superconductor coated MWCNT pillars
    A. M. Gheytaghi; S. Vollebregt; R.H. Poelma; H. W. Zeijl; GuoQi Zhang;
    In IEEE MEMS,
    2019.

  346. Wafer-scale integration of CVD graphene on CMOS devices using a transfer-free approach
    Sten Vollebregt; Joost Romijn; Henk W. van Zeijl; Pasqualina M. Sarro;
    In Graphene Week,
    2019.

  347. Free-standing, Transfer-free Graphene-based Differential Pressure Sensors
    R. Ramesha; S. Vollebregt; P.M. Sarro;
    In SAFE/ProRISC,
    2019.

  348. A miniaturized EHT platform for contractile tissue measurements
    M. Dostanic; L. Windt; J. Stein; B. van Meer; M. Mastrangeli; C. Mummery; P. M. Sarro;
    In International MicroNanoConference,
    Utrecht (NL), December 10-11, 2019.

  349. Effect of Signals on the Encapsulation Performance of Parylene Coated Platinum Tracks for Active Medical Implants
    Nanbakhsh, K.; Kluba, M.; Pahl, B.; Bourgeois, F.; Dekker, R.; Serdijn, W.; Giagka, V.;
    In 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC),
    IEEE, pp. 3840-3844, 2019. DOI: 10.1109/EMBC.2019.8857702

  350. Transfer-free Graphene-based Differential Pressure Sensor
    Raghutham Ramesha; Sten Vollebregt; Lina Sarro;
    In Proc. IEEE NMDC,
    2019.

  351. Enabling actuation and sensing in organs-on-chip using electroactive polymers
    P. Motreuil-Ragot; A. Hunt; D. Kasi; B. Brajon; A. van den Maagdenberg; V. Orlova; M. Mastrangeli; P. M. Sarro;
    In International MicroNanoConference,
    Utrecht (NL), December 10-11, 2019.

  352. Towards a Microfabricated Flexible Graphene-Based Active Implant for Tissue Monitoring During Optogenetic Spinal Cord Stimulation
    Andrada Iulia Velea; Sten Vollebregt; Tim Hosman; Anna Pak; Vasiliki Giagka;
    In Proc. IEEE NMDC,
    2019.

  353. Flexible, graphene-based acive implant for spinal cord stimulation in rodents
    Andrada Velea; Sten Vollebregt; Vasiliki Giagka;
    In SAFE/ProRISC,
    2019.

  354. A Novel Partial Carrier Stored and Hole Path IGBT for Ultralow Turn-Off Loss and On-State Voltage With High EMI Noise Controllability
    Wang, S.; Tan, C.; Wang, L.; Luo, H.; GuoQi Zhang; Chen, X.;
    In Electron Devices Technology and Manufacturing Conference, EDTM 2019. IEEE,
    2019. DOI: 10.1109/EDTM.2019.8731110

  355. A wafer-scale process for the monolithic integration of CVD graphene and CMOS logic for smart MEMS/NEMS sensors
    Joost Romijn; Sten Vollebregt; Henk W. van Zeijl; Pasqualina M. Sarro;
    In IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS). Piscataway: IEEE,
    2019. DOI: 10.1109/MEMSYS.2019.8870741

  356. A SPICE-based transient thermal-electronic model for LEDs
    Bo Sun; Fan, J.; Fan, X.; GuoQi Zhang;
    In 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019. IEEE,
    2019. DOI: 10.1109/EuroSimE.2019.8724555

  357. Degradation of bisphenol-a-polycarbonate (BPA-PC) optical lenses under simulated harsh environment conditions
    Mehr, M. Y.; Van Driel, W.; GuoQi Zhang;
    In 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019,
    2019. DOI: 10.1109/EuroSimE.2019.8724524

  358. Novel Two-dimensional Semiconductor Monolayer SnP2 with Tunable Bandgap
    Zhang, Y.; Tao, L.; Li, X.; GuoQi Zhang; Chen, X.;
    In Electron Devices Technology and Manufacturing Conference, EDTM 2019. IEEE,
    IEEE, 2019. DOI: 10.1109/EDTM.2019.8731255

  359. Lifetime prediction of ultraviolet light-emitting diodes with accelerated wiener degradation process
    Jing, Z.; Ibrahim, M. S.; Fan, J.; Fan, X.; GuoQi Zhang;
    In 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019. IEEE,
    2019. DOI: 10.1109/EuroSimE.2019.8724571

  360. Electrical and optical characterization of MoS2 thin film transistors and the effect of strain on their performances
    Zuopeng Qu; Hongyu Tang; Huaiyu Ye; Xuejun Fan; GuoQi Zhang;
    In EurosimE,
    IEEE, IEEE, 2019. DOI: 10.1109/EuroSimE.2019.8724549

  361. Towards a semi-flexible parylene-based platform technology for active implantable medical devices
    Bakhshaee Babaroud, N.; Kluba, M.; Dekker, R.; Serdijn, W.; Giagka, V.;
    In 7th Dutch Bio-Medical Engineering Conference - Egmond aan Zee, Netherlands,
    2019.
    document

  362. Sensor applications for organ-on-chip platforms
    H. Aydogmus; M. Dostanic; M. Jahangiri; R. Sinha; W. F. Quiros-Solano; M. Mastrangeli; P. M. Sarro;
    In International MicroNanoConference,
    Utrecht (NL), December 10-11, 2019.

  363. Organs- (and other pretty cool stuff) on-chip
    M. Mastrangeli;
    Seminar, presented at the Department of Nano Opto-Mechatronic Instruments (NOMI) of TNO, June 6 2019.

  364. Micro- and nanosystems assembly via fluid joints
    M. Mastrangeli;
    Seminar, presented at Stanford University, Palo Alto (CA), August 12, 2019.

  365. Microengineering organs-on-chip
    M. Mastrangeli;
    Invited talk, presented at QBio Symposium, Utrecht (NL), October 29, 2019.

  366. Microengineered organs-on-chip
    H. Aydogmus; M. Dostanic; P. Motreuil-Ragot; M. Mastrangeli; P. M. Sarro;
    Poster, presented at QBio Symposium, Utrecht (NL), October 29, 2019.

  367. Self-assembly by fluidics and by shaking
    M. Mastrangeli;
    Seminar, presented at Palo Alto Research Center (PARC), Palo Alto (CA), July 31, 2019.

  368. Microengineering organs-on-chip
    M. Mastrangeli;
    Seminar, presented at Universita' di Roma - Tor Vergata, Roma (IT), December 20, 2019.

  369. Single nanoparticle printing
    M. Mastrangeli;
    Seminar, presented at Palo Alto Research Center (PARC), Palo Alto (CA), August 28, 2019.

  370. Graphene pellicle lithographic apparatus
    Evgenia Kurganova; Jos Giesbers; Maria Peter; Maxim Naselevich; Arnoud Notenboom; Alexander Klein; Pieter-Jan van Zwol; David Vles; Pim Voorthuijzen; Sten Vollebregt;
    Patent, WO2019170356, 2019.

  371. Full wafer transfer-free graphene
    Filiberto Ricciardella; Sten Vollebregt; Lina Sarro;
    Patent, WO2019125140; NL2020111, 2019.

  372. Multi-functional LED Module Integration and Miniaturization for Solid State Lighting Applications
    Pan Liu;
    PhD thesis, Delft University of Technology, 2019.
    document

  373. Investigation of Pressure Assisted Nanosilver Sintering Process for Application in Power Electronics
    Hao Zhang;
    PhD thesis, Delft University of Technology, 2019.
    document

  374. Monolithic integration of silicon and polymer microstructures for Organ-on-Chip applications
    William Fausto Quiros Solano;
    PhD thesis, Delft University of Technology, 2019.
    document

  375. A single-chip micro-opto-electro-mechanical system for optical coherence tomography imaging
    Aleksandar Jovic;
    PhD thesis, Delft University of Technology, 2019.
    document

  376. Organ-on-silicon
    Nikolas Gaio;
    PhD thesis, Delft University of Technology, 2019.
    document

  377. Ultra-thin MEMS fabricated tynodes for electron multiplication
    Violeta Prodanovic;
    PhD thesis, Delft University Technology, 2019.

  378. AlGaN/GaN high electron mobility transistor (HEMT) based sensors for gas sensing applications
    Robert Sokolovskij;
    PhD thesis, Delft University Technology, 2019.
    document

  379. A review on discoloration and high accelerated testing of optical materials in LED based-products
    M. Yazdan Mehr; M.R. Toroghinejad; F. Karimzadeh; W.D. van Driel; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 81, pp. 136-142, 2018.

  380. A Platform for Mechano(-Electrical) Characterization of Free-Standing Micron-Sized Structures and Interconnects
    Angel Savov; Shivani Savov; Salman Shafqat; Johan Hoefnagels; Marcus Louwerse; Ronald Stoute; Ronald Dekker;
    Micromachines,
    Volume 9, Issue 1, pp. 39, 2018.
    document

  381. Thermal Management on IGBT Power Electronic Devices and Modules
    Cheng Qian; Amir Mirza Gheytaghi; Jiajie Fan; Hongyu Tang; Bo Sun; Huaiyu Ye; GuoQi Zhang;
    IEEE Access,
    Volume 6, pp. 12868-12884, 2018.

  382. A design and qualification of LED flip Chip-on-Board module with tunable color temperatures
    Jiajie Fan; Jianwu Cao; Chaohua Yu; Cheng Qian; Xuejun Fan; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 84, pp. 140-148, 2018.

  383. Tomorrow’s advanced packaging; for electronics and heterogeneous system integration
    H. Yi; A. M. Gheytaghi; B. El Mansouri; L.M. Middelburg; GuoQi Zhang;
    ETV Maxwell,
    Volume 21.2, 2018.

  384. Effect of Nanostructured Microporous Surfaces on Pool Boiling Augmentation
    Amir Mirza Gheytaghi; Hamid Saffari; GuoQi Zhang;
    Heat Transfer Engineering,
    2018.

  385. Effect of thermal annealing and chemical treatments on secondary electron emission properties of atomic layer deposited MgO
    Violeta Prodanovic; Hong Wah Chan; Anil U. Mane; Jeffrey W. Elam; Matthias M. Minjauw; Christophe Detavernier; Harry van der Graaf; Pasqualina M. Sarro;
    Journal of Vacuum Science and Technology A,
    Volume 36, Issue 6, pp. 06A102-1-9, 2018.
    document

  386. Kinetics of orbitally shaken particles constrained to two dimensions
    D. Ipparthi; T. A. G. Hageman; N. Cambier; M. Sitti; M. Dorigo; L. Abelmann; M. Mastrangeli;
    Physical Review E,
    Volume 98, pp. 042137, 2018. DOI: 10.1103/PhysRevE.98.042137

  387. A Review on Water Vapor Pressure Model for Moisture Permeable Materials Subjected to Rapid Heating
    Liangbiao Chen; Jiang Zhou; Hsing-Wei Chu; GuoQi Zhang; Xuejun Fan;
    Applied Mechanics Reviews,
    Volume 70, Issue 2, pp. 020803-1-16, 2018.

  388. Microfabricated tuneable and transferable porous PDMS membranes for Organs-on-Chips
    W. F. Quirós-Solano; N. Gaio; O. M. J. A. Stassen; Y. B. Arik; C. Silvestri; N. C. A. Van Engeland; A. Van der Meer; R. Passier; C. M. Sahlgren; C. V. C. Bouten; A. van den Berg; R. Dekker; P. M. Sarro;
    Scientific Reports,
    pp. 13524, 2018. DOI: 10.1038/s41598-018-31912-6

  389. Silicon Nitride MOMS Oscillator for Room Temperature Quantum Optomechanics
    Enrico Serra, Bruno Morana, Antonio Borrielli, Francesco Marin, Gregory Pandraud, Antonio Pontin, Giovanni Andrea Prodi, Pasqualina M. Sarro,; Michele Bonaldi;
    ArXiv preprint,
    2018.

  390. System in package (SiP) technology: fundamentals, design and applications
    F. Santagata, J. Sun, E. Iervolino, H. Yu, F. Wang, G. Zhang, P. M. Sarro, G. Zhang;
    Microelectronics International,
    2018. DOI: 10.1108/MI-09-2017-0045

  391. Grafeen: een zoektocht naar de toepassing
    Sten Vollebregt; Jos Giesbers; Johan Klootwijk;
    Nederlands Tijdschrift voor Natuurkunde,
    pp. 16-20, September 2018.

  392. Advances in the electronics for cyclic voltammetry: the case of gas detection by using microfabricated electrodes
    Giorgio Pennazza; Marco Santonico; Luca Vollero; Alessandro Zompanti; Anna Sabatini; Nandeesh Kumar; Ivan Pini; William F Quiros Solano; Lina Sarro; Arnaldo D'Amico;
    Frontiers in Chemistry,
    Volume 6, pp. 327, 2018.
    document

  393. Carbon Nanotube Array: Scaffolding Material for Opto, Electro, Thermo, and Mechanical Systems
    Amir M. Gheytaghi; H. van Zeijl; S. Vollebregt; R.H. Poelma; C. Silvestri; R. Ishihara; G. Q. Zhang; P. M. Sarro;
    Innovative Materials,
    Volume 3, pp. 22-25, 2018.

  394. Quantum nondemolition measurement of optical field fluctuations by optomechanical interaction
    A Pontin; M Bonaldi; A Borrielli; L Marconi; F Marino; G Pandraud; GA Prodi; PM Sarro; E Serra; F Marin;
    Physical Review A,
    Volume 97, Issue 3, pp. 033833, 2018.

  395. A MEMS Actuator System for an Integrated 3-D Optical Coherent Tomography Scanner
    Aleksandar Jovic; Grégory Pandraud; Nuria Sanchez Losilla; Juan Sancho; Kirill Zinoviev; Jose Luis Rubio; Eduaro Margallo-Ballbas; Pasqualina M. Sarro;
    Journal of Microelectromechanical Systems,
    Volume 27, Issue 2, pp. 259-268, 2018.
    document

  396. A new hermetic sealing method for ceramic package using nanosilver sintering technology
    Hao Zhang; Yang Liu; Lingen Wang; Jiajie Fan; Xuejun Fan; Fenglian Sun; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 81, pp. 143-149, 2018.

  397. Effect of Sintering Pressure on the Porosity and the Shear Strength of the Pressure-Assisted Silver Sintering Bonding
    Yang Liu; Hao Zhang; Lingen Wang; Xuejun Fan; GuoQi Zhang; Fenglian Sun;
    IEEE Transactions on Device and Materials Reliability,
    Volume 18, Issue 2, pp. 240-246, 2018.

  398. Failure of AISI 304H stainless steel elbows in a heat exchanger
    A. Bahrami; S. H. Mousavi Anijdan; P. Taheri; M. Yazdan Mehr;
    Engineering Failure Analysis,
    Volume 90, pp. 397-403, 2018.

  399. Effects of Voids on Mechanical and Thermal Properties of the Die Attach Solder Layer Used in High-Power LED Chip-Scale Packages
    Chengshuo Jiang; Jiajie Fan; Cheng Qian; Hao Zhang; Xuejun Fan; Weiling Guo; GuoQi Zhang;
    IEEE Transactions on Components, Packaging and Manufacturing Technology,
    Volume 8, Issue 7, pp. 1254-1262, 2018.

  400. Germanene on single layer ZnSe substrate: Novel electronic and optical properties
    H. Y. Ye; F. F. Hu; Hongyu Tang; L. W. Yang; X. P. Chen; L. G. Wang; GuoQi Zhang;
    Physical Chemistry Chemical Physics,
    Volume 20, Issue 23, pp. 16067-16076, 2018.

  401. A stochastic process based reliability prediction method for LED driver
    Bo Sun; Xuejun Fan; Willem van Driel; Chengqiang Cui; GuoQi Zhang;
    Reliability Engineering and System Safety,
    Volume 178, pp. 140-146, 2018.

  402. High Selective Gas Detection for small molecules based on Germanium selenide monolayer
    Liu, L.; Yang, Q.; Wang, Z.; Ye, H.; Chen, X.; Fan, X.; GuoQi Zhang;
    Applied Surface Science,
    pp. 575-581, 2018. DOI: 10.1016/j.apsusc.2017.10.084

  403. Hydrogen sulfide detection properties of Pt-gated AlGaN/GaN HEMT-sensor
    Sokolovskij, R.; Zhang, J.; Iervolino, E.; Zhao, C.; Santagata, F.; Wang, F.; Yu, H.; Sarro, P. M.; GuoQi Zhang;
    Sensors and Actuators B: Chemical,
    2018. DOI: 10.1016/j.snb.2018.08.015

  404. Investigation of 'Fur-like' Residues Post Dry Etching of Polyimide Using Aluminum Hard Etch Mask
    Shivani Joshi; Angel Savov; Salman Shafqat; Ronald Dekker;
    Materials Science in Semiconductor Processing,
    Volume 75, pp. 130-135, 2018.
    document

  405. Imaging Correlations in Heterodyne Spectra for Quantum Displacement Sensing
    Pontin, A.; Lang, J. E.; Chowdhury, A.; Vezio, P.; Marino, F.; Morana, B.; Serra, E.; Marin, F.; Monteiro, T. S.;
    Physical Review Letters,
    2018. DOI: 10.1103/PhysRevLett.120.020503

  406. Ultra-thin Alumina and Silicon Nitride MEMS Fabricated Membranes for the Electron Multiplication
    Violeta Prodanović; Hong Wah Chan; W A van der Graaf; Lina Sarro;
    Nanotechnology,
    Volume 29, pp. 155703, 2018.
    document

  407. In Situ Failure Detection of Electronic Control Units Using Piezoresistive Stress Sensor
    Prisacaru, A.; Palczynska, A.; Theissler, A.; Gromala, P.; Han, B.; GuoQi Zhang;
    IEEE Transactions on Components, Packaging and Manufacturing Technology,
    Volume 750-763, 2018. DOI: 10.1109/TCPMT.2018.2816259

  408. Influence of pressure on the mechanical and electronic properties of wurtzite and zinc-blende gaN crystals
    Qin, H.; Kuang, T.; Luan, X.; Li, W.; Xiao, J.; Zhang, P.; Yang, D.; GuoQi Zhang;
    Crystals,
    2018. DOI: 10.3390/cryst8110428

  409. Special issue: International conference on thermal, mechanical & multiphysics simulation and experiments in micro- and nano-electronics and systems [EuroSimE2017]
    van Driel, W. D.; Wymyslowski, A.;
    Microelectronics Reliability,
    2018. DOI: 10.1016/j.microrel.2018.06.012

  410. The effects of graphene stacking on the performance of methane sensor: A first-principles study on the adsorption, band gap and doping of graphene
    Yang, N.; Yang, D.; GuoQi Zhang; Chen, L.; Liu, D.; Cai, M.; Fan, X.;
    Sensors,
    2018. DOI: 10.3390/s18020422

  411. Study on the Degradation of Optical Silicone Exposed to Harsh Environments
    Yazdan Mehr, M.; van Driel, W.; De Buyl, F.; GuoQi Zhang;
    Materials,
    2018. DOI: 10.3390/ma11081305

  412. MEMS-based multi-modal vibration energy harvesters for ultra-low power autonomous remote and distributed sensing
    Iannacci, J.; Serra, E.; Sordo, G.; Bonaldi, M.; Borrielli, A.; Schmid, U.; Bittner, A.; Schneider, M.; Kuenzig, T.; Schrag, G.; Pandraud, G.; Sarro, P. M.;
    Microsystem Technologies,
    pp. 5027-5036, 2018. DOI: 10.1007/s00542-018-3923-1

  413. Microstructure and hardness of SAC305 and SAC305-0.3Ni solder on Cu, high temperature treated Cu, and graphene-coated Cu substrates
    Li, S.; Yang Liu; Hao Zhang; Cai, H.; Sun, F.; GuoQi Zhang;
    Results in Physics,
    2018. DOI: 10.1016/j.rinp.2018.10.005

  414. Microstructure and hardness of SAC305-xNi solder on Cu and graphene-coated Cu substrates
    Yang Liu; Li, S.; Hao Zhang; Cai, H.; Sun, F.; GuoQi Zhang;
    Journal of Materials Science: Materials in Electronics,
    pp. 13167-13175, 2018. DOI: 10.1007/s10854-018-9440-2

  415. Microstructure and mechanical properties of spark plasma sintered nanocrystalline Ni3Al-xB alloy
    Mohammadnejad, A.; Bahrami, A.; Sajadi, M.; Karimi, P.; Fozveh, H. R.; Mehr, M. Y.;
    Materials Today Communications,
    2018. DOI: 10.1016/j.mtcomm.2018.09.002

  416. Promoting sensitivity and selectivity of HCHO sensor based on strained InP3 monolayer: A DFT study
    Yang, H.; Wang, Z.; Ye, H.; Zhang, K.; Chen, X.; GuoQi Zhang;
    Applied Surface Science,
    pp. 554-561, 2018. DOI: 10.1016/j.apsusc.2018.08.014

  417. A photovoltaic window with sun-tracking shading elements towards maximum power generation and non-glare daylighting
    Yuan Gao; Jianfei Dong; Olindo Isabella; Rudi Santbergen; Hairen Tan; Miro Zeman; GuoQi Zhang;
    Applied Energy,
    Volume 228, pp. 1454-1472, 2018.

  418. Quality and Reliability in Solid-State Lighting: Qua Vadis?
    Vos, T; den Breeijen, P.; van Driel, W. D.;
    Solid State Lighting Reliability Part 2: Components to Systems,
    2018. DOI: 10.1007/978-3-319-58175-0_1

  419. Effects of Conformal Nanoscale Coatings on Thermal Performance of Vertically Aligned Carbon Nanotubes
    Cinzia Silvestri; Michele Riccio; René H. Poelma; Aleksandar Jovic; Bruno Morana; Sten Vollebregt; Andrea Irace; GuoQi Zhang; Pasqualina M. Sarro;
    Small,
    Volume 14, Issue 20, pp. 1800614, 2018. DOI: 10.1002/smll.201800614

  420. Solid State Lighting Reliability Part 2: Components to Systems
    van Driel, W. (ed.); Fan, X. (ed.); Zhang, G. Q. (ed.) (Ed.);
    Springer International Publishing AG, , 2018. DOI: 10.1007/978-3-319-58175-0_1_16

  421. Lightning Effects on LED-Based Luminaires
    Agbemuko, A.; van Meurs, J.; van Driel, W. D.;
    Springer International Publishing, , pp. 573-583, 2018. DOI: 10.1007/978-3-319-58175-0_21

  422. Reliability Prediction of Integrated LED Lamps with Electrolytic Capacitor-Less LED Drivers
    Bo Sun; Fan, X.; van Driel, W. D. (ed.); GuoQi Zhang;
    Springer, , 2018. DOI: 10.1007/978-3-319-58175-0_16

  423. The Next Frontier: Reliability of Complex Systems
    Schenkelaars, D.; van Driel, W. D. (ed.); Duijve, R.;
    Springer International Publishing AG, , 2018. DOI: 10.1007/978-3-319-58175-0_22

  424. LED-Based Luminaire Color Shift Acceleration and Prediction
    Lu, G.; van Driel, W. D. (ed.); Fan, X.; Fan, J.; GuoQi Zhang;
    Springer, , pp. 201-219, 2018. DOI: 10.1007/978-3-319-58175-0_9

  425. Statistical Analysis of Lumen Depreciation for LED Packages
    Schuld, M.; van Driel, W. D. (ed.); Jacobs, B.;
    Springer International Publishing, , 2018. DOI: 10.1007/978-3-319-58175-0_17

  426. Reliability and Lifetime Assessment of Optical Materials in LED-Based Products
    Maryam Yazdan Mehr; Willem Dirk van Driel; GuoQi Zhang;
    In Solid State Lighting Reliability Part 2,
    Springer, 2018.

  427. Corrosion Sensitivity of LED Packages
    B.J.C. Jacobs; C. van der Marel; W.D. van Driel; S.J. Lu; X.P. Li;
    In Solid State Lighting Reliability Part 2: Components to Systems,
    Springer International Publishing AG, 2018.

  428. Capacitively-Coupled Chopper Instrumentation Amplifiers: An Overview
    Qinwen Fan; Kofi A. A. Makinwa;
    In Proc. IEEE Sensors,
    10 2018. DOI: 10.1109/ICSENS.2018.8589958

  429. Wafer-Scale Integration for Semi-Flexible Neural Implant Miniaturization
    Marta Kluba; Bruno Morana; Angel Savov; Henk Van Zeijl; Gregory Pandraud; Ronald Dekker;
    In Proceedings Eurosensors,
    pp. 941, 2018. DOI: 10.3390/proceedings2130941

  430. A Highly Miniaturized Single-chip MOMS Scanner for All-in-one Imaginging Solution
    A. Jovic; T. Uto; K. Hei; J. Sancho; N. Sanchez; K. Zinoviev; J.L. Rubio; E. Margallo; G. Pandraud; P.M. Sarro;
    In 31th IEEE International Conference on Micro Electro Mechanical Systems (MEMS),
    2018.

  431. A novel method to transfer porous PDMS membranes for high throughput Organ-on-Chip and Lab-on-Chip assembly
    William.F Quirós-Solano; Nikolas Gaio; Cinzia Silvestri; Oscar M. J. A. Arik; Yusuf, B. Stassen; Andries van der Meer; Carlijn V.C. Bouten; Albert van den Berg; Ronald Dekker; P.M. Sarro;
    In 31th IEEE International Conference on Micro Electro Mechanical Systems (MEMS),
    pp. 318-321, 2018.

  432. High Power-Density 3D Integrated Power Supply Module Based on Panel-Level PCB Embedded Technology
    Fengze Hou; Xueping Guo; Qidong Wang; Wenbo Wang; Tingyu Lin; Liqiang Cao; GuoQi Zhang; J.A. Ferreira;
    In Proc. IEEE Electronic Components and Technol. Conf. (ECTC),
    pp. 1365- 1370, 2018.

  433. A transfer-free approach to wafer-scale graphene deposited by chemical vapour deposition
    Sten Vollebregt; Filiberto Ricciardella; Joost Romijn; Manvika Singh; Shengtai Shi; Lina Sarro;
    In Graphene Conference,
    2018. (invited).
    document

  434. Self-assembly: Insights from the macroscale
    M. Mastrangeli;
    In 3rd Int. Conf. on Manipulation, Automation and Robotics at Small Scales (MARSS2018),
    2018.

  435. Making large free-standing multi-layer graphene/graphitic membranes
    Evgenia Kurganova; A.J.M. Giesbers; Sten Vollebregt; Arnoud Notenboom; David Vles; Maxim Nasalevich; Peter van Zwol;
    In Graphene Conference,
    2018.

  436. Vacuum Assisted Liquified Metal (VALM) TSV Filling Method With Superconductive Material
    J.A. Alfaro; P.M. Sberna; C. Silvestri; M. Mastrangeli; R. Ishihara; P.M. Sarro;
    In 31th IEEE International Conference on Micro Electro Mechanical Systems (MEMS),
    2018. DOI: 10.1109/MEMSYS.2018.8346611

  437. A Multi Well Plate Organ-on-chip (Ooc) Device For In-vitro Cell Culture Stimulation And Monitoring
    N. Gaio; A. Waafi; M.L.H. Vlaming; E. Boschman; P. Dijkstra; P. Nacken; S.R. Braam; C. Boucsein; P.M. Sarro; R. Dekker;
    In 31th IEEE International Conference on Micro Electro Mechanical Systems (MEMS),
    2018.

  438. A Miniaturized Low Power Pirani Pressure Sensor Based on Suspended Graphene
    Joost Romijn; Sten Vollebregt; Robin J. Dolleman; Manvika Singh; Herre S.J. van der Zant; Peter G. Steeneken; Pasqualina M. Sarro;
    In Proceedings of IEEE NEMS,
    2018.

  439. Designing a 100 [aF/nm] capacitive transducer
    L. M. Middelburg; B. El Mansouri; R. H. Poelma; H. W. van Zeijl; Jia Wei; GuoQi Zhang; W. D. van Driel;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    2018.

  440. Wafer-scale CVD graphene integration: a transfer-free approach
    Sten Vollebregt;
    In GrapChina,
    2018. (invited).

  441. Modeling of two-dimensional hyperbolic heat conduction in silicon-on-insulator transistor by equivalent RLC network
    Amir Mirza Gheytaghi; Huaiyu Ye; GuoQi Zhang;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    2018.

  442. Wafer Level Through-polymer Optical Vias (TPOV) Enabling High Throughput of Optical Windows Manufacturing
    Z. Huang; R.H. Poelma; S. Vollebregt; M.H. Koelink; E. Boschman; R. Kropf; M. Gallouch; GuoQi Zhang;
    In IEEE Electronics System-Integration Technology Conference (ESTC),
    pp. 1-5, 2018.

  443. Lumen maintenance prediction for LEDs: New insights
    Jacobs, B.; van Driel, W. D.; Schuld, M.;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018. Piscataway, NJ: IEEE,
    pp. 1-4, 2018. DOI: 10.1109/EuroSimE.2018.8369895

  444. Modulation of Gas Adsorption on SnS by strain
    Fafei Hu; Huaiyu Ye; Hongyu Tang; Xianping Chen;
    In 19th International Conference on Electronic Packaging Technology (ICEPT),
    2018.

  445. Interfacial properties of Cu/SiO2 using a multiscale modelling approach in electronic packages
    Zhen Cui; Xianping Chen; Xuejun Fan; GuoQi Zhang;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    2018.

  446. A tunable THz wave modulator based on graphene
    Feng Zhang; Xian-Ping Chen; Qi-qin Wei; Li-Bo Yuan; Miao Cai; Huai-Yu Ye; GuoQi Zhang Jing Xiao;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018,
    2018.

  447. A probabilistic physics-of-failure reliability assessment approach for integrated LED lamps
    Bo Sun; Jiajie Fan; Xuejun Fan; GuoQi Zhang;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    2018.

  448. Au-based and Au-free Ohmic Contacts to AlGaN/GaN Structures on Silicon or Sapphire Substrates
    Wenmao Li; Jian Zhang; Robert Sokolovskij; Yumeng Zhu; Yongle Qi; Xinpeng Lin; Jingyi Wu; Lingli Jiang; Hongyu Yu;
    In 18th International Workshop on Junction Technology,
    2018.

  449. Color maintenance prediction for LED-based products
    W.D. van Driel; J.G.J. Beijer; J.W. Bikker; C.H.M. van Blokland; C. Ankomah B. Jacobs;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018,
    2018.

  450. SiC MOSFET Threshold-Voltage Instability under High Temperature Aging
    Liu, Y.; Chen, X.; Zhao, Z.; Li, Z.; Lu, C.; Zhang, J.; Ye, H.; Koh, S. W.; Wang, L.; GuoQi Zhang;
    In Proceedings - 2018 19th International Conference on Electronic Packaging Technology, ICEPT 2018,
    2018. DOI: 10.1109/ICEPT.2018.8480781

  451. The performance of sintered nanocopper interconnections for high temperature device
    Liu, Q.; Chen, X.; Zhu, J.; Zhang, H.; Zhang, J. S.; Zhang, J. G.; Wang, L.; Ye, H.; Koh, S. W.; GuoQi Zhang;
    In 19th International Conference on Electronic Packaging Technology, ICEPT 2018,
    IEEE, 2018. DOI: 10.1109/ICEPT.2018.8480591

  452. Non-Linear Bulk Micromachined Accelerometer for High Sensitivity Applications
    Middelburg, L. M.; Mansouri, B. E.; Poelma, R.; GuoQi Zhang; Van Zeijl, H.; Wei, J.;
    In Proc. IEEE Sensors,
    2018. DOI: 10.1109/ICSENS.2018.8589630

  453. Study of ultraviolet assisted cure mechanism of the phosphor/silicone composites used in White LEDs
    Wang, Z.; Fan, J.; Liu, J.; Hu, A.; Qian, C.; Fan, X.; GuoQi Zhang;
    In 19th International Conference on Electronic Packaging Technology, ICEPT 2018,
    IEEE, pp. 525-530, 2018. DOI: 10.1109/ICEPT.2018.8480566

  454. Interfacial Failure Characterization of Electronic Packaging Component Using a Multiscale Modelling Approach
    Zhen Cui; Yingying Zhang; Qun Yang; GuoQi Zhang; Xianping Chen;
    In IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM),
    2018. DOI: 10.1109/EDTM.2018.8421434

  455. Compensation Method for Die Shift in Fan-Out Packaging
    Yue Sun; Fengze Hou; Chen, F.; Liu, H.; Zhang, H.; Sun, P.; Lin, T.; Cao, L.;
    In 19th International Conference on Electronic Packaging Technology, ICEPT 2018,
    2018. DOI: 10.1109/ICEPT.2018.8480551

  456. Shining light on cardiac tachyarrhythmias
    Nyns E CA; Bingen B O; Bart C I; Kip A; Poelma R H; Volkers L; Plomp J J; Jangsangthong W; Engels M C; Schalij M J; GuoQi Zhang; de Vries A AF; Pijnappels D A;
    In Changing the Face of Modern Medicine: Stem Cell and Gene Therapy,
    2018. DOI: 10.1089/hum.2018.29077.abstracts

  457. Internal stress state of TQFP subjected to liquid thermal shock using piezoresistive silicon stress sensor
    Prisacaru, A.; Sun, Y.; Gromala, P. J.; Han, B.; GuoQi Zhang;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018. Piscataway, NJ: IEEE,
    IEEE, pp. 1-3, 2018. DOI: 10.1109/EuroSimE.2018.8369955

  458. Fatigue Damage Assessment of LED Chip Scale Packages with Finite Element Simulation
    Fan, J.; Hu, A.; Pecht, M.; Chen, W.; Fan, X.; Xu, D.; GuoQi Zhang;
    In 19th International Conference on Electronic Packaging Technology, ICEPT 2018,
    IEEE, pp. pp. 1642-1648, 2018. DOI: 10.1109/ICEPT.2018.8480748

  459. Technological challenges and unmet needs for organs-on-chip: Expert opinions
    M. Mastrangeli;
    presented at ORCHID (Organs-on-CHIp in Development) Vision Workshop, Stuttgart (DE), May 23, 2018.

  460. Nanoscale topography controls the capillary assembly of nanoparticles
    M. Mastrangeli;
    presented at the Institute of Applied Sciences and Intelligent Systems, National Research Council of Italy, Pozzuoli (IT), October 26, 2018.

  461. Small-scale soft robots with multimodal locomotion
    M. Mastrangeli;
    presented at Digital Health: Robotic Assistance for a better life (ETV Symposium), Delft (NL), 6 June 2018.

  462. On capillary nanoparticle assembly and soft multimodal robots
    M. Mastrangeli;
    presented at Aalto University, Espoo (FI), August 10, 2018.

  463. Nanoscale topography controls the capillary assembly of nanoparticles
    M. Mastrangeli;
    presented at Holst Centre, Eindhoven (NL), February 16, 2018.

  464. Fully Capacitive Coupled Input Choppers
    J. H. Huijsing; Qinwen Fan; K. A. A. Makinwa;
    Patent, US US10033369B2, July 2018. Assignee: Maxim Integrated Products Inc.

  465. Versatile 3D Stretchable Micro-Environment for Organ-on-Chip Devices Fabricated with Standard Silicon Technology
    Nikolas Gaio; William Quiros Solano;
    Patent, WO2018021906, 2018.

  466. Three dimensional thermoacoustic device composed of nanoporous material and the method to fabricate such a device
    Poelma, R.; GuoQi Zhang, G. Q.; Yi, H.; van Zeijl, H.;
    Patent, NL 2017268, 2018. IPC No. H04R, Priority date 1 Aug 2016, Priority No. NL 2017268.

  467. Free standing interconnects for stretchable electronics
    S. Joshi;
    PhD thesis, Delft University of Technology, 2018.
    document

  468. Surface Acoustic Mode Aluminum Nitride Transducer for micro-size liquid sensing applications
    Thu Hang Bui;
    PhD thesis, Delft University of Technology, 2018.
    document

  469. First-Principles Study of Nitric Oxide Sensor Based on Blue Phosphorus Monolayer
    HC Luo; RS Meng; H Gao; X Sun; J Xiao; HY Ye; GuoQi Zhang; XP Chen;
    IEEE Electron Device Letters,
    Volume 38, Issue 8, pp. 1139-1142, 2017.

  470. Effect of droplet shrinking on surface acoustic wave response in microfluidic applications
    Thu Hang Bui; Van Nguyen; Sten Vollebregt; Bruno Morana; Henk van Zeijl; Trinh Chu Duc; P.M. Sarro;
    Applied Surface Science,
    Volume 426, pp. 253-261, 2017.
    document

  471. Multi-domain spectroscopy for composition measurement of water-containing bio-ethanol fuel
    L.M. Middelburg; G. de Graaf; A. Bossche; J.Bastemeijer; M. Ghaderi; F.S. Wolffenbuttel; J. Visser; R. Soltis; R.F. Wolffenbuttel;
    Fuel Processing Technology,
    Volume 167, pp. 127-135, 2017.

  472. Effects of Graphene Monolayer Coating on the Optical Performance of Remote Phosphors
    Maryam Yazdan Mehr; S. Vollebregt; W. D. van Driel; GuoQi Zhang;
    Journal of Electronic Materials,
    Volume 46, Issue 10, pp. 5866--5872, 2017. DOI: 10.1007/s11664-017-5592-8
    Keywords: ... graphene, Light-emitting diode, reliability, remote phosphor.

  473. Color shift acceleration on mid-power LED packages
    Guangjun Lu; Driel, W.D. van; Xuejun Fan; Jiajie Fan; Cheng Qian; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 78, Issue Supplement C, pp. 294 -- 298, 11 2017. DOI: 10.1016/j.microrel.2017.09.014
    Keywords: ... Color shift, Mid-power LED package, Temperature stress, Current stress, Humidity stress.

  474. Reliability and diffusion-controlled through thickness oxidation of optical materials in LED-based products
    Yazdan Mehr, M.; M.R. Toroghinejad; F. Karimzadeh; van Driel, W.D.; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 78, pp. 143--147, 2017. DOI: 10.1016/j.microrel.2017.08.014
    Keywords: ... BPA-PC, LED-based products, Optics, Oxidation, Yellowing.

  475. Microstructure, hardness, and shear behavior of the as-soldered SnBi–SAC composite solder pastes
    Y Liu; H Fu; H Zhang; F Sun; X Wang; GuoQi Zhang;
    Journal of Materials Science: Materials in Electronics,
    Volume 28, Issue 24, pp. 19113-19120, 2017.

  476. Overdriving reliability of chip scale packaged LEDs: Quantitatively analyzing the impact of component
    Hongyu Tang; H Ye; CKY Wong; SYY Leung; J Fan; X Chen; X Fan; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 78, pp. 197-204, 2017.

  477. Phosphor–silicone interaction effects in high power white light emitting diode packages
    J Fan; M Zhang; X Luo; C Qian; X Fan; A Ji; GuoQi Zhang;
    Journal of Materials Science: Materials in Electronics,
    Volume 28, Issue 23, pp. 17557-17569, 2017.

  478. Photometric and Colorimetric Assessment of LED Chip Scale Packages by Using a Step-Stress Accelerated Degradation Test (SSADT) Method
    C Qian; J Fan; J Fang; C Yu; Y Ren; X Fan; GuoQi Zhang;
    Materials,
    Volume 10, Issue 10, pp. 1181, 2017.

  479. Liquid identification by using a micro-electro-mechanical interdigital transducer
    Thu Hang Bui; Bruno Morana; Atef Akhnoukh; Trinh Chu Duc; Pasqualina M Sarro;
    Analyst,
    Volume 142, Issue 5, pp. 763-771, 2017.

  480. Effects of graphene defects on gas sensing properties towards NO2 detection
    Filiberto Ricciardella; Sten Vollebregt; Tiziana Polichetti; Mario Miscuglio; Brigida Alfano; Maria L. Miglietta; Ettore Massera; Girolamo Di Francia; Pasqualina M. Sarro;
    Nanoscale,
    Volume 9, pp. 6085-6093, 2017.
    document

  481. Modeling nonlinear moisture diffusion in inhomogeneous media
    L Chen; J Zhou; H Chu; GuoQi Zhang; X Fan;
    Microelectronics Reliability,
    Volume 75, pp. 162-170, 2017.

  482. CVD transfer-free graphene for sensing applications
    Chiara Schiattarella; Sten Vollebregt; Tiziana Polichetti; Brigida Alfano; Ettore Massera; Maria Lucia Miglietta; Girolamo Di Francia; Pasqualina Maria Sarro;
    Beilstein Journal of Nanotechnology,
    Volume 8, pp. 1015-1022, 2017.
    document

  483. Humidity sensor based on the ionic polymer metal composite
    E Esmaeli; M Ganjian; H Rastegar; M Kolahdouz; Z Kolahdouz; GuoQi Zhang;
    Sensors and Actuators B: Chemical,
    Volume 247, pp. 498-504, 2017.

  484. Silicon-based multi-functional wafer-level-package for LEDs in 7-mask BiCMOS process
    Zahra Kolahdouz; T Ma; H Abdy; M Kolahdouz; H van Zeijl; GuoQi Zhang;
    Sensors and Actuators A: Physical,
    Volume 263, pp. 622-632, 2017.

  485. Sensitive and Reversible Detection of Methanol and Water Vapor by In Situ Electrochemically Grown CuBTC MOFs on Interdigitated Electrodes
    Sumit Sachdeva; Manjunath R. Venkatesh; Brahim El Mansouri; Jia Wei; Andre Bossche; Freek Kapteijn; GuoQi Zhang; Jorge Gascon; Louis C. P. M. de Smet; Ernst J. R. Sudhölter;
    Small,
    Volume 13, Issue 29, pp. 1604150, 2017.

  486. Hybrid plasmonics slot THz waveguide for subwavelength field confinement and crosstalk between two waveguides
    J Xiao; QQ Wei; DG Yang; P Zhang; N He; GuoQi Zhang; XP Chen;
    IEEE Journal of Selected Topics in Quantum Electronics,
    Volume 23, Issue 4, 2017.

  487. Experimental Verification and Optimization Analysis of Warpage for Panel-Level Fan-Out Package
    Fengze Hou; T Lin; L Cao; F Liu; J Li; X Fan; GuoQi Zhang;
    IEEE Transactions on Components, Packaging and Manufacturing Technology,
    Volume 7, Issue 10, pp. 1721-1728, 2017.

  488. Nitrogen Dioxide Gas Sensor Based on Monolayer SnS: A First-Principle Study
    FF Hu; Hongyu Tang; CJ Tan; HY Ye; XP Chen; GuoQi Zhang;
    IEEE Electron Device Letters,
    Volume 38, Issue 7, pp. 983-986, 2017.

  489. Thermal/luminescence characterization and degradation mechanism analysis on phosphor-converted white LED chip scale packages
    J Fan; C Yu; C Qian; X Fan; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 74, pp. 179-185, 2017.

  490. A Reliability Prediction for Integrated LED Lamp With Electrolytic Capacitor-Free Driver
    Bo Sun; X Fan; L Li; H Ye; W van Driel; GuoQi Zhang;
    IEEE Transactions on Components and Packaging and Manufacturing Technology,
    Volume 7, Issue 7, pp. 1081-1088, 2017.

  491. Studies of the light output properties for a GaN based blue LED using an electro-optical simulation method
    C Qian; Y Li; J Fan; X Fan; J Fu; L Zhao; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 74, pp. 173-178, 2017.

  492. Integrated virtual impactor enabled PM 2.5 sensor
    Mingzhi Dong; E Iervolino; F Santagata; G Zhang; GuoQi Zhang;
    IEEE Sensors Journal,
    Volume 17, Issue 9, pp. 2814-2821, 2017.

  493. A novel lifetime prediction for integrated LED lamps by electronic-thermal simulation
    Bo Sun; X Fan; H Ye; J Fan; C Qian; W van Driel; GuoQi Zhang;
    Reliability Engineering & System Safety,
    Volume 163, pp. 14-21, 2017.

  494. Sulfur Dioxide and Nitrogen Dioxide Gas Sensor Based on Arsenene: A First-Principle Study
    XP Chen; LM Wang; X Sun; RS Meng; J Xiao; HY Ye; GuoQi Zhang;
    IEEE Electron Device Letters,
    Volume 38, Issue 5, pp. 661-664, 2017.

  495. Color shift modeling of light-emitting diode lamps in step-loaded stress testing
    M Cai; D Yang; J Huang; M Zhang; X Chen; C Liang; S Koh; GuoQi Zhang;
    IEEE Photonics Journal,
    Volume 9, Issue 1, pp. 1-14, 2017.

  496. Monolithically integrated light feedback control circuit for blue/UV LED smart package
    Zahra K Esfahani; M Tohidian; H van Zeijl; M Kolahdouz; GuoQi Zhang;
    IEEE Photonics Journal,
    Volume 9, Issue 2, pp. 1-13, 2017.

  497. Identification and robust control of the nonlinear photoelectrothermal dynamics of LED systems
    J Dong; GuoQi Zhang;
    IEEE Transactions on Industrial Electronics,
    Volume 64, Issue 3, pp. 2215-2225, 2017.

  498. Prediction of lumen depreciation and color shift for phosphor-converted white light-emitting diodes based on a spectral power distribution analysis method
    C Qian; J Fan; X Fan; GuoQi Zhang;
    IEEE Access,
    Volume 5, pp. 24054-24061, 2017.

  499. Color shift failure prediction for phosphor-converted white LEDs by modeling features of spectral power distribution with a nonlinear filter approach
    J Fan; MG Mohamed; C Qian; X Fan; GuoQi Zhang; M Pecht;
    Materials 10,
    Volume 7, pp. 819, 2017.

  500. Numerical Thermal Analysis and Optimization of Multi-Chip LED Module Using Response Surface Methodology and Genetic Algorithm
    Hongy Tang; HY Ye; XP Chen; C Qian; XJ Fan; GuoQi Zhang;
    IEEE Access,
    Volume 5, Issue 5, pp. 16459-16468, 2017.

  501. Inverter-based low-power delta\textendashsigma modulator using correlated level shifting technique
    H. Zhang; Z. Tan; K. Nguyen;
    Electronics Letters,
    Volume 53, Issue 25, pp. 1663--1665, December 2017. DOI: 10.1049/el.2017.3593
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  502. Inverter-based low-power delta\textendashsigma modulator using correlated level shifting technique
    H. Zhang; Z. Tan; K. Nguyen;
    Electronics Letters,
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  503. Capacitively-Coupled Chopper Operational Amplifiers
    Qinwen Fan; K.A.A. Makinwa; J.H. Huising;
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  504. Carbon Nanotubes as Vertical Interconnects for 3D Integrated Circuits
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  505. A transfer-free wafer-scale method for the fabrication of suspended graphene beams for squeeze-film pressure sensors
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  506. High aspect ratio spiral resonators for process variation investigation and MEMS applications
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  507. Combining impedance spectroscopy with optical absorption spectroscopy in the UV for biofuel composition measurement
    Luke Middelburg; Mohammadamir Ghaderi; Andre Bossche; Jeroen Bastemeijer; Ger de Graaf; Reinoud Wolffenbuttel;
    In Instrumentation and Measurement Technology Conference (I2MTC), 2017 IEEE International,
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  508. Prognostics \& health management for LED-based applications
    W.D. van Driel; B. Jacobs; D. Schenkelaars; M. Klompenhouwer; R. Poelma; B. El Mansouri; L.M. Middelburg;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
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  509. An Innovative Approach to Overcome Saturation and Recovery Issues of CVD graphene-Based Gas Sensors
    F. Ricciardella; S. Vollebregt; T. Polichetti; B. Alfano; E. Massera; P. M. Sarro;
    In Proceedings of IEEE Sensors Conference,
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  510. Novel Method for Adhesion between PI-PDMS Using Butyl Rubber for Large Area Flexible Body Patches
    Joshi, Shivani; Bagani, Rishab; Beckers, Lucas; Dekker, Ronald;
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  511. Integrated SiGe Detectors for Si Photonic Sensor Platforms
    Gregory Pandraud; Silvana Milosavljevic; Amir Sammak; Matteo Cherchi; Aleksandar Jovic; Pasqualina Sarro;
    In Proceedings of Eurosensors,
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  512. Wafer-scale measurements of the specific contact resistance between different metals and mono- and multi-layer graphene
    S. Vollebregt; M. Singh; D.J. Wehenkel; R. van Rijn; P.M. Sarro;
    In Proc. of the 43rd international conference on Micro and Nanoengineering (MNE),
    pp. 152, 2017.

  513. Low Temperature CVD Grown Graphene for Highly Selective Gas Sensors Working under Ambient Conditions
    Filiberto Ricciardella; Sten Vollebregt; Tiziana Polichetti; Brigida Alfano; Ettore Massera; Pasqualina M. Sarro;
    In Proceedings of Eurosensors 2017,
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  514. Generic platform for the miniaturization of bioelectronic implants
    M. M. Kluba; J. W. Weekamp; M. Louwerse; V. Henneken; R. Dekker;
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  515. An AlAs/germanene heterostructure with outstanding tunability of electronic properties
    C Tan; Q Yang; H Ye; X Chen; GuoQi Zhang;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
    2017.

  516. Polymeric strain gauges as pressure sensor for microfabricated organ-on-chips
    W.F. Quiros Solano; N. Gaio; C. Silvestri; G. Pandraud; P.M. Sarro;
    In Proc.of Transducers 2017, the 19th International Conference on Solid-state Sensors, Actuators, and Microsystems,
    pp. 1296-1299, 2017.

  517. High sensitive CVD graphene-based gas sensors operating under environmental conditions
    Filiberto Ricciardella; Sten Vollebregt; Tiziana Polichetti; Brigida Alfano; Ettore Massera; Pasqualina M. Sarro;
    In Graphene Conference,
    2017.

  518. Smart Systems Integration in the era of Solid State Lighting
    GuoQi Zhang; H. van Zeijl; W.D. van Driel; R. Poelma; Z.K. Esfahani; M.R. Venkatesh; L. Middelburg; B. El Mansouri;
    In Smart System Integration conference (SSI),
    2017.

  519. Ultra-thin ALD MGO membranes as mems transmission dynodes in a timed photon counter
    Violeta Prodanovic; Hong Wah Chan; Anil U Mane; Jeffrey W Elam; Harry VD Graaf; Pasqualina M Sarro;
    In Micro Electro Mechanical Systems (MEMS), 2017 IEEE 30th International Conference on,
    pp. 740-743, 2017.

  520. Horizontally aligned carbon nanotube scaffolds for freestanding structures with enhanced conductivity
    Cinzia Silvestri; Federico Marciano; Bruno Morana; Violeta Podranovic; Sten Vollebregt; GuoQi Zhang; Pasqualina M Sarro;
    In Micro Electro Mechanical Systems (MEMS), 2017 IEEE 30th International Conference on,
    pp. 266-269, 2017.

  521. Two novel MEMS actuator systems for self-aligned integrated 3D optical coherent tomography scanners
    Aleksandar Jovic; Gregory Pandraud; Nuria Sanchez; Juan Sancho; Kirill Zinoviev; Jose L Rubio; Eduardo Margallo; Pasqualina M Sarro;
    In Micro Electro Mechanical Systems (MEMS), 2017 IEEE 30th International Conference on,
    pp. 797-800, 2017.

  522. Next generation smart catheters
    R. Dekker;
    In Philips Research,
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  523. Singe-Step CMOS Compatible Fabrication of High Aspect Ratio Microchannels Embedded in Silicon
    M. Kluba; A. Arslan; R. Stoute; J. Muganda; R. Dekker;
    In Eurosensors,
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  524. Towards the Next Generation Smart Catheters and implants
    R. Dekker;
    In Smart Systems Industry Summit,
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  525. Organ-on-Chip
    R. Dekker;
    In Professors in de theatre arena,
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  526. Silicon based microfluidic device with integrated electrodes for the assessment of cellular stiffness
    S. Kawasaki; M. Kluba; R.Dekker;
    In Design of Medical Devices Conference (DMD Europe),
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  527. Towards the next generation of smart catheters and bioelectronics medicines
    R. Dekker;
    In Tyndall Technology Days 2017,
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  528. Optimization of reflow soldering process for white LED chip-scale-packages on substrate
    C Jiang; W Guo; J Fan; C Qian; X Fan; GuoQi Zhang;
    In Electronic Packaging Technology (ICEPT), 2017 18th International Conference on,
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  529. A low-cost electrical read-out system for cell stiffness measurement using silicon based microfluidic device
    S. Kawasaki; M. M. Kluba; R. Dekker;
    In ICT.OPEN,
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  530. Luminous flux modeling for high power LED automotive headlamp module
    C Yu; J Fan; C Qian; X Fan; GuoQi Zhang;
    In Electronic Packaging Technology (ICEPT), 2017 18th International Conference on,
    2017.

  531. Condition monitoring algorithm for piezoresistive silicon-based stress sensor data obtained from electronic control units
    A Prisacaru; A Palczynska; PJ Gromala; B Han; GuoQi Zhang;
    In Electronic Components and Technology Conference (ECTC), 2017 IEEE 67th,
    2017.

  532. Pt-AlGaN/GaN HEMT-Sensor for Hydrogen Sulfide (H2S) Detection
    R Sokolovskij; E Iervolino; C Zhao; F Santagata; F Wang; H Yu; PM Sarro; GuoQi Zhang;
    In Proceedings of Eurosensors,
    pp. 463, 2017.

  533. Degradation mechanism analysis for phosphor/silicone composites aged under high temperature and high humidity condition
    X Luo; J Fan; M Zhang; C Qian; X Fan; G Zhang;
    In Electronic Packaging Technology (ICEPT), 2017 18th International Conference on,
    2017.

  534. A PoF and statistics combined reliability prediction for LED arrays in lamps
    B Sun; X Fan; J Fan; C Qian; GuoQi Zhang;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
    2017.

  535. Electrical and optical properties of NO and H2S adsorption on Arsenic Phosphorus
    Y Zhang; K Zheng; X Chen; GuoQi Zhang; C Tan; Q Yang; J Jiang; H Ye;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
    2017.

  536. SnS monolayer as gas sensors: Insights from a first-principles investigation
    F Hu; C Tan; H Ye; X Chen; GuoQi Zhang;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
    2017.

  537. In-situ characterization of moisture absorption and hygroscopic swelling of silicone/phosphor composite film and epoxy mold compound in LED packaging
    I Khalilullah; T Reza; L Chen; AKMMH Mazumder; J Fan; C Qian; GuoQi Zhang; X Fan;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
    2017.

  538. Adsorption of gases on monolayer GeSe: A first principle study
    L Liu; Q Yang; H Ye; X Chen; GuoQi Zhang;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
    2017.

  539. First principle design of CdS/germanene heterostructures with tunable electronic and transport properties
    K Zheng; H Ye; GuoQi Zhang; Y Zhang; L Liu; J Jiang; Q Yang; C Tan; X Chen;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
    2017.

  540. The intriguing electronic and optical properties modulation in blue phosphorene/g-III-nitrides heterostructures
    Q Yang; C Tan; H Ye; X Chen; GuoQi Zhang;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
    2017.

  541. Luminescence mechanism analysis on high power tunable color temperature Chip-on-Board white LED modules
    J Fan; C Xie; C Qian; X Fan; GuoQi Zhang;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
    2017.

  542. Effects of phosphor dispersion on optical characteristics of LED Chip Scale Package LEDs
    C Qian; LL Luo; JJ Fan; XQ Li; XJ Fan; GuoQi Zhang;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
    2017.

  543. Pt-AlGaN/GaN HEMT-sensor layout optimization for enhancement of hydrogen detection
    Robert Sokolovskij, Elina Iervolino, Changhui Zhao, Fei Wang, Hongyu Yu, Fabio Santagata, Pasqualina M. Sarro, Guo Qi Zhang;
    In IEEE Sensors 2017,
    2017.

  544. Prognostics and health monitoring of electronic system: A review
    A Prisacaru; PJ Gromala; MB Jeronimo; B Han; GuoQi Zhang;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
    2017.

  545. Thermal conductivity of functionalized graphene-polymer nanocomposite: A non-equilibrium molecular dynamics study
    Hongyu Tang; Huaiyu Ye; Xianping Chen; Xuejun Fan; GuoQi Zhang;
    In EurosimE,
    2017.

  546. Suspended graphene beams with tunable gap for squeeze-film pressure sensing
    S. Vollebregt; R.J. Dolleman; H.S.J. van der Zant; P.G. Steeneken; P.M. Sarro;
    In Proc.of Transducers 2017, the 19th International Conference on Solid-state Sensors, Actuators, and Microsystems,
    pp. 770-773, 2017.

  547. The Next Generation Smart Catheters
    R. Dekker;
    Maxwell, November 2017. "Maxwell" is a periodical of the Delft university of technology that is distributed amongst students and alumni.

  548. Nanoscale topography controls the capillary assembly of nanoparticles
    M. Mastrangeli;
    presented at AMOLF (Amsterdam, NL), November 2017.

  549. Soft miniature robots with multimodal locomotion
    M. Mastrangeli;
    presented at the microMAST General Meeting, 2017.

  550. Carbon nanotube based solutions for on-chip thermal management
    Cinzia Silvestri;
    PhD thesis, Delft University of Technology, 2017.
    document

  551. The Lifetime Prediction of LED Drivers and Lamps
    Bo Sun;
    PhD thesis, Delft University of Technology, 2017.
    document

  552. Monolithic 3D Wafer Level Integration: Applied for Smart LED Wafer Level Packaging
    Zahra Kolahdouz Esfahani;
    PhD thesis, Delft University of Technology, 2017.
    document

  553. Solid State Lighting Color Shift
    Guangjun Lu;
    PhD thesis, Delft University of Technology, 2017.
    document

  554. An accelerated test method of luminous flux depreciation for LED luminaires and lamps
    C. Qian; X.J.Fan; J.J.Fan; C.A.Yuan; GuoQi Zhang;
    Reliability Engineering and System Safety,
    Volume 147, pp. 84-92, 2016.

  555. Potential applications of electron emission membranes in medicine
    Yevgen Bilevych; Stefan E. Brunner; Hong Wah Chan; Edoardo Charbon; Harry van der Graaf; Cornelis W. Hagen; Gert Nützelf; Serge D. Pintof; Violeta Prodanović; Daan Rotman; Fabio Santagata; Lina Sarro; Dennis R. Schaar;
    Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment,
    Volume 809, pp. 171-174, 2016.

  556. Data Communication Pathway for Sensing Guidewire at Proximal Side: A Review
    Sharei H; Stoute R; van den Dobbelsteen J; Siebes M; Dankelman J.;
    Journal of Medical Devices,
    2016.

  557. PoF-Simulation Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers
    Bo Sun; Xuejun Fan; Cheng Qian; GuoQi Zhang;
    IEEE Transactions on Industrial Electronics,
    pp. 99, 2016.

  558. A CMOS-Compatible Hybrid Plasmonic Slot Waveguide With Enhanced Field Confinement
    Jing Xiao; Qi-Qin Wei; Dao-Guo Yang; Ping Zhang; Ning He; GuoQi Zhang;
    IEEE Electron Device Letters,
    Volume 37, Issue 4, 2016.

  559. Degradation Mechanism Decoupling of Mid-Power White-Light LEDs by SPD Simulation
    Jianlin Huang; D. S. Golubović; S. Koh; D. Yang; X. Li; X. Fan; GuoQi Zhang;
    IEEE Transactions on Electron Devices,
    Volume 63, pp. 2807-2814, 2016.

  560. Output blue light evaluation for phosphor based smart white LED wafer level packages
    Z. Kolahdouz; A. Rostamian; M. Kolahdouz; T. Ma; H. van Zeijl; GuoQi Zhang;
    Optics Express,
    Volume 24, Issue 4, pp. 174-177, 2016.

  561. Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test
    Jianlin Huang, D. S. Golubović, S. Koh, D. Yang, X. Li, X. Fan,; G. Q. Zhang;
    Reliability Engineering & System Safety,
    Volume 154, pp. 152-159, 2016.

  562. Silicon microfabrication based particulate matter sensor
    Mingzhi Dong; Elina Iervolino; Fabio Santagata; GuoQi Zhang;
    Sensors and Actuators A: Physical,
    Volume 247, pp. 115-124, 2016.

  563. Increasing color saturation by optimizing light spectra constrained on color rendering properties
    H. Wu; J. Dong; GuoQi Zhang.;
    Journal of the Optical Society of America A,
    Volume 33, Issue 2, pp. 192-2014, 2016.

  564. SiNW-FET in-Air Biosensors for High Sensitive and Specific Detection in Breast Tumor Extract
    F. Puppo; M.-A. Doucey; J.-F. Delaloye; T.S.Y. Moh; G. Pandraud; P.M. Sarro; G. De Micheli; S. Carrara;
    IEEE Sensors Journal,
    Volume 16, Issue 10, pp. 3374-3381, 2016.
    document

  565. A mixing surface acoustic wave device for liquid sensing applications: Design, simulation, and analysis
    T.H. Bui; B. Morana; T. Scholtes; T. Chu Duc; P.M. Sarro;
    Journal of Applied Physics,
    Volume 120, Issue 7, pp. 074504, 2016.

  566. The Tynode: A new vacuum electron multiplier
    Harry van der Graaf; Hassan Akhtar; Neil Budko; Hong Wah Chan; Cornelis W. Hagen; Conny C.T. Hansson; Gert Nützel; Serge D. Pinto; Violeta Prodanović; Behrouz Raftari; Pasqualina M. Sarro; John Sinsheimer; John Smedle;
    Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment,
    2016.
    document

  567. Cytostretch, an Organ-on-Chip Platform
    Gaio, N.; van Meer, B.; Quiros Solano, W.; Bergers, L.; van de Stolpe, A.; Mummery, C.; Sarro, P.M.; Dekker, R.;
    Micromachines,
    Volume 7, Issue 7, pp. 120, 2016.

  568. Thermally induced oxidative growth of copper oxide nanowire on dendritic micropowder and reductive conversion to copper nanowire
    A. M. Gheytaghi; S.H. Tabatabaie; H. Saffari; GuoQi Zhang;
    Micro and Nano Letters,
    Volume 11, Issue 8, pp. 412, 2016.

  569. Fabrication and characterization of an Upside-down Carbon Nanotube (CNT) Microelectrode array (MEA)
    Gaio, N.; Silvestri, C.; van Meer, B.; Vollebregt, S.; Mummery, C.; Dekker, R.;
    IEEE Sensors Journal,
    Volume 16, Issue 24, pp. 8685, 2016.

  570. Control of recoil losses in nanomechanical SiN membrane resonators
    A. Borrielli; L. Marconi; F. Marin; F. Marino; B. Morana; G. Pandraud; A. Pontin; G. A. Prodi; P. M. Sarro; E. Serra; M. Bonaldi;
    Physical Review B,
    Volume 94, pp. 121403, 2016.

  571. Adhesion Improvement of Polyimide/PDMS Interface by Polyimide Surface Modification
    Shivani Joshi; Antonie van Loona; Angel Savov; Ronald Dekker;
    MRS Advances,
    Volume 1, pp. 33-38, 2016.

  572. Thermal characterization of carbon nanotube foam using MEMS microhotplates and thermographic analysis
    Cinzia Silvestri; Michele Riccio; Rene Poelma; Bruno Morana; Sten Vollebregt; Fabio Santagata; Andrea Irace; GuoQi Zhang; Pasqualina M. Sarro;
    Nanoscale,
    Volume 8, pp. 8266-8275, 2016.
    document

  573. Microfabrication of large-area circular high-stress silicon nitride membranes for optomechanical applications
    E. Serra; M. Bawaj; A. Borrielli; G. Di Giuseppe; S. Forte; N. Kralj; N. Malossi; L. Marconi; F. Marin; F. Marino; B. Morana; R. Natali; G. Pandraud; A. Pontin; G. A. Prodi; M. Rossi; P. M. Sarro; D. Vita;
    AIP Advances,
    Volume 6, pp. 065004, 2016.

  574. Dynamical two-mode squeezing of thermal fluctuations in a cavity opto-mechanical system
    A. Pontin; M. Bonaldi; A. Borrielli; L. Marconi; F. Marino; G. Pandraud; G. A. Prodi; P.M. Sarro; E. Serra; F. Marin;
    Physical Review Letters,
    Volume 116, pp. 103601, 2016.

  575. Stretchable Binary Fresnel Lens for Focus Tuning
    Xueming Li; Lei Wei; Ren� H. Poelma; Sten Vollebregt; Jia Wei; Hendrik Paul Urbach; Pasqualina M. Sarro; GuoQi Zhang;
    Scientific Reports,
    Volume 6, pp. 25348, 2016.

  576. The growth of carbon nanotubes on electrically conductive ZrN support layers for through-silicon vias
    Sten Vollebregt; Sourish Banerjee; Frans D. Tichelaar; Ryoichi Ishihara;
    Microelectronic Engineering,
    Volume 156, pp. 126-130, 2016.
    document

  577. Effects of Nanostructure and Coating on the Mechanics of Carbon Nanotube Arrays
    R. H. Poelma; X. J. Fan; Z. Y. Hu; G. van Tendeloo; H.W. van Zeijl; GuoQi Zhang;
    Advanced Functional Materials,
    Volume 26, Issue 8, pp. 1233-1242, 2016.

  578. LED degradation: From component to system
    B. Hamon; van Driel, Willem;
    Microelectronics Reliability,
    Volume 64, pp. 599--604, 9 2016. DOI: DOI: 10.1016/j.microrel.2016.07.014

  579. Effect of excimer laser annealing on a -InGaZnO thin-film transistors passivated by solution-processed hybrid passivation layers
    Juan Paolo Bermundo; Yasuaki Ishikawa; Mami N Fujii; Toshiaki Nonaka; Ryoichi Ishihara; Hiroshi Ikenoue; Yukiharu Uraoka;
    Journal of Physics D: Applied Physics,
    Volume 49, Issue 3, pp. 035102-1-7, 2016.

  580. A review of small heat pipes for electronics
    Xianping Chen; Huaiyu Ye; Xuejun Fan; Tianling Ren; GuoQi Zhang;
    Applied Thermal Engineering,
    Volume 96, pp. 1-17, 2016.

  581. The Direct Growth of Carbon Nanotubes as Vertical Interconnects in 3D Integrated Circuits
    Sten Vollebregt; Ryoichi Ishihara;
    Carbon,
    Volume 96, pp. 332-338, 2016.
    document

  582. Lumen maintenance predictions for LED packages
    van Driel, Willem; M Schuld; B. Jacobs; F. Commissaris; van der Eyden, J; B. Hamon;
    Microelectronics Reliability,
    Volume 62, pp. 39--44, 3 2016. DOI: 10.1016/j.microrel.2016.03.018

  583. Creep fatigue models of solder joints: A critical review
    E.H. Wong; van Driel, Willem; A. Dasgupta; M. Pecht;
    Microelectronics Reliability,
    Volume 59, pp. 186--194, 1 2016.

  584. Colour shift and mechanism investigation on the PMMA diffuser used in LED-based luminaires
    G Lu; van Driel, WD; Xuejun Fan; Yazdan Mehr, M; Jiajie Fan; Cheng Qian; KMB Jansen; GQ Zhang;
    Optical Materials,
    Volume 54, pp. 282--287, 2016. harvest. DOI: 10.1016/j.optmat.2016.02.023
    Keywords: ... Colour shift, PMMA, Solid state lighting, LED-based luminaire, Infrared absorption spectroscopy.

  585. Advances in Low-Offset Opamps
    Qinwen Fan; J.H. Huising; K.A.A. Makinwa;
    Switzerland: Springer, , 2016.

  586. A Systematic Approach for Reliability Assessment of Electrolytic Capacitor-Free LED Drivers
    Bo Sun; Xuejun Fan; van Driel, Willem; GuoQi Zhang;
    United States: IEEE, , pp. 1--5, 4 2016. DOI: 10.1109/EuroSimE.2016.7463387
    Keywords: ... Reliability, MOSFET, Electrolytic Capacitor-Free LED Driver.

  587. Lumen Decay Prediction in LED Lamps
    Bo Sun; Xuejun Fan; van Driel, Willem; Thomas Michel; Jiang Zhou; GuoQi Zhang;
    United States: IEEE, , pp. 1--5, 4 2016. DOI: 10.1109/EuroSimE.2016.7463391
    Keywords: ... Reliability, LED Lamp, Lumen Decay Prediction.

  588. Optical Spectroscopy for Biofuel Composition Sensing
    L.M. Middelburg; G. de Graaf; M. Ghaderi; A.Bossche; J. Bastemeijer; J.H. Visser; R.E. Soltis; R.F. Wolffenbuttel;
    In Procedia Engineering (Eurosensors 2016),
    pp. 55-58, 2016.

  589. High Definition Flex-to-Rigid (HD F2R): an Interconnect Substrate Technology
    Ronald Stoute; Marcus C. Louwerse; Vincent A. Henneken; Ronald Dekker;
    In ICT.OPEN,
    2016.

  590. Origami Assembly Platform for Smart Medical Instruments
    Ronald Stoute, Marcus C. Louwerse, Vincent A. Henneken, Ronald Dekker;
    In 28th Conference of the international Society for Medical Innovation and Technology,
    2016.

  591. Mass sensitivity of aluminum nitride thin film based surface acoustic wave sensors prepared for biosensing application
    Ying-ge Li; Lian-xiang Ma; P. M. Sarro; Dong-xing Du; Xue-feng Liu;
    In Symposium on Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA),
    pp. 368-370, 2016.

  592. CMOS compatible embedded microchannels
    R. Stoute; J.M. Muganda; S. Dahar; A. Arslan; R.J.M Henderikx; P.C.M. van Stiphout; J.M.J. den Toonder; R. Dekker;
    In 20th International Conference on Miniaturized Systems for Chemistry and Life Sciences,
    2016.

  593. Reliability optimization of gold-tin eutectic die attach layer in HEMT package
    Hao Zhang; Jiajie Fan; Jing Zhang; Cheng Qian; Xuejun Fan; Fenglian Sun; Guoqi Zhang;
    In 13th China International Forum on Solid State Lighting (SSLChina),
    2016.
    document

  594. Intravascular Ultrasound at the Tip of a Guidewire: Concept and First Assembly Steps
    Ronald Stoute; Marcus C. Louwerse; Vincent A. Henneken; Ronald Dekker;
    In Procedia Engineering: Proceedings of the 30th anniversary Eurosensors Conference,
    pp. 1563-1567, 2016.

  595. Metallic Nanoparticle Based Interconnect for Heterogeneous 3D Integration
    Zeijl, H. W. V.; Y. Carisey; A. Damian; R. H. Poelma; A. Zinn; GuoQi Zhang;
    In IEEE 66th Electronic Components and Technology Conference (ECTC),
    2016.
    document

  596. Tailoring material properties for 3D microfabrication: In-situ experimentation and multi-scale modelling
    Poelma, R. H.; X. J. Fan; E. Schlangen; H. W. v. Zeijl; GuoQi Zhang;
    In 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    2016.
    document

  597. 3D interconnect technology based on low temperature copper nanoparticle sintering
    Boyao Zhang; Y. C. P. Carisey; A. Damian; R. H. Poelma; GuoQi Zhang; H. W. v. Zeijl;
    In 17th International Conference on Electronic Packaging Technology (ICEPT),
    2016.
    document

  598. High Aspect Ratio Buried Channel Fabricated Using Two Step DRIE Process
    M. M. Kluba; A. Arslan; R. Dekker;
    In ICT.OPEN,
    2016.

  599. Precision recess of AlGaN/GaN with controllable etching rate using ICP-RIE oxidation and wet etching
    R. Sokolovskij; J. Sun; F. Santagata; E. Iervolino; S. Li; G.Y. Zhang; P.M.Sarro; GuoQi Zhang;
    In Procedia Engineering: Proceedings of the 30th anniversary Eurosensors Conference,
    pp. 1094-1097, 2016.

  600. PEDOT:PDMS: a conductive and flexible polymer for sensor integration in Organ-on-Chip platforms
    W.Quiros Solano; N.Gaio; C. Silvestri; G. Pandraud; P.M. Sarro;
    In Procedia Engineering: Proceedings of the 30th anniversary Eurosensors Conference,
    pp. 1184-1187, 2016.

  601. A calorimetry-based measurement apparatus for switching losses in high power electronic devices
    D. Iero; F.G. Della Corte; G. Fiorentino; P.M. Sarro;
    In IEEE International Energy Conference,
    pp. 1-5, 2016.

  602. Characterization of Thermal Expansion Coefficient of LPCVD Polycrystalline SiC Thin Films Using Two Section V-beam Actuators
    S. Thomas; A. Jovic; B. Morana; F. Buja; A. Gkouzou; G. Pandraud; P.M. Sarro;
    In Procedia Engineering: Proceedings of the 30th anniversary Eurosensors Conference,
    pp. 1144-1147, 2016.
    document

  603. High sensitive gas sensors realized by a transfer-free process of CVD graphene
    Filiberto Ricciardella; Sten Vollebregt; Tiziana Polichetti; Brigida Alfano; Ettore Massera; Lina Sarro;
    In Proceedings of the IEEE Sensors conference,
    2016.

  604. Effect of the interruption of the propagation path on the response of surface acoustic wave transducers
    Thu Hang Bui; An Tran; Bruno Morana; Jia Wei; Trinh Chu Duc; P.M. Sarro;
    In Proceedings of the IEEE Sensors conference,
    2016.

  605. Flexible/Stretchable Ultrasound Body Patches
    Shivani Joshi; Sourush Yazdi; Vincent Henneken; Rene Sanders; Ronald Dekker;
    In ICT.OPEN Conference,
    2016.

  606. Effect of Nanostructure in Microporous Surfaces on Pool Boiling Augmentation
    A. M. Gheytaghi; H. Saffari; G. Q. Zhang;
    In 5th Micro and Nano Flows Conference,
    2016.

  607. A predefined wafer-scale CVD graphene deposition method requiring no transfer
    Sten Vollebregt; Lina Sarro;
    In Graphene Week,
    2016.

  608. Solving the Nonlinear Heat Conduction in a Spherical Coordinate with Electrical Simulation
    A. M. Gheitaghy; H. Saffari; GuoQi Zhang;
    In 18th International Conference on Thermal Engineering,
    2016.

  609. All-SiC surface micromachined nanoreactor for in-situ transmission electron microscopy
    B. Morana; C. Silvestri; J.F. Creemer; P.M. Sarro;
    In Proc. of the 29th IEEE International Conference of Micro Electro Mechanical Systems,
    pp. 753-756, 2016.

  610. Fabrication process of Si microlenses for OCT systems
    A. Jovic; G. Pandraud; K. Zinoviev; J. L. Rubio; E. Margallo; P. M. Sarro;
    In Proc. SPIE 9888, Micro-Optics,
    2016.
    document

  611. A novel mixing surface acoustic wave device for liquid sensing applictions
    Thu Hang Bui; B, Morana; T. Scholtes; T. Chu Duc; P.M. Sarro;
    In Proc. of the 29th IEEE International Conference of Micro Electro Mechanical Systems,
    pp. 745-748, 2016.

  612. A transfer-free wafer-scale CVD graphene fabrication process for MEMS/NEMS sensors
    S. Vollebregt; B. Alfano; F. Ricciardella; A.J.M. Giesbers; Y. Grachova; H.W. van Zeijl; T. Polichetti; P.M. Sarro;
    In Proc. of the 29th IEEE International Conference of Micro Electro Mechanical Systems,
    pp. 17-20, 2016.

  613. Thermal analysis and optimization of IGBT power electronic module based on layout model
    Hongyu Tang; Huaiyu Ye; Mingming Wang; Xuejun Fan; GuoQi Zhang;
    In ICEPT,
    2016.

  614. Flexible membrane sensor for opto-mechanical force transducer
    Ronald Stoute; James Muganda; Steven Beekmans; Davide Iannuzzi; Ronald Dekker;
    In 13th International Workshop on Nanomechanical Sensing,
    2016.

  615. Flex-to-Rigid, an assembly platform for the next generation smart catheters
    R. Dekker;
    In Forum BE-FLEXIBLE,
    Fraunhofer EMFT, 2016.

  616. Origami assembly platform for smart medical instruments
    R. Stoute; M. C. Louwerse; V. A. Henneken; R. Dekker;
    In 28th Conference of the international Society for Medical Innovation and Technology (iSMIT) / 4th Design of Medical Devices Conference,
    2016.
    document

  617. Towards the Next Generation of Smart Catheters
    R. Dekker;
    In SEMICON Europa,
    2016.

  618. Meet Dr. Frankenstein
    Dekker R.;
    In ICT.OPEN 2016,
    2016.

  619. Software-Defined, WiFi and BLE Compliant Back-Channel for Ultra-Low Power Wireless Communication
    Huajun Zhang; David D. Wentzloff; Hun Seok Kim;
    In 2016 IEEE Global Communications Conference (GLOBECOM),
    IEEE, December 2016. DOI: 10.1109/glocom.2016.7842275
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  620. Meet Dr. Frankenstein
    R. Dekker;
    Guest Lecture at École Polytechnique Fédérale de Lausanne, November 2016.
    document

  621. Reinforced structure for a stack of layers in a semiconductor component
    HP Hochstenbach; van Driel, Willem;
    10 2016.

  622. Fast-Settling Capacitive-Coupled Amplifiers
    J.H. Huijsing; Qinwen Fan; K.A.A. Makinwa; D. Fu; J. Wu; L. Zhou;
    Patent, 9,294,049, March 22 2016.

  623. Multi-scale Material and Technology for Heterogeneous Integration
    Rene Poelma;
    PhD thesis, Delft University of Technology, 2016.

  624. Flexible CMOS Single-Photon Avalanche Diode Image Sensor Technology
    Pengfei Sun;
    PhD thesis, Delft University of Technology, 2016.
    document

  625. Liquid Silicon for Printed Polycrystalline Silicon Thin-Film Transistors on Paper
    Miki Trifunovic;
    PhD thesis, Delft University of Technology, 2016.
    document

  626. Interface Properties of Group-III-Element Deposited-Layers Integrated in High-Sensitivity Si Photodiodes
    Lin Qi;
    PhD thesis, Delft University of Technology, 2016.

  627. Optical degradation mechanisms and accelerated reliability evaluation for LEDs
    Jianlin Huang;
    PhD thesis, Delft University of Technology, 2016.

  628. System in package for intelligent lighting and sensing applications
    Mingzhi Dong;
    PhD thesis, Delft University of Technology, 2016.
    document

  629. Design and fabrication of a foldable 3D silicon based package for solid state lighting applications
    R. Sokolovskij; Pan Liu; H.W. van Zeijl; B. Mimoun; GuoQi Zhang;
    Journal of Micromechanics and Microengineering,
    Volume 25, Issue 5, pp. 055017, 2015.

  630. Optimization of LED light spectrum to enhance colorfulness of illuminated objects with white light constraints
    H. Wu; J. Dong; G. Qi; GuoQi Zhang;
    Journal of the Optical Society of America A,
    Volume 32, Issue 7, pp. 1262-1270, 2015.

  631. Optimal Design of Life Testing for High Brightness White LEDs Using the Six Sigma DMAIC Approach
    Chuen Yung; Xuejun Fan; GuoQi Zhang; Michael Pecht;
    IEEE Transactions on Device and Materials Reliability,
    Volume 15, Issue 4, pp. 576-587, 2015.

  632. Ab Initio Study of Temperature, Humidity, and Covalent Functionalization-Induced Bandgap Change of Single-Walled Carbon Nanotubes
    Xian-Ping Chen; Ning Yang; Jun-Ke Jiang; Qiu-Hua Liang; Dao-Guo Yang; GuoQi Zhang;
    IEEE Electron Device Letters,
    Volume 36, Issue 6, 2015.

  633. Rapid degradation of mid-power white-light LEDs in saturated moisture conditions
    Jianlin Huang, D. S. Golubovic, S. Koh, D. Yang, X. Li, X. Fan,; GuoQi Zhang;
    IEEE Transactions on Device and Materials Reliability,
    Volume 15, Issue 4, pp. 478-485, 2015.

  634. Light-Emitting n-ZnO Nanotube/n+-GaAs Heterostructures Processed at Low Temperatures
    F. Karegar; M. Kolahdouz; F. D. Nayeri; R. Soleimanzadeh; M. Hosseini; Z Kolahdouz; GuoQi Zhang;
    IEEE Photonics Technology Letters,
    Volume 27, Issue 13, pp. 1430-1433, 2015.

  635. Degradation modeling of mid-power white-light LEDs by using Wiener process
    Jianlin Huang; D. S. Golubović; S. Koh; D. Yang; X. Li; X. Fan; GuoQi Zhang;
    Optics Express,
    Volume 23, pp. A966-A978, 2015.

  636. Sequential microwave-assisted ultra-fast ZnO nanorod growth on optimized sol–gel seedlayers
    R. Soleimanzadeh; M. S. S. Mousavi; A. Mehrfar; Z. Kolahdouz; M. Kolahdouz; GuoQi Zhang;
    Journal of Crystal Growth,
    Volume 426, pp. 228-233, 2015.

  637. Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests
    Jianlin Huang, D. S. Golubović, S. Koh, D. Yang, X. Li, X. Fan,; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 55, Issue 2654-2662, 2015.

  638. Highly selective and responsive ultra-violet detection using an improved phototransistor
    R. Soleimanzadeh; M. Kolahdouz; M. A. Charsooghi; Z. Kolahdouz; GuoQi Zhang;
    Applied Physics Letters,
    Volume 106, Issue 23, pp. 231102, 2015.

  639. Degradation Mechanisms of Mid-power White-light LEDs under High Temperature-Humidity Conditions
    Jianlin Huang; D.S. Golubović; S. Koh; D. Yang; X. Li; X. Fan; GuoQi Zhang;
    IEEE Transactions on Device and Materials Reliability,
    Volume 15, Issue 2, pp. 220-228, 2015.

  640. SiNW-FET in-Air Biosensors for High Sensitive and Specific Detection in Breast Tumor Extract
    Puppo, F.; Doucey, Marie-Agnes; Delaloye, Jean-Francois; Moh, T.S.Y.; Pandraud, G.; Sarro, P.M.; De Micheli, G.; Carrara, S.;
    IEEE Sensors Journal,
    2015.

  641. Manufacturing uniform field silicon drift detector using double boron layer
    Negin Golshani; C.I.M Beenakker; Ryoichi Ishihara;
    Nuclear Instruments and Methods in Physics Research Section A,
    Volume 794, pp. 206-214, 2015.

  642. Degradation of Microcellular PET Reflective Materials Used in LED-based Products
    Guangjun Lu; W.D. van Driel; Xuejun Fan; M. Yazdan Mehr; Jiajie Fan; K.M.B. Jansen; GuoQi Zhang;
    Optical Materials,
    Volume 49, pp. 79-84, 2015.

  643. Solution-processed polycrystalline silicon on paper
    M. Trifunovic; T. Shimoda; R. Ishihara;
    Applied Physics Letters,
    Volume 106, pp. 163502, 2015.

  644. Low loss single-crystal silicon mechanical resonators for the investigation of thermal noise statistical properties
    E.Serra; M. Bonaldi; A.Borrielli; L.Conti; G. Pandraud; P. M. Sarro;
    Sensors and Actuators A: Physical,
    Volume 227, pp. 48-54, 2015.

  645. Fabrication of Low Temperature Carbon Nanotube Vertical Interconnects Compatible with Semiconductor Technology
    S. Vollebregt; R. Ishihara;
    Journal of Visual Experiments,
    Volume 106, pp. e53260, 2015.
    document

  646. First-principles study of the effect of functional groups on polyaniline backbone
    X P Chen; J K Jiang; Q H Liang; N Yang; Huaiyu Ye; M Cai; L Shen; D G Yang; T L Ren;
    Scientific Reports,
    Volume 5, pp. 16907, 2015.

  647. Color shift investigations for LED secondary optical designs: Comparison between BPA-PC and PMMA
    Guangjun Lu; M. Yazdan Mehr; W.D. van Driel; Xuejun Fan; Jiajie Fan; K.M.B. Jansen; GuoQi Zhang;
    Optical Materials,
    Volume 45, pp. 37-41, 2015.

  648. Impact of the atomic layer deposition precursors diffusion on solid-state carbon nanotube based supercapacitors performances
    G Fiorentino; S Vollebregt; FD Tichelaar; R Ishihara; PM Sarro;
    IOP Nanotechnology,
    Volume 26, Issue 6, pp. 064002, 2015.
    document

  649. Dynamical back-action effects in low loss optomechanical oscillators
    A. Pontin; M. Bonaldi; A. Borrielli; F. Marino; L. Marconi; A. Bagolini; G. Pandraud; E. Serra; G.A. Prodi; F. Marin;
    Annalen der Physik,
    Volume 527, Issue 1-2, pp. 89-99, 2015.

  650. High-ohmic resistors fabricated by PureB layer for silicon drift detectors applications
    Negin Golshani; Jaber Derakhshandeh; C.I.M. Beenakker; R. Ishihara;
    Solid-State Electronics,
    Volume 105, pp. 6-11, 2015.

  651. 3D system-in-package design using stacked silicon submount technology
    Mingzhi Dong; Fabio Santagata; Robert Sokolovskij; Jia Wei; Cadmus Yuan; GuoQi Zhang;
    Microelectronics International,
    Volume 32, Issue 2, pp. 63-72, 2015.

  652. Fabrication and characterization of low loss MOMS resonators for cavity opto-mechanics
    E. Serra; M. Bonaldi; A. Borrielli; F. Marin; L. Marconi; F. Marino; G. Pandraud; A. Pontine; G.A. Prodi; P.M. Sarro;
    Microelectronic Engineering,
    2015.
    document

  653. Role of atomic layer deposited aluminum oxide as oxidation barrier for silicon based materials
    G. Fiorentino; B. Morana; S. Forte; P.M .Sarro;
    Journal of Vacuum Science and Technology A,
    Volume 33, pp. 01A142, 2015.

  654. Ingredients for sensors science
    Arnaldo D'Amicoa; Corrado Di Natalea; Pasqualina M. Sarro;
    Sensors and Actuators B: Chemical,
    Volume 207, pp. 1060-1068, 2015.

  655. Structured film for compensation of anthropogenic radiative forcing
    G. Vdovin; P.M. Sarro; O. Soloviev; M. Loktev; R. Angel;
    Optics Letters,
    2015.

  656. Mechanics of graphene and carbon nanotubes under uniaxial compression and tension
    R. H. Poelma; GuoQi Zhang;
    In Molecular Modeling and Multiscaling Issues for Electronic Materials Applications,
    Springer, 2015.

  657. Heart on a Chip, a marriage between cell biology and microfabrication
    Dekker R.;
    In Personalized Medicine and Health Research 2015,
    2015.

  658. Living Chips - Chips for the Living
    Dekker R.;
    In IEEE International Symposium on Circuits and Systems (ISCAS 2015),
    2015.
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  659. A 110dB SNR ADC with ±30V input common-mode range and 8¿V Offset for current sensing applications
    L. Xu; B. Gönen; Qinwen Fan; J.H. Huijsing; K.A.A. Makinwa;
    In M Romdhane; LC Fujino; J Anderson (Ed.), Proceedings of the 2015 IEEE International Solid-State Circuits Conference,
    IEEE, pp. 89-91, 2015. Harvest Session 5.2.

  660. From Chips in Organs to Organ-on-Chip
    Dekker R.;
    In Semicon Europe 2015,
    2015.

  661. Doped Carbon Nanotubes for Interconnects
    J. Robertson; S. Esconjauregui; L. D’Arsie; J. Yang; H. Sugime; G. Zhong; Y. Guo; S. Vollebregt; R. Ishihara; C. Cepek; G. Duesberg; T. Hallam;
    In Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials (SSDM),
    2015.

  662. A novel processing concept for reduction of substrate artifacts in ultrasound transducer arrays
    A.Savov; A. H. Noor; R. Dekker;
    In Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2015 10th International,,
    pp. 145-148, 2015.

  663. Living Chips - Chips for the Living
    Dekker R.;
    In Euromat 2015,
    2015.

  664. Living Chips - Chips for the Living
    Dekker R.;
    In Sense of Contact 17,
    Federatie van Technologiebranches, 2015.
    document

  665. Carbon nanotubes TSV grown on an electrically conductive ZrN support layer
    Sten Vollebregt; Sourish Banerjee; Frans D. Tichelaar; Ryoichi Ishihara;
    In IEEE International Interconnect Technology Conference,
    pp. 281-283, 2015.

  666. A measurement apparatus for switching losses based on an heat-flux sensor
    Iero, Demetrio; Della Corte, Francesco G.; Fiorentino, Giuseppe; Sarro, Pasqualina M.; Morana, B.;
    In AISEM Annual Conference,
    pp. 1-4, 2015.

  667. Molybdenum grown CVD graphene Schottky diodes
    S. Vollebregt; F. Ricciardella; Y. Grachova; T. Polichetti; P.M. Sarro;
    In Graphene Week,
    2015.

  668. Tunable binary fresnel lens based on stretchable PDMS/CNT compsite
    Xueming Li; L. Wei; S. Vollebregt; R. Poelma; Y. Shen; Jia Wei; P. Urbach; P.M. Sarro; GuoQi Zhang;
    In Transducers,
    pp. 2041-2044, 2015.

  669. Silicon-PDMS optofluidic integration
    Testa Genni; Gianluca Persichetti; Pasqualina M. Sarro; Romeo Bernini;
    In Proc. SPIE 9367, Silicon Photonics X,
    pp. 936718, 2015.

  670. Design dependent SRAM PUF robustness analysis
    M. Cortez; S. Hamdioui; R. Ishihara;
    In 16th IEEE Latin-American Test Symposium,
    2015.

  671. Optimization of Silicon-rich Silicon Nitride Films for Electron Multiplication in Timed Photon Counters
    V. Prodanovic; H.W. Chan; J. Smedley; A. Theulings; S. Tao; H.v.d. Graaf; P.M. Sarro;
    In Procedia Engineering 120: EUROSENSORS 2015,
    pp. 1111-1114, 2015.

  672. Crystallinity variations over the length of vertically aligned carbon nanotubes grown by chemical vapour deposition
    S. Vollebregt; P. Padmanabhan; C. Silvestri; P.M. Sarro;
    In 41st Micro and Nano Engineering conference,
    2015.

  673. The Role of Edge Defects in Liquid Phase Exfoliated and Chemical Vapor Deposited Graphene for NO2 Detection
    F Ricciardella; S Vollebregt; T Polichetti; B Alfano; PM Sarro; ML Miglietta; E Massera; G Di Francia;
    In GraphITA,
    2015.

  674. SAW device for liquid vaporization rate and remaining molecule sensing
    Thu Hang Bui; Bruno Morana; An Tran; Tom Scholtes; Trinh Chu Duc; Pasqualina M. Sarro;
    In IEEE Sensors Conference,
    2015.

  675. Upside-down Carbon Nanotube (CNT) Micro-electrode Array (MEA)
    N. Gaio; B. van Meer; C. Silvestri; Saeed Khoshfetrat Pakazad; S. Vollebregt; C.L. Mummery; R. Dekker;
    In IEEE Sensors Conference,
    2015.

  676. A Flexible 32�32 SPAD Image Sensor with Integrated Microlenses
    Pengfei Sun; E. Charbon; R.Ishihara;
    In International Image Sensor Workshop,
    2015.

  677. Conformable Body Patches for Ultrasound Applications
    S. Joshi; S. Yazadi; V. Henneken; R. Sanders; R. Dekker;
    In 17th IEEE Electronics Packaging Technology Conference,
    2015.

  678. Miniaturized Optical Data Link Assembly for 360 �m Guidewires
    Stoute, Ronald; Louwerse, Marcus C.; van Rens, Jeannet; Henneken, Vincent A.; Dekker, Ronald;
    In ICT.OPEN Conference,
    pp. 46-51, 2015.
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  679. On-chip double slot antenna at 300 GHz enhanced by artificial dielectrics
    Syed, W. H.; Fiorentino, G.; Cavallo, D.; Sarro, P. M.; Neto, A.;
    In Eur. Conf. Antennas Propag.,
    2015.

  680. Modelling of Carbon Nanotube Arrays with Analytical and Numerical Methods
    X. J. Fan; R. H. Poelma; L. Chen; GuoQi Zhang;
    In ASME International Mechanical Engineering Congress and Exposition,
    2015.

  681. Living Chips - Chips for the Living
    Dekker R.;
    In Life Science on a Chip,
    MinacNed - Trade Association for MicroNano Technology, March 2015.

  682. Solution-Processed Poly-Si TFTs at Paper Compatible Temperatures
    Miki Trifunovic; Jin Zhang; Michiel van der Zwan; Tatsuya Shimoda; Ryoichi Ishihara;
    In SID Symposium Digest of Technical Papers,
    pp. 415-418, 2015.

  683. Performance enhancement of 300 GHz on-chip double slot antenna by means of artificial dielectrics
    Syed, W. H.; Fiorentino, G.; Cavallo, D.; Sarro, P. M.; Neto, A.; Lager, I. E.;
    In 45th European Microwave Conference,
    2015.

  684. Solution-Processed LTPS on Paper
    Ryoichi Ishihara; Miki Trifunovic; Paolo Sberna; Tatsuya Shimoda;
    In Proceeding of IDW �15, The 22nd International Display Workshop,
    2015.

  685. Wafer-level fabrication of strain gauges on PDMS membranes for low-pressure sensing
    William Quiros Solano; Gregory Pandraud; Pasqualina M. Sarro;
    In IEEE Sensors Conference,
    2015.

  686. Liquid-Si Technology for High-Speed Circuits on Flexible Substrates
    Jin Zhang;
    PhD thesis, Delft University of Technology, 2015.
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  687. Low temperature PureB technology for CMOS compatible photodetectors
    Vahid Mohammadi;
    PhD thesis, Delft University of Technology, 2015.
    document

  688. Silicon Carbide Technologies applied to MEMS Nanoreactors for in-situ Transmission Electron Microscopy
    Bruno Morana;
    PhD thesis, Delft University of Technology, 2015.

  689. Development of Silicon Drift Detectors using Boron layer technology
    Negin Golshani;
    PhD thesis, Delft University of Technology, 2015.
    document

  690. High Aspect-Ratio MEMS Devices for the next generation of THZ/MHZ Passive Components
    Giuseppe Fiorentino;
    PhD thesis, Delft University of Technology, 2015.
    document

  691. Single-grain Silicon Technology for Large Area X-ray Imaging
    Aslihan Arslan;
    PhD thesis, Delft University of Technology, 2015.
    document

  692. Fast Qualification of Solder Reliability in Solid-state Lightning System
    Jing Zhang;
    PhD thesis, Delft University of Technology, 2015.
    document

  693. Stretchable Micro-Electrode Arrays for Electrophysiology
    Saeed Khoshfetrat Pakazad;
    PhD thesis, Delft University of Technology, 2015.
    document

  694. Organic Materials Degradation in Solid State Lighting Applications
    Maryam Yazdan Mehr;
    PhD thesis, Delft University of Technology, 2015.
    document

  695. Fabrication and application of temperature triggered MEMS switch for active cooling control in solid state lighting system
    Huaiyu Ye; Jai Wei; van Zeijl, HW; Sarro, PM; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 54, Issue 6-7, pp. 1338-1343, 2014.

  696. A Flexible Ultrathin-Body Single-Photon Avalanche Diode With Dual-Side Illumination
    Pengfei Sun; Charbon, E.; Ishihara, R.;
    IEEE Journal of Selected Topics in Quantum Electronics,
    Volume 20, Issue 6, pp. 1-8, Nov 2014.
    document

  697. Research Update: Reactively sputtered nanometer-thin ZrN film as a diffusion barrier between Al and boron layers for radiation detector applications
    Golshani, Negin; Mohammadi, V.; Schellevis, H.; Beenakker, C. I. M.; Ishihara, R.;
    APL Materials,
    Volume 2, Issue 10, pp. 100702, 2014.
    document

  698. A novel stretchable micro-electrode array (SMEA) design for directional stretching of cells
    S Khoshfetrat Pakazad; A Savov; A van de Stolpe; R Dekker;
    Journal of Micromechanics and Microengineering,
    Volume 24, Issue 3, pp. 034003, 2014.

  699. Surface aspects of discolouration in Bisphenol A Polycarbonate (BPA-PC), used as lens in LED-based products
    Maryam Yazdan Mehr; W. D. van Driel; H. Udono; GuoQi Zhang;
    Optical Materials,
    Volume 37, pp. 155-159, 2014.

  700. Atomic-scale imaging of Pt and Pd nanoparticle catalysts during CO oxidation at 1 Bar reaction conditions
    Vendelbo, SB; Elkjaer, CF; Puspitasari, I; Creemer, JF; Dona, P; Mele, L; Morana, B; Nelissen, BJ; Roobol, S; Rijn, R van; Helveg, S; Kooyman, PJ;
    Microscopy and Microanalysis,
    Volume 20, Issue S3, pp. 1570-1571, 2014.

  701. Electrical-thermal-luminous-chromatic model of phosphor-converted white light-emitting diodes
    Huaiyu Ye; Sau Wee Koh; Cadmus Yuan; Henk van Zeijl; Alexander W.J. Gielen; Shi-Wei Ricky Lee; GuoQi Zhang;
    Applied Thermal Engineering,
    Volume 63, Issue 2, pp. 588-597, 2014.

  702. Multi-modal vibration based MEMS energy harvesters for ultra-low power wireless functional nodes
    Iannacci, J; Serre, E; Di Criscienzo, R; Sordo, G; Gottardi, M; Borrielli, A; Bonaldi, M; Kuenzig, T; Schrag, G; Pandraud, G; Sarro, PM;
    Microsystem Technologies: micro and nanosystems - information storage and processing systems,
    Volume 20, Issue 4-5, pp. 627-640, 2014.

  703. Flow-Through Cell Electroporation Microchip Integrating Dielectrophoretic Viable Cell Sorting
    Zewen Wei; Xueming Li; Deyao Zhao; Hao Yan; Zhiyuan Hu; Zicai Liang; Zhihong Li;
    Analytical chemistry,
    Volume 86, Issue 20, pp. 10215-10222, 2014.

  704. Thermal and mechanical effects of voids within flip chip soldering in LED packages
    Yang Liu; Stanley Y.Y. Leung; Jia Zhao; Cell K.Y. Wong; Cadmus A. Yuan; GuoQi Zhang; Fenglian Sun; Liangliang Luo;
    Microelectronics Reliability,
    Volume 54, Issue 9-10, pp. 2028-2033, 2014.

  705. Self-healing thermally conductive adhesives
    Lafont, UL; Moreno Belle, C.; Zeijl, HW van; Zwaag, S van der;
    Journal of Intelligent Material Systems and Structures,
    Volume 25, Issue 1, pp. 67-74, 2014.

  706. Dominant thermal boundary resistance in multi-walled carbon nanotube bundles fabricated at low temperature
    Vollebregt, Sten; Banerjee, Sourish; Chiaramonti, Ann N; Tichelaar, Frans D; Beenakker, Kees; Ishihara, Ryoichi;
    Journal of Applied Physics,
    Volume 116, Issue 2, pp. 023514, 2014.

  707. Carbon nanotube vertical interconnects fabricated at temperatures as low as 350 �C
    Vollebregt, Sten; Tichelaar, FD; Schellevis, H; Beenakker, CIM; Ishihara, R;
    Carbon,
    Volume 71, pp. 249--256, 2014.

  708. Stiction-Induced Sealing of Surface Micromachined Channels
    B Morana; RH Poelma; G Fiorentino; J Wei; JF Creemer; PM Sarro;
    Journal of Microelectromechanical Systems,
    Volume 23, Issue 2, pp. 459-470, 2014.
    document

  709. Single-Grain Si Thin-Film Transistors for Monolithic 3D-ICs and Flexible Electronics:
    Ryoichi ISHIHARA; Jin ZHANG; Miki TRIFUNOVIC; Jaber DERAKHSHANDEH; Negin GOLSHANI; Daniel M.R. TAJARI MOFRAD; Tao CHEN; Kees BEENAKKER; Tatsuya SHIMODA;
    IEICE Transactions on Electronics,
    Volume E97.C, Issue 4, pp. 227--237, 2014.

  710. Failure Analysis and Reliability of Low-Temperature-Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
    Chiaramonti, Ann N; Vollebregt, Sten; Sanders, Aric W; Ishihara, Ryoichi; Read, David T;
    Microsc. Microanal,
    Volume 20, pp. 1762-1763, 2014.

  711. Reliability and optical properties of LED lens plates under high temperature stress
    Maryam Yazdan Mehr; van Driel, WD; Koh, SW; GuoQi Zhang;
    Microelectronics Reliability,
    2014.

  712. Tailoring the Mechanical Properties of High-Aspect-Ratio Carbon Nanotube Arrays using Amorphous Silicon Carbide Coatings
    Poelma, RH; Morana, Bruno; Vollebregt, Sten; Schlangen, Erik; van Zeijl, HW; Fan, Xuejun; Zhang, GuoQi;
    Advanced Functional Materials,
    Volume 24, Issue 36, pp. 5737-5744, 2014.
    document

  713. Accelerated life time testing and optical degradation of remote phosphor plates
    Maryam Yazdan Mehr; van Driel, WD; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 54, Issue 8, pp. 1544-1548, 2014.

  714. A polymer based miniature loop heat pipe with silicon substrate and temperature sensors for high brightness light-emitting
    Huaiyu Ye; Sokolovskij, R; van Zeijl, HW; Gielen, AWJ; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 54, Issue 6-7, pp. 1355-1362, 2014.

  715. Lifetime assessment of Bisphenol-A Polycarbonate (BPA-PC) plastic lens, used in LED-based products
    Maryam Yazdan Mehr; van Driel, WD; Jansen, KMB; Deeben, P; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 54, Issue 1, pp. 138-142, 2014.

  716. Multi-physics reliability simulation for solid state lighting drivers
    Tarashioon, S; van Driel, WD; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 54, Issue 6-7, pp. 1212-1222, 2014.

  717. Visualization of oscillatory behaviour of Pt nanoparticles catalysing CO oxidation
    Vendelbo, SB; Elkj{\ae}r, CF; Falsig, H; Puspitasari, I; Dona, P; Mele, L; Morana, B; Nelissen, BJ; Rijn, R van; Creemer, JF; Kooyman, PJ; Helveg, S;
    Nature Materials,
    Volume 13, Issue 9, pp. 884-890, 2014.

  718. A hybrid silicon-PDMS optofluidic platform for sensing applications
    Testa, G; Persichetti, G; Sarro, PM; Bernini, R;
    Biomedical Optics Express,
    Volume 5, Issue 2, pp. 417-426, 2014.

  719. Formation and evolution of intermetallic layer structures at SAC305/Ag/Cu and SAC0705-Bi-Ni/Ag/Cu solder joint interfaces after reflow and aging
    Yang Liu; Joost Meerwijk; Liangliang Luo; Honglin Zhang; Fenglian Sun; Cadmus A. Yuan; GuoQi Zhang;
    Journal of Materials Science: Materials in Electronics,
    Volume 25, Issue 11, pp. 4954-4959, 2014.

  720. RF-noise modeling in advanced CMOS technologies
    Smit, GDJ; Scholten, AJ; Pijper, RMT; Tiemeijer, LF; van der Toorn, R; Klaassen, D.B.M;
    IEEE Transactions on Electron Devices,
    Volume 61, Issue 2, pp. 245-254, 2014.

  721. Amorphous silicon carbide nitride layer as an alternative to a disordered silicon surface to suppress RF/microwave losses
    Evseev, S; Nanver, LK; Rejaei Salmassi, B; Milosavljevic, S;
    Microelectronic Engineering,
    Volume 125, pp. 2-7, 2014.

  722. Design of silicon micro-resonators with low mechanical and optical losses for quantum optics experiments
    Borrielli, A; Bonaldi, M; Serre, E; Bagolini, A; Bellutti, P; Cataliotti, FS; Marin, F; Marino, F; Pontin, A; Prodi, GA; Pandraud, G; Sarro, PM; Lorito,; Zoumpoulidis, T;
    Microsystem Technologies,
    Volume 20, Issue 4-5, pp. 907-917, 2014.

  723. Single-Grain Si TFTs Fabricated From Sputtered Si on a Polyimide Substrate
    Jin Zhang; Michiel van der Zwan; Ryoichi Ishihara;
    Journal of Display Technology,
    Volume 10, Issue 11, pp. 945-949, 2014.

  724. Robust UV/VUV/EUV PureB Photodiode Detector Technology with High CMOS Compatibility
    L.K. Nanver; L. Qi; V. Mohammadi; K.R.M. Mok; W.B. de Boer; N. Golshani; A. Sammak; T.L.M. Scholtes; A. Gottwald; U. Kroth; F. Scholze;
    Journal of Selected Topics in Quantum Electronics,
    Volume 20, Issue 6, pp. pp.1-11, 2014.

  725. Fracture toughness of Cu-EMC interfaces in pressurized steam
    Sadeghinia, M; Jansen, KMB amd Ernst, LJ; Pape, H; Maus, I; van Driel, WD; GuoQi Zhang;
    International Journal of Adhesion and Adhesives,
    Volume 49, pp. 73-79, 2014.

  726. Temperature Dependency of the Kinetics of PureB CVD Deposition over Patterned Si/SiO2 Surfaces
    V. Mohammadi; N. Golshani; K.R.C. Mok; W.B. de Boer; J. Derakhshandeh; L.K. Nanver;
    Microelectronic Engineering,
    Volume 125, pp. 45-50, 2014.

  727. Establishment of the Mesoscale Parameters for Separation: A Nonequilibrium Molecular Dynamics Model
    Cell K. Y. Wong; S. Y. Y. Leung; R. H. Poelma; K. M. B. Jansen; C. C. A. Yuan; W. D. van Driel; GuoQi Zhang;
    In Molecular Modeling and Multiscaling Issues for Electronic Material Applications,
    Springer, 2014.

  728. Carbon Nanotube Vertical Interconnects: Prospects and Challenges
    Vollebregt, S; Beenakker, CIM; Ishihara, R;
    In Micro-and Nanoelectronics: Emerging Device Challenges and Solutions,
    CRC Press, 2014.

  729. High Sensitive Detection in Tumor Extracts with SiNW-FET in-Air Biosensors
    F. Puppo; M.-A. Doucey; J.-F. Delaloye; T.S.Y. Moh; G. Pandraud; P.M. Sarro; G. De Micheli; S. Carrara;
    In IEEE Sensors,
    pp. 866-869, 2014.

  730. Associated IDTs in Surface Acoustic Wave Devices for Closed-loop Control Inkjet System
    Thu Hang Bui; T. Bui Duc; T. Chu Duc; P.M. Sarro;
    In IEEE Sensors,
    pp. 1936-1939, 2014.

  731. Solution-processed Poly-Si TFTs Fabricated at a Maximum Temperature of 150 �C
    M. Trifunovic; Jin Zhang; M. van der Zwan; R. Ishihara;
    In Technical Digest � International Electron Devices Meeting,
    pp. 26.5.1-4, 2014.

  732. Reliability of LED-based Products is a Matter of Balancing Temperatures
    Maryam Yazdan Mehr; W.D. van Driel; GuoQi Zhang;
    In Therminic Conference,
    2014.

  733. A post processing approach for manufacturing high-density stretchable sensor arrays
    A. Savov; S. Khoshfetrat Pakazad; S. Joshi; V. Henneken; R. Dekker;
    In IEEE Sensors,
    pp. 1703-1705, 2014.

  734. Compact tunable optics for dynamic lighting
    Xueming Li and�Jia Wei and�Teng Ma and�Cadmus Yuan and�Lina Sarro and�GuoQi Zhang;
    In Optical Fabrication and Testing,
    2014.

  735. Vertical Interconnect technology for Wafer-Level-Packaging and 3D Integration
    H. W. v. Zeijl; R. H. Poelma; L. Wang; E. Boschman; F. Boschman; GuoQi Zhang;
    In nanoFIS 2014 - Functional Integrated nanoSystems,,
    2014.

  736. Microfabrication and characterization of single-mask silicon microlens arrays for the IR spectra
    Belmonte, PNA; de Lima Monteiro, DW; de Oliveira Costa, RF; French, PJ; Pandraud, G;
    In Micro-Optics 2014 Vol. 9130. Proceedings of SPIE- International Society for Optical Engineering,
    pp. 1-7, 2014.

  737. Correlation of activation energy between LEDs and luminaires in the lumen depreciation test
    Guangjun Lu; Yuan, C; Fan, X; GuoQi Zhang;
    In Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    pp. 1-3, 2014.

  738. A novel design of heatsink-less LED base fluorescent lamp retrofit
    Y. L. Jia Zhao; Hongyu Tang; Stanley Y Y Leung; Cadmus C A Yuan; GuoQi Zhang;
    In ICEPT2014,
    2014.

  739. Numerical modeling of flexible actuator for dynamic lighting
    Teng Ma; Xueming Li; Jia Wei; GuoQi Zhang; P. M. Sarro;
    In 15th International Conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems,
    2014.

  740. High Accelerated Optical Remote Phosphor Aging Studies for LED Luminaire Applications
    W. D. v. Driel; Maryam Yazdan Mehr; GuoQi Zhang;
    In 11th China SSL conference,
    2014.

  741. Blue Selective Photodiodes for Optical Feedback in LED Wafer Level Packages
    Z. Kolahdouz; A. Rostamian; M. Kolahdouz; T. Ma; H. V. Zeijl; GuoQi Zhang;
    In Solid-State Device Research Conference (ESSDERC), 2014 Proceedings of the European,
    pp. 174-177, 2014.

  742. Excimer Laser Annealing of Amorphous Oxide Thin-Film Transistors Passivated with Hybrid Passivation Layer
    J. P. S. Bermundo; Y. Ishikawa; M. N. Fujii; M. V. D. Zwan; T. Nonaka; R. Ishihara; Y. Uraoka;
    In The 21st International Display Workshops,
    2014.

  743. Single-Grain Si TFTs fabricated on a Precursor from Doctor-Blade Coated Liquid-Si
    Jin Zhang; M. Trifunovic; M. van der Zwan; H. Takagishi; T. Shimoda; R. Ishihara;
    In ECS and SMEQ Joint International Meeting,
    2014.

  744. Selective coating deposition on high Q single crystal silicon resonators for the investigation og thermal nois statistical properties
    E. Serra; M. Bonaldi; A. Borrielli; L. Conti; G. Pandraud; P.M. Sarro;
    In Procedia Engineering 87: EUROSENSORS 2014, the 28th European Conference on Solid-State Transducers,
    pp. 1485-1488, 2014.

  745. Developing High-Optical Quality Silicon Resonators Working in the Quantum Regime
    E. Serra, M. Bonaldi, A. Borrielli, F. Marin, L. Marconi, F. Marino, G. Pandraud, A. Pontin, G.A. Prodi; P.M. Sarro;
    In 40th Micro and Nano Engineering Conference,
    2014.

  746. Electro-thermal simulation and characterization of vertically aligned CNTs directly grown on a suspended microhoplate for thermal management applications
    C. Silvestri; P. Piacciafoco; B. Morana; F. Santagata; GuoQi Zhang; P.M. Sarro;
    In IEEE Sensors,
    pp. 827-830, 2014.
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  747. Front-to-back ratio enhancement of on-chip antenna using artificial dielectrics at 300 GHz
    Syed, WH; Fiorentino, G; Cavallo, D; Spirito, M; Neto, A; Sarro, PM;
    In Proceedings - 2014 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium),
    pp. 140, 2014.

  748. Miniaturized particulate matter sensor for portable air quality monitoring devices
    Xueming Li; E Iervolino; F Santagata; Jia Wei; Cadmus Yuan; PM Sarro; GuoQi Zhang;
    In IEEE Sensors,
    pp. 2151-2154, 2014.

  749. Microfabrication of ultra-thin transmission dynodes for electron amplification
    V. Prodanovic;
    In Proc. of the IEEE Nuclear Science Symposium and Medical Imaging Conference,
    2014.

  750. Colour shift in remote phosphor based LED products
    Maryam Yazdan Mehr; Driel, WD van; GuoQi Zhang;
    In Proceedings - 64th Electronic Components and Technology Conference,
    pp. 1477-1481, 2014.

  751. Influences of viscoelasticity of polybutylene terephthalate (PBT) on the thermal interface contact of LED spotlight module
    Hongyu Tang; Yu, Y; Jia, M; Leung, SYY; Qian, C; Cadmus Yuan; Zhou, X; GuoQi Zhang;
    In Proceedings of the 15th International Conference on Electronic Packaging Technology,
    pp. 1198-1201, 2014.

  752. Solution processed single-grain Si TFTs on a plastic substrate
    Ishihara, R; Jin Zhang,; Zwan, M van der; Trifunovic, M; Takagishi, H; Shimoda, T;
    In SID International symposium digest of technical papers Vol. 45. SID International Symposium. Digest of Technical Papers,
    pp. 439-442, 2014.

  753. High Quality Wafer-scale CVD Graphene on Molybdenum Thin Film for Sensing Application
    Yelena Grachova; Sten Vollebregt; Andrea Leonardo Lacaita; Pasqualina M. Sarro;
    In Procedia Engineering 87: EUROSENSORS 2014, the 28th European Conference on Solid-State Transducers,
    pp. 1501-1504, 2014.
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  754. Investigation of lumen degradation mechanisms of mid-power LED by HAST
    Jianlin Huang; Koh, SW; Xueming Li; GuoQi Zhang;
    In Proceedings of the 15th International Conference on Electronic Packaging Technology,
    pp. 1437-1441, 2014.

  755. Artificial Dielectric Layer Based on PECVD Silicon Carbide for Terahertz Sensing Applications
    G. Fiorentino; W. Syed; A. Adam; A. Neto; P.M. Sarro;
    In Procedia Engineering 87: EUROSENSORS 2014, the 28th European Conference on Solid-State Transducers,
    pp. 1497-1500, 2014.

  756. Optofluidic hybrid platform with integrated solid core waveguides
    Testa, G; Persichetti, G; Sarro, PM; Bernini, R;
    In Proceedings of SPIE - Integrated Optics: Devices, Materials and Technologies XVIII Vol. 8988. Proceedings of SPIE- International Society for Optical Engineering,
    pp. 1-6, 2014.

  757. Reliability and accelerated test methods for plastic materials in LED-based products
    Maryam Yazdan Mehr; van Driel, WD; GuoQi Zhang;
    In Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    pp. 1-5, 2014.

  758. Modeling and simulation of monolithic integration of rectifiers for solid state lighting applications
    Venkatesh, MR; Liu, P; van Zeijl, HW; GuoQi Zhang;
    In Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    pp. 1-6, 2014.

  759. A 270�1 Ge-on-Si photodetector array for sensitive infrared imaging
    Sammak, A; Aminian, M; Lin Qi; Charbon, E; Nanver, LK;
    In Optical Sensing and Detection III Vol. 9141. Proceedings of SPIE- International Society for Optical Engineering,
    pp. 1-7, 2014.

  760. A lifetime prediction method for Solid State Lighting power converters based on SPICE models and finite element thermal simulations
    Bo Sun; Fan, X; Zhao, L; Yuan, CA; Koh, SW; GuoQi Zhang;
    In Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    pp. 1-4, 2014.

  761. Thermal performance of embedded heat pipe in high power density LED streetlight module
    Hongyu Tang; Zhao, J; Li, B; Leung, SYY; Yuan, CCA; GuoQi Zhang;
    In Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    pp. 1-6, 2014.

  762. Thickness evaluation of deposited pureb layers in micro-/millimeter-sized windows to Si
    Mohammadi, V; Ramesh, S; Nanver, LK;
    In Proceedings - 2014 IEEE International Conference on Microelectronic Test Structures,
    pp. 194-199, 2014.

  763. Enhancement of Front to Back Ratio of on Chip Antenna by Artificial Dielectrics at 300 GHz
    Syed, WH; Fiorentino, G; Cavallo, D; Spirito, M; Neto, A; Sarro, PM;
    In 39th International Conference on Infrared, Millimeter, and Terahertz Waves,
    2014.

  764. High aspect ratio lithography for litho-defined wire bonding
    Esfahani, ZK; van Zeijl, HW; GuoQi Zhang;
    In Proceedings - 64th Electronic Components and Technology Conference,
    pp. 1556-1561, 2014.

  765. 3D solid-state supercapacitors obtained by ALD coating of high-density carbon nanotubes bundles
    Fiorentino, Giuseppe; Vollebregt, Sten; Tichelaar, FD; Ishihara, Ryoichi; Sarro, Pasqualina M;
    In Micro Electro Mechanical Systems (MEMS), 2014 IEEE 27th International Conference on,
    IEEE, pp. 342--345, 2014.

  766. CNT bundles growth on microhotplates for direct measurement of their thermal properties
    C. Silvestri; B. Morana; G. Fiorentino; S. Vollebregt; G. Pandraud; F. Santagata; GuoQi Zhang; P.M. Sarro;
    In 27th IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2014),
    San Francisco, USA, Jan. 2014.
    document

  767. Investigation of color shift of LEDs-based lighting products
    Koh, SW; Huaiyu Ye; Maryam Yazdan Mehr; Jia Wei; van Driel, WD; Zhao, LB; GuoQi Zhang;
    In Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    pp. 1-5, 2014.

  768. Novel system-in-package design and packaging solution for solid state lighting systems
    Mingzhi Dong; Santagata, F; Jia Wei; Yuan, C; GuoQi Zhang;
    In Proceedings - 64th Electronic Components and Technology Conference,
    pp. 1192-1197, 2014.

  769. Atomic-scale imaging of catalysts at 1 bar reaction conditions
    Elkjaer, CF; Vendelbo, SB; Puspitasari, I; Dona, P; Mele, L; Morana, B; Rijn, R van, Nelissen, BJ; Creemer, JF; Kooyman, PJ; Helveg, S;
    In Abstracts Workshop TAILOR-2014,
    pp. 49, 2014.

  770. Software reliability and its interaction with hardware reliability
    van Driel, WD; Schuld, M; Wijgers, R; van Kooten, WEJ;
    In Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    pp. 1-8, 2014.

  771. Adapting LED lighting to compensate the influence of ambient light on the light color
    J.D.H. Wu; GuoQi Zhang;
    In 11th China SSL conference,
    2014.

  772. MEMS-Based Multi-Modal Vibration Energy Harvesters for Ultra-Low Power Autonomous Remote and Distributed Sensing
    Jacopo Iannacci; Enrico Serra; Guido Sordo; Michele Bonaldi; Antonio Borrielli; Ulrich Schmid; Achim Bittner; Michael Schneider; Thomas Kuenzig; Gabriele Schrag; Gregory Pandraud; Pasqualina Sarro;
    In 14th Mechatronics Forum International Conference,
    2014.

  773. Manufacture a submicron structure using a liquid precursor
    R. Ishihara; M. van der Zwam; M. Trifunovic;
    Patent no. 2010199, 08 2014.

  774. Method of forming silicon on a substrate
    Ishihara, R.; Trifunovic, M.; Van der Zwan, M.;
    European Patent Office WO 2014175740 (A1), 2014.
    document

  775. Through-polymer via (TPV) and method to manufacture such a via
    H.W. van Zeijl; R.H. Poelma; GuoQi Zhang;
    Dutch patent, 2014.

  776. MIP Plasma Decapsulation of Copper-wired Semiconductor Devices for Failure Analysis
    Jiaqi Tang;
    PhD thesis, Delft University of Technology, 2014.
    document

  777. SiGe heterojunction bipolar transistors with Schottky collector contacts
    Gianpaolo Lorito;
    PhD thesis, Delft University of Technology, 2014.
    document

  778. Carbon Nanotubes as Vertical Interconnects in 3D Integrated Circuits
    Sten Vollebregt;
    PhD thesis, Delft University of Technology, 2014.
    document

  779. A Systematic Approach to Address the Reliability of Solid State Lighting Drivers
    Sima Tarashioon;
    PhD thesis, Delft University of Technology, 2014.
    document

  780. AlN Piezoelectric Films for Sensing and Actuation
    Tran Trong An;
    PhD thesis, Delft University of Technology, 2014.
    document

  781. Thermal Management of Solid State Lighting Module
    Huaiyu Ye;
    PhD thesis, Delft University of Technology, 2014.
    document

  782. Characterization of low temperature deposited atomic layer deposition TiO2 for MEMS applications
    Yujian Huang; Gregory Pandraud; Pasqualina M. Sarro;
    Journal of Vacuum Science & Technology A,
    Volume 31, Issue 1, pp. 01A148, 2013.

  783. Measurement and analysis of current noise in chopper amplifiers
    J. Xu; Qinwen Fan; J.H. Huijsing; C. van Hoof; R.F. Yazicioglu; K.A.A. Makinwa;
    IEEE Journal of Solid State Circuits,
    Volume 48, Issue 7, pp. 1575-1584, 2013. Harvest.

  784. Photodegradation of bisphenol A polycarbonate under blue light radiation and its effect on optical properties
    Maryam Yazdan Mehr; W. D. van Driel; K. M. B. Jansen; P. Deeben; M. Boutelje; GuoQi Zhang;
    Optical Materials,
    Volume 35, pp. 504-508, 2013.

  785. Thermal Analysis of Remote Phosphor in LED Modules
    Mingzhi Dong; Jia Wei; Huaiyu Ye; Cadmus Yuan; GuoQi Zhang;
    Journal of Semiconductors,
    Volume 34, Issue 5, pp. 053007-1-3, 2013.

  786. Size-Dependent Effects on the Temperature Coefficient of Resistance of Carbon Nanotube Vias
    Vollebregt, Sten; Banerjee, Sourish; Beenakker, Kees; Ishihara, Ryoichi;
    Electron Devices, IEEE Transactions on,
    Volume 60, Issue 12, pp. 4085--4089, 2013.

  787. Thermal conductivity of low temperature grown vertical carbon nanotube bundles measured using the three-ω method.
    S. Vollebregt; S. Banerjee; C.I.M. Beenakker; R. Ishihara;
    Applied Physics Letters,
    Volume 102, Issue 19, pp. 1-4, 2013.

  788. Local Loading Effect of The Pure-Boron-Layer Chemical-Vapor Depositions
    V. Mohammadi; W.B. de Boer; T.L.M. Scholtes; L.K. Nanver;
    ECS Transactions,
    Volume 50, Issue 4, pp. 333-341, 2013. DOI 10.1149/05004.0333ecst.

  789. Resonance frequency of locally heated cantilever beams
    E. Iervolino; M. Riccio; F. Santagata; J. Wei; A.W. van Herwaarden; A. Irace; G. Breglio; P.M. Sarro;
    Sensors and Actuators A,
    Volume 190, pp. 6-12, Feb. 2013. DOI 10.1016/j.sna.2012.10.008.

  790. Residue-free plasma etching of polyimide coatings for small pitch vias with improved step coverage
    B. Mimoun; H.T.M. Pham; V. Henneken; R. Dekker;
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures,
    Volume 31, Issue 2, pp. 021201-021201-6, Mar. 2013. DOI 10.1116/1.4788795.

  791. Fully back-end TSV process by Cu electro-less plating for 3D smart sensor systems
    F. Santagata; C. Farriciello; G. Fiorentino; H.W. van Zeijl; C. Silvestri; GuoQi Zhang; P.M. Sarro;
    Journal of Micromechanics and Microengineering,
    2013.

  792. Towards the integration of carbon nanotubes as vias in monolithic three-dimensional integrated circuits
    S. Vollebregt; Chiaramonti A.N.; J. van der Cingel; C.I.M. Beenakker; R. Ishihara;
    Japanese Journal of Applied Physics. Part 1, Regular Papers Brief Communications & Review Papers,
    Volume 52, Issue 1-5, 2013.

  793. VUV/Low-Energy-Electron Si Photodiodes with Post-Metal 400�C PureB Deposition
    V. Mohammadi; L. Qi; N. Golshani; K. R. C. Mok; W. B. de Boer; A. Sammak; J. J. Derakhshandeh. van der Cingel; L. K. Nanver;
    IEEE Electron Device Letters,
    Volume 34, Issue 12, 2013. DOI 10.1109/LED.2013.2287221.

  794. Single-grain Si thin-film transistors on flexible polyimide substrate fabricated from doctor-blade coated liquid-Si.
    Jin Zhang; M. Trifunovic; M. van der Zwan; H. Takagishi; R. Kawajiri; T. Shimoda; C.I.M. Beenakker; R. Ishihara;
    Applied Physics Letters,
    Volume 102, Issue 24, pp. 1-4, 2013.

  795. Effects of Annealing on Chemical-Vapor Deposited PureB Layers
    K. R. C. Mok; A. H. G. Vlooswijk; V. Mohammadi; L. K. Nanver;
    ECS Journal of Solid State Science and Technology,
    Volume 2, Issue 9, pp. 413-417, 2013. DOI 10.1149/2.044309jss.

  796. A Simple Model describing the kinetic of CVD Deposition of Pure-Boron Layers from Diborane
    V. Mohammadi; W.B. de Boer; T.L.M. Scholtes; L.K. Nanver and;
    ECS Transactions,
    Volume 45, Issue 31, pp. 57-65, 2013. DOI 10.1149/04531.0057ecst.

  797. Low temperature high-mobility InZnO thin-film transistors fabricated by excimer laser annealing
    Fujii; M; Ishikawa; Y; R. Ishihara; J. van der Cingel; Mofrad; MRT; Horita; M; Uraoka; Y;
    Applied Physics Letters,
    Volume 102, Issue 12, pp. 1-4, 2013.

  798. Flex-to-Rigid (F2R): A Generic Platform for the Fabrication and Assembly of Flexible Sensors for Minimally Invasive Instruments
    Benjamin Mimoun; Vincent Henneken; Arjen van der Horst; Ronald Dekker;
    IEEE Sensors Journal,
    Volume 13, Issue 10, 2013. DOI: 10.1109/JSEN.2013.2252613

  799. Integrating low temperature aligned carbon nanotubes as vertical interconnects in Si technology
    Sten Vollebregt; Ryoichi Ishihara; Jaber J. Derakhshandehohan van der Cingel; Hugo Schellevis; C.I.M. Beenakker;
    In Nanoelectronic Device Applications Handbook,
    Taylor and Francis, 2013.

  800. Carbon Nanotubes as Interconnects in Integrated Circuits
    Vollebregt, S; Ishihara, R; Beenakker, CIM;
    In Dekker Encyclopedia of Nanoscience and Nanotechnology, Second Edition,
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  801. A multi-path chopper-stabilized capacitively coupled operational amplifier with 20V-input-common-mode range and 3μV offset
    Qinwen Fan; J.H. Huijsing; K.A.A. Makinwa;
    In A Chandrakasan (Ed.), Digest of Technical Papers - 2013 IEEE International Solid-State Circuits Conference (ISSCC 2013),
    IEEE, pp. 176-177, 2013. Harvest Session 10.

  802. A manufacturable platform for in vito electrophysiological studies under mechanical stimulation
    S. Khoshferat Pakazad; A. Savov; R. Dekker;
    In Proceedings of the 17th international conference on miniaturized systems for chemistry and life sciences,
    pp. 1412-1414, 2013.

  803. Cause analysis on highly depreciated indoor LED product in CSA020
    Guangjun Lu; Yuan C; Hongyu Tang; Wong C; Fan XJ; GuoQi Zhang;
    In Proceedings of China Solid State Lighting Forum,
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  804. A novel SMEA design for directional stretching of cells
    S. Khoshferat Pakazad; A. Savov and. A. van der Stolpe; R. Dekker;
    In Proceedings of the 2013 International Conference on Microtechnologies in Medicine,
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  805. Validation of the methodology of lumen depreciation acceleration of LED lighting
    Guangjun Lu; Yuan C; Sun B; Li B; Fan XJ; GuoQi Zhang;
    In Proceedings of China Solid State Lighting Forum,
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  806. Thermal Analysis for Silicon-based Integration of LED Systems
    Mingzhi Dong; Fabio Santagata; Jia Wei; Cadmus Yuan; GuoQi Zhang;
    In 10th China International Forum on Solid State Lighting,
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  807. Flexible single-grain Si TFTs
    R. Ishihara;
    In The 13th International Meeting on Information Display (IMID2013),
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  808. Carbon nanotube vias fabricated at back-end of line compatible temperature using a novel CoAl catalyst
    S. Vollebregt; H. Schellevis; C.I.M. Beenakker; R. Ishihara;
    In S. Ogawa (Ed.), IEEE International Interconnect Technology Conference-technical papers,
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  809. PureB Photodetector Technology Research for application in detectors/imagers for the whole electromagnetic spectrum
    V. Mohammadi and;
    In STW Annual Congress 2013,
    Nieuwegein, The Netherlands, Oct 2013.

  810. Piezoelectric Pressure Sensor Based on Enhanced Thin-Film PZT Diaphragm Containing Nanocrystalline Powders
    V. Mohammadi;
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  811. Investigation of the Issues Arising by Lowering the Deposition Temperature of the PureB-layer on Si/SiO2 Surfaces
    V. Mohammadi; N. Golshani; K.R.C. Mok; W.B. de Boer; J. Derakhshandeh; L.K. Nanver and;
    In ICT.OPEN,
    Eindhoven, The Netherlands, Nov. 2013.

  812. Flexible single-grain Si TFTs
    Ryoichi Ishihara;
    In 4th International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT),
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  813. High-Ohmic Resistors using Nanometer-Thin Pure-Boron Chemical-Vapour-Deposited Layers
    N. Golshani; V. Mohammadi; S. Ramesh; L.K. Nanver and;
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  814. Temperature Dependency of the Kinetics of PureB CVD Deposition over Patterned Si/SiO2 Surfaces
    V. Mohammadi; N.Golshani; K.R.C. Mok; W.B. de Boer; J. Derakhshandeh; L.K. Nanver and;
    In E-MRS 2013 Fall Meeting 2013,
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  815. A CMOS-compatible metamaterial to enhance the front to back radiation ratio in terahertz antenna for sensing application
    Fiorentino, G; Syed, W; Santagata, F; Spirito, M; Pandraud, G; Neto, A; Sarro, PM; Adam, AJL;
    In Sensors, 2013 IEEE,
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  816. Ald aluminum oxide as protective coating against oxidation of LPCVD SiC microhotplates
    Morana, B; Fiorentino, G; Pandraud, G; Creemer, JF; Sarro, PM;
    In Micro Electro Mechanical Systems (MEMS), 2013 IEEE 26th International Conference on,
    IEEE, pp. 484--487, 2013.

  817. Heat flux sensor for power loss measurements of switching devices
    Iero, Demetrio; Corte, Francesco G Della; Fiorentino, Giuseppe; Sarro, Pasqualina M; Morana, B;
    In Thermal Investigations of ICs and Systems (THERMINIC), 2013 19th International Workshop on,
    IEEE, pp. 327--330, 2013.

  818. Carbon Nanotube based heat-sink for solid state lighting
    F. Santagata; G. Almanno; S. Vollebregt; C Silvestri; GuoQi Zhang; P.M. Sarro;
    In 8th IEEE Int. Conf. Nano/Micro Engineered and Molecular Systems (NEMS),
    pp. 1214-1217, Apr 2013. DOI 10.1109/NEMS.2013.6559937.

  819. A novel silicon interposer for measuring devices requiring complex two-sided contacting
    J. Derakhshandeh; N. Golshani; L.A. Steenweg; W. van der Vlist; L.K. Nanver;
    In IEEE International Conference on Microelectronic Test Structures,
    Osaka, Japan, pp. 43-46, 2013.

  820. A Flexible Ultra-Thin-Body SOI Single-Photon Avalanche Diode
    Pengfei Sun; Benjamin Mimoun; Edoardo Charbon; Ryoichi Ishihara;
    In IEEE International Electron Device Meeting (IEDM),
    Washington, DC, USA, 2013.

  821. Silicon Drift Detectors for the detection of x-rays down to energies as low as 100 eV
    Negin Golshani; Jaber Derakhshandeh; Agata Sakic; Lis Nanver;
    In Micronano conference,
    Ede, The Netherlands, 2013.

  822. Improvement on MIS Properties of Single-Grain Germanium by Pulsed-Laser Annealing
    Pengfei Sun; M. van der Zwan; A. Arslan; E. Charbon; R. Ishihara;
    In 44th IEEE Semiconductor Interface Specialists Conference,
    Arlington, USA, 2013.

  823. Capacitively coupled chopper amplifiers
    Qinwen Fan;
    PhD thesis, Delft University of Technology, 2013. Onder embargo; staat niet in de IR van de Bibliotheek.

  824. IC Compatible Wafer Level Fabrication of Silicon Nanowire Field Effect Transistors for Biosensing Applications
    Thomas Moh Shan Yau;
    PhD thesis, Delft University of Technology, 2013.
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  825. Hybrid Wafer-Level Packaging for RF MEMS and Optoelectronic Applications
    Jun Tian;
    PhD thesis, Delft University of Technology, 2013.
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  826. Flexible Sensors for Minimally Invasive Medical Instruments
    Benjamin Mimoun;
    PhD thesis, Delft University of Technology, 2013.
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  827. A 21 nV/√ Hz chopper-stabilized multi-path current-feedback instrumentation amplifier with 2 μ v offset
    Qinwen Fan; J.H. Huijsing; K.A.A. Makinwa;
    IEEE Journal of Solid State Circuits,
    Volume 47, Issue 2, pp. 464-475, February 2012. Harvest Article number: 6112184.

  828. Reflectance-based two-dimensional TiO2 photonic crystal liquid sensors
    Yujian Huang; G. Pandraud; P.M. Sarro;
    Optics Letters,
    Volume 37, Issue 15, pp. 3162-3164, Aug. 2012. DOI 10.1364/OL.37.003162.

  829. Electrical and optical performance investigation of Si-based ultrashallow-junction VUV/EUV photodiodes
    S. Lei; S. Nihtianov; X. Sha; L.K. Nanver; A. Gottwald; F. Scholze;
    IEEE Transactions on Instrumentation and Measurement,
    Volume 61, Issue 5, pp. 1268-1277, 2012. DOI 10.1109/TIM.2012.2187029.
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  830. The atomic layer deposition array defined by etch-back technique: A new method to fabricate TiO2 nanopillars, nanotubes and nanochannel arrays
    Yujian Huang; G. Pandraud; P.M. Sarro;
    Nanotechnology,
    Volume 23, pp. 1-8, Nov. 2012. DOI 10.1088/0957-4484/23/48/485306.

  831. Hybrid silicon-PDMS optofluidic ARROW waveguide
    G. Testa; Yujian Huang; L. Zeni; P.M. Sarro;
    IEEE Photonics Technology Letters,
    Volume 24, Issue 15, pp. 1307-1309, Aug. 2012. DOI 10.1109/LPT.2012.2202645.

  832. In-situ TEM on (de)hydrogenation of Pd at 0.5�4.5 bar hydrogen pressure and 20�400�C
    T. Yokosawaa; T. Alan; G. Pandraud; B. Dam; H. Zandbergen;
    Ultramicroscopy,
    Volume 12, Issue 1, pp. 47-52, Jan. 2012. DOI 10.1016/j.ultramic.2011.10.010.

  833. Location controlled high performance single-grain Ge TFTs on glass substrate
    T. Chen; R. Ishihara; C.I.M. Beenakker;
    Solid-State Electronics,
    Volume 69, pp. 94-98, Mar. 2012. DOI 10.1016/j.sse.2011.11.027.

  834. 6 DOF force and torque sensor for micro-manipulation applications
    P. Estevez; J.M. Bank; M. Porta; J. Wei; P.M. Sarro; M. Tichem; U. Staufer;
    Sensors and Actuators A,
    Volume 186, pp. 86-93, Oct. 2012. DOI 10.1016/j.sna.2012.02.037.

  835. Suspended submicron silicon-beam for high sensitivity piezoresistive force sensing cantilevers
    J. Wei; S. Magnani; P.M. Sarro;
    Sensors and Actuators A,
    Volume 186, pp. 80-85, Oct. 2012. DOI 10.1016/j.sna.2012.02.021.

  836. Monolithic 3D-ICs with single grain Si thin film transistors
    R. Ishihara; J. Derakhshandeh; M.R. Tajari Mofrad; T. Chen; N. Golshani; C.I.M. Beenakker;
    Solid-State Electronics,
    Volume 71, pp. 80-87, May 2012. DOI 10.1016/j.sse.2011.10.025.

  837. A molybdenum MEMS microhotplate for high-temperature operation
    L. Mele; F. Santagata; E. Iervolino; M. Mihailovic; T. Rossi; A.T. Tran; H. Schellevis; J.F. Creemer; P.M. Sarro;
    Sensors and Actuators A,
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  838. A buried vertical filter for micro and nanoparticle filtration
    S.J. Li; C. Shen; P.M. Sarro;
    Sensors and Actuators A,
    Volume 186, pp. 203-209., Oct. 2012. DOI 10.1016/j.sna.2012.04.027.

  839. A review of visible-range Fabry�Perot microspectrometers in silicon for the industry
    J.P. Carmoa; R.P. Rocha; M. Bartek; G. de Graaf; R.F. Wolffenbuttel; J.H. Correia;
    Optics & Laser Technology,
    Volume 44, Issue 7, pp. 2312-2320, Oct. 2012. DOI 10.1016/j.optlastec.2012.03.036.

  840. An adaptive Cu trace fatigue model based on average cross-section strain
    D. Farley; Y. Zhou; A. Dasgupta; and J.W.C. De Vries;
    Microelectronics Reliability,
    Volume 52, Issue 11, pp. 2763-2772, 2012. DOI 10.1016/j.microrel.2012.06.114.

  841. Linear and rotational thermal micro-stepper motors
    A. Khiat; J.W. Spronck; J. van Schieveen; S. Milosavljevic; J. Wei; P. Estevez; P.M. Sarro; U. Staufer;
    Microelectronic Engineering,
    Volume 98, pp. 497-501, Oct. 2012. DOI 10.1016/j.mee.2012.07.086.

  842. Geometric-mechanical origin of global planetary angular momentum dynamics
    R. van der Toorn;
    Journal of Sea Research,
    Volume 74, pp. 45-51., Nov. 2012. DOI 10.1016/j.seares.2012.08.006.

  843. PureGaB p+n Ge diodes grown in large windows to Si with a sub-300 nm transition region
    A. Sammak; W.B. de Boer; L. L. Qi K. Nanver;
    Journal of Solid-State Electronics,
    Volume 74, Issue 1, pp. 126-133, Aug. 2012. DOI 10.1016/j.sse.2012.04.023.

  844. Tube-shaped Pirani gauge for in situ hermeticity monitoring of SiN thin-film encapsulation
    F. Santagata; J.F. Creemer; E. Iervolino; P.M. Sarro;
    Journal of Micromechanics and Microengineering,
    Volume 22, Issue 10, Sep. 2012. DOI 10.1088/0960-1317/22/10/105025.

  845. Sensing performance of plasma-enhanced chemical vapor deposition SiC-SiO2-SiC horizontal slot waveguides
    G. Pandraud; E. Margallo-Balb�s; P.M. Sarro;
    Journal of Nanophotonics,
    Volume 6, pp. 1-7, Nov. 2012. DOI 10.1117/1.JNP.6.063530.

  846. Microcantilevers encapsulated in fluid wells for sensing in liquids
    W.J. Venstra; W.H. Wien; P.M. Sarro; J. van Eijk;
    Microelectronic Engineering,
    Volume 97, pp. 247-250, Sep. 2012. DOI 10.1016/j.mee.2012.03.030.

  847. Mechanical design and characterization for MEMS thin-film packaging
    F. Santagata; J.J.M. Zaal; V.G. Huerta; L. Mele; J.F. Creemer; P.M. Sarro;
    Journal of Microelectromechanical Systems,
    Volume 21, Issue 1, pp. 100-109, Feb. 2012. DOI 10.1109/JMEMS.2011.2170817.

  848. Lateral-transistor test structures for evaluating the effectiveness of surface doping techniques
    L. Qi; G. Lorito; L.K. Nanver;
    IEEE Transactions on Semiconductor Manufacturing,
    Volume 25, Issue 4, pp. 581-588, 2012. DOI 10.1109/TSM.2012.2206834.

  849. Micromachined nanofiltration modules for lab-on-a-chip applications
    C. Shen; V.R.S.S. Mokkapati; H.T.M. Pham; P.M. Sarro;
    Journal of Micromechanics and Microengineering,
    Volume 22, Issue 2, pp. 1-10., Jan. 2012. DOI 10.1088/0960-1317/22/2/025003.

  850. Analysis of u-Czochralski technique using two-dimensional crystallization simulator
    K. Matsuki; R. Saito; S. Tsukamoto; M. Kimura; R. Ishihara;
    Journal of Crystallization Process and Technology,
    Volume 2, Issue 1, pp. 12-15., Jan. 2012. DOI 10.4236/jcpt.2012.21002.

  851. Surface-charge-layer sheet-resistance measurements for evaluating interface RF losses on high-resistivity-silicon substrates
    S.B. Evseev; L.K. Nanver; S. Milosaviljevi_;
    IEEE Transactions on Microwave Theory and Techniques,
    Volume 60, Issue 11, pp. 3542-3550, Nov. 2012. DOI 10.1109/TMTT.2012.2215050.

  852. High-efficiency silicon photodiode detector for sub-keV electron microscopy
    A. Sakic; G. van Veen; K. Kooijman; P. Vogelsang; T.L.M. Scholtes; W.B. de Boer; J. Derakhshandeh; W.H.A. Wien; S. Milosavljevic; L.K. Nanver;
    IEEE Transactions on Electron Devices,
    Volume 59, Issue 10, pp. 2707-2714, Oct. 2012. DOI 10.1109/TED.2012.2207960.

  853. An Analytical Kinetic Model for Chemical-Vapor Deposition of Pure-Boron Layers from Diborane
    V. Mohammadi; W.B. de Boer; L.K. Nanver and;
    Journal of Applied Physics,
    Volume 112, 2012. DOI 10.1063/1.4767328.

  854. Self-biased low loss conductor featured with skin effect suppression for high quality RF passives
    I. Iramnaaz; H. Schellevis; B. Rejaei; R. Fitch; Y. Zhuang;
    IEEE Transactions on Magnetics,
    Volume 48, Issue 11, pp. 4139-4142, Nov. 2012. DOI 10.1109/TMAG.2012.2200660.

  855. High-quality integrated inductors based on multilayered meta-conductors
    I. Iramnaaz; H. Schellevis; B. Rejaei; R. Fitch; Y. Zhuang;
    IEEE Microwave and Wireless Components Letters,
    Volume 22, Issue 7, pp. 345-347, Jul. 2012. DOI 10.1109/LMWC.2012.2201710.

  856. Thick single grain silicon formation with microsecond green laser crystallization
    A. Arslan; H.J. Kahlert; P. Oesterlin; D.T. Mofrad; R. Ishihara; C.I.M. Beenakker;
    ECS Transactions,
    Volume 50, Issue 8, pp. 35-42, Oct. 2012. ISBN 978-1-62332-007-2.

  857. Fast etching of molding compound by an Ar/O2/CF4 plasma and process improvements for semiconductor package decapsulation
    Jiaqi Tang; D. Gruber; J.B.J. Schelen; H.-J. Funke; C.I.M. Beenakker;
    ECS Journal of Solid State Science and Technology,
    Volume 1, Issue 4, pp. P175-P178, Aug. 2012. DOI 10.1149/2.019204jss.

  858. Pattern dependency and loading effect of pure-boron-layer chemical-vapor deposition
    V. Mohammadi; W.B. de Boer; T.L.M. Scholtes; L.K. Nanver;
    ECS Journal of Solid State Science and Technology,
    Volume 1, Issue 1, pp. Q16-Q20, 2012. DOI 10.1149/2.024201jss.

  859. Influence of the growth temperature on the first and second-order Raman band ratios and widths of carbon nanotubes and fibers
    S. Vollebregt; R. Ishihara; F.D. Tichelaar; Y. Hou; C.I.M. Beenakker;
    Carbon,
    Volume 50, Issue 10, pp. 3542-3554, Aug. 2012. DOI 10.1016/j.carbon.2012.03.026.

  860. Luminescence quenching of porous silicon nanoparticles in presence of ascorbic acid
    La Ferrara, Vera; Fiorentino, Giuseppe; Rametta, Gabriella; Di Francia, Girolamo;
    physica status solidi (a),
    Volume 209, Issue 4, pp. 736--740, 2012.

  861. Temperature dependence of chemical-vapor deposition of pure boron layers from diborane
    V. Mohammadi; W.B. de Boer; T.L.M. Scholtes; L.K. Nanver;
    Applied Physics Letters,
    Volume 101, Issue 11, pp. 1-4, 2012. DOI 10.1063/1.4752109.

  862. Molecular modeling of protonic acid doping of emeraldine base polyaniline for chemical sensors
    X.P. Chen; C. Yuan; C.K.Y. Wong; H. Ye; S.Y.Y. Leung; GuoQi Zhang;
    Sensors and Actuators B: Chemical,
    Volume 174, pp. 210-216., 2012. DOI 10.1016/j.snb.2012.08.042.

  863. Homogeneous superconducting phase in TiN film: A complex impedance study
    P. Diener; H. Schellevis; J.J.A. Baselmans;
    Applied Physics Letters,
    Volume 101, Issue 25, pp. 252601/1-4, Dec. 2012. DOI 10.1063/1.4771995.

  864. Micro-fabricated channel with ultra-thin yet ultra-strong windows enables electron microscopy under 4-bar pressure
    T. Alan; T. Yokosawa; J. Gaspar; G. Pandraud; O. Paul; F. Creemer; P.M. Sarro; H.W. Zandbergen;
    Applied Physics Letters,
    Volume 100, pp. 1-4, 2012. DOI 10.1063/1.3688490.

  865. Effects of single vacancy defect position on the stability of carbon nanotubes
    R.H. Poelma; H. Sadeghian; S. Koh; GuoQi Zhang;
    Microelectronics Reliability Journal,
    Volume 52, Issue 7, pp. 1279-1284, Jul. 2012. DOI 10.1016/j.microrel.2012.03.015.

  866. An approach to �Design for Reliability� in solid state lighting systems at high temperatures
    S. Tarashioon; A. Baiano; H. van Zeijl; C. Guo; S.W. Koh; W.D. van Driel; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 52, Issue 5, pp. 783-793, May 2012. DOI 10.1016/j.microrel.2011.06.029.

  867. Diagnosing lumen depreciation in LED lighting systems: An estimation approach
    J. Dong; A. Pandharipande; W. van Driel; GuoQi Zhang;
    IEEE Transactions on Signal Processing,
    Volume 60, Issue 7, pp. 3796-3808, Jul. 2012. DOI 10.1109/TSP.2012.2192114.

  868. Analytical large deflection method for carbon nanotube young�s modulus determination
    N. Tolou; A. Khiat; GuoQi Zhang; J.L. Herder;
    International Journal of Nonlinear Sciences and Numerical Simulation,
    Volume 12, Issue 1-8, pp. 51-58, Feb. 2012. DOI 10.1515/ijnsns.2011.300.

  869. Establishment of the coarse grained parameters for epoxy-copper interfacial separation
    C.K.Y. Wong; S.Y.Y. Leung; R.H. Poelma; K.M.B. Jansen; C.C.A. Yuan; W.D. van Driel; GuoQi Zhang;
    Journal of Applied Physics,
    Volume 111, Issue 9, pp. 094906/1-094906, May 2012. DOI 10.1063/1.4712060.

  870. Mechanical characterization of individual polycrystalline carbon tubes for use in electrical nano-interconnects
    A. Khiat; R.H. Poelma; GuoQi Zhang; F. Heuck; F.D. Tichelaar; M. Sarno; P. Ciambelli; S. Fontorbes; L. Arurault; U. Staufer;
    Microelectronic Engineering,
    Volume 98, pp. 317-320, Oct. 2012. DOI 10.1016/j.mee.2012.07.087.

  871. Solid State Lighting Reliability: Components to Systems
    W.D. van Driel; X.J. Fan;
    Springer, , Aug. 2012. DOI 10.1007/978-1-4614-3067-4.

  872. Introduction to SSL driver reliability
    S. Tarashioon;
    In Solid State Lighting Reliability: Components to Systems,
    Springer, Aug. 2012. ISBN 978-1-4614-3066-7.

  873. The mechanical properties modeling of nano-scale materials by molecular dynamics
    C. Yuan; W.D. Driel; R.H Poelma; GuoQi Zhang;
    In Molecular Modeling and Multiscaling for Electronic Material Applications,
    Springer, 2012. DOI 10.1007/978-1-4614-1728-6_8.

  874. Semi empirical low cycle fatigue crack growth analysis of nanostructure chip-to-package copper interconnect using molecular simulation
    S. Koh; A. Saxena; W.D. van Driel; GuoQi Zhang; R. Tummala;
    In Molecular Modeling and Multiscaling for Electronic Material Applications,
    Springer, 2012. DOI 10.1007/978-1-4614-1728-6_5.

  875. A capacitively-coupled chopper operational amplifier with 3μV Offset and outside-the-rail capability
    Qinwen Fan; J.H. Huijsing; K.A.A. Makinwa;
    In Y. Deval; J-B Begueret; D Belot (Ed.), Proceedings 2012 38th European Solid-State Circuit Conference,
    IEEE, pp. 73-76, 2012.

  876. Measurement and analysis of input current noise in chopper amplifiers
    J. Xu; Qinwen Fan; J.H. Huijsing; C. van Hoof; R.F. Yazicioglu; K.A.A. Makinwa;
    In Y. Deval; J-B Begueret; D Belot (Ed.), Proceedings 2012 38th European Solid-State Circuit Conference,
    IEEE, pp. 81-84, 2012.

  877. A capacitively coupled chopper instrumentation amplifier with a ±30V common-mode range, 160dB CMRR and 5μV offset
    Qinwen Fan; J.H. Huijsing; K.A.A. Makinwa;
    In L Fujino (Ed.), Digest of Technical Papers - 2012 IEEE International Solid-state Circuits Conference,
    IEEE, pp. 374-375, 2012. Harvest Article number: 6177045.

  878. High accuracy dual side overlay with wet anisotropic etching for HAR MEMS
    H.W. van Zeijl; K. Best; P.M. Sarro;
    In Technical Proceedings of the 2012 NSTI Nanotechnology Conference and Expo (NSTI-Nanotech 2012),
    pp. 180-183, 2012. ISBN 978-1-4665-6275-2.

  879. Phase transformations in Al alloys during heat treatment investigated by in situ TEM
    S.R.K. Malladi; Q. Xu; G. Pandraud; F.D. Tichelaar; H.W. Zandbergen; K. Kulawik; B. Dubiel; A. Czyrska-Filemonowicz;
    In The 15th European Microscopy Congress (EMC 2012),
    Manchester, UK, pp. 1-2, Sept. 2012.

  880. In-situ TEM on (de)hydrogenation and oxidation/reduction of Pd
    T. Yokosawa; M.Y. Wu; G. Pandraud; B. Dam; H.W. Zandbergen;
    In The 15th European Microscopy Congress (EMC 2012),
    Manchester, UK, pp. 1-2, Sept. 2012.

  881. Studies on localized corrosion in aluminium alloys using in situ transmission electron microscopy
    S.R.K. Malladi; Q. C. Xu Shen; G. Pandraud; F.D. Tichelaar; H.W. Zandbergen;
    In The 15th European Microscopy Congress (EMC 2012),
    Manchester, UK, pp. 1-2, Sept. 2012.

  882. Stiction-driven sealing of surface micromachined channels
    B. Morana; G. Pandraud; F. Santagata; J.F. Creemer; P.M. Sarro;
    In 25th IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2012),
    Paris, France, IEEE, pp. 329-332, Jan. 2012. ISBN 978-978-1-4673-0325-5; DOI 10.1109/MEMSYS.2012.6170202.

  883. Ultra-flexible devices for 360 _m diameter guidewires
    B. Mimoun; V. Henneken; P.M. Sarro; R. Dekker;
    In 25th IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2012),
    Paris, France, IEEE, pp. 472-475, Jan. 2012. ISBN: 978-978-1-4673-0325-5, DOI 10.1109/MEMSYS.2012.6170227.

  884. Below-IC post-CMOS integration of thick MEMS on a thin-SOI platform using embedded interconnects
    V. Rajaraman; J.J. Koning; E. Ooms; G. Pandraud; K.A.A. Makinwa; H. Boezen;
    In 25th IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2012),
    Paris, France, IEEE, pp. 220-223, Jan. 2012. ISBN 978-978-1-4673-0325-5; DOI 10.1109/MEMSYS.2012.6170130.

  885. Silicon nanowire FET arrays for real time detection of chemical activation of cells
    T.S.Y. Moh; S.K. Srivastava; S. Milosavljevic; M. Roelse; G. Pandraud; H.W. Zandbergen; L.C.P.M de Smet; C.J.M van Rijn; E.J.R. Sudh�lter; M.A. Jongsma; P.M. Sarro;
    In 25th IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2012),
    Paris, France, IEEE, pp. 1344-1347, Jan. 2012. ISBN 978-978-1-4673-0325-5; DOI 10.1109/MEMSYS.2012.6170424.

  886. A Ge-on-Si single-photon avalanche diode operating in Geiger mode at infrared wavelengths
    M. Aminian; A. Sammak; L. L. Qi K. Nanver; E. Charbon;
    In Proc. SPIE: Advanced Photon Counting Techniques VI,
    Baltimore, Maryland, Apr 2012. DOI 10.1117/12.920561.

  887. A comparison between PECVD and ALD for the fabrication of slot-waveguide-based sensors
    G. Pandraud; A. Purniawan; E. Margallo-Balb�s; P.M. Sarro;
    In Proc. SPIE: Nanophotonics IV,
    Brussels, Belgium, Apr. 2012. DOI 10.1117/12.922400.

  888. Epitaxial growth of large-area p+n diodes at 400 �C by aluminum-induced crystallization
    A. Sakic; L. Qi; T.L.M. Scholtes; J. van der Cingel; L.K. Nanver;
    In Proc. of the 42th European Solid-State Device Research Conference (ESSDERC 2012),
    Bordeaux, France, pp. 145-148, Sept. 2012. ISBN 978-1-4673-1707-8; DOI 10.1109/ESSDERC.2012.6343354.

  889. Modelling of electrical characteristics of ultrashallow pure amorphous boron p+n junctions
    T. Knezevic; T. Suligoj; A. Sakic; L.K. Nanver;
    In Proc. of the 35th International Convention MIPRO 2012,
    Opatija, Croatia, pp. 36-41, May 2012. ISBN 978-1-4673-2577-6.

  890. Living chips and Chips for the living
    R. Dekker; S. Braam; V. Henneken; A. van der Horst; S. Khoshfetrat Pakazad; M. Louwerse; B. van Meer; B. Mimoun; A. Savov; A. van de Stolpe;
    In Proc. of IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM 2012),
    Portland, Oregon, USA, pp. 1-9, Sep. 2012. DOI 10.1109/BCTM.2012.6352653.

  891. Thermal flow sensors on flexible substrates for minimally invasive medical instruments
    B. Mimoun; A. van der Horst; D. van der Voort; M. Rutten; R. Dekker; F. van de Vosse;
    In Proc. of IEEE Sensors Conference 2012,
    Taipei, Taiwan, pp. 1-4, Oct. 2012 2012. DOI 10.1109/ICSENS.2012.6411429.

  892. Analyzing protein denaturation using fast differential scanning calorimetry
    R. Splinter; A.W. van Herwaarden; E. Iervolino; G. Vanden Poel; D. Istrate; P.M. Sarro;
    In R. Walczak; J. Dziuban (Ed.), Proc. Eurosensors XXVI,
    Krakow, Poland, Procedia Engineering, pp. 140-143, Sep 2012. DOI 10.1016/j.proeng.2012.09.104.

  893. A platform for manufacturable stretchable micro-electrode arrays
    S. Khoshfetrat Pakazad; A. Savov; S.R. Braam; R. Dekker;
    In R. Walczak; J. Dziuban (Ed.), Proc. Eurosensors XXVI,
    Krakow, Poland, Procedia Engineering, pp. 817-820, Sep 2012. DOI 10.1016/j.proeng.2012.09.272.

  894. Integrating carbon nanotubes as vias in a monolithic 3DIC process
    S. Vollebregt; R. Ishihara; A.N. Chiaramonti; J. van der Cingel; C.I.M. Beenakker;
    In Proc. International Conference on Solid State Devices and Materials (SSDM 2012),
    Kyoto, Japan, pp. 1170-1171, Sep 2012.

  895. Enhancement of AlN slender piezoelectric cantilevers actuation by PECVD silicon nitride coating
    A.T. Tran; G. Pandraud; H. Schellevis; P.M. Sarro;
    In R. Walczak; J. Dziuban (Ed.), Proc. Eurosensors XXVI,
    Krakow, Poland, Procedia Engineering, pp. 104-107, Sep 2012. DOI 10.1016/j.proeng.2012.09.095.

  896. Electrical performance stability characterization of high-sensitivity Si-based EUV photodiodes in a harsh industrial application
    L. Shi; S.N. Nihtianov; F. Scholze; L.K. Nanver;
    In Proc. 38th Annual Conference on IEEE Industrial Electronics Society (IEEE IECON12),
    Montreal, Canada, pp. 3952-3957, Oct 2012. ISBN 978-1-4673-2419-9; DOI 10.1109/IECON.2012.6389260.

  897. An Inspiring BSc-EE Curriculum for Science and Engineering
    N.P. van der Meijs; M. Bartek; P. Bauer; A.J. van Genderen; G.J.M. Janssen;
    In Proc. 42th International European Microwave Conference (EuMC-2012),
    Amsterdam, pp. 494-497, Oct. 2012. ISBN 978-2-87487-027-9.

  898. Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon
    Z. Jin; R. Ishihara; H. Takagishi; R. Kawajiri; T. Shimoda; C.I.M. Beenakker;
    In Proc. 2012 19th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD),
    Kyoto, Japan, pp. 309-312, Jul. 2012. ISBN: 978-1-4673-0399-6.

  899. OTFT with PNDT3BT-20 dispersed solution by drop casting method
    M. Trifunovic; T. Yokota; Y. Kato; T. Tokuhara; I. Hirata; I. Osaka; K. Takimiya; T. Sekitani; T. Someya; R. Ishihara;
    In Proc. 2012 19th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD),
    Kyoto, Japan, pp. 203-206, Jul 2012. ISBN: 978-1-4673-0399-6.

  900. Impact of the emitter stored charge on RF noise of junction bipolar transistors
    F. Vitale; R. van der Toorn;
    In Proc. 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM 2012),
    Portland, Oregon, USA, pp. 1-4, Sept. 2012. ISBN 978-1-4673-3020-6; DOI 10.1109/BCTM.2012.6352625.

  901. Flexible multipolar cuff microelectrode for FES of sacral nerve roots
    F. Rodrigues; B. Mimoun; M. Bartek; P.M. Mendes; R. Dekker;
    In Proc. 17th Annual International FES Society Conference (IFESS 2012),
    Banff, Alberta, Canada, pp. 1-4, Sept. 2012.

  902. A novel approach for piezoresistivity characterization of silicon nanowires
    M. Nie; F. Santagata; T. Moh; Q.-A. Huang; P.M. Sarro;
    In Proc. 11th IEEE Sensors Conference,
    Taipei, Taiwan, pp. 1747-1750, Oct 2012.

  903. Encapsulated aluminum nitride SAW devices for liquid sensing applications
    A.T. Tran; G. Pandraud; T.S.Y. Moh; H. Schellevis; A. Akhnoukh; A. Purniawan; P.M. Sarro;
    In Proc of the 11th IEEE Sensors Conf,
    Taipei, Taiwan, pp. 604-607, Oct. 2012.

  904. Residue-free plasma etching of polyimide coatings
    B. Mimoun; H.T.M. Pham; V. Henneken; R. Dekker;
    In International Conference on Electronics Packaging 2012 (ICEP),
    Tokyo, Japan, pp. 265-269, Apr. 2012.

  905. Electrical characterization of carbon nanotube vertical interconnects with different lengths and widths
    S. Vollebregt; R. Ishihara; F.D. Tichelaar; J. van der Cingel; C.I.M. Beenakker;
    In IEEE International Interconnect Technology Conference (IITC 2012),
    San Jose, CA, USA, pp. 1-3, Jun. 2012. DOI 10.1109/IITC.2012.6251578.

  906. Single-grain Si TFTs fabricated by liquid-Si and long-pulse excimer-laser
    R. Ishihara; Jin Zhang; M. Trifunovic; M. van der Zwan; H. Takagishi; R. Kawajiri; T. Shimoda; C.I.M. Beenakker;
    In Y. Kuo (Ed.), ECS Transactions,
    Honolulu, USA, pp. 49-53, Oct. 2012. ISBN 978-1-62332-007-2.

  907. Ge-on-Si: Single-crystal selective epitaxial growth in a CVD reactor
    A. Sammak; W.B. de Boer; L.K. Nanver;
    In Electro-Chemical Society (ECS) Meeting Abstracts,
    Honolulu, Hawaii, Oct. 2012.

  908. Impact of the Process and Chamber Parameters on CVD Deposition of PureB layer
    V. Mohammadi; W.B. de Boer; T.L.M. Scholtes; L.K. Nanver;
    In ICT.OPEN: Micro technology and micro devices (SAFE 2012),
    Rotterdam, The Netherlands, Oct. 2012.

  909. Pattern dependency of pure-boron-layer chemical-vapor depositions
    V. Mohammadi; W.B. de Boer; T.L.M. Scholtes; L.K. Nanver;
    In 221st ECS Meeting: ECS Transactions,
    Seattle, Washington, pp. 39-48, May 2012. DOI 10.1149/1.3700937.

  910. High-sensitivity single-grain Si PIN photodiode with thick-silicon and deep doped regions
    A. Arslan; R. Ishihara; C.I.M. Beenakker;
    In 8th International Thin-Film Transistor Conference,
    Lisbon, Portugal, Jan. 2012.

  911. Insights to emitter saturation current densities of boron implanted samples based on defects simulations
    K.R.C. Mok; R.C.G. Naber; L.K. Nanver;
    In AIP Conf. Proc,
    Valladolid, Spain, pp. 245-248, Jun. 2012. ISBN 978-0-7354-1108-1; DOI 10.1063/1.4766534.

  912. Silicon-polymer electro-thermal bimorph actuators with SiC bottom-layer for large out-of-plane motion and improved power efficiency
    M. Aarts; J. Wei; P.M. Sarro;
    In 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS 2012),
    Kyoto, Japan, pp. 253-256, Mar. 2012. ISBN: 978-1-4673-1124-3; DOI 10.1109/NEMS.2012.6196768.

  913. Single-Grain Germanium TFTs
    R. Ishihara; T. Chen; A. Baiano; M.R. Tajari Mofrad; C.I.M. Beenakker;
    In Y. Kuo; G. Bersuker (Ed.), ECS Transactions: Challenges Si- and Ge-based TFT Technology,
    Hong Kong, China, pp. 65-74, Jun. 2012. DOI 10.1149/1.3600725.

  914. Pure dopant deposition of B and Ga for ultrashallow junctions in Si-based devices
    L.K. Nanver; A. Sammak; V. Mohammadi; K.R.C. Mok; L. Qi; A. Sakic; N. Golshani; J. Derakhshandeh; T.M.L. Scholtes; W.D. de Boer;
    In ECS Trans. 2012: 27th Symposium on Microelectronics Technology and Devices (SBMicro2012),
    Brazil, Brasilia, pp. 25-33, Aug. 2012. DOI 10.1149/04901.0025ecst.

  915. Flexible system for real-time plasma decapsulation of copper wire bonded IC packages
    Jiaqi Tang; J.B.J. Schelen; C.I.M. Beenakker;
    In 62nd IEEE Electronic Components and Technology Conference (ECTC 2012),
    San Diego, US, pp. 1764-1769, May 2012. ISBN 978-1-4673-1966-9; DOI 10.1109/ECTC.2012.6249076.

  916. Low-temperature bottom-up integration of carbon nanotubes for vertical interconnects in monolithic 3D integrated circuits
    S. Vollebregt; R. Ishihara; J. van der Cingel; C.I.M. Beenakker;
    In 3rd IEEE International 3D Systems Integration Conference (3DIC 2011),
    Osaka, Japan, Jan. 2012. DOI 10.1109/3DIC.2012.6262989.

  917. Applications of PureB and PureGaB ultrashallow junction technologies
    L.K. Nanver; A. _akic; V. Mohammadi; J. Derakhshandeh; K.R.C. Mok; L. Qi; N. Golshani; T.M.L. Scholtes; W.B. de Boer;
    In 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSCT 2012),
    Xi'an, pp. 303-306., Oct. 2012.
    document

  918. MEMS accelerometers and their bio-applications
    M. Trifunovic; A.M. Vadiraj; W.D. van Driel;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Lisbon, Portugal, Apr. 2012. DOI 10.1109/ESimE.2012.6191749.

  919. Multilayer conformal coating of highly dense Multi-Walled Carbon Nanotubes bundles
    G. Fiorentino; S. Vollebregt; R. Ishihara; P.M. Sarro;
    In 2012 12th IEEE Conference on Nanotechnology (IEEE-NANO),
    Birmingham, UK, Aug. 2012. ISBN 978-1-4673-2198-3; DOI 10.1109/NANO.2012.6322054.

  920. Contact resistance of low-temperature carbon nanotube vertical interconnects
    S. Vollebregt; A.N. Chiaramonti; R. Ishihara; H. Schellevis; C.I.M. Beenakker;
    In K. Jiang (Ed.), 2012 12th IEEE Conference on Nanotechnology (IEEE-NANO),
    Birmingham, UK, Aug. 2012. ISBN 978-1-4673-2198-3; DOI 10.1109/NANO.2012.6321985.

  921. Modeling lead free solder reliability in SSL applications towards virtual design
    R. Kregting; M. Erinc; J. Kloosterman; W.D. van Driel;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Lisbon, Portugal, pp. 1-6, Apr. 2012. DOI 10.1109/ESimE.2012.6191755.

  922. Low-pressure chemical vapor deposition of pureB layers on silicon for p+n junction formation
    K.R.C. Mok; V. Mohammadi; L.K. Nanver; W.D. de Boer; A.H.G. Vlooswijk;
    In 12th International Workshop on Junction Technology (IWJT 2012),
    Shanghai, China, pp. 113-116, May 2012. DOI 10.1109/IWJT.2012.6212822.

  923. Optofluidics: waveguides and devices
    G. Testa; Yujian Huang; L. Zeni; P.M. Sarro; R. Bernini;
    In Proc. SPIE: Integrated Optics: Devices, Materials, and Technologies XVI,
    Feb 2012. DOI 10.1117/12.908683.

  924. Single-mask fabrication of temperature triggered MEMS switch for cooling control in SSL system
    J. Wei; H. Ye; H.W. van Zeijl; P.M Sarro; GuoQi Zhang;
    In R. Walczak; J. Dziuban (Ed.), Proc. Eurosensors XXVI,
    Krakow, Poland, Procedia Engineering, pp. 849-852, Sep 2012. DOI 10.1016/j.proeng.2012.09.280.

  925. Fully back-end TSV process by Cu electro-less plating for 3D smart sensor systems
    F. Santagata; G. Fiorentino; M. Nie; C. Farriciello; R. Poelma; GuoQi Zhang; P.M. Sarro;
    In Proc. 11th IEEE Sensors Conference,
    Taipei, Taiwan, pp. 668-671, Oct 2012.

  926. Simulation and qualification of a system-in-package (SiP) based solid state lighting (SSL) module
    D.M. Farley; F. Boschman; J.E. Bullema; A.W.J. Gielen; P. Hesen; J.P.H.M. Krugers; F. Swartjes; H.W. van Zeijl; GuoQi Zhang;
    In Proc. 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Cascais, Portugal, pp. 1-3, Apr 2012. ISBN 978-1-4673-1511-1; DOI 10.1109/ESimE.2012.6191780.

  927. Monitoring of meniscus motion at nozzle orifice with capacitive sensor for inkjet applications
    J. Wei; C. Yue; GuoQi Zhang; J.F. Dijksman; P.M. Sarro;
    In Proc. 11th IEEE Sensors Conference,
    Taipei, Taiwan, pp. 2172-2175, Oct 2012.

  928. Thermal and moisture degradation in SSL system
    S. Koh; W.D. van Driel; GuoQi Zhang;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Lisbon, Portugal, pp. 1-6, Apr. 2012. DOI 10.1109/ESimE.2012.6191806.

  929. System approach for reliability of low-power power electronics: How to break down into their constructed parts
    S. Tarashioon; W.D. van Driel; GuoQi Zhang;
    In 7th International Conference on Integrated Power Electronics Systems (CIPS 2012),
    Nuremberg, Germany, pp. 1-5, Mar. 2012.

  930. Dynamic thermal simulation of high brightness LEDs with unsteady driver power output
    H. Ye; S. Koh; J. Wei; H.W. van Zeijl; GuoQi Zhang;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Lisbon, Portugal, Apr. 2012. DOI 10.1109/ESimE.2012.6191768.

  931. Establishment of the mesoscale parameters for epoxy-copper interfacial separation
    C.K.Y. Wong; S.Y.Y. Leung; R.H. Poelma; K.M.B. Jansen; C.C.A. Yuan; W.D. van Driel; GuoQi Zhang;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Lisbon, Portugal, Apr. 2012. DOI 10.1109/ESimE.2012.6191737.

  932. Molecular modeling of the conductivity changes of the emeraldine base polyaniline due to protonic acid doping
    X. Chen; C. Yuan; C. Wong; GuoQi Zhang;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Cascais, Portugal, Apr. 2012. ISBN 978-1-4673-1511-1; DOI 10.1109/ESimE.2012.6191741.

  933. Monolithic 3D- ICs with Single Grain Si Thin Film Transistors
    R. Ishihara; M. R. T. Mofrad; J. Derakhshandeh; N. Golshani; C. I. M. Beenakker;
    In IEEE 11th International Conference on Solid-State and Integrated Circuit Technology,
    2012.

  934. MEMS integration techniques on silicon-on-insulator for inertial devices
    V. Rajaraman;
    PhD thesis, Delft University of Technology, May 2012. ISBN 978-94-6191-316-6; Promotor: prof.dr. R. Dekker, prof.dr. K.A.A. Makinwa.

  935. Fully integrated MEMS TGA device for inspection of nano-masses
    E. Iervolino;
    PhD thesis, Delft University of Technology, May 2012. ISBN 9789462030312; Promotor: prof.dr. P.M. Sarro.

  936. Monolithic, low-temperature fabrication of three-dimensional integrated circuits
    M.R. Tajari Mofrad;
    PhD thesis, Delft University of Technology, Oct. 2012. ISBN 978-94-6203-173-9; Promotor: prof.dr. C.I.M. Beenakker, dr. R. Ishihara.

  937. Silicon-based integration of groups III, IV, V chemical vapor deposition in high quality photodiodes
    A. Sammak;
    PhD thesis, Delft University of Technology, Dec. 2012. ISBN 9789462032705; Promotor: prof.dr. L.K. Nanver.

  938. Silicon technology for integrating high-performance low-energy electron photodiode detector
    A. Sakic;
    PhD thesis, Delft University of Technology, Nov. 2012. ISBN 978-94-6203-260-6; Promotor: prof.dr. L.K. Nanver.

  939. A 1.8 µW 60 nV/√Hz Capacitively-Coupled Chopper Instrumentation Amplifier in 65 nm CMOS for Wireless Sensor Nodes
    Qinwen Fan; Fabio Sebastiano; Johan H. Huijsing; Kofi A.A. Makinwa;
    {IEEE} J. Solid-State Circuits,
    Volume 46, Issue 7, pp. 1534 - 1543, July 2011. DOI: 10.1109/JSSC.2011.2143610
    Keywords: ... CMOS integrated circuits;choppers (circuits);instrumentation amplifiers;wireless sensor networks;CMOS technology;CMRR;DC servo loop;PSRR;biopotential sensing;capacitively-coupled chopper instrumentation amplifier;chopping ripple;current 1.8 muA;electrode offset suppression;low-power precision instrumentation amplifier;noise efficiency factor;positive feedback loop;power 1.8 muW;rail-to-rail input common-mode range;ripple reduction loop;size 65 nm;voltage 1 V;wireless sensor nodes;Capacitors;Choppers;Impedance;Noise;Sensors;Topology;Wireless sensor networks;Bio-signal sensing;chopping;high power efficiency;low offset;low power;precision amplifier;wireless sensor nodes.

    Abstract: ... This paper presents a low-power precision instrumentation amplifier intended for use in wireless sensor nodes. It employs a capacitively-coupled chopper topology to achieve a rail-to-rail input common-mode range as well as high power efficiency. A positive feedback loop is employed to boost its input impedance, while a ripple reduction loop suppresses the chopping ripple. To facilitate bio-potential sensing, an optional DC servo loop may be employed to suppress electrode offset. The IA achieves 1 µV offset, 0.16% gain inaccuracy, 134 dB CMRR, 120 dB PSRR and a noise efficiency factor of 3.3. The instrumentation amplifier was implemented in a 65 nm CMOS technology. It occupies only 0.1 mm² chip area (0.2 mm² with the DC servo loop) and consumes 1.8 µA current (2.1 µA with the DC servo loop) from a 1 V supply.

  940. Temperature calibration and electrical characterization of the differential scanning calorimeter chip UFS1 for the Mettler-Toledo Flash DSC 1
    E. Iervolino; A.W. van Herwaarden; F.G. van Herwaarden; E. van de Kerkhof; P.P.W. van Grinsven; A.C.H.I. Leenaers; V.B.F. Mathot; P.M. Sarro;
    Thermochimica Acta,
    Volume 522, Issue 1-2, pp. 53-59, Aug. 2011. DOI 10.1016/j.tca.2011.01.023.

  941. Modeling study on carrier mobility in ultra-thin body FinFETs with circuit-level implications
    M. Poljak; V. Jovanovic; T. Suligoj;
    Solid-State Electronics,
    Volume 65-66, pp. 130-138, 2011. DOI 10.1016/j.sse.2011.06.039.

  942. Boron-layer silicon photodiodes for high-efficiency low-energy electron detection
    A. _akic; L.K. Nanver; T.L.M. Scholtes; C.Th.H. Heerkens; T. Kne_evic; G. van Veen; K. Kooijman; P. Vogelsang;
    Solid-State Electronics,
    Volume 65-66, pp. 38-34, Dec. 2011. DOI 10.1016/j.sse.2011.06.042.

  943. Integration of MOSFETs with SiGe dots as stressor material
    L.K. Nanver; V. Jovanovic; C. Biasotto; J. Moers; D. Gruetzmacher; J.J. Zhang; N. Hrauda; M. Stoffel; F. Pezzoli; O.G. Schmidt; L. Miglio; H. Kosina; A. Marzegalli; G. G. Vastola. Mussler; J. Stangl; G. Bauer a;
    Solid-State Electronics,
    Volume 60, Issue 1, pp. 75-83., 2011. DOI 10.1016/j.sse.2011.01.038.

  944. Design, performance and analysis of thermal lag of the UFS1 twin-calorimeter chip for fast scanning calorimetry using the Mettler-Toledo Flash DSC 1
    A.W. van Herwaarden; E. Iervolino; F.G. van Herwaarden; T. Wijffels; A. Leenaers; V.B.F. Mathot;
    Thermochimica Acta,
    Volume 522, Issue 1-2, pp. 46-52, Aug. 2011. DOI 10.1016/j.tca.2011.05.025.

  945. Atomic-scale electron-beam sculpting of near-defect-free graphene nanostructures
    B. Song; G.F. Schneider; Q. Xu; G. Pandraud; C. Dekker; H.W. Zandbergen;
    Nano Letters,
    Volume 11, Issue 6, pp. 2247-2250, 2011. DOI 10.1021/nl200369r.

  946. X-ray Nanodiffraction on a Single SiGe Quantum Dot inside a Functioning Field-Effect Transistor
    N. Hrauda; J. Zhang; E. Wintersberger; T. Etzelstorfer; B. Mandl; J. Stangl; D. Carbone; V. Holy; V. Jovanovic; C. Biasotto; L.K. Nanver; J. Moers; D. Grutzmacher; G. Bauer;
    Nano Letters,
    Volume 11, Issue 7, pp. 2875-2880, 2011. DOI 10.1021/nl2013289.

  947. MEMS silicon-based micro-evaporator
    M. Mihailovic; C.M. Rops; J. Hao; L. Mele; J.F. Creemer; P.M. Sarro;
    Journal of Micromechanics and Microengineering,
    Volume 21, Issue 7, pp. 1-9, 2011. DOI 10.1088/0960-1317/21/7/075007.

  948. Arsenic-doped high-resistivity-silicon epitaxial layers for integrating low-capacitance diodes
    A. Sakic; T.L.M. Scholtes; W. de Boer; N. Golshani; J. Derakhshandeh; L.K. Nanver;
    Materials,
    Volume 4, Issue 12, pp. 2092-2107, Dec. 2011. DOI 10.3390/ma4122092.

  949. RF small signal avalanche for bipolar transistor circuit design: Characterization, modeling and repercussions
    V. Milovanovic; R. R. van der Toorn Pijper;
    Microelectronics Reliability,
    Volume 51, Issue 3, pp. 560-565, 2011. DOI 10.1016/j.microrel.2010.10.006.

  950. An analytical model and verification for MEMS Pirani gauges
    F. Santagata; E. Iervolino; L. Mele; A.W. van Herwaarden; J.F. Creemer; P.M. Sarro;
    Journal of Micromechanics and Microengineering,
    Volume 21, Issue 11, pp. 1-7, 2011. DOI 10.1088/0960-1317/21/11/115007.

  951. A surface micromachined thermopile detector array with an interference-based absorber
    H. Wu; A. Emadi; P.M. Sarro; G. de Graaf; R.F. Wolffenbuttel;
    Journal of Micromechanics and Microengineering,
    Volume 21, Issue 7, pp. 1-8, Jun. 2011. DOI 10.1088/0960-1317/21/7/074009.

  952. Mixed motion in deterministic ratchets due to anisotropic permeability
    T. Kulrattanarak; R.G.M. van der Sman; Y.S. Lubbersen; C.G.P.H. Schro�n; H.T.M. Pham; P.M. Sarro; R.M. Boom;
    Journal of Colloid and Interface Science,
    Volume 354, Issue 1, pp. 7-14., Feb. 2011. DOI 10.1016/j.jcis.2010.10.02.

  953. Low-complexity full-melt laser-anneal process for fabrication of low-leakage implanted ultrashallow junctions
    C. Biasotto; V. Gonda; L.K. Nanver; T.L.M. Scholtes; J. van der Cingel; D. Vidal; V. Jovanovi_;
    Journal of Electronic Materials,
    Volume 40, Issue 11, pp. 2187-2196, 2011. DOI 10.1007/s11664-011-1734-6.

  954. Excimer laser crystallization of InGaZnO4 on SiO2 substrate
    T. Chen; M.Y. Wu; R. Ishihara; K. Nomura; T. Kamiya; H. Hosono; C.I.M Beenakker;
    Journal of Materials Science: Materials Electronics,
    Volume 22, pp. 1694-1696, 2011. DOI 10.1007/s10854-011-0347-4.

  955. Synergistic toughening of epoxy-copper interface using a thiol-based coupling layer
    C.K.Y. Wong; S.Y.Y. Leung; H. Fan; M.M.F. Yuen;
    Journal of Adhesion Science and Technology,
    Volume 25, Issue 16, pp. 2081-2099, 2011. DOI 10.1163/016942410X544875.

  956. MEMS for thermogravimetry: Fully integrated device for inspection of nanomasses
    E. Iervolino; A.W. van Herwaarden; W. van der Vlist; P.M. Sarro;
    IEEE/ASME Journal of Microelectromechanical Systems,
    Volume 20, Issue 6, pp. 1277-1286, Dec. 2011. DOI 10.1109/JMEMS.2011.2167672.

  957. Hot carrier effect and tunneling effect of location- and orientation-controlled (100)- and (110)-oriented single-grain Si TFTs without seed substrate
    T. Chen; R. Ishihara; C.I.M. Beenakker;
    IEEE Transactions on Electron Devices,
    Volume 58, Issue 1, pp. 216-223, 2011. DOI 10.1109/TED.2010.2084089.

  958. Analysis of electrothermal effects in bipolar differential pairs
    V. d'Alessandro; L. La Spina; L.K. Nanver; N. Rinaldi;
    IEEE Transactions on Electron Devices,
    Volume 58, Issue 4, pp. 966-978, Apr. 2011. DOI 10.1109/TED.2011.2106132.

  959. Enhancing the wettability of high aspect-ratio through-silicon vias lined with LPCVD silicon nitride or PE-ALD titanium nitride for void-free bottom-up copper electroplating
    M. Saadaoui; H. van Zeijl; W.H.A. Wien; H.T.M. Pham; C. Kwakernaak; H.C.M. Knoops; W.M.M. Erwin Kessels; R.M.C.M. van de Sanden; F.C. Voogt; F. Roozeboom; P.M. Sarro;
    IEEE Transactions on Components, Packaging and Manufacturing Technology,
    Volume 1, Issue 11, pp. 1728-1738, 2011. DOI 10.1109/TCPMT.2011.2167969.

  960. A tube-shaped buried Pirani gauge for low detection limit with small footprint
    F. Santagata; J.F. Creemer; E. Iervolino; L. Mele; A.W. van Herwaarden; P.M. Sarro;
    IEEE Journal of Microelectromechanical Systems,
    Volume 20, Issue 3, pp. 676-684, Jun. 2011. DOI 10.1109/JMEMS.2011.2127457.

  961. Monolithic 3-D integration of SRAM and image sensor using two layers of single-grain silicon
    J.Derakhshandeh; N.Golshani; R. Ishihara; M.R. Tajari Mofrad; M. Robertson; T. Morrison; C.I.M. Beenakker;
    IEEE Transactions on Electron Devices,
    pp. 3954-3961, 2011.

  962. A review of passive thermal management of LED module
    H. Ye; S. Koh; H. Zeijl; A.W.J. Gielen; GuoQi Zhang;
    Journal of Semiconductors,
    Volume 32, Issue 1, pp. 1-4, 2011. DOI 10.1088/1674-4926/32/1/014008.

  963. Validation of forcefields in predicting the physical and thermophysical properties of emeraldine base polyaniline
    X.P. Chen; C.A. Yuan; C.K.Y. Wong; S.W. Koh; GuoQi Zhang;
    Molecular Simulation,
    Volume 37, Issue 12, pp. 990-996, Oct. 2011. DOI 10.1080/08927022.2011.562503.

  964. Nanopatterned platinum electrodes by focused ion beam in single palladium nanowire based devices
    La Ferrara, Vera; Alfano, Brigida; Fiorentino, Giuseppe; Polichetti, Tiziana; Massera, Ettore; Di Francia, Girolamo;
    Microelectronic Engineering,
    Volume 88, Issue 11, pp. 3261--3266, 2011.

  965. Molecular modeling of temperature dependence of solubility parameters for amorphous polymers
    X.P. Chen; C.A. Yuan; C.K.. Wong; GuoQi Zhang;
    Journal of Molecular Modeling,
    pp. 1-9, Oct. 2011. DOI 10.1007/s00894-011-1249-3.

  966. A numerical experimental approach for characterizing the elastic properties of thin films: Application of nanocantilevers
    R.H. Poelma; H. Sadeghian; S.P.M. Noijen; J.J.M. Zaal; GuoQi Zhang;
    Journal of Micromechanics and Microengineering,
    Volume 21, Issue 6, pp. 1-11, 2011. DOI 10.1088/0960-1317/21/6/065003.

  967. Monolithic 3D Integration of SRAM and Image Sensor Using Two Layers of Single Grain Silicon
    Jaber Derakhshandeh; Negin Golshani; Ryoichi Ishihara; Mohammad Reza Tajari Mofrad; Michael Robertson; Thomas Morrison; C.I.M Beenakker;
    IEEE Transactions on Electron Devices,
    Volume 58, Issue 11, pp. 3954-3961, 2011.

  968. Luminescent Porous Silicon Nanoparticles as Drug Carrier
    La Ferrara, Vera; Di Francia, Girolamo; Fiorentino, Giuseppe;
    In Sensors and Microsystems,
    Springer, 2011.

  969. Calorimetry Measurement
    E.Iervolino; A.W. van Herwaarden.;
    In The Measurement, Instrumentation and Sensors Handbook,
    CRC Press, 2011.

  970. Silicon Photodiodes for Low Penetration Depth Beams such as DUV/VUV/EUV Light and Low-Energy Electrons
    L.K. Nanver;
    In Advances Photodiodes,
    InTech, Publishing, 2011. ISBN: 978-953-307-163-3.

  971. Single Palladium Nanowire: Morphology and its Correlation with Sensing Mechanism
    La Ferrara, Vera; Alfano, Brigida; Polichetti, Tiziana; Massera, Ettore; Di Francia, Girolamo; Fiorentino, Giuseppe;
    In Sensors and Microsystems,
    Springer, 2011.

  972. High quality factor RF inductors using low loss conductor featured with skin effect suppression for standard CMOS/BiCMOS
    I. Iramnaaz; T. Sandoval; Y. Zhuang; H. Schellevis; B. Rejaei;
    In Proc. 2011 IEEE 61st Electronic Components and Technology Conference (ECTC 2011),
    Lake Buena Vista, FL, pp. 163-168, May 2011. DOI 10.1109/ECTC.2011.5898508.

  973. Input characteristics of a chopped multi-path current feedback instrumentation amplifier
    Qinwen Fan; J.H. Huijsing; K.A.A. Makinwa;
    In {De Venuto}, D; L Benini (Ed.), 4th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI),
    IEEE, pp. 61-66, 2011.

  974. Low temperature encapsulation of nanochannels with water inside
    C. Shen; V.R.S.S. Mokkapati; F. Santagata; A. Bossche; P.M. Sarro;
    In 16th International Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS 2011),
    Beijing, China, pp. 854-857, Jun. 2011. ISBN 978-1-4577-0157-3; DOI 10.1109/TRANSDUCERS.2011.5969464.

  975. PureB silicon photodiode detectors for DUV/VUV/EUV light and low-energy electrons
    L.K. Nanver;
    In Workshop on Next Generation UV Instrument Technologies Enabling Missions Astrophysics, Cosmology and Planetary Sciences,
    Keck Institute for Space Studies, Jet Propulsion Laboratory, Caltech, Pasadena, CA, USA-oral presentation, Aug. 2011.

  976. Electrical performance optimization of a silicon-based EUV photodiode with near-theoretical quantum efficiency
    L. L. ShiK. Nanver; S. Nihtianov;
    In 16th International Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS 2011),
    Beijing, China, pp. 48-51, Jun. 2011. ISBN 978-1-4577-0157-3; DOI 10.1109/TRANSDUCERS.2011.5969130.

  977. Sputtered molybdenum as conductive material for high-temperature microhotplates
    L. Mele; F. Santagata; E. Iervolino; M. Mihailovic; T. Rossi; A.T. Tran; H. Schellevis; J.F. Creemer; P.M. Sarro;
    In 16th International Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS 2011),
    Beijing, China, pp. 2690-2693, Jun. 2011. ISBN 978-1-4577-0157-3; DOI 10.1109/TRANSDUCERS.2011.5969500.

  978. Layer-by-layer deposition of colloidal semiconductor nanocrystals for integration of infrared photon-detectors on 3D topography
    J. Wei; Y. Gao; A.J. Houtepen; G. Pandraud; P.M. Sarro;
    In 16th International Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS 2011),
    Beijing, China, pp. 1749-1752, Jun. 2011. ISBN 978-1-4577-0157-3; DOI 10.1109/TRANSDUCERS.2011.5969819.

  979. A novel SOI-MEMS �micro-swing� time-accelerometer operating in two time-based transduction modes for high sensitivity and extended range
    V. Rajaraman; B.S. Hau; L.A. Rocha; R.A. Dias; K.A.A. Makinwa; R. Dekker;
    In 16th International Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS 2011),
    Beijing, China, pp. 2066-2069, Jun. 2011. ISBN 978-1-4577-0157-3; DOI 10.1109/TRANSDUCERS.2011.5969225.

  980. MEMS silicon-based resistojet micro-thruster for attitude control of nano-satellites
    M. Mihailovic; T.V. Mathew; J.F. Creemer; B.T.C. Zandbergen; P.M. Sarro;
    In of 16th International Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS 2011),
    Beijing, China, pp. 262-265, Jun. 2011. ISBN 978-1-4577-0157-3; DOI 10.1109/TRANSDUCERS.2011.5969432.

  981. Self-cleaning mass calibration of a thermogravimetric device using a thin-film molybdenum
    E. Iervolino; L. Mele; F. Santagata; A.W. van Herwaarden; W. van der Vlist; J.F. Creemer; P.M. Sarro;
    In 16th International Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS 2011),
    Beijing, China, pp. 1038-1041, Jun. 2011. ISBN 978-1-4577-0157-3; DOI 10.1109/TRANSDUCERS.2011.5969167.

  982. IC compatible top down process for silicon nanowire FET arrays with three 100 surfaces for (BIO) chemical sensing
    T.S.Y. Moh; Y. Maruyama; C. Shen; G. Pandraud; L.C.P.M. de Smet; H.D. Tong; C. van Rijn; E.J.R. Sudholter; P.M. Sarro;
    In 16th International Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS 2011),
    Beijing, China, pp. 1590-1593, Jun. 2011. ISBN 978-1-4577-0157-3; DOI 10.1109/TRANSDUCERS.2011.5969796.

  983. Design and fabrication of single grain (SG) TFTs and lateral PIN photodiodes for low dose X-ray detection
    A. Arslan; R. Ishihara; J. Derakhshandeh; C.I.M. Beenakker;
    In Proc. of SPIE Medical Imaging Conference,
    Lake Buena Vista, Orlando, USA, pp. 79614N-1-79614N, Feb. 2011. DOI 10.1117/12.877959.
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  984. Lateral bipolar structures for evaluating the effectiveness of surface doping techniques
    G. Lorito; L. L. Qi K. Nanver;
    In Proc. of IEEE International Conference on Microelectronic Test Structures (ICMTS 2011),
    Amsterdam, pp. 108-113, Apr. 2011. DOI 10.1109/ICMTS.2011.5976870.

  985. Optimization of the perimeter doping of ultrashallow p+-n--n+ photodiodes
    T. Kne_evi_; T. Suligoj; A. _aki_; L.K. Nanver;
    In Proc. International Conventions MIPRO 2011,
    Opatija, Croatia, pp. 44-48, May 2011. ISBN 978-1-4577-0996-8.
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  986. High-sensitivity high-stability silicon photodiodes for DUV, VUV and EUV spectral ranges
    L. Shi; S. Nihtianov; L.K. Nanver; F. Scholze; A. Gottwald;
    In O.H. Siegmund (Ed.), Proc. SPIE,
    San Diego, CA, USA, pp. 1-9, Aug. 2011. DOI 10.1117/12.891865.

  987. Process for low temperature deposition of strain gauge materials based on chromium nitride thin films
    H.A. Mol; H. Schellevis; P.M. Sarro; Y. Hou;
    In Proc. IEEE SENSORS 2011 Conference,
    Limerick, Ireland, pp. 226-229, Oct. 2011. ISBN 978-1-4244-9288-6; DOI 10.1109/ICSENS.2011.6127044.

  988. Solid-state backscattered-electron detector for sub-keV imaging in scanning electron microscopy
    A. _aki_; L.K. Nanver; G. van Veen; K. Kooijman; P. Vogelsang; T.L.M. Scholtes; W. de Boer; W. Wien; S. Milosavljevi_; C.Th.H. Heerkens; T. Kne_evi_; I. Spee;
    In Proc. ICT.OPEN: Micro technology and micro devices (SAFE 2011),
    Veldhoven, The Netherlands, pp. 92-95, Nov. 2011.

  989. Large-area selective CVD epitaxial growth of Ge on Si substrates
    A. Sammak; W.B. de Boer; L. L. Qi K. Nanver;
    In Proc. ICT.OPEN: Micro technology and micro devices (SAFE 2011),
    Veldhoven, The Netherlands, pp. 96-99, Nov. 2011.
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  990. A steering electrode array for selective stimulation of sacral nerve roots
    F.O. Rodrigues; P.M. Mendes; M. Bartek; B. Mimoun;
    In Proc. ICT.OPEN: Micro technology and micro devices (SAFE 2011),
    Veldhoven, The Netherlands, pp. 88-91, Nov. 2011.

  991. with transferring PureB CVD from an epitaxial reactor to a furnace system
    K.R.C. Mok; L.K. Nanver; W.D. de Boer; A.H.G. Vlooswijk;
    In Proc. ICT.OPEN: Micro technology and micro devices (SAFE 2011),
    Veldhoven, The Netherlands, pp. 76-78, Nov. 2011.

  992. On the uniformity of pure-boron-layer depositions
    V. Mohammadi; W.D. de Boer; T.L.M. Scholtes; A. Sakic; C. Heerkens; L.K. Nanver;
    In Proc. ICT.OPEN: Micro technology and micro devices (SAFE 2011),
    Veldhoven, The Netherlands, pp. 73-75, Nov. 2011.

  993. Simple method to evaluate minority carrier injection levels in schottky diodes
    L. Qi; G. Lorito; L.K. Nanver;
    In Proc. ICT.OPEN: Micro technology and micro devices (SAFE 2011),
    Veldhoven, The Netherlands, pp. 1-3, Nov. 2011.

  994. Electrical characterisation of low temperature aligned carbon nanotubes for vertical interconnects
    S. Vollebregt; R. Ishihara; J. van der Cingel; H. Schellevis; C.I.M. Beenakker;
    In Proc. ICT.OPEN: Micro technology and micro devices (SAFE 2011),
    Veldhoven, The Netherlands, Nov. 2011.

  995. Developer etched single and arrays of three 100 planes silicon nanowires (SiNWs) FET
    T.S.Y. Moh; Y. Maruyama; G. Pandraud; L.C.P.M. de Smet; C. van Rijn; E.J.R. Sudholter; P.M. Sarro;
    In Proc. ICT.OPEN: Micro technology and micro devices (SAFE 2011),
    Veldhoven, The Netherlands, Nov. 2011.

  996. Fabrication of AlN slender piezoelectric cantilevers for high-speed MEMS actuations
    A.T. Tran; G. Pandraud; H. Schellevis; T. Alan; V. Aravindh; O. Wunnicke; P.M. Sarro;
    In C. Tsamis; G. Kaltas (Ed.), Proc. Eurosensors XXV,
    Athens, Greece, Procedia Engineering, pp. 673-676, Sep. 2011. DOI 10.1016/j.proeng.2011.12.166.

  997. 6 DOF force and torque sensor for micro-manipulation applications
    P. Estevez; J.M. Bank; M. Porta; J. Wei; P.M. Sarro; M. Tichem; U. Staufer;
    In C. Tsamis; G. Kaltas (Ed.), Proc. Eurosensors XXV,
    Athens, Greece, Procedia Engineering, pp. 39-42, Sep. 2011. DOI 10.1016/j.proeng.2011.12.010.

  998. Use of multi-wall carbon nanotubes as an absorber in a thermal detector
    H. Wu; S. Vollebregt; A. Emadi; G. de Graaf; R. R. IshiharaF. Wolffenbuttel;
    In C. Tsamis; G. Kaltas (Ed.), Proc. Eurosensors XXV,
    Athens, Greece, Procedia Engineering, pp. 523-526, Sep. 2011. DOI 10.1016/j.proeng.2011.12.130.

  999. Electro-thermal analysis of MEMS microhotplates for the optimization of temperature uniformity
    L. Mele; T. Rossi; M. Riccio; E. Iervolino; F. Santagata; A. Irace; G. Breglio; J.F. Creemer; P.M. Sarro;
    In C. Tsamis; G. Kaltas (Ed.), Proc. Eurosensors XXV,
    Athens, Greece, Procedia Engineering, pp. 387-390, Sep. 2011. DOI 10.1016/j.proeng.2011.12.096.

  1000. Suspended submicron silicon-beam for high sensitivity piezoresistive sensing
    J. Wei; S. Magnani; P.M. Sarro;
    In C. Tsamis; G. Kaltas (Ed.), Proc. Eurosensors XXV,
    Athens, Greece, Procedia Engineering, pp. 1437-1440, Sep. 2011. DOI 10.1016/j.proeng.2011.12.355.

  1001. A buried vertical filter for micro and nanoparticle filtration
    S.J. Li; C. Shen; P.M. Sarro;
    In C. Tsamis; G. Kaltas (Ed.), Proc. Eurosensors XXV,
    Athens, Greece, Procedia Engineering, pp. 1193-1196, Sep. 2011. DOI 10.1016/j.proeng.2011.12.294.

  1002. Physics-based modeling of hole mobility in ultrathin-body silicon-on-insulator MOSFETs
    M. Poljak; V. Jovanovi_; T. Suligoj;
    In Proc. 34th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO),
    Opatija, Croatia, pp. 71-76, May 2011. ISBN 978-953-233-060-1.

  1003. A silicon-based MEMS resistojet for propelling cubesats
    T.V. Mathew; B.T.C. Zandbergen; M. Mihailovic; J.F. Creemer; P.M. Sarro;
    In Proc. 62nd International Astronautical Congress,
    Cape Town, South Africa, pp. 1-8, Oct. 2011.

  1004. High-quality p+n Ge diodes selectively grown on Si with a sub-300nm transition region
    A. Sammak; W.B. de Boer; L. L. Qi K. Nanver;
    In Proc. European Solid-State Device Research Conference (ESSDERC 2011),
    Helsinki, Finland, pp. 359-362, Sep. 2011. ISBN 978-1-4577-0707-0; DOI 10.1109/ESSDERC.2011.6044160.

  1005. An all-in-one nanoreactor for high-resolution microscopy on nanomaterials at high pressures
    J.F. Creemer; F. Santagata; B. Morana; L. Mele; T. Alan; E. Iervolino; G. Pandraud; P.M. Sarro;
    In Proc. 24th IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2011),
    Cancun, Mexico, IEEE, pp. 1103-1106, Jan. 2011. ISBN 978-1-4244-9633-4; DOI 10.1109/MEMSYS.2011.5734622.

  1006. A stretchable micro-electrode array for in vitro electrophysiology
    S. Khoshfetrat Pakazad; A. Metodiev Savov; A. van de Stolpe; S. Braam; B. van Meer; R. Dekker;
    In Proc. 24th IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2011),
    Cancun, Mexico, IEEE, pp. 829-832, Jan. 2011. ISBN 978-1-4244-9633-4; DOI 10.1109/MEMSYS.2011.5734553.

  1007. Features of electron mobility in ultrathin-body InGaAs-on-insulator MOSFETs down to body thickness of 2 nm
    M. Poljak; V. Jovanovi_; T. Suligoj;
    In Proc. 2011 IEEE International SOI Conference,
    Tempe, Arizona, USA, pp. 156-157, Oct. 2011. ISBN 978-1-61284-759-7; DOI 10.1109/SOI.2011.6081700.

  1008. Investigation of hole mobility in ultrathin-body SOI MOSFETs on (110) surface: Effects of silicon thickness and body doping
    M. Poljak; V. Jovanovi_; T. Suligoj;
    In Proc. 2011 IEEE International SOI Conference,
    Tempe, Arizona, USA, pp. 114-115, Oct. 2011. ISBN 978-1-61284-759-7; DOI 10.1109/SOI.2011.6081691.

  1009. Millimeter-wave integrated waveguides on silicon
    G. Gentile; R. Dekker; P. de Graaf; M. Spirito; L.C.N. de Vreede; B. Rejaei;
    In Proc. 2011 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits RF Systems (SiRF 2011),
    Phoenix, AZ, pp. 37-40, Jan. 2011. ISBN 978-1-4244-8060-9; DOI 10.1109/SIRF.2011.5719314.

  1010. Single grain TFTs and lateral photodiodes for large area X-ray detection
    A. Arslan; R. Ishihara; C.I.M. Beenakker;
    In Proc. 2011 International Image Sensor Workshop (IISW),
    Hokkaido, Japan, pp. 301-304., Jun. 2011.

  1011. Series resistance optimization of high-sensitivity Si-based VUV photodiodes
    L. L. ShiK. Nanver; A. _aki_; T. Kne_evi_; S. Nihtianov; A. Gottwald; U. Kroth;
    In Proc. 2011 IEEE Instrumentation and Measurement Technology Conference (I2MTC),
    Hangzhou, China, pp. 1-4, May 2011. ISBN 978-1-4244-7935-1; DOI 10.1109/IMTC.2011.5944073.

  1012. Monolithic 3D-ICs with single grain Si thin film transistors
    R. Ishihara; N. Golshani; J. Derakhshandeh; M.R. Tajari Mofrad; C.I.M. Beenakker;
    In Proc. 12th International Conference on Ultimate Integration on Silicon (ULIS),
    Cork, Ireland, pp. 1-4, Mar. 2011. ISBN 978-1-4577-0090-3; DOI 10.1109/ULIS.2011.5758004.

  1013. Compact noise modeling of SiGe heterojunction bipolar transistors: Relevance of base-collector shot noise correlation and non-quasi static effects in the quasi-neutral emitter
    F. Vitale; R. Pijper; R. van der Toorn;
    In Proc. 2011 IEEE Bipolar/BiCMOS Technology and Circuits Meeting (BCTM 2011),
    Atlanta, GA, pp. 179-182, Oct. 2011.

  1014. Integrating low temperature aligned carbon nanotubes as vertical interconnects in Si technology
    S. Vollebregt; R. Ishihara; J. J. Derakhshandeh. van der Cingel; H. Schellevis; C.I.M. Beenakker;
    In Proc. 11th IEEE International Conference on Nanotechnology (NANO 2011),
    Portland, OR, pp. 985-990, Aug. 2011.

  1015. In situ HRTEM of a catalyst using a nanoreactor at 1 bar
    S.B. Vendelbo; J.F. Creemer; S. Helveg; B. Morana; L. Mele; A.M. Molenbroek; P.M. Sarro; H.W. Zandbergen; P.J. Kooyman;
    In Netherlands Catalysis and Chemistry Conference (NCCC-XII),
    Noordwijk, pp. 332, Feb. 2011.

  1016. Positioning More-than-Moore characterization needs within the 2011 ITRS
    M. Graef;
    In AIP Conference Proceedings: Frontiers of Characterization and Metrology for Nanoelectronics,
    Grenoble (France), pp. 345-350, May 2011. ISBN: 978-0-7354-0965-1; DOI 10.1063/1.3657913.

  1017. A CMOS compatible Ge-on-Si APD operating in proportional and geiger modes at infrared wavelengths
    A. Sammak; M. Aminian; L. Qi; W.B. de Boer; E. Charbon; L.K. Nanver;
    In International Electron Device Meeting (IEDM 2011),
    Washington DC, Dec. 2011.

  1018. Single-grain Si TFTs for high-speed flexible electronics
    R. Ishihara; T. Chen; M. van der Zwan; M. He; H. Schellevis; C.I.M. Beenakker;
    In K. Blankenbach; L.C. Chien (Ed.), Proc. of SPIE: Advances Display Technologies and E-papers and Flexible Displays,
    San Francisco, CA, SPIE, Jan. 2011. ISBN 9780819484932; DOI 10.1117/12.876649.

  1019. Conventional micro-fabrication process for silicon nanowires FET with three 100 surfaces
    T.S.Y. Moh; G. Pandraud; L.C.P.M. de Smet; C. van Rijn; E.J.R. Sudholter; P.M. Sarro;
    In International Conference on Materials for Advanced Technologies (ICMAT 2011),
    Suntec City, Singapore, Jun. 2011.

  1020. Plasma etching for failure analysis of integrated circuit packages
    Jiaqi Tang; J.B.J. Schelen; C.I.M. Beenakker;
    In ECS Transactions: China Semiconductor Technology International Conference 2011 (CSTIC 2011),
    Shanghai, China, pp. 913-918, Mar. 2011. ISSN 1938-5862; DOI 10.1149/1.3567691.

  1021. Novel Si-based diodes opening up new electronic frontiers
    L.K. Nanver;
    In 7-th Workshop on Future Trends Electronics (WOFE-2011),
    San Juan, Puerto Rico, Dec. 2011.

  1022. Biosensing
    E.J.R. Sudholter; G.Z. Garyfallou; D. Ullien; L.C.P.M. Smet; S. Srivastava; M.A. Jongsma; M. Mescher; J.H. Klootwijk; T.S.Y. Moh; P.M. Sarro; C. Rijn;
    In Book of Abstracts, 4th IRUN Symposium on NanoTechnology,
    Nijmegen, The Netherlands, pp. 32-33, Oct. 2011.

  1023. Patterned aligned carbon nanotubes for vertical interconnects in 3D integrated TFT circuits
    S. Vollebregt; R. Ishihara; J. J. Derakhshandeh. van der Cingel; W.H.A. Wien; C.I.M. Beenakker;
    In 7th International Thin-Film Transistor Conference,
    Cambridge, United Kingdom, Mar. 2011.

  1024. Silicon boron-layer photodiodes for detecting low penetration-depth beams
    L.K. Nanver;
    In Book of Abstracts, 262nd PTB Seminar, EUV Metrology,
    Berlin, Germany, Oct. 2011.

  1025. FleXss: A standalone Matlab-based graphical user interface (GUI) for stress-strain analytical modeling of multilayered structures with applied bending
    B. Mimoun; A. Vieira da Silva; R. Dekker;
    In 3rd Flexible and Stretchable Electronics Workshop 2011,
    Berlin, Germany, Nov. 2011.
    document

  1026. Living chips-Chips for the living
    R. Dekker; B. Mimoun; S. Pakazaad;
    In 3rd Flexible and Stretchable Electronics Workshop 2011,
    Berlin, Germany, Nov. 2011.
    document

  1027. Ultra-flexible devices for smart invasive medical instruments
    B. Mimoun; V. Henneken; R. Dekker;
    In 3rd Flexible and Stretchable Electronics Workshop 2011,
    Berlin, Germany, Nov. 2011.

  1028. Linear and rotation thermal micro-stepper
    A. Khiat; J. Spronck; J. van Schieveen; S. Milosavljevic; J. Wei; P. Estevez; P.M. Sarro; U. Staufer;
    In 37th International Conference on Micro and Nano Engineering (MNE 2011,
    Berlin, Germany, pp. 1, Sep. 2011.
    document

  1029. A silicon carbide MEMS microhotplate for nanomaterial characterization in TEM
    B. Morana; F. Santagata; L. Mele; M. Mihailovic; G. Pandraud; J.F. Creemer; P.M. Sarro;
    In 24th IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2011),
    Cancun, Mexico, IEEE, pp. 380-383, Jan. 2011. ISBN 978-1-4244-9633-4; DOI 10.1109/MEMSYS.2011.5734441.

  1030. Microcantilevers encapsulated in fluid wells for sensing in liquids
    W.J. Venstra; W.H. Wien; P.M. Sarro; J. van Eijk;
    In 37th International Conference on Micro and Nano Engineering (MNE 2011),
    Berlin, Germany, pp. 1, Sep. 2011.
    document

  1031. Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental industrial environment
    L. L. ShiK. Nanver; S.N. Nihtianov;
    In 37th Annual Conference of the IEEE Industrial Electronics Society (IECON 2011),
    Melbourne, Australia, Nov. 2011. DOI 10.1109/IECON.2011.6119729.

  1032. Reflectance-based TiO2 photonic crystal sensors
    Yujian Huang; G. Pandraud; P.M. Sarro;
    In 16th International Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS 2011),
    Beijing, China, pp. 2682-2685, Jun. 2011. ISBN 978-1-4577-0157-3; DOI 10.1109/TRANSDUCERS.2011.5969771.

  1033. Fatigue model based on average cross-section strain of Cu trace cyclic bending
    D.M. Farley; A. Dasgupta; Y. Zhou; J.F.J Caers; J.W.C. de Vries;
    In 12th Internat. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2011),
    Linz, Austria, pp. 1-10, Apr. 2011. ISBN 978-1-4577-0106-1; DOI 10.1109/ESIME.2011.5765858.

  1034. PECVD SiC photonic crystal sensor
    G. Pandraud; Yujian Huang; P.M. Sarro; F. Bernal Arango;
    In Proc. IEEE SENSORS 2011 Conference,
    Limerick, Ireland, pp. 367-370, Oct. 2011. ISBN 978-1-4244-9288-6; DOI 10.1109/ICSENS.2011.6127130.

  1035. Evaluation and selection of sensing materials for carbon dioxide (CO2) sensor by molecular modeling
    X.P. Chen; C.K.Y. Wong; C.A. Yuan; GuoQi Zhang;
    In C. Tsamis; G. Kaltas (Ed.), Proc. Eurosensors XXV,
    Athens, Greece, Procedia Engineering, pp. 379-382, Sep. 2011. DOI 10.1016/j.proeng.2011.12.094.

  1036. Buckling analysis of carbon nanotubes and the influence of defect position
    R.H. Poelma; H. Sadeghian; S.W. Koh; GuoQi Zhang;
    In 12th Internat. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2011),
    Linz, Austria, pp. 1-7, Apr. 2011. ISBN 978-1-4577-0106-1; DOI 10.1109/ESIME.2011.5765864.

  1037. Thermal analysis of HB LED packages and advanced materials
    H. Ye; A.W.J. Gielen; H.W. vanZeijl; GuoQi Zhang;
    In ChinaSSL 2012, China,
    2011.

  1038. Co-design of wafer level thin film package assembly
    J.J.M. Zaal; F. Santagata; W.D. van Driel; GuoQi Zhang; J.F. Creemer; P.M. Sarro;
    In 12th Internat. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2011),
    Linz, Austria, pp. 1-6, Apr. 2011. ISBN 978-1-4577-0106-1.
    document

  1039. Numerical modeling of thermal performance: Natural convection and radiation of solid state lighting
    H. Ye; A.W.J. Gielen; H.W. vanZeijl; R.J. Werkhoven; GuoQi Zhang;
    In 12th Internat. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2011),
    Linz, Austria, pp. 1-6, Apr. 2011. ISBN 978-1-4577-0106-1; DOI 10.1109/ESIME.2011.5765845.

  1040. Degradation of epoxy lens materials in LED systems
    S. Koh; W.D. van Driel; GuoQi Zhang;
    In 12th Internat. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2011),
    Linz, Austria, pp. 1-5, Apr. 2011. ISBN 978-1-4577-0106-1; DOI 10.1109/ESIME.2011.5765850.

  1041. Molecular Dynamics study of the traction-displacement relations of epoxy-copper interfaces
    C.K.Y. Wong; S.Y.Y. Leung; R.H. Poelma; K.M.B. Jansen; C.A. Yuan; W.D. van Driel; GuoQi Zhang;
    In 12th Internat. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2011),
    Linz, Austria, pp. 1-5, Apr. 2011. ISBN 978-1-4577-0106-1; DOI 10.1109/ESIME.2011.5765785.

  1042. Plasma decapsulation of plastic IC packages with copper wire bonds for failure analysis
    Jiaqi Tang; H. Ye; J.B.J. Schelen; C.I.M. Beenakker;
    In Proc. 12th International Conference on Electronics Packaging Technology & High Density Packaging (ICEPT-HDP 2011),
    Shanghai, China, pp. 888-892, Aug. 2011. ISBN 978-1-4577-1768-0; DOI 10.1109/ICEPT.2011.6066972.

  1043. Reflectance-based photonic crystal liquid sensors made of ALD TiO2
    Yujian Huang; G. Pandraud; P.M Sarro;
    In C. Tsamis; G. Kaltas (Ed.), Proc. Eurosensors XXV,
    Athens, Greece, Procedia Engineering, pp. 1389-1392, Sep. 2011. DOI 10.1016/j.proeng.2011.12.343.

  1044. Single-grain Si TFTs using spin-coated liquid-silicon
    Jin Zhang; R. Ishihara; H. Tagagishi; R. Kawajiri; T. Shimoda. C.I.M. Beenakker;
    In 2011 International Electron Device Meeting (IEDM 2011),
    Washington, DC, USA, pp. 14.5.1-14.5.4, Dec. 2011. ISBN 978-1-4577-0505-2; DOI 10.1109/IEDM.2011.6131553.

  1045. Patent: Thermogravimetric device with thermal actuator
    E.Iervolino; A.W. van Herwaarden;
    WIPO Patent Application WO/2011/062489, 2011.

  1046. Radiation Detector
    Lis K. Nanver; T. Ludovicus; M. Scholtes; Agata Sakic; C. Sander Kooijman; Gerard Nicolaas Anne Van Veen;
    Patent application, 2011.

  1047. Method of manufacturing a micro unit and micro unit for use in a microscope
    J.F. Creemer; G. Pandraud; F. Santagata;
    Patent No. WO2011019276, Feb. 2011.

  1048. Patent: Thermogravimetric device
    A.W. van Herwaarden; E.Iervolino;
    WIPO Patent Application WO/2011/062491, 2011.

  1049. MEMS monocrystalline-silicon based thermal devices for chemical and microfluidic applications
    M. Mihailovic;
    PhD thesis, Delft University of Technology, Jun. 2011. ISBN 978-90-5335-430-8; Promotor: prof.dr. P.M. Sarro.

  1050. Mechanical robustness and hermeticity monitoring for MEMS thin film encapsulation
    F. Santagata;
    PhD thesis, Delft University of Technology, Dec. 2011. ISBN 978-90-8570-759-2; Promotor: prof.dr. P.M. Sarro.

  1051. Orientation-and-location controlled single-grain TFTs on glass substrate
    T. Chen;
    PhD thesis, Delft University of Technology, Apr. 2011. ISBN 978-90-8570-741-7; Promotors: prof. C.I.M. Beenakker, dr. R. Ishihara.

  1052. Interconnect schemes for stretchable array-type microsystems
    S. Sosin;
    PhD thesis, Delft University of Technology, Apr. 2011. ISBN 978-90-5335-390-7; Promotors: prof. P.M. Sarro, dr. M. Bartek.

  1053. DotFETs: MOSFETs strained by a single SiGe dot in a low-temperature ELA technology
    C. Biasotto;
    PhD thesis, Delft University of Technology, Oct. 2011. ISBN 978-90-8570-425-6; Promotor: prof.dr. L.K. Nanver.

  1054. Silicon micromachined vertical structures for nanoparticle separation
    C. Shen;
    PhD thesis, Delft University of Technology, Nov. 2011. ISBN 978-90-8570-761-5; Promotor: prof.dr. P.M. Sarro.

  1055. C-V profiling of ultra-shallow junctions using step like background profiles
    M. Popadic; V. Milovanovic; C. Xu; F. Sarubbi; L.K. Nanver;
    Solid-state electronics,
    Volume 54, Issue 9, pp. 890-896, 2010.

  1056. Design, fabrication and characterization of a femto-farad capacitive sensor for pico-liter liquid monitoring
    J. Wei; C. Yue; M. van der Velden; Z.L. Chen; Z.W. Liu; K.A.A. Makinwa; P.M. Sarro;
    Sensors and Actuators A,
    Volume 162, Issue 2, pp. 406-417, 2010.

  1057. Influence of layout design and on-wafer heatspreaders on the thermal behavior of fully-isolated Bipolar transistors: Part I - Static analysis
    S. Russo; La Spina; L; d'Alessandro; V; N. Rinaldi; L.K. Nanver;
    Solid-state electronics,
    Volume 54, Issue 8, pp. 745-753, 2010.

  1058. Ultra-high aspect ratio FinFET technology.
    V. Jovanovic; T. Suligoj; M. Poljak; Y. Civale; L.K. Nanver;
    Solid-state electronics,
    Volume 54, Issue 9, pp. 870-876, 2010.

  1059. Copper trace fatigue models for mechanical cycling, vibration and shock/drop of high-density PWAs
    D. Farley; Y. Zhou; F. Askari; M. Al-Bassyiouni; A. Dasgupta; J. Caers; J. DeVries;
    Microelectronics Reliability,
    Volume 50, pp. 937-947, Jul. 2010.

  1060. Comb-Actuated Resonant Torsional Microscanner with Mechanical Amplification
    A. Arslan; D. Brown; W. Davis; S. Holmstrom; S. K. Gokce; H. Urey;
    Journal of Microelectromechanical Systems (JMEMS),
    Volume 19, pp. 936-943, 2010.

  1061. MEMPHIS: a smart mix of electronics and photonics
    L.K. Nanver; Polmans; R; Leinse; A; Flannary; L; Mulders; H;
    Mikroniek,
    Volume 50, Issue 3, pp. 46-52, 2010.

  1062. Thermal budget considerations for excimer laser annealing of implanted dopant
    V. Gonda; J. Venturini; C. Sabatier; J. van der Cingel; L.K. Nanver;
    Journal of optoelectronics and advanced materials,
    Volume 12, Issue 3, pp. 466-469, 2010.

  1063. Growth of high density aligned carbon nanotubes using palladium as catalyst
    S. Vollebregt; J. Derakhshandeh; R. Ishihara; M. Y. Wu; C. I. M. Beenakker;
    Journal of Electronic Materials,
    Volume 39, Issue 4, pp. 371-375, 2010.

  1064. A silicon MEMS structure for characterization of femto-farad-level capacitive sensors with lock-in architecture
    J. Wei; C. Yue; Z.L. Chen; Z.W. Liu; P.M. Sarro;
    Journal of Micromechanics and Microengineering,
    Volume 20, Issue 6, 2010.

  1065. Chemical vapor deposition of a-boron layers on silicon for controlled nanometer deep p+n junction formation
    F. Sarubbi; T.L.M. Scholtes; L.K. Nanver;
    Journal of Electronic Materials,
    Volume 39, Issue 2, pp. 162-173, 2010.

  1066. Angular momentum dynamics and the intrinsic drift of monopolar vortices on a rotating sphere
    Ramses van der Toorn; Joseph T. F. Zimmerman;
    Journal of Mathematical Physics,
    Volume 51, 2010. DOI 10.1063/1.3455315.

  1067. High speed 6T SRAM cells using single grain TFTs fabricated by ""angstrom""""micro""-Czochralski-Czochralski process at low temperature
    Negin Golshani; Jaber Derakhshandeh; R. Ishihara; C.I.M Beenakker;
    Japanese Journal of Applied Physics (JJAP),
    2010.

  1068. Thermal design of multifinger Bipolar transistors.
    L. La Spina; V. d'Alessandro; S. Russo; L.K. Nanver;
    IEEE Transactions on Electron Devices,
    Volume 57, Issue 8, pp. 1789-1800, 2010.

  1069. Wafer-level assembly and sealing of a MEMS nanoreactor for in situ microscopy
    L. Mele; F. Santagata; G. Pandraud; B. Morana; F. D. Tichelaar; J. F. Creemer; P. M. Sarro;
    J. Micromech. Microeng.,
    Volume 20, 2010.

  1070. High effective Gummel number of CVD boron layers in ultrashallow p+n diode configurations.
    F. Sarubbi; L.K. Nanver; T.L.M. Scholtes;
    IEEE Transactions on Electron Devices,
    Volume 57, Issue 6, pp. 1269-1278, 2010.

  1071. Merging standard CVD techniques for GaAs and Si epitaxial growth.
    A. Sammak; W.B. de Boer; Boogaard; A van den; L.K. Nanver;
    ECS Transactions,
    Volume 28, Issue 5, pp. 237-244, 2010.

  1072. n-Channel MOSFETs fabricated on SiGe dots for strain-enhanced mobility.
    V. Jovanovic; C. Biasotto; L.K. Nanver; J. Moers; D. Gruetzmacher; J. Gerharz; G. Mussler; J. van der Cingel; J.J. Zhang; G. Bauer; O.G. Schmidt; L. Miglio;
    IEEE Electron Device Letters,
    Volume 31, Issue 10, pp. 1083-1085, 2010.

  1073. Flex-to-Rigid (F2R): A Novel Ultra-Flexible Technology for Smart Invasive Medical Instruments
    B. Mimoun; V. Henneken; R. Dekker;
    In Stretchable Electronics and Conformal Biointerfaces,
    Mater. Res. Soc. Symp. Proc. Volume 1271E, 2010.

  1074. A 2.1 µW Area-Efficient Capacitively-Coupled Chopper Instrumentation Amplifier for ECG Applications in 65 nm CMOS
    Qinwen Fan; Fabio Sebastiano; Johan H. Huijsing; Kofi A.A. Makinwa;
    In Proc. Asian Solid-State Circuits Conference,
    Beijing, China, pp. 1 - 4, November8--10 2010. DOI: 10.1109/ASSCC.2010.5716624
    Keywords: ... CMOS integrated circuits;amplifiers;biomedical electrodes;choppers (circuits);electrocardiography;CMOS technology;DC servo loop;ECG application;area efficient chopper instrumentation amplifier;capacitive feedback network;capacitively coupled chopper instrumentation amplifier;electrocardiography;electrode-tissue interface;power 2.1 muW;switched capacitor integrator;Choppers;DSL;Earth Observing System;Electrocardiography;Impedance;Instruments;Noise.

    Abstract: ... This paper describes a capacitively-coupled chopper instrumentation amplifier for use in electrocardiography (ECG). The amplifier's gain is accurately defined by a capacitive feedback network, while a DC servo loop rejects the DC offset generated by the electrode-tissue interface. The high-pass corner frequency established by the servo loop is realized by an area-efficient switched-capacitor integrator. Additional feedback loops are employed to boost the amplifier's input-impedance to 80 MΩ and to suppress the chopper ripple. Implemented in a 65 nm CMOS technology, the amplifier draws 2.1 µA from a 1 V supply and occupies 0.2 mm².

  1075. A 21nV/¿Hz chopper-stabilized multipath current-feedback instrumentation amplifier with 2µV offset
    Qinwen Fan; J.H. Huijsing; K.A.A. Makinwa;
    In H Hidaka; B. Nauta (Ed.), Digest of Technical Papers - 2010 IEEE International Solid-State Circuits Conference,
    IEEE, pp. 80-81, 2010.

  1076. A 1.8µW 1-µV-offset capacitively-coupled chopper instrumentation amplifier in 65nm CMOS
    Qinwen Fan; Fabio Sebastiano; Johan H. Huijsing; Kofi A.A. Makinwa;
    In Proc. European Solid-State Circuits Conference,
    Sevilla, Spain, pp. 170 - 173, September14--16 2010. DOI: 10.1109/ESSCIRC.2010.5619902
    Keywords: ... CMOS integrated circuits;instrumentation amplifiers;CMOS;input impedance;noise efficiency factor;positive feedback loop;precision capacitively-coupled chopper instrumentation amplifier;rail-to-rail DC common-mode input range;ripple reduction loop;size 65 nm;Accuracy;Choppers;Impedance;Instruments;Noise;Resistors;Topology.

    Abstract: ... This paper describes a precision capacitively-coupled chopper instrumentation amplifier (CCIA). It achieves 1µV offset, 134dB CMRR, 120dB PSRR, 0.16% gain accuracy and a noise efficiency factor (NEF) of 3.1, which is more than 3x better than state-of-the-art. It has a rail-to-rail DC common-mode (CM) input range. Furthermore, a positive feedback loop (PFL) is used to boost the input impedance, and a ripple reduction loop (RRL) is used to reduce the ripple associated with chopping. The CCIA occupies only 0.1mm² in a 65nm CMOS technology. It can operate from a 1V supply, from which it draws only 1.8µA.

  1077. A novel 3-D tube-shaped buried poly-Si Pirani gauge for extended dynamic range with small footprint
    Santagata; F.; E. Iervolino; Laros; J.M.W.; Groeneweg; J.; Creemer; J.F.; van Herwaarden; A.W.; P.M. Sarro and;
    In Y. Suzuki; Man Wong (Ed.), Proceedings of IEEE MEMS 2010 Conference,
    Wanchai, Hong Kong, IEEE, pp. 643-646), 2010.

  1078. Unifying GaAs and Si epitaxial growth in a standard Si/SiGe CVD system.
    A. Sammak; W.B. de Boer; L.K. Nanver;
    In STW-SAFE 2010 Conference Proceeding,
    Veldhoven, pp. 147-154, 2010.

  1079. Ultrashallow junction silicon photdiodes for detection of low energy electrons
    A. Sakic; L.K. Nanver; T.L.M. Scholtes; C.T.H. Heerkens; G. van Veen; K. Kooijman; P. Vogelsang;
    In STW-SAFE2010 Conference Proceeding,
    Veldhoven, pp. 150-153, 2010.

  1080. LPCVD amorphous SiCx for freestanding electron transparent windows
    B. Morana; J.F. Creemer; F. Santagata; C.C. Fan; H.T.M. Pham; G. Pandraud; F.D. Tichelaar; P.M. Sarro;
    In Y. Suzuki; Man Wong (Ed.), Proceedings of IEEE MEMS 2010 Conference,
    Wanchai, Hong Kong, IEEE, pp. 572-575), 2010.

  1081. VUV performance characterization of a silicon based ultrashallow junction photodiode
    L. Shi; S. Nihtianov; L.K. Nanver; Krothc A; U;
    In STW-SAFE2010 Conference Proceeding,
    Veldhoven, pp. 158-161, 2010.

  1082. High Performance Single Grain Si- TFT X-ray Image Sensors
    A. Arslan; R. Ishihara; C.I.M. Beenakker;
    In Semiconductor Advances for Future Electronics Workshop (SAFE),
    Veldhoven, The Netherlands, Nov. 2010.

  1083. The influence of stacking faults on the leakage current of B-layer p+n diodes.
    Golshani; N; W.B. de Boer; T.L.M. Scholtes; A. Sakic; L.K. Nanver;
    In Proceedings of STW-SAFE 2010,
    Veldhoven, Nederland, pp. 81-84, 2010.

  1084. Design and Development of an Ultra Compact Silicon Phase-Change Heat Exchanger
    Rops; C M; M. Mihailovic; P.M. Sarro;
    In Proceedings of the 2nd European Conference Microfluidics,
    Toulouse, France, Dec. 2010.

  1085. A Verilog-A Implementation for Correlated Noise in HBTs
    F. Vitale; Ramses van der Toorn;
    In Proceedings of SAFE 2010,
    Veldhoven, Netherlands, pp. 180-183, Nov. 2010.

  1086. Single-grain Si TFTs with high performance surpassing SOI-TFTs
    R. Ishihara; T. Chen; C.I.M. Beenakker;
    In Proceedings of International Meeting on Information Display,
    2010.

  1087. Molecular design of reliable epoxy-copper interface using molecular dynamic simulation
    C. K. Y. Wong; H. Fan; G. Zhang; M. Yuen;
    In Proceedings of International Conference of Thermal, Mechanical & Multi-Physics Simulation, and Experiments Microelectronics and Microsystems (EuroSimE),
    France, pp. 1-7, 2010.

  1088. Effect of the pulse offset on the thermal cycle for double excimer laser annealing of implanted silicon
    V. Gonda; L.K. Nanver;
    In Proceedings of OGET conference 2009,
    Gyergy�szentmikl�s, Romania: Hungarian Technical Scientific Society of Transylvania, Romania, pp. 135-138, 2010.

  1089. Base Resistance Distribution in Bipolar Transistors: Relevance to Compact Noise Modeling and Extraction from Admittance Parameters
    F. Vitale; R. Pijper; Ramses van der Toorn;
    In Proceedings of IEEE BCTM 2010,
    Austin, TX, pp. 161-164, Oct. 2010.

  1090. Optical Stability Investigation of High-Performance Silicon-Based VUV Photodiode
    L. Shi; S. Nihtianov; L.K. Nanver; U. Kroth; A. A. Sakic Gottwald;
    In Proceedings of IEEE Sensors 2010,
    Waikoloa, Hawaii, USA, pp. 132-135, Nov. 2010.

  1091. MEMS Silicon-Based Micro-Evaporator with Diamond-Shaped Fins
    M. Mihailovic; C. Rops; J.F. Creemer; P.M. Sarro;
    In Proceedings of EUROSENSORS XXIV,
    Linz, Austria, Sep. 2010.

  1092. Electrical characterization of TiSi/TiN layer stack in temperature range from 0 � 500 �C
    M. Mihailovic; J.F. Creemer; P.M. Sarro;
    In Proceedings of 13th Annual Workshop on Semiconductors Advances for Future Electronics and Sensors (SAFE),
    Veldhoven, The Netherlands, pp. 114-117, 2010.

  1093. Silicon Photodiodes for High-Efficiency Low-Energy Electron Detection
    Agata Sakic; Lis K. Nanver; T. L. M. Scholtes; Carel Th. H. Heerkens; Gerard van Veen; Kees Kooijman; Patrick Vogelsang;
    In Proceedings of IEEE 40th European Solid-State Device Research Conference (ESSDERC 2010),
    Seville, Spain, pp. 102-105, Sep. 2010.

  1094. Design concepts for semiconductor based ultra linear varactor circuits.
    C. Huang; K. Buisman; L.K. Nanver; P.J. Zampardi; L.E. Larson; L.C.N. de Vreede;
    In Proceedings of Bipolar/BiCMOS Circuits and Technology Meeting (BCTM),
    Austin, Texas, USA, IEEE, pp. 204-211, 2010.

  1095. Optical performance of B-layer ultra-shallow-junction silicon photodiodes in the VUV spectral range
    L. Shi; F. Sarubbi; L.K. Nanver; Kroth; U; Gottwald; A; S. Nihtianov;
    In Proc. Eurosensors XXIV,
    Linz, Austria, 2010.

  1096. A piezoresistive sensor for pressure monitoring at inkjet nozzle
    J. Wei; P.M. Sarro; T. Chu Duc;
    In Proc. IEEE Sensors,
    pp. 2093-2096, 2010.

  1097. Thermogravimetric Device with Integrated Thermal Actuators
    E. Iervolino; A.W. van Herwaarden; W. van der Vlist; P.M. Sarro.;
    In Proceedings MEMS2010,
    Hong Kong, China, pp. 683-686, Jan. 2010.

  1098. Optical Performance of B-Layer Ultrashallow Junction Si Photodiodes in the VUV Spectral Range
    L. Shi; F. Sarubbi; L.K. Nanver; Kroth; U; Gottwald; A; S. Nihtianov;
    In Procedia Engineering 5,
    pp. 633-636, 2010.

  1099. FleSS: a Matlab Based Graphical User Interface for Stress � Strain Analytical Modeling of Multilayered Structures with Applied Bending
    A. Vieira da Silva; B. Mimoun; R. Dekker;
    In Proc. of 13th Workshop on Semiconductors Advances for Future Electronics and Sensors 2010 (SAFE 2010),
    Veldhoven, The Netherlands, STW, pp. 175-179, 2010. ISBN 978-90-73461-67-3).

  1100. A position and force-distribution sensor-array for monitoring the contact condition of objects in microhandling
    J. Wei; M. M. Porta. Tichem; U. Staufer; P.M. Sarro;
    In Proc. the 23th IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2010),
    pp. 623-626, 2010.

  1101. Release and Mounting of Partially Flexible Devices Inside and Around Tubes for Smart Invasive Medical Applications
    B. Mimoun; V. Henneken; R. Dekker;
    In Proc. of 12th Electronic Packaging and Technology Conference 2010 (EPTC 2010),
    Singapore, IEEE, pp. 7-12, 2010. ISBN 978-1-4244-8561-1.

  1102. Patterned growth of carbon nanotubes for vertical interconnect in 3D integrated circuits
    S. Vollebregt; R. Ishihara; J. Derakhshandeh; W. Wien; J. van der Cingel; C.E.M. Beenakker;
    In Proc. of SAFE 2010,
    pp. 184-187, 2010.

  1103. Characterization of amorphous boron layers as diffusion barrier for pure aluminium
    Agata Sakic; Vladimir Jovanovic; Parastoo Maleki; Tom L.M. Scholtes; Silvana Milosavljevic; Lis K. Nanver;
    In MIPRO 2010 International Conference,
    Opatija, Croatia, pp. 52-55, May 2010.

  1104. Al-mediated Solid-Phase Epitaxy of Silicon-On-Insulator
    Agata Sakic; Yann Civale; Lis K. Nanver; Cleber Biasotto; Vladimir Jovanovic;
    In MRS Spring Meeting Symposium A: Amorphous and Polycrystalline Thin-Film Silicon Science and Technology,
    San Francisco, Apr. 2010.

  1105. Field effect transistor devices based on strained Si channels above buried 2D periodic SiGe quantum dots.
    N. Hrauda; T. Etzelstorfer; J. Strangl; D. Carbone; G. Bauer; C. Biasotto; V. Jovanovic; L.K. Nanver; J. Moers; D. Gruetzmacher;
    In Materials Research Society (MRS) spring meeting,
    San Francisco, USA, 2010.

  1106. Dual-inlet microfluidic calorimeter for thermal characterization of bio-chemical solutions
    T. Adrega; E. Iervolino; A.W. van Herwaarden; P.M. Sarro.;
    In BIOSENSORS 2010, 20th Anniversary World Congress on Biosensors,
    Glasgow, UK, May 2010.

  1107. Versatile Silicon Photodiode Detector Technology for Scanning Electron Microscopy with High-Efficiency Sub-5 keV Electron Detection
    A. Sakic; L. K. Nanver; G. van Veen; K. Kooijman; P. Vogelsang; T. L.M. Scholtes; W. de Boer; W. H. A. Wien; S. Milosavljevic; C. Th. H. Heerkens; T. Kne_evi_; I. Spee;
    In International Electron Devices Meeting (IEDM),
    San Francisco, CA, 2010.

  1108. Deep p+ junctions formed by drive-in from pure boron depositions.
    P. Maleki; T.L.M. Scholtes; M. Popadic; F. Sarubbi; G. Lorito; S. Milosavljevic; W.B. de Boer; L.K. Nanver;
    In International Workshop on Junction Technology (IWJT), 2010,
    Shanghai, China, pp. 1�4, 2010.

  1109. Temperature Dependence of the Resonance Frequency of Thermogravimetric Devices
    E. Iervolino; M. Riccio; A.W. van Herwaarden; A. Irace; G. Breglio; W. van der Vlist; P.M. Sarro.;
    In Eurosensors XXIV,
    Linz, Austria, Sep. 2010.

  1110. SiGe dots as stressor material for strained Si devices
    L.K. Nanver; C. Biasotto andV. Jovanovic; J. Moers; D. Gruetzmacher; J.J. Zhang; G. Bauer; O.G. Schmidt; L. Miglio; H. Kosina; A. Marzegalli; G. G. Vastola. Mussler; H. Hrauda; J. Stangl; J. van der Cingel; and F.;
    In 5th International SiGe Technology and Device Meeting,
    Stockholm, Sweden, 2010.

  1111. Micro-lens Array Integrated 2D MEMS Actuator for High Resolution Beam Scanning
    S. K. Gokce; S. Holmstrom; C. Hibert; C. Ataman; A. Arslan; H. R. Seren; H. Urey;
    In 11th National Conference on Photonics,
    Ankara, Turkey, 2010.

  1112. Pure-Boron Chemical-Vapor-Deposited Layers: a New Material for Silicon Device Processing
    L.K. Nanver; T. L. M. Scholtes; F. Sarubbi; W.B. de Boer; G. Lorito; A. Sakic; S. Milosavljevic; C. Mok; L. Shi; S. Nihtianov; K. Buisman;
    In 18th Annual Conference on Advanced Thermal Processing of Semiconductors-RTP 2010,
    Gainesville, FL, Sep. 2010.

  1113. New Solid State Detector Design for Ultra-Sensitive Back-Scattered Electron Detection
    Ingo Gestmann; Kees Kooijman; Agata Sakic; Lis Nanver; Gerard van Veen;
    In 17th International Microscopy Congress (IMC17),
    Rio de Janeiro, Brazil, Sep. 2010.

  1114. Arbitrarily shallow arsenic-deposited junctions on silicon tuned by excimer laser annealing.
    G. Lorito; L. Qi; L.K. Nanver;
    In 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2010),
    Shanghai, China, pp. 972-974, 2010.
    document

  1115. The state-of-the-art of RF capacitive tunable components
    C. Huang; K. Buisman; L.K. Nanver; L.C.N. de Vreede;
    In 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2010),
    Shanghai, China, pp. 619-622, 2010.
    document

  1116. Chemical vapor deposition of Ga dopants for fabricating ultrashallow pn junctions at 400
    A. Sammak; L. Qi; W.B. de Boer; L.K. Nanver;
    In 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2010),
    Shanghai, China, pp. 969-971, 2010.
    document

  1117. MOSFETS on self assembled SiGe dots with strain enhanced mobility.
    V. Jovanovic; C. Biasotto; L.K. Nanver; J. Moers; D. Grutzmacher; J. Gerharz; G. Mussler; J. van der Cingel; J.J. Zhang; Z. Jianjun; G. Bauer; O.G. Schmidt; L. Miglio;
    In 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2010),
    Shanghai, China, pp. 926-928, 2010.
    document

  1118. Monolithic 3D Integration of SRAM and Image Sensor Using Two Layers of Single Grain Silicon
    Negin Golshani; Jaber Derakhshandeh; Ryoichi Ishihara; C.I.M Beenakker; Michael Robertson; Thomas Morrison;
    In IEEE International Conference on 3D System Integration,
    Munich, Germany, 2010.

  1119. Low Subthreshold Slope and High Mobility Single Grain Silicon TFTs Using Grown Oxide
    Negin Golshani; Jaber Derakhshandeh; Shu Yi Liu; Ryoichi Ishihara; J. Van der Cingel; C.I.M Beenakker;
    In EMRS,
    2010.

  1120. n-channel MOSFETs fabricated on self assembled SiGe dots for strain enhanced mobility
    Vladimir Jovanovic; Cleber Biasotto; Juergen Moers; Detlev Grutzmacher; Jianjun Zhang; Nina Hrauda; Mathieu Stoffel; Fabio Pezzoli; Oliver G. Schmidt; Leo Miglio; Hans Kosina; Anna Marzegalli; Guglielmo Vastola; Greg;
    In STW-SAFE2010 Conference Proceeding,
    Veldhoven, pp. 101-104, 2010.

  1121. Electronics on flexible and stretchable silicon arrays
    T. Zoumpoulidis;
    PhD thesis, Delft University of Technology, Feb. 2010. ISBN 978-90-8570-504-8; Promotors: prof. R. Dekker, prof. J.N. Burghartz, dr. M. Bartek.

  1122. Advanced breakdown modeling for solid-state circuit design
    V. Milovanovic;
    PhD thesis, Delft University of Technology, Jul. 2010. ISBN 978-90-8570-583-3; Promotors: prof. L.K. Nanver. R. van der Toorn.

  1123. Substrate crosstalk suppression using wafer-level packaging: Metalized through-substrate trench approach
    S.M. Sinaga;
    PhD thesis, Delft University of Technology, Oct. 2010. ISBN 978-90-8570-600-7; Promotors: prof. J.N. Burghartz, dr. M. Bartek.

  1124. Characterization of pure boron depositions integrated in silicon diodes for nanometer-deep junction applications
    F. Sarubbi;
    PhD thesis, Delft University of Technology, Jan. 2010. ISBN 978-90-8570-436-2; Promotor: prof. L.K. Nanver.

  1125. Silicon MEMS for detection of liquid and solid fronts
    J. Wei;
    PhD thesis, Delft University of Technology, Jul. 2010. ISBN 978-90-8570-584-0; Promotor: prof. P.M. Sarro.
    document

  1126. Thermal actuation for precision micro motion and positioning
    S. Paalvast;
    PhD thesis, Delft University of Technology, Apr. 2010. ISBN 978-90-9025291-9; Promotors: prof. R.H. Munnig Schmidt, prof. P.M. Sarro.

  1127. High-aspect-ratio through-wafer parylene beams for stretchable silicon electronics.
    T. Zoumpoulidis; M. Bartek; P. de Graaf; R. Dekker;
    Sensors and actuators a-physical,
    Volume 156, Issue 1, pp. 257-264, 2009. ISSN 0924-4247.

  1128. Calorimeter chip calibration for thermal characterization of liquid samples
    E. Iervolino; A.W. van Herwaarden;
    Thermochimica acta,
    Volume 492, Issue 1-2, pp. 95-100, 2009.

  1129. Analytical Models of Front- and Back-Gate Potential Distribution and Threshold Voltage for Recessed Source/Drain UTB SOI MOSFETs
    B. Svilicic; V. Jovanovic; T. Suligoj;
    Solid-state electronics,
    Volume 53, Issue 5, pp. 540-547, 2009.

  1130. Improving bulk FinFET DC performance in comparison to SOI FinFET
    M. Poljak; V. Jovanovic; T. Suligoj;
    Microelectronic engineering,
    Volume 86, Issue 10, pp. 2078-2085, 2009.

  1131. X-ray investigation of buried SiGe islands for devices with strain-enhanced mobility
    Hrauda; N; J.J. Zhang; Stangl; J; A. Rehman-Khan; G. Bauer; M. Stoffel; O.G. Schmist; V. Jovanovic; L.K. Nanver;
    Journal of vacuum science & technology b,
    Volume 27, Issue 2, pp. 912-918, 2009.

  1132. Controlled Growth of Non-uniform Arsenic Profiles in Silicon RPCVD Epitaxial Layers
    M. Popadic; T.L.M. Scholtes; W. de Boer; F. Sarubbi; L.K. Nanver;
    Journal of Electronic Materials,
    Volume 38, Issue 11, pp. 2323-2328, 2009.

  1133. Direct observation of the electrical activity of coincidence-site lattice boundaries in location-controlled silicon islands using scanning spread resistance microscopy
    N. Matsuki; R. Ishihara; C.I.M. Beenakker;
    Journal of the society for information display,
    Volume 17, Issue 3, pp. 293-297, 2009.

  1134. Stacking of Single-Grain Thin-Film Transistors.
    M.R. Tajari Mofrad; J. Derakhshandeh; R. Ishihara; A. Baiano; J. van der Cingel; C.I.M. Beenakker;
    Japanese journal of applied physics,
    Volume 48, 2009. ISSN 0021-4922.

  1135. Modulation speed improvement in a FabryPerot thermo-optical modulator through a driving signal optimization technique
    F.G. della Corte; M. Merenda; G. Cocorullo; M. Iodice; I. Rendina; P.M. Sarro;
    Optical engineering,
    Volume 48, Issue 7, 2009.

  1136. Pattern transfer on a vertical cavity sidewall using SU8
    T. Verhaar; J. Wei; P.M. Sarro;
    Journal of micromechanics and microengineering,
    Volume 19, 2009.

  1137. Photolithography on bulk micromachined substrates. Journal of micromechanics and microengineering
    W.J. Venstra; J.W. Spronck; P.M. Sarro; J. van Eijk;
    Journal of micromechanics and microengineering,
    Volume 19, pp. 1-6, 2009.

  1138. On the Mechanisms Governing Aluminum-Mediated Solid-Phase Epitaxy of Silicon
    Y. Civale; G. Vastola; L.K. Nanver; R. Mary-Joy; J.R. Kim;
    Journal of electronic materials,
    Volume 38, Issue 10, pp. 2052-2062, 2009.

  1139. Ultra Linear Low-Loss Varactor Diode Configurations for Adaptive RF Systems
    C. Huang; K. Buisman; M. Maretti; L. K. Nanver; F. Sarubbi; M. Popadic; T. Scholtes; H. Schellevis; L. E. Larson; L. de Vreede;
    IEEE Transactions on Microwave Theory and Techniques,
    Volume 57, Issue 1, pp. 205-215, 2009.

  1140. Monolithic Stacking of Single-Grain Thin-Film Transistors to realize high performance three dimensional integrated circuits
    M.R Tajari Mofrad; Jaber Derakhshandeh; R. Ishihara; Cees Beenakker;
    Japanese Journal of Applied Physics,
    Volume 48, 2009.

  1141. Analytical Model of I-V Characteristics of Arbitrarily Shallow p-n Junctions
    M. Popadic; G. Lorito; L. K. Nanver;
    IEEE Transactions on Electron Devices,
    Volume 56, Issue 1, pp. 116-125, 2009.

  1142. Analytical Carrier Transport Model for Arbitrarily Shallow p-n Junctions
    M. Popadic; G. Lorito; L.K. Nanver;
    IEEE Transactions on Electron Devices,
    Volume 56, Issue 1, pp. 116-125, 2009.

  1143. Ultra linear low-loss varactor diode configurations for adaptive RF systems
    C. Huang; K. Buisman; L.K. Nanver; F. Sarubbi; M. Popadic; T.L.M. Scholtes; H. Schellevis;
    IEEE Transactions on Microwave Theory and Techniques,
    Volume 57, Issue 1, pp. 205-215, 2009.

  1144. Influence of Concurrent Electrothermal and Avalanche Effects on the Safe Operating Area of Multifinger Bipolar Transistors
    L. La Spina; V. Alessandro; S. Russo; N. Rinaldi; L.K. Nanver;
    IEEE Transactions on Electron Devices,
    Volume 56, Issue 3, pp. 483-491, 2009.

  1145. A 2_2 Optofluidic Multimode Interference Coupler
    R. Bernini; G. Testa; L. Zeni; P.M. Sarro;
    IEEE journal of selected topics quantum electronics,
    Volume 15, Issue 5, pp. 1478-1484, 2009. ISSN 1077-260X.

  1146. Thiol-based self-assembly nanostructures in promoting interfacial adhesion for copper-epoxy joint
    C. K. Y. Wong; M. M. F. Yuen; B. Xu;
    Applied Physics Letters,
    Volume 94, 2009.

  1147. Analysis of the Bipolar Current Mirror Including Electrothermal and Avalanche Effects
    N. Rinaldi; V. Alessandro; L.K. Nanver;
    IEEE Transactions on Electron Devices,
    Volume 56, Issue 6, pp. 1309-1321, 2009.

  1148. Improved RF Devices for Future Adaptive Wireless Systems Using Two-Sided Contacting and AlN Cooling
    L.K. Nanver; H. Schellevis; T.L.M. Scholtes; L. La Spina; G. Lorito; F. Sarubbi; V. Gonda; M. Popadic; K. Buisman; L.C.N. de Vreede; C. Huang; S. Milosavljevic; E.J.G. Goudena;
    IEEE Journal of Solid-State Circuits,
    Volume 44, Issue 9, pp. 2322-2338, 2009.

  1149. Nanoscale chemical imaging of the reduction behavior of a single catalyst particle
    E. Smit; I. Swart; J.F. Creemer; Karunakaran; C; Bertwistle; D; H.W. Zandbergen; F.M.F. de Groot; B.M. Weckhuysen;
    Angewandte chemie-international edition,
    pp. 3632-3635, 2009.

  1150. X-ray diffraction study of the composition and strain fields in buried SiGe islands
    N. Hrauda; J.J. Zhang; M. Stoffel; J. Stangl; G. Bauer; A. Rehman-Khan; V. Holy; O.G. Schmist; V. Jovanovic; L.K. Nanver;
    European physical journal-special topics,
    Volume 167, pp. 41-46, 2009.

  1151. Strained Single Grain Silicon n- and p-channel Thin Film Transistors by Excimer Laser
    A. Baiano; R. Ishihara; J. van der Cindel; K. Beenakker;
    Accepted IEEE Electron Device Letters,
    2009.

  1152. Atomic imaging of phase transitions and morphology transformations in nanocrystals
    M.A. van Huis; N.P. Young; G. Pandraud; J.F. Creemer; D. Vanmaekelbergh; A.I. Kirkland; H.W. Zandbergen;
    Advanced materials,
    Volume 21, pp. 4992-4995, 2009.

  1153. Stretchable array of ISFET devices for applications in biomedical imagers.
    T. Zoumpoulidis; T. Prodomakis; K. Michelakis; H.W. van Zeijl; M. Bartek; C. Toumazou; R. Dekker;
    In S.C. Mukhopadhyay (Ed.), Proc. IEEE Sensors 2009 Conference,
    Christchurch, New Zealand, IEEE, pp. 7-12, 2009. ISBN 978-1-4244-5335-1).

  1154. Integration of Laser-Annealed Junctions in a Low-Temperature High-k Metal-Gate MISFET
    C. Biasotto; V. V. Jovanovic Gonda; J. van der Cingel; S. Milosavljevic; L. K. Nanver;
    In Ultimate Integration on Silicon Conference (ULIS-2009),
    Aachen, Germany, Mar. 2009.
    document

  1155. Alignment and Overlay Characterization for 3D Integration and Advanced Packaging
    H.W. van Zeijl; P.M. Sarro;
    In Proc. of 11th Electronic packaging and Technology conference 2009 (EPTC 2009),
    Singapore, IEEE, 2009. ISBN 978-1-4244-5100-5.

  1156. Investigating Low Temperature High Density Aligned Carbon Nanotube and Nanofilament Growth using Palladium as Catalyst
    S. Vollebregt; J. Derakhshandeh; M.Y. Wu; R. Ishihara; C.I.M. Beenakker;
    In SAFE 2009,
    STW, pp. 125-128, 2009.

  1157. Parylene-embedded metal interconnects for stretchable silicon electronics.
    T. Zoumpoulidis; M. Bartek; R. Dekker;
    In Proc. International Conference on Electronics Packaging (ICEP 2009),
    Kyoto, Japan, JIEP, IEEE, pp. 611-615, 2009.

  1158. Paalvast, SL, Sarro, PM & Munnig Schmidt, RH
    S.L. Paalvast; P.M. Sarro; R.H. Munnig Schmidt;
    In Proceedings of the EuroSimE 2009,
    Montigny le Bretonneux, pp. 318-321, 2009.

  1159. Fast response thermal linear motor with reduced power consumption
    S.L. Paalvast; H.T.M. Pham; P.M. Sarro; R.H. Munnig Schmidt;
    In Proceedings of the Eurosensors XXIII Conference, august 2009,
    Lausanne, pp. 690-693, 2009.

  1160. Electro less deposition and structuring of silver electrodes inside closed micro fluidic channels
    F.C.A. Heuck; P.M. Sarro; J.H.C.M. Slabbekoorn; T. Akiyama; U. Staufer;
    In Proceedings of the Euspen 9th International Conference,
    Bedford: Euspen, pp. 158-161, 2009.

  1161. Characterization of ultrathin membranes to enable TEM observation of gas reaction at high pressures
    Alan; T; Gaspar; J; Paul; O; H.W. Zandbergen; J.F. Creemer; P.M. Sarro;
    In Proceedings of the ASME 2009 International Mechanical Engineering Congress & Exposition,
    Lake Buena Vista, Florida, USA: American Society of Mechanical Engineers (ASME), pp. 1-5, 2009.

  1162. ntegration of Laser-Annealed Junctions in a Low-Temperature High-k Metal-Gate MISFET
    C. Biasotto; V. Jovanovic; V. Gonda; J. van der Cingel; Milosavljevic; S; L.K. Nanver;
    In Proceedings of the 10th International Conference on ULtimate Integration of Silicon (ULIS 2009),
    Aachen, Germany: IEEE, pp. 181-184, 2009.

  1163. Comparing Single Grain and Poly silicon Lateral PIN Photodiodes
    Jaber Derakhshandeh; R. Ishihara; C.I.M Beenakker;
    In Proceedings of SAFE 2009,
    Veldhoven, Netherlands, 2009.

  1164. Wafer Level Encapsulation Techniques for a MEMS Microreactor with integrated Heat Exchanger
    F. Santagata; L. Mele; M. Mihailovic; B. Morana; J.F. Creemer; P.M. Sarro;
    In Proceedings of IEEE Sensors 2009 Conference,
    Christchurch, New Zealand, pp. 799-802, 2009.
    document

  1165. High speed 6T SRAM cells using single grain TFTs fabricated by ""angstrom""""micro""-Czochralski process at low temperature
    Negin Golshani; Jaber Derakhshandeh; R. Ishihara; C.I.M Beenakker;
    In Proceedings of SAFE 2009,
    Veldhoven, Netherlands, 2009.

  1166. Very thin SiC membranes for micromachined vacuum sensors
    H.T.M. Pham; C. Fan; G. Pandraud; J.F. Creemer; N.M. van der Pers; P. Visser; C. Kwakernaak;
    In Proceedings of IEEE sensors 2008,
    Lecce, Italy, pp. 1143-1146, 2009.

  1167. Growth of high density aligned carbon nanotubes using palladium as catalyst
    S. Vollebregt; J. Derakhshandeh; R. Ishihara; C.I.M. Beenakker;
    In Proceedings of Electronic Material conference 2009,
    USA, 2009.

  1168. A three-dimensional phase-field simulation of pulsed laser induced epitaxial growth of silicon
    M.R. Tajari Mofrad; A. La Magna; R. Ishihara; J. Derakhshandeh; J. van der Cingel; C.I.M. Beenakker;
    In Proceedings of E-MRS Symposium Q Laser and plasma processing for advanced materials E-MRS,
    pp. 1-4, 2009.
    document

  1169. Monolithic 3D-ICs with Single Grain Si TFTs
    R. Ishihara; J. Derakhshandeh; M.R. Tajari Mofrad; T. Chen; C.I.M. Beenakker;
    In Proceedings of Active-Matrix and Flat Panel Displays 2009,
    Tokyo, Japan, 2009.
    document

  1170. Fabrication of 6T SRAM cell using single grain TFTs obtained by ""angstrom""""micro""-Czochralski process
    Negin Golshani; R. Ishihara; J. Derakhshandeh; C.I.M Beenakker;
    In Proceedings of Active-Matrix and Flat Panel Displays 2009,
    Nara, Japan, 2009.
    document

  1171. C-V Profiling of Ultrashallow Junctions using a Step-Like Background Doping Profile
    M. Popadic; C. Xu; F. Sarubbi; L.K. Nanver;
    In Proceedings of 39th European Solid-State Device Research Conference, ESSDERC 2009,
    Athens, Greece, pp. 303-306, 2009.
    document

  1172. Thermal analysis of peptides with a calorimeterchip
    E. Iervolino; I.M.O. Finoulst; A.W. van Herwaarden; W.H.A. Wien; P.D.E. Verhaert; P.M. Sarro;
    In Proceedings of 15th international conference on solid-state sensors, actuators & microsystems,
    2009.
    document

  1173. Silicon-based MEMS micro-evaporator
    J. Hao; M. Mihailovic; C.M. Rops; J.F. Creemer; P.M. Sarro;
    In Proceedings of 20th Micromechanics Europe Workshop (MME),
    Toulouse, France, pp. 1-4, 2009.
    document

  1174. Thermal Characterization of Microliter Amounts of Liquids by a Micromachined Calorimetric Transducer.
    G. Parr; E. Santagata-Iervolino; A.W. van Herwaarden; W. Wien; M.J. Vellekoop;
    In Proceedings MEMS 2009,
    Sorrento, IEEE, pp. 535-538, Jan. 2009.
    document

  1175. Hydrophobic Self-Assembly Molecular Layer for Reliable Cu-Epoxy Interface
    C. K. Y. Wong; M. M. F. Yuen;
    In Proceedings-Electronic Components and Technology Conference,
    San Diego, CA, pp. 1816-1823, 2009.
    document

  1176. Sheet resistance of As-doped monocrystalline silicon in temperature range up to 1100 K
    M. Mihailovic; J.F. Creemer; P.M. Sarro;
    In Proceedings of 12th Annual Workshop on Semiconductors Advances for Future Electronics and Sensors (SAFE),
    Veldhoven, The Netherlands, pp. 36-39, 2009.
    document

  1177. Mems nanoreactor for atomic-resolution microscopy of nanomaterials in their working state
    J.F. Creemer; S. Helveg; G.H. Hoveling; S. Ullman; P.J. Kooyman; A.M. Molenbroek; H.W. Zandbergen; P.M. Sarro;
    In Proceedings 22nd IEEE International Conference on Micro Electro Mechanical Systems 2009,
    Sorrento, IEEE, pp. 76-79, 2009.
    document

  1178. Low-temperature wafer-level packaging of a MEMS microreactor with a lateral feedthrough by local PECVD TEOS deposition
    L. Mele; B. Morana; C.R. de Boer; J.F. Creemer; P.M. Sarro;
    In Proceeding title: Proceedings of the Eurosensors XXIII Conference,
    Lausanne, Switzerland, pp. 1531-1534, 2009.
    document

  1179. MEMS Stage Integrated with Microlens Arrays for High-Resolution Beam Steering
    S. Gokce; S. Holmstrom; C. Hibert; C. Ataman; A. Arslan; H. R. Seren; H. Urey;
    In Procedia Chemistry,
    pp. 1319-1322, 2009.
    document

  1180. Bulk-Si FinFET Technology for Ultra-High Aspect-Ratio Devices
    V. Jovanovic; L.K. Nanver; T. Suligoj; M. Poljak;
    In Proc. of the 39th IEEE European Solid-State Device Research Conference (ESSDERC 2009),
    Athens, Greece, pp. 241-244, 2009.
    document

  1181. Deterministic Ratchets for Particle Separation Fabricated With Si MEMS Technology
    H.T.M. Pham; T. Kulrattanarak; R.G.M. van der Sman; C. Schroen; R.M. Boom; P.M. Sarro;
    In Proc. of the Eurosensors XXIII conference,
    Lausanne, Switzerland, pp. 345-348, 2009.
    document

  1182. Fabrication of Stretchable PDMS Membrane as Substrate Material for Multi-Electrode Array Devices
    R. Li; A. van Bogaard; R. Dekker;
    In Proc. of SAFE 2009,
    Veldhoven, The Netherlands, pp. 91-94, 2009.
    document

  1183. Chemical Vapor Deposition of Gallium on Silicon and SiO2. In PJ French
    A. Sammak; W.B. de Boer; L.K. Nanver; L. Qi; G. Lorito;
    In Proc. of SAFE 2009,
    Veldhoven, The Netherlands, pp. 538-541, 2009.
    document

  1184. Downscaling of Al/Si-gate MOSFETs with Self-Aligned Laser Annealed Source/Drain Junctions
    C. Biasotto; V. Jovanovic; L.K. Nanver; J. van der Cingel;
    In Proc. of SAFE 2009,
    Veldhoven, The Netherlands, pp. 189-192, 2009.
    document

  1185. Stability Investigation of High Performance Silicon-Based DUV/EUV Photodiodes
    L. Shi; F. Sarubbi; S. Nihtianov; L.K. Nanver; F. Scholze;
    In Proc. of SAFE 2009,
    Veldhoven, The Netherlands, pp. 530-533, 2009.
    document

  1186. Characterization of AlN thin films sputtered on Al/Ti electrodes for piezoelectric devices
    A.T. Tran; H. Schellevis; C. Shen; H.T.M. Pham; P.M. Sarro;
    In Proc. of SAFE 2009,
    Veldhoven, The Netherlands, STW, pp. 121-124, 2009.
    document

  1187. Simulation and Experimental study of crystallographic orientation control of 2D location controlled single grain crystalline silicon
    M.R. Tajari Mofrad; R. Ishihara; J. Derakhshandeh; A. Baiano; J. van der Cingel; C.I.M. Beenakker;
    In Proc. of SAFE 2009,
    pp. 185-188, 2009.
    document

  1188. Application of amorphous boron layer as diffusion barrier for pure aluminium
    A. Sakic; G. Lorito; F. Sarubbi; T.L.M. Scholtes; J. van der Cingel; L.K. Nanver;
    In Proc. of SAFE 2009,
    Veldhoven, The Netherlands, pp. 112-115, 2009.
    document

  1189. Effect of the pulse offset on the thermal cycle for double excimer laser annealing of implanted silicon
    G. Viktor; L.K. Nanver;
    In Proc. of OGET 2009,
    2009.
    document

  1190. Evaluating the self-heating thermal resistance of bipolar transistors by DC measurements: A critical review and update
    S. Russo; V. Alessandro; L. La Spina; N. Rinaldi; L.K. Nanver;
    In Proc. of IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM),
    Capri, Italy, pp. 95-98, 2009.
    document

  1191. Numerical analysis of the dynamic thermal behavior of RF bipolar transistors
    S. Russo; V. Alessandro; N. Rinaldi; M. de Magistris; L. La Spina; L.K. Nanver;
    In Proc. of International Conference on Computational Methods for Thermal Problems (ThermaComp),
    Naples, Italy, pp. 345-348, 2009.
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  1192. Thermal budget considerations for excimer laser annealing of implanted dopants
    V. Gonda; J. Venturini; C. Sabatier; J. van der Cingel; L.K. Nanver;
    In Proc. of E-MRS 2009 Spring Meeting,
    Strasbourg, France, MRS, pp. 1-4, 2009.
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  1193. Electrothermal Behavior of Highly-Symmetric Three-Finger Bipolar Transistors
    L. La Spina; V. Alessandro; S. Russo; N. Rinaldi; L.K. Nanver;
    In Proc. of IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM),
    Capri, Italy, pp. 21-24, 2009.
    document

  1194. Compact Model of Zener tunneling Current in Bipolar Transistors featuring a Smooth Transition to Zero Forward Bias Current
    V. Milovanovic; R. van der Toorn; P. Huphries; D. Vidal; A. Vafanejad;
    In Proc. of Bipolar/BiCMOS Circuits and Technology Meeting,
    Capri, Italy, IEEE, pp. 99-102, 2009.
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  1195. FinFET Considerations for 0.18 um Technology
    V. Jovanovic; M. Poljak; T. Suligoj;
    In Proc. of 45th International Conference on Microelectronics, Devices and Materials (MIDEM 2009),
    Ljubljana, Slovenija, MIDEM Society for Microelectronics, Electronic Components and Materials, 2009.
    document

  1196. Analog and digital output lateral photodiodes fabricated by ""angstrom""""micro""-Czochralski process at low temperature
    J. Derakhshandeh; M.R. Tajari Mofrad; R. Ishihara; C.I.M. Beenakker;
    In Proc. of DRC 2009,
    IEEE, pp. 93-94, 2009.
    document

  1197. Behavioural Biometrics Hardware Based on Bioinformatics Matching
    S. Bojanic; V. Povic; G. Caffarena; V. Milovanovic; C. Carrers; J. Popovic;
    In Proc. of 3rd International Conference on Complex, Intelligent and Software Intensive Systems (CISIS-2009),
    Fukuoka, Japan: IEEE, pp. 171-178, 2009.

  1198. Laser Annealing of Self-Aligned As+ Implants in Contact Windows for Ultrashallow Junction Formation
    C. Biasotto; V. Gonda; L.K. Nanver; J. van der Cingel; Jovanovic;
    In Proc. of 24th Symposium on Microelectronics Technology and Devices Dielectric and Semiconductor Materials, Devices, and Processing (SBMicro 2009),
    Natal, Brazil, Electrochemical Society, pp. 19-27, 2009.

  1199. Compact Capacitance Model for Drain-Induced Barrier-Lowering of Vertical SONFET
    B. Svilicic; V. Jovanovic; T. Suligoj;
    In Proc. of 32nd International Convention MIPRO 2009,
    Croatian Society for Information and Communication Technology, Electronics and Microelectronics, pp. 85-88, 2009.
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  1200. Sensing Microgripper with PID Control
    P. Phan Huu; V.Q. Nguyen; T. Chu Duc; P.M. Sarro;
    In Ngo Nguyen; N.K. Cheung (Ed.), Proc. of 2008 International Conference on Advanced Technologies for Communications,
    Hanoi, Vietnam, pp. 319-322), 2009.

  1201. Quantum Confinement and Scaling Effects in Ultra-Thin Body Double-Gate FinFETs
    M. Poljak; V. Jovanovic; T. Suligoj;
    In Proc. of 32nd International Convention MIPRO 2009,
    pp. 95-100, 2009.

  1202. Application of Laser Annealing in the EU FP6 Project D-DotFET
    L.K. Nanver; V. Jovanovic; C. Biasotto; J. van der Cingel;
    In Proc. Of 17th IEEE International Conference on Advanced Thermal Processing of Semiconductors (RTP 2009),
    pp. 1-7, 2009.
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  1203. Mechanical study of silicon nitride layers on thin flexible substrates under bending
    B. Mimoun; O. Gourhant; R. Dekker;
    In Proc. of 12th Workshop on Semiconductors Advances for Future Electronics and Sensors 2009 (SAFE 2009),
    Veldhoven, The Netherlands: STW (ISBN: 978-90-73461-62-8)-Best Flash Presentation Award, pp. 95-98, 2009.

  1204. Biocompatible encapsulation of CMOS based chemical sensors
    T. Prodomakis; K. Michelakis; T. Zoumpoulidis; R. Dekker; C. Toumazou;
    In Proc. IEEE Sensors 2009 Conference,
    Christchurch, New Zealand, pp. 791-794, 2009.

  1205. A general purpose reconfigurable MEMS-based attenuator for radio frequency and microwave applications
    J. Iannacci; F. Giacomozzi; S. Colpo; B. Margesin; M. Bartek;
    In Proc. IEEE Region 8 EUROCON 2009 Conference,
    Saint Petersburg, Russia: IEEE, pp. 1201-1209, 2009.

  1206. Stretchable silicon electronics
    M. Bartek; T. Zoumpoulidis; S. Sosin;
    In Proc. IWLPC 2009,
    Santa Clara, CA: SMTA, pp. 45-50, 2009.

  1207. Thermal characterization of microliter amounts of liquids by a micromachined calorimetric transducer
    S.L. Paalvast; P.M. Sarro; R.H. Munnig Schmidt;
    In Proc. IEEE MEMS 2009,
    Sorrento, Italy: IEEE, pp. 535-538, 2009.

  1208. Vertical Contact Position Detection and Grasping Force Monitoring for Micro-Gripper Applications
    M. Porta; J. Wei; M. Tichem; P.M. Sarro; U. Staufer;
    In Proc. IEEE Sensors 2009 Conference,
    Christchurch, New Zealand, pp. 967-970, 2009.

  1209. 1.9 nm Wide Ultra-High Aspect-Ratio Bulk-Si FinFETs
    V. Jovanovic; M. Poljak; T. Suligoj; Y. Civale; L.K. Nanver;
    In Proc. 67th IEEE Device Research Conference, DRC 2009,
    2009.

  1210. Suppression of Corner Effects in Triple-Gate Bulk FINFETs
    Mirko Poljak; Vladimir Jovanovic; Tomislav Suligoj;
    In Proc. EUROCON 2009,
    St. Petersburg, Russia, 2009.

  1211. Thermal transient behavior of silicon-on-glass BJTs
    N. Rinaldi; V. Alessandro; L. La Spina; S. Russo;
    In Proc. IEEE EuroSimE,
    pp. 93-100, 2009.

  1212. Large-area silicon electronics using stretchable metal interconnect
    S. Sosin; T. Zoumpoulidis; M. Bartek; R. Dekker;
    In Proc. 59th Electronic Components & Technology Conference (ECTC 2009),
    San Diego, CA, pp. 1059-1064, 2009.

  1213. In-situ Scanning Transmission X-ray Microscopy of catalytic materials under reaction conditions
    E. Smit; J.F. Creemer; H.W. Zandbergen; B.M. Weckhuysen; F.M.F. de Groot;
    In Proc. 14th International Conference on X-Ray Absorption Fine Structure (XAFS14),
    Camerino, Italy, pp. 1-4, 2009.

  1214. Matlab toolkit for semiconductor device characterization and model.
    Vidal; D; Vitale; F; R. van der Toorn;
    In P.J. French (Ed.), Proc. 12th Annual Workshop on Semiconductor Advances for Future,
    Veldhoven, The Netherlands, STW, pp. 174-177, 2009. ISBN 978-90-73461-62-8.

  1215. Characterization of Femto-Farad-Level Capacitive MEMS Sensors using Lock-in Architecture
    C. Yue; J. Wei; Z.L. Chen; Z.W. Liu; P.M. Sarro;
    In P. Pons (Ed.), Proceedings of 20th Micromechanics Europe Workshop (MME),
    Toulouse, France, LAAS-CNRS, pp. 1-4, 2009.

  1216. Statistical Analysis of Diode Ideal Current Parameter Extraction Procedures
    V. Milovanovic; R. van der Toorn;
    In Proc. 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE 2009),
    Veldhoven, The Netherlands, pp. 163-166, 2009.

  1217. Oxidized ALD-deposited titanium nitride films as a low-temperature alternative for enhancing the wettability of through-silicon vias
    M. Saadaoui; H.W. van Zeijl; H.T.M. Pham; H.C. Knoops; W.M.M. Kessels; M.C.M. van de Sanden; F. Roozeboom; Y. Lamy; K.B. Jinesh; W. Besling; P.M. Sarro;
    In MRS Proceedings Volume 1112, Materials and Technologies for 3-D Integration,
    Warrendale, PA, pp. 1-8, 2009.

  1218. Implementation and Characterization of a femto-Farad Capacitive Sensor for pico-Liter Liquid Monitoring.
    J. Wei; C. Yue; Z.L. Chen; Z.W. Liu; K.A.A. Makinwa; P.M. Sarro;
    In J. Brugger; D. Briand (Ed.), Eurosensors XXIII,
    Lausanne, Switzerland, Elsevier, pp. 120-123), 2009.
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  1219. Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy
    N. Matsuki; R. Ishihara; A. Baiano; Y. Hiroshima; S. Inoue; C.I.M. Beenakker;
    In Materials Research Society Symposium Proceedings,
    pp. 94-99, 2009.

  1220. Through Silicon Interconnect Using grayscale Lithography for MEMS Applications.
    H.W. van Zeijl; D. Liu; P.M. Sarro;
    In J. Brugger; D. Briand (Ed.), Eurosensors XXIII,
    Lausanne, Switzerland, Elsevier, pp. 1543-1546, 2009.
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  1221. A Multifunctional Vertical Microsieve for Micro and Nano Particles Separation
    C. Shen; T.M.H. Pham; P.M. Sarro;
    In Micro Electro Mechanical Systems,
    Sorrento, Italy, pp. 383-386, 2009.

  1222. A contact position detection and interaction force monitoring sensor for micro-assembly applications.
    J. Wei; M. Porta; M. Tichem; P.M. Sarro;
    In K Najafi & M Schmidt (Eds.), Proceedings of the 15th International Conference on Solid State Sensors, Actuators and Microsystems (Transducers 2009),
    Denver, USA, IEEE, pp. 2385-2388), 2009. ISBN 978-1-4244-4193-8.

  1223. Integrated High Performance (100) and (110) Oriented Single-Grain Si TFTs without Seed Substrate
    T. Chen; R. Ishihara; J. van der Cingel; A. Baiano; M.R. Tajari Mofrad; H. Schellevis; C.I.M. Beenakker;
    In International Electron Devices Meeting (IEDM 2009),
    Baltimore, MD, USA: IEEE, pp. 179-182, 2009.
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  1224. Alignment insensitive anisotropic etching of silicon cavities with smooth 49� sidewalls
    C. Shen; H.T.M. Pham; P.M. Sarro;
    In he 15th International Conference on Solid-State Sensors, Actuators and Microsystems, Transducers 2009,
    pp. 1071-1074, 2009.
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  1225. 2D Scanning MEMS Stage Integrated with Microlens Arrays for High-Resolution Beam Steering
    S. Gokce; S. Holmstrom; C. Hibert; C. Ataman; A. Arslan; H. R. Seren; H. Urey;
    In IEEE/LEOS Optical MEMS and Nanophotonics,
    Florida, USA, 2009.

  1226. Copper Trace Fatigue Models for Mechanical Cycling, Vibration and Shock/Drop of High-Density PWAs
    D. Farley; Y. Zhou; F. Askari; M. Al-Bassyiouni; A. Dasgupta; J. F. J. Caers; J. W. C. DeVries;
    In EuroSimE 2009, Proceedings of the 10th International Conference on,
    2009.
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  1227. MEMS Stage Integrated with Microlens Arrays for High-Resolution Beam Steering
    S. K. Gokce; S. Holmstrom; C. Ataman; A. Arslan; H. R. Seren; H. Urey;
    In Eurosensors XXIII Conference,
    Lausanne, Switzerland, 2009.
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  1228. Comb-Actuated Resonant Torsional Scanner for Microdisplays
    A. Arslan; D. Brown; W. Davis; S. Holmstrom; S. K. Gokce; H. Urey;
    In IEEE/LEOS Optical MEMS and Nanophotonics,
    Florida, USA, 2009.
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  1229. Cold Welding: A New Factor Governing the Robustness of Adhesively Bonded Flip-Chip Interconnects
    D. Farley; T. Kahnert; K. Sinha; S. Solares; A. Dasgupta; J.F.J. Caers; X.J. Zhao;
    In ECTC 2009, The 59th Electronics Components and Technology Conference,
    2009.
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  1230. Thermal transient behavior of silicon-on-glass BJTs
    S. Russo; L. La Spina; V. Alessandro; N. Rinaldi; M. de Magistris; L.K. Nanver;
    In EEE Int. Conf. on Thermal, Mechanical and Multiphysics Simulation and Experiments Micro-Electronics and Micro-Systems (EuroSimE 2009),
    pp. 93-100, 2009.
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  1231. Aluminum thermal motor for high bandwidth positioning stages
    S.L. Paalvast; H.T.M. Pham; P.M. Sarro; R.H. Munnig Schmidt;
    In 9th international conference of the european society for precision engineering and nanotechnology,
    San Sebastian, SP, pp. 54-58, 2009.

  1232. Expitaxially grown (111) oriented Si film on a crystalline InGaO3(ZnO)5 substrate
    T. Chen; M.Y. Wu; T. Kamiya; H. Hosono; C.I.M. Beenakker;
    In AMFPD 09,
    pp. 67-68, 2009.
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  1233. Mechanical study of silicon nitride layers on thin flexible substrates under bending
    B. Mimoun; O. Gourhant; R. Dekker;
    In 2nd International Workshop on Flexible & Stretchable Electronics 2009,
    Ghent, Belgium, 2009.
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  1234. Optical and surface properties of ALD TiO2 thin films and laminate layers for sensing applications
    Yujian Huang; P.M. Sarro;
    In Proceedings of 12th Annual Workshop on Semiconductors Advances for Future Electronics and Sensors (SAFE),
    Veldhoven, The Netherlands, pp. 24-27, 2009.
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  1235. HEAT TRANSFER ENHANCEMANT USING FIN STRUCTURES: ULTRA-COMPACT HEAT EXCHANGER DESIGN
    C.M. Rops; J. Hao; R. Lindken; M. Mihailovic; J.F. Creemer;
    In 2nd european process intensification conference,
    Venice, Italy, pp. 1-4, 2009.

  1236. Single Grain Si TFTs for RF and 3DICs
    R. Ishihara; A. Baiano; T. Chen; J. Derakhshandeh; M.R. Tajari Mofrad; M. Danesh; N. Saputra; J. Long; C.I.M. Beenakker;
    In 2009 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT),
    Xian, China, 2009.

  1237. High Performance n- and p-channel Strained Single Grain Silicon TFTs using Excimer Laser
    A. Baiano; R. Ishihara; K. Beenakker;
    In Mater. Res. Soc. Symp. Proc,
    Warrendale, PA, Materials Research Society, pp. 1-11, 2009.
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  1238. Dynamic Model for Design Optimization of a high Bandwidth Thermal Linear Motor.
    S.L. Paalvast; P.M. Sarro; R.H. Munnig Schmidt;
    In L.J. Ernst; GuoQi Zhang (Ed.), Proceedings of the EuroSimE 2009,
    Montigny le Bretonneux, IEEE, pp. 318-321, 2009. ISBN 978-1-4244-4159-4.

  1239. RF Small Signal Avalanche Characterization and Repercussions on Bipolar Transistor Circuit Design
    Vladimir Milovanovic; Ramses van der Toorn;
    In Proc. IEEE EUROCON 2009,
    St. Petersburg, Russia, IEEE, pp. 230-233, 2009.
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  1240. Characterization and AlN cooling of thermally isolated bipolar transistors
    L. La Spina;
    PhD thesis, Delft University of Technology, Jun. 2009. ISBN 978-90-8559-546-5; Promotor: prof. L.K. Nanver.
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  1241. Single grain TFTs for high speed flexible electronics
    A. Baiano;
    PhD thesis, Delft University of Technology, Nov. 2009. ISBN 978-90-8570-430-0; Promotors: prof. C.I.M. Beenakker, dr. R. Ishihara.

  1242. Periodical nanocavities in thin films for optical bio-molecular detection
    O.M. Piciu;
    PhD thesis, Delft University of Technology, Feb. 2009. ISBN 978-90-813316-5-4; Promotors: prof. P.M. Sarro, prof. P.J. French, dr. A. Bossche.
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  1243. Silicon doping techniques using chemical vapor dopant deposition
    M. Popadic;
    PhD thesis, Delft University of Technology, Nov. 2009. ISBN 978-90-8570-422-5; Promotor: prof. L.K. Nanver.
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  1244. Vertical silicon-on-nothing FET: Threshold voltage calculation using compact capacitance model
    B. Svilicic; V. Jovanovic; T. Suligoj;
    Solid-State Electronics,
    Volume 52, Issue 10, pp. 1505-1511, Oct. 2008.

  1245. Silicon nitride thin films deposited by electron cyclotron resonance plasma enhanced chemical vapor deposition for micromechanical system applications
    C. Biasotto; J.A. Diniz; A.M. Daltrini; S.A. Moshkalev; M.J.R. Monteiro;
    Thin Solid Films,
    Volume 516, pp. 7777-7782, 2008.

  1246. Aluminum nitride for heatspreading in RF IC's
    L. La Spina; E. Iborra; H. Schellevis; M. Clement; J. Olivares; L. K. Nanver;
    Solid-State Electronics,
    Volume 52, Issue 9, pp. 1359-1363, 2008.

  1247. Single-Grain Si Thin Film Transistors SPICE Model, Analog and RF Circuit Applications
    A. Baiano; M. Danesh; N. Saputra; R. Ishihara; J. Long; W. Metselaar; C.I.M. Beenakker; N. Karaki; Y. Hiroshima; S. Inoue;
    Solid State Electronics,
    Volume 52, Issue 9, pp. 1345-1352, Aug. 2008.

  1248. Mechanics of Adhesively Bonded Flip-Chip-on-Flex Assemblies. Part II: Effect of Bump Coplanarity on Manufacturability and Durability of Non-Conducting Adhesive Assemblies
    D. Farley; A. Dasgupta; J. Caers;
    Journal of Adhesion Science and Technology,
    Volume 22, pp. 1757-1780, Sep. 2008.

  1249. Reduction of surface roughness of a silicon chip for advanced nanocalorimetry
    L. La Spina; Denis Ovchinnikov; Wim H.A. Wien; Alexander W. van Herwaarden; Egbert J.G. Goudena; Joachim Loos; Lis K. Nanver;
    Sensors and Actuators A,
    Volume 144, pp. 403-409, 2008.

  1250. Mechanics of Adhesively Bonded Flip-Chip-on-Flex Assemblies. Part I: Durability of Anisotropically Conductive Adhesive Interconnects
    J. Haase; D. Farley; P. Iyer; P. Baumgartner; A. Dasgupta; J.F.J. Caers;
    Journal of Adhesion Science and Technology,
    Volume 22, pp. 1733-1756, 2008.

  1251. Single-Grain Si TFTs and Circuits Fabricated Through Advanced Excimer-Laser Crystallization
    R. Ishihara; Vikas Rana; Ming He; Y. Hiroshima; S. Inoue; Wim Metselaar; Kees Beenakker;
    Solid State Electronics,
    Volume 52, pp. 353-358, 2008.

  1252. Location and Crystallographic Orientation Control of Si Grains Through Combined Metal Induced Lateral Crystallization and micro-Czochralski process
    Chen Tao; Ryoichi Ishihara; J. W .Metselaar; C.I.M Beenakker; Meng-Yue Wu;
    JJAP,
    Volume 47, Issue 3, pp. 1880-1883, 2008.

  1253. Vertical Silicon-on-Nothing FET: Subthreshold Slope Calculation Using Compact Capacitance Model
    B. Svilicic; V. Jovanovic; T. Suligoj;
    Informacije MIDEM Journal of Microelectronics Electronic Components and Materials,
    Volume 38, Issue 1, pp. 1-4, 2008.

  1254. Interfacial Adhesion Study for SAM Induced Covalent Bonded Copper-EMC Interface by Molecular Dynamics Simulation
    C. K. Y. Wong; H. Fan; M. M. F. Yuen;
    IEEE Transactions on Components, Packaging and Manufacturing Technology, Part A: Packaging Technologies,
    Volume 31, pp. 297-308, 2008.

  1255. Continuous deep reactive ion etching of tapered via holes for three-dimensional integration
    R. Li; .Y Lamy; W.F.A. Besling; F. Roozeboom; P.M. Sarro;
    J. Micromech. Microeng.,
    Volume 18, 2008.

  1256. Enabling low-distortion varactors for adaptive transmitters
    C. Huang; L. C. N. de Vreede; F. Sarubbi; M. Popadic; K. Buisman; J. Qureshi; M. Mar.etti; A. Akhnoukh; T. L. M. Scholtes; L. E. Larson; L. K. Nanver;
    IEEE Trans. Microwave Theory and Techniques,
    Volume 56, Issue 5, pp. 1149-1163, May 2008.

  1257. An Assessment of angstrom micro-Czochralski, Single-Grain Silicon Thin-Film Transistor Technology for Large-Area, Sensor and 3-D Electronic Integation
    N. Saputra; M. Danesh; A. Baiano; R. Ishihara; J.R. Long; N. Karaki; S. Inoue;
    IEEE Journal of Solid-State Circuits,
    Volume 43, Issue 7, pp. 1563-1576, Jul. 2008.

  1258. An Assessment of �_-Czochralski, Single-Grain Silicon Thin-Film Transistor Technology for Large-Area, Sensor and 3-D Electronic Integration
    N. Saputra; M. Danesh; A. Baiano; R. Ishihara; J. R. Long; N. Karaki; S. Inoue;
    IEEE Journal of Solid State Circuits,
    Volume 43, Issue 7, pp. 1563-1576, 2008.

  1259. A 67 dBm OIP3 Multistacked Junction Varactor
    C. Huang; K. Buisman; L. K. Nanver; F. Sarubbi; M. Popadic; T. L. M. Scholtes; H. Schellevis; L. E. Larson; L. C. N. de Vreede;
    IEEE Microwave and Wireless Components Letters,
    Volume 18, Issue 11, pp. 749-751, 2008.

  1260. Accurate SIMS doping profiling of aluminum-doped solid-phase epitaxy silicon islands
    Y. Civale; L.K. Nanver; S.G. Alberici; A. Gammon; I. Kelly;
    Electrochemical and Solid-State Letters,
    Volume 11, Issue 4, pp. H74-H76, 2008.

  1261. On the Spherical Approximation of the Geopotential in Geophysical Fluid Dynamics and the use of a Spherical Coordinate System
    Ramses van der Toorn; and Joseph T.F. Zimmerman;
    Geophysical and Astrophysical Fluid Dynamics,
    Volume 102, Issue 4, pp. 349-371, 2008.

  1262. Formation of Location-Controlled Germanium Grains by Excimer Laser
    A. Baiano; R. Ishihara; J. van d. Cingel; K. Beenakker;
    ECS Transactions Thin Film Transistors,
    Volume 13, Issue 9, Oct. 2008.

  1263. Hyrogenation Assisted Lateral Micromachining of (111) Silicon Wafers
    S. Darbari; S. Azimi; S. Mohajerzadeh; A. Sammak; N. Izadi; S. Famini;
    IEEE Journal of Microelectromechanical systems,
    Volume 17,, Issue 6, pp. 1489-1494, Dec. 2008.

  1264. Reliability Analysis of Single Grain Si TFT using 2D Simulation
    A. Baiano; J. Tan; R. Ishihara; K. Beenakker;
    ECS Transactions Thin Film Transistors,
    Volume 13, Issue 9, Oct. 2008.

  1265. Investigation of Local Electrical Properties of Coincidence-Site-Lattice Boundaries in Location-Controlled Silicon Islands Using Scanning Capacitance Microscopy
    N. Matsuki; R. Ishihara; A. Baiano; K. Beenakker;
    Applied Physics Letters,
    Volume 93, Issue 6, Aug. 2008.

  1266. CMP effect on the quality of thin silicon film crystallized by ""angstrom""""micro""-Czochralski process with excimer laser irradiation
    J. Derakhshandeh; M.R. Tajari Mofrad; R. Ishihara; J. van der Cingel; C.I.M Beenakker;
    In The 4th International Thin-Film Transistor Conference ITC 08,
    Seol, Korea, 2008.

  1267. Thin-film encapsulation of a silicon field emission electron source
    F. Santagata; C.K. Yang; J.F. Creemer; P.M. Sarro;
    In s.n. (Ed.), Proceedings Eurosensors XXII,
    Dresden, Germany: Eurosensors XXII, pp. 625-628, 2008.
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  1268. Influence of Scaling and Source/Drain Series Resistance on the Characteristics of Ultra-Thin Body FinFETs
    A. Sakic; M. Poljak; V. Jovanovic; T. Suligoj;
    In Proceedings of the 31st International Convention MIPRO,
    Zagreb, pp. 84-89, 2008.
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  1269. 50 GHz Integrated Distributed Phase Shifter based on novel Silicon-on-Glass Varactor Diodes
    G. Gentile; K. Buisman; A. Akhoukh; L.C.N. de Vreede; B. Rejaei; L. K. Nanver;
    In Proceedings of SiRF 2008,
    Orlando, Florida, 2008.
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  1270. Monolithic Three-Dimensional Stacking of Integrated Circuits with a Low-Temperature Process
    Mohammad Reza Tajari Mofrad; Jaber Derakhshandeh; Ryoichi Ishihara; Kees Beenakker;
    In Proceedings of SAFE 2008,
    Velhoven, Netherlands, 2008.

  1271. Optimizing Chemical Mechanical Polishing process in 3D-IC
    J. Derakhshandeh; M.R. Tajari Mofrad; R. Ishihara; J. Van der Cingel; C.I.M Beenakker;
    In Proceedings of SAFE 2008,
    Velhoven, Netherlands, 2008.
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  1272. Extremely ultrashallow junctions for a high-linearity silicon-on-glass RF varactor-diode Technology
    L.K. Nanver; F. Sarubbi; V. Gonda; M. Popadic; T.L.M. Scholtes; W. de Boer; K. Buisman;
    In Proceedings of IEEE International Workshop on Junction Technology (IWJT 2008),
    Shanghai, China, pp. 101-106, May 2008.
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  1273. Evaluation of Al-doped SPE ultrashallow P+N Junctions for use as PNP SiGe HBT Emitters
    Yann Civale; Gianpaolo Lorito; Cuiqin Xu; Lis K. Nanver; Ramses van der Toorn;
    In Proceedings of IEEE International Workshop on Junction Technology (IWJT 2008),
    Shanghai, China, pp. 97-100, May 2008.
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  1274. Monocrystalline silicon microhotplate heater
    M. Mihailovic; J.F. Creemer; P.M. Sarro;
    In Proceedings of EUROSENSORS XXII,
    Dresden, Germany, pp. 1611-1614, Sep. 2008.

  1275. Response time of shallow junction silicon photodiodes
    L. Shi; S. Xia; F. Sarubbi; R. Naulaerts; S. N. Nihtianov; L. K. Nanver;
    In Proceedings of Electronics 2008,
    Sozopol, Bulgaria, pp. 21-26, Sep. 2008.

  1276. Monolithic Stacking of Single-Grain Thin-Film Transistors
    Mohammad Reza Tajari Mofrad; Jaber Derakhshandeh; R. Ishihara; Cees Beenakker;
    In Proceedings of Active-Matrix and Flat Panel Displays 2008,
    Tokyo, Japan, 2008.

  1277. Pure boron-doped photodiodes: a solution for radiation detection in EUV lithography
    F. Sarubbi; L. K. Nanver; T. L. M. Scholtes; S. N. Nihtianov; F. Scholze;
    In Proceedings of IEEE 38th European Solid-State Device Research Conference (ESSDERC 2008),
    Edinburgh, Scotland, UK, pp. 278-281, Sep. 2008.

  1278. Analytical carrier transport model for arbitrary shallow p-n junctions
    M. Popadic; G. Lorito; L.K. Nanver;
    In Proceedings of 26th International Conference on Microelectronics (MIEL 2008),
    Niza, Serbia, pp. 155-158, May 2008.

  1279. Ultra-low-temperature process modules for back-wafer-contacted silicon-on-glass RF/microwave technology
    L.K. Nanver; V. Gonda; Y. Civale; T.L.M. Scholtes; L. La Spina; H. Schellevis G. Lorito; F. Sarubbi; M. Popadic; K. Buisman; S. Milosavljevic; E.J.G. Goudena;
    In Proceedings of 9th International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2008),
    Beijing, China, pp. 1184-1187, Oct. 2008.

  1280. SiGe HBTs implemented with implanted laser-annealed emitters to completely eliminate the transient enhanced diffusion
    G. Lorito; V. Gonda; T.L.M. Scholtes; L.K. Nanver;
    In Proceedings of 26th International Conference on Microelectronics (MIEL 2008),
    Niza, Serbia, pp. 291-294, May 2008.

  1281. RF/Microwave Device Fabrication in Silicon-on-Glass Technology
    L..K. Nanver; H. Schellevis; T.L.M. Scholtes; L. La Spina; G. Lorito; F. Sarubbi; V. Gonda; M. Popadic; K. Buisman; L.C.N. de Vreede; C. Huang; S. Milosavljevic; E.J.G. Goudena;
    In Proceedings of 26th International Conference on Microelectronics (MIEL 2008),
    Niza, Serbia, pp. 273-280, May 2008.

  1282. Response time of silicon photodiodes for DUV/EUV radiation
    S. Xia; F. Sarubbi; R. Naulaerts; S. N. Nihtianov; L. K. Nanver;
    In Proceedings of 2008 International Instrumentation and Measurement Technology Conference (I2MTC 2008),
    Victoria, Vancouver Island, Canada, pp. 1956-1959, May 2008.

  1283. Ultrashallow doping by excimer laser drive-in of RPCVD surface deposited Arsenic monolayers
    M. Popadic; Lis K. Nanver; Cleber Biasotto; Viktor Gonda; Johan van der Cingel;
    In Proceedings of 16th IEEE International Conference on Advanced Thermal Processing of Semiconductors (RTP 2008),
    Las Vegas, Nevada, USA, pp. 141-146, Sep. 2008.

  1284. SOA Reduction due to Combined Electrothermal and Avalanche Effects in Multifinger Bipolar Transistors
    V. d'Alessandro; L. La Spina; N. Rinaldi; L.K. Nanver;
    In Proceedings of IEEE Bipolar/BiCMOS Circuit and Technology Meeting (BCTM 2008),
    Monterey, CA, USA, pp. 85-88, Oct. 2008.

  1285. Electrical behaviour of mono-Si based microhotplate heater
    M. Mihailovic; J.F. Creemer; P.M. Sarro;
    In Proceedings of 11th Annual Workshop on Semiconductors Advances for Future Electronics and Sensors (SAFE),
    Veldhoven, The Netherlands, pp. 411-414, 2008.

  1286. Special RF/Microwave Devices in Silicon-on-Glass Technology
    L.K. Nanver; H. Schellevis; T.L.M. Scholtes; L. La Spina; G. Lorito; F. Sarubbi; V. Gonda; M. Popadic; K. Buisman; L.C.N. de Vreede; C. Huang; S. Milosavljevic; E.J.G. Goudena;
    In Proceedings of IEEE Bipolar/BiCMOS Circuit and Technology Meeting (BCTM 2008),
    Monterey, CA, USA, pp. 33-40, Oct. 2008.

  1287. 2D Simulation of Hot-Carrier-Induced Degradation and Reliability Analysis for Single Grain Si TFTs
    J. Tan; A. Baiano; R. Ishihara; K. Beenakker;
    In Proceeding of SAFE,
    2008.

  1288. Analysis and characterization of an electrothermal silicon-polymer
    J. Wei; P.M. Sarro;
    In Proc. the 2008 annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008),
    pp. 436-439, 2008.

  1289. Temperature Calibration of Fast Scan Calorimeter Chips.
    E. Iervolino; A.W. van Herwaarden; P.M. Sarro;
    In Proceedings Eurosensors XXII,
    Dresden, Germany, Sep. 2008.

  1290. Germanium Grains Location Control using ""angstrom""""micro""-Czochralski Process
    A. Baiano; R. Ishihara; J. van d. Cingel; K. Beenakker;
    In Proceeding of SAFE,
    2008.

  1291. Thermal Design of Multifinger Bipolar Transistors
    L. La Spina; S. Russo; V. Alessandro; L. K. Nanver;
    In Proc. SAFE/STW,
    pp. 565-568, 2008.

  1292. A novel semi SOI fabrication process for integrated 3D micromachining
    J. Wei; T. Chu Duc; P.M. Sarro;
    In Proc. IEEE NEMS 2008,
    pp. 717-720, 2008.

  1293. Impact of Aluminum Nitride Heatspreaders on the Thermal Impedance of Silicon-on-Glass BJTs
    S. Russo; L. La Spina; V. Alessandro; N. Rinaldi; L. K. Nanver;
    In Proc. SAFE/STW,
    pp. 501-505, 2008.

  1294. A Flexible Active-Matrix Electronic Paper with Integrated Display Driver using the -Czochralski Single Grain TFT Technology
    W. M. Chim; N. Saputra; A. Baiano; R. Ishihara; A. van Genderen;
    In Proceeding of PRORISC,
    2008.

  1295. Design and characterization of a novel icp plasma tool for high speed and high accuracy drie processing
    N. Launay; H. W. van Zeijl; P. M. Sarro;
    In Proc. IEEE MEMS 2008,
    Tucson, Arizona, USA, pp. 311-314, Jan. 2008.

  1296. Thermal design of fully-isolated bipolar transistors
    S. Russo; L. La Spina; V. Alessandro; N. Rinaldi; L. K. Nanver;
    In Proc. IEEE Therminic,
    pp. 101-105, 2008.

  1297. Electrothermal microgripper with large jaws displacement and integrated force sensors
    T.Chu Duc; G.K.lau; J.F. Creemer; P.M. Sarro;
    In Proc. IEEE MEMS 2008,
    Tucson, Arizona, USA, pp. 519-522, Jan. 2008.

  1298. Magnesium Isotopic Composition of CAIs and Chondrules from CR Chondrites
    B. Mimoun; M. Gounelle; E.D. Young; A. Shahar; A.T. Kearsley;
    In Proc. 39th Lunar and Planetary Science Conference, (Lunar and Planetary Science XXXIX),
    League City, Texas. LPI Contribution, pp. 1639, Mar. 2008.

  1299. An electro-thermal silicon-polymer micro-gripper for simultaneous in-plane and out-of-plane motions
    J. Wei; T. Chu Duc; P.M. Sarro;
    In Proc. EUROSENSORS XXII,
    pp. 1466-1469, 2008.

  1300. Aluminium-Nitride Thin-Film Heatspreaders Integrated in Bipolar Transistors
    L. La Spina; I. Marano; V. d�Alessandro; H. Schellevis; L. K. Nanver;
    In Proc. IEEE EuroSimE,
    pp. 99-103, 2008.

  1301. 3D Microstructuring of silicon and SU8 polymer for microsystems applications
    P.M. Sarro; J. Wei; T. Chu Duc;
    In Proc. 19th Micromechanics Europe (MME 2008),
    pp. 237-241, 2008.

  1302. Highly uniform coating of vertical sidewall for 3D pattern definition
    T. Verhaar; J. Wei; P.M. Sarro;
    In Proc. 19th Micromechanics Europe (MME 2008),
    pp. 141-145, 2008.

  1303. Ultrashallow Defect-Free Junction Formation by Excimer Laser Annealing
    M. Popadic; Lis K. Nanver; Johan van der Cingel;
    In Proc. 11th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE),
    Veldhoven, The Netherlands, pp. 495-498, Nov. 2008.

  1304. Modeling Advanced Avalanche Effects for Bipolar Transistor Circuit Design
    Vladimir Milovanovic; Ramses van der Toorn;
    In Proc. 11th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE),
    Veldhoven, The Netherlands, Nov. 2008.

  1305. High-performance DUV/EUV photodiodes in a pure boron doping technology
    F. Sarubbi; L. K. Nanver; T. L. M. Scholtes; S. N. Nihtianov; F. Scholze;
    In Proc. 11th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE),
    Veldhoven, The Netherlands, pp. 588-591, Nov. 2008.

  1306. Properties of Bulk FinFET with High-eps Gate Dielectric and Metal Gate Electrode
    M. Poljak; V. Jovanovic; T. Suligoj;
    In MIPRO2008,
    2008.

  1307. First sub-30nm vertical Silicon-On-Nothing MOSFET
    L. Hllt; J. Schulze; I. Eisele; T. Suligoj; V. Jovanovic; P.E. Thompson;
    In MIPRO2008,
    2008.

  1308. Design rules for Patterning in Deep Cavities Formed by TMAH-etching of Si
    Lei Gu; Wim Wien; Lis. K. Nanver;
    In Proc. 11th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE),
    Veldhoven, The Netherlands, Nov. 2008.

  1309. On the Aluminum-Mediated Solid-Phase Epitaxy of Silicon at 300C
    A. Sammak; Y. Civale; L. K. Nanver;
    In Proc. 11th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE),
    Veldhoven, The Netherlands, Nov. 2008.

  1310. SOI vs. Bulk FinFET: Body Doping and Corner Effects Influence on Device Characteristics
    M. Poljak; V. Jovanovic; T. Suligoj;
    In MELECON2008,
    2008.

  1311. Reduction of alloying temperature of metallization stacks containing Al/Ti/TiN from 400 to 300�C
    G. Lorito; L.K. Nanver;
    In Proc. 11th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE),
    Veldhoven, The Netherlands, Nov. 2008.

  1312. Polymer Waveguide and LED Array Integration on FR4 Scanner
    M. Sayinta; A. Arslan; H. Urey;
    In Microoptics Conference,
    Brussels, Belgium, 2008.
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  1313. Monolithic 3D Integration of Single-Grain Si TFTs
    M.R. Tajari Mofrad; R. Ishihara; J. Derakhshandeh; A. Baiano; J. van der Cingel; C.I.M. Beenakker;
    In Material Research Society Symposium Proceedings,1066,A20,2008,MRS Spring Meeting,
    San Francisco, CA, USA, 2008.

  1314. Mechanically Coupled Comb Drive MEMS Stages
    A. Arslan; C. Ataman; S. Holmstrom; K. Hedsten; P. Enoksson; H. Urey;
    In IEEE/LEOS Optical MEMS & Nanophotonics,
    Freiburg, Germany, 2008.

  1315. MEMS Laser Scanner for Endoscopic Imaging Application
    A. Arslan; C. Ataman; H. Urey;
    In 10th National Optics and Photonics Meeting,
    Kocaeli, Turkey, 2008.

  1316. Characterization of new EUV stable silicon photodiodes
    F. Scholze; C. Laubis; F. Sarubbi; L. K. Nanver; S. N. Nihtianov;
    In International Symposium on Extreme Ultraviolet Lithography,
    Lake Tahoe, California, USA, Sep. 2008.

  1317. Single-Grain Si TFTs for Flexible Electronics and 3D-ICs
    R. Ishihara; A. Baiano; N. Saputra; M. Danesh; N. Matsuki; T. Chen; V. Rana; M. He; J. Long; Y. Hiroshima; N. Karaki; S. Inoue; C.I.M. Beenakker;
    In International TFT Conference,
    Jan. 2008.

  1318. Fabrication of Three-Dimensional Inverters Using the ""angstrom""""micro""-Czochralski
    Mohammad Reza Tajari Mofrad; Jaber Derakhshandeh; R. Ishihara; Cees Beenakker;
    In European Solid-State Device Research Conference 2008,
    Edinburgh, Scotland, 2008.

  1319. FinFET technology for wide-channel devices with ultra-thin silicon body
    V. Jovanovic; T. Suligoj; P. Biljanovic; L.K. Nanver;
    In MIPRO2008,
    pp. 79-83, May 2008.

  1320. Novel electrothermal bimorph actuator for large out-of-plane displacement and force
    J.Wei; T.Chu Duc; G.K.Lau; P.M. Sarro;
    In IEEE MEMS 2008,
    Tucson, Arizona, USA, pp. 46-49, Jan. 2008.

  1321. Crystallographic Silicon-Etching for Ultra-High Aspect-Ratio FinFET
    V. Jovanovic; T. Suligoj; L. K. Nanver;
    In ECS 2008,
    pp. 313-320, May 2008.

  1322. Extremely ultra-shallow p+-n boron-deposited silicon diodes applied to DUV photodiodes
    F. Sarubbi; L. K. Nanver; T. L. M. Scholtes; S. N. Nihtianov;
    In IEEE 66th Device Research Conference (DRC 2008),
    Santa Barbara, California, USA, pp. 143-144, Jun. 2008.

  1323. A chopper instrumentation amplifier for biopotential applications
    Qinwen Fan;
    PhD thesis, Delft University of Technology, 2008.

  1324. Excimer laser annealing for ultrashallow junctions and contacts
    V. Gonda;
    PhD thesis, Delft University of Technology, Dec. 2008. ISBN 978-90-8559-475-8; Promotor: prof. L.K. Nanver.

  1325. Product-internal assembly functions: A novel micro-assembly concept applied to optical interconnects
    V.A. Hanneken;
    PhD thesis, Delft University of Technology, Dec. 2008. ISBN 978-90-9023430-4; Promotors: prof. U. Staufer, prof. P.M. Sarro, dr. M. Tichem.
    document

  1326. Aluminum-mediated selective solid-phase epitaxy of high-quality silicon diodes
    Y. Civale;
    PhD thesis, Delft University of Technology, Nov. 2008. ISBN 978-90-9023633-9; Promotor: prof. L.K. Nanver.
    document

  1327. Agglomeration of amorphous silicon film with high energy density excimer laser irradiation
    Ming He; Ryoichi Ishihara; Wim Metselaar; Kees Beenakker;
    Thin Solid Films,
    Volume 515, pp. 2872-2878, 2007.

  1328. Suppression of crystalline growth in silicon films deposited from hydrogen diluted silane using a layer-by-layer approach
    G. van Elzakker; F.D. Tichelaar; M. Zeman;
    Thin Solid Films 515,
    pp. 7460, 2007.

  1329. Eyring acceleration model in thick nitride/oxide dielectrics
    S. B. Evseev;
    Microelectronics Reliability,
    Volume 47, Issue 4-5, pp. 748-751, Apr. 2007.

  1330. A dual-side fabrication method for silicon plate springs with high out-of plane stiffness
    S.L.Paalvast; H.W. van Zeijl; J.Su; P.M. Sarro; J. van Eijk;
    J. Micromech. and Microeng.,
    Volume 17, Issue 7, pp. 197-203, 2007.

  1331. Deposition of sacrificial silicon oxide layers by electron cyclotron resonance plasma
    C. Biasotto; A. M. Daltrini; R. C. Teixeira; F. A. Boscoli; J. A. Diniz; S. A. Moshkalev; I. Doi;
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures,
    Volume 25, Issue 4, pp. 1166-1170, Jul. 2007.

  1332. Microstructure characterization of location-controlled Si-islands crystallized by excimer laser in the micro-Czochralski (grain filter) process
    R. Ishihara; D. Danciu; F. Tichelaar; M. He; Y. Hiroshima; S. Inoue; T. Shimoda; J.W. Metselaar; C.I.M. Beenakker;
    Journal of Crystal Growth,
    Volume 299, Issue 2, pp. 316-321, Feb. 2007.

  1333. An in-plane thermal unimorph using confined polymers
    G.K.Lau; T.Chu Duc; J.F.L Goosen; F. van Keulen; P.M. Sarro;
    J. Micromech. and Microeng.,
    Volume 17, Issue 7, pp. 174-183, 2007.

  1334. Large Polycrystalline Silicon Grains Prepared by Excimer Laser Crystallization of Sputtered Amorphous Silicon Film with Process Temperature at 100oC
    Ming He; Ryoichi Ishihara; Ellen J. J. Neihof; Yvonne van Andel; Hugo Schellevis; Wim Metselaar; Kees Beenakker;
    Japanese Journal of Applied Physics,
    Volume 46, Issue 3B, pp. 1245-1249, Mar. 2007.

  1335. A Monte-Carlo simulation of the effect of surface morphology on the fracture of nanobeams
    Tuncay Alan; Alan Zehnder;
    Int. J. Frac,
    2007.

  1336. Bulk-Micromachined Test Structure for Fast and Reliable Determination of the Lateral Thermal Conductivity of Thin Films
    L. La Spina; A. W. van Herwaarden; H. Schellevis; W. H. A. Wien; N. Nenadovic; L. K. Nanver;
    IEEE/ASME Journal of Microelectromechanical Systems,
    Volume 6, Issue 3, pp. 675-683, 2007.

  1337. A Monolithic Low-Distortion Low-Loss Silicon-on-Glass Varactor-Tuned Filter With Optimized Biasing
    K. Buisman; L. C. N. de Vreede; L. E. Larson; M. Spirito; A. Akhnoukh; Y. Lin; X. Liu; L. K. Nanver;
    IEEE Microwave and Wireless Components Letters,
    Volume 17, Issue 1, pp. 58-60, Jan. 2007.

  1338. High Performance Single Grain Si TFTs Inside a Location-Controlled Grain by Micro-Czochralski Process with Capping Layer
    Rana Vikas; Ryoichi Ishihara; Yasushi Hiroshima; Daisuke Abe; Satoshi Inoue; Tatsuya Shimoda; J.W. Metselaar; C.I.M. Beenakker;
    IEEE Transactions on Electron Devices,
    Volume 54, Issue 1, pp. 124-130, Jan. 2007.

  1339. Deep vertical etching of silicon wafers using a hydrogenation assisted reactive ion etching
    A. Sammak; S. Azimi; N. Izadi; B. Khadem Hosseinieh; S. Mohajerzadeh;
    IEEE Journal of Microelectromechanical Systems,
    Volume 16, Issue 4, pp. 912-918, Aug. 2007.

  1340. Piezoresistive cantilever beam for force sensing in two dimensions
    T.Chu Duc; J.F. Creemer; P.M. Sarro;
    IEEE Sensors,
    Volume 7, pp. 96-104, 2007.

  1341. 2-D MMI devices based on integrated hollow ARROW waveguides
    R.Bernini; E.De Nuccio; F.Brescia; A.Minardo; L.Zeni; P.M. Sarro;
    IEEE J.of Selected Topics Quantum Electronics,
    Volume 13, Issue 2, pp. 194-201, 2007.

  1342. Threshold Current for the Onset of Kirk Effect in Bipolar Transistors With a Fully Depleted Nonuniformly Doped Collector
    R. van der Toorn;
    IEEE Electron Device Letters,
    Volume 28, Issue 1, pp. 54-57, Jan. 2007.

  1343. Microstructure of Hydrogenated Silicon Thin Films Prepared From Silane Diluted with Hydrogen
    J. Mallerovic; P. Zutta; G. van Elzakker; M. Zeman; M. Mikula;
    Applied Surface Science,
    2007.

  1344. Simulation of twin boundary effect on characteristics of single-grain silicon thin film transistors
    F. Yan; P. Migliorato; R. Ishihara;
    Applied Physics Letters,
    Volume 91, pp. 073509, 2007.

  1345. SiGe growth on patterned Si(001) substrates: Surface evolution and evidence of modified island coarsening
    J.J. Zhang; M. Stoffel; A. Rastrelli; O.G. Schmidt; V. Jovanovic; L.K. Nanver;
    Applied Physics Letters,
    Volume 91, 2007.

  1346. Powerful polymeric thermal micro-actuator with embedded silicon microstructure
    G.K. Lau; .F.L Goosen; F. van Keulen; T. Chu Duc; P.M. Sarro;
    Applied Physics Letters,
    Volume 90, Issue 21, 2007.

  1347. Polymer constraint effect for electro-thermal bimorph microactuators
    T. Chu Duc; G.K. Lau; P.M. Sarro;
    Appl. Phys. Lett.,
    Volume 91, 2007.

  1348. Fabrication of in situ ultrathin anodic aluminum oxide layers for nanostructuring on silicon substrate
    B. Yan; H.T.M. Pham; Y. Ma; Y. Zhuang; P.M. Sarro;
    Appl. Phys. Lett.,
    Volume 91, pp. 101902.1-3, 2007.

  1349. Analysis of Hydrogenated Amorphous Silicon Thin Films and Solar Cells by means of Fourier Transform Photocurrent Spectroscopy
    J. Melskens; G. van Elzakker; Y. Li; M. Zeman;
    In Thin Solid Films,
    2007.

  1350. Qualification of SiP Products: Quasi-Static Cyclic Mechanical Bending
    D. Farley; Y. Zhou; A. Dasgupta; J. F. J. Caers; J. W. C. De Vries;
    In Proceedings of the 2007 ASME International Mechanical Engineering Congress and Exposition Seattle,
    Washington, USA, 2007.

  1351. Guidelines for Transient Modelling of Board Level Drop Tests
    J. Varghese; G. Sobue; D. Farley; G. Freitas; A. Dasgupta;
    In Proceedings of the NAFEMS World Conf.,
    2007.

  1352. Single-Grain Si TFTs and Circuits for Flexible Electronics and 3D-ICs
    Ryoichi Ishihara; Vikas Rana; Ming He; Wim Metselaar; Kees Beenakker; Yasushi Hiroshima; Daisuke Abe; Satoshi Inoue;
    In Society for Information Display 2007 International Symposium,
    pp. 252-255, 2007.

  1353. Influence of Deposition Pressure on Protocrystalline Silicon Films as Solar Cell Absorber Layer
    G. van Elzakker; J. Melskens; M. Zeman;
    In Proceedings of SAFE 2007,
    Veldhoven, The Netherlands, 2007.

  1354. Ultra-Shallow Dopant Diffusion from Pre-Deposited RPCVD Monolayers of Arsenic and Phosphorus
    Milos Popadic; Lis K. Nanver; Tom L. M. Scholtes;
    In Proceedings of the 15th IEEE International Conference on Advanced Thermal Processing of Semiconductors RTP 2007,
    Catania, Italy, pp. 95-100, 2007. ISBN 1-4244-1227-7.

  1355. Hydrogenated Silicon Absorber Layers for Thin Film Solar Cells Deposited from Hydrogen Diluted Silane using a Layer-by-Layer Approach
    G. van Elzakker; J. M�_llerov��; P. ?�utta; M. Zeman;
    In Proceedings of 22nd European Photovoltaic Solar Energy Conference,
    Milan, Italy, 2007.

  1356. Silicon Dioxide Contact Window Disfiguration Due to Oxide Decomposition During the Baking Step
    M. Popadic; L. K. Nanver; Y. Civale;
    In Proceedings of 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors,
    Veldhoven, The Netherlands, 2007. ISBN 978-90-73461-49-9.

  1357. Local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning spread resistance microscopy
    N. Matsuki; R. Ishihara; A. Baiano; Y. Hiroshima; S. Inoue; C.I.M Beenakker;
    In Proceeding of The 14th International Display Workshops,
    pp. 489-492, 2007.

  1358. Electrical Characterization of Layer-Exchange Solid-Phase Epitaxy Si Diode Junctions
    Y. Civale; R. Mary-Joy; L. K. Nanver;
    In Proc. 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors,
    Veldhoven, The Netherlands, pp. 408-411, 2007. ISBN 978-90-73461-49-9.

  1359. Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscope
    N. Matsuki; R. Ishihara; A. Baiano; Y. Hiroshima; S. Inoue; C.I.M Beenakker;
    In Proceeding of SAFE,
    2007.

  1360. Orientation and Location Controlled Si Grains Through Combined MILC and ""angstrom""""micro""-Czochralski Process
    C. Tao; R. Ishihara; J. W. Metselaar; C. I. M. Beenakker;
    In Proceeding of The 14th International Display Workshops,
    pp. 2011-2012, 2007.

  1361. Analog and RF Design Using the �_-Czochralski Single Grain TFT Technology
    Nitz Saputra; Mina Danesh; Alessandro Baiano; Ryoichi Ishihara; Satoshi Inoue; Nobuo Karaki; John R. Long;
    In Proceeding of PRORISC,
    2007.

  1362. SPICE Modeling with NQS effect of Single-Grain Si TFTs using BSIMSOI
    Alessandro Baiano; Ryoichi Ishihara; Nobuo Karaki; Satoshi Inoue; Wim Metselaar; Kees Beenakeer;
    In Proceeding of SAFE,
    2007.

  1363. In-situ isotropic and anisotropic DRIE sequence for massive parallel multistage Brownian ratchets
    H.T.M.Hoa; C.d.Boer; J.Wei; P.M. Sarro;
    In G. Delapierre; R. Puers (Ed.), Proc. Transducers 2007 Conference,
    Lyon, France, IEEE, pp. 497-500, Jun. 2007.

  1364. Single-Grain Si Thin-Film Transistors for Analog and RF Circuit Applications
    N. Saputra; M. Danesh; A. Baiano; R. Ishihara; J.R. Long; J.W. Metselaarand; C.I.M. Beenakker; N. Karaki; Y. Hiroshima; S. Inoue;
    In Proceeding of ESSDERC 2007,
    pp. 107-110, 2007.

  1365. Fabrication and characterization of high aspect ratio silicon plate springs with high out-of plane stiffness
    H.W. van Zeijl; S.L. Paalvast; J. Su; J. van Eijk; P.M. Sarro;
    In G. Delapierre; R. Puers (Ed.), Proc. Transducers 2007 Conference,
    Lyon, France, IEEE, pp. 1605-1608, Jun. 2007.

  1366. Power efficient V-shape electro-thermal actuator using constrained SU8
    G.K.Lau; T.Chu Duc; J.F.L Goosen; P.M. Sarro; F. van Keulen;
    In G. Delapierre; R. Puers (Ed.), Proc. Transducers 2007 Conference,
    Lyon, France, IEEE, pp. 287-290, Jun. 2007.

  1367. Fabrication of vertical electrodes on channel sidewall for picoliter liquid measurements
    Jia Wei; M. van der Velden; P.M. Sarro;
    In G. Delapierre; R. Puers (Ed.), Proc. Transducers 2007 Conference,
    Lyon, France, IEEE, pp. 1613-1616, Jun. 2007.

  1368. Analysis of Si-Ti and Si-TiN interface after 400�C alloying
    G. Lorito; L. K. Nanver; H. Schellevis;
    In Proc. SAFE/STW,
    Veldhoven, The Netherlands, pp. 525-528, Nov. 2007.

  1369. Double laser annealing of implanted silicon by using laser pulse offsets
    V. Gonda; J. Slabbekoorn; L. K. Nanver;
    In Proc. SAFE/STW,
    Veldhoven, The Netherlands, pp. 517-520, Nov. 2007.

  1370. Characterization of ultra-shallow gate n-channel JFETs
    G. Piccolo; L. K. Vandamme; M. Macucci; L. K. Nanver;
    In Proc. SAFE/STW,
    Veldhoven, The Netherlands, pp. 448-451, Nov. 2007.

  1371. Study of boron-doped nm-deep junctions fabricated by B2H6 surface reaction doping
    F. Sarubbi; L. K. Nanver; T. L. M. Scholtes;
    In Proc. SAFE/STW,
    Veldhoven, The Netherlands, pp. 547-550, Nov. 2007.

  1372. An Efficient Sectionalized Modeling Approach for Introduction of @Distributed Avalanche Effects in Bipolar Circuit Design
    V. Milovanovic; S. Mijalkovic;
    In Proc. NANOTEC 2007,
    Santa Clara, CA, 2007.

  1373. Aluminium Nitride Layers: One Way to Beat the Heat in Silicon-On-Glass Technology
    L. La Spina; H. Schellevis; L. K. Nanver;
    In Proc. SAFE/STW,
    Veldhoven, The Netherlands, pp. 430-433, Nov. 2007.

  1374. Integration of Junction FETs in Back-wafer Contacted Silicon-On-Glass Technology
    V. Jovanovic; L. Shi; G. G. Lorito Piccolo; F. Sarubbi; L. K. Nanver;
    In Proc. SAFE/STW,
    Veldhoven, The Netherlands, pp. 425-429, Nov. 2007.

  1375. Varactor Topologies for RF Adaptivity with Improved Power Handling and Linearity
    K. Buisman; C. Huang; A. Akhnoukh; M. Mar.etti; L. C. N. de Vreede; L. E. Larson; L. K. Nanver;
    In Proc. Microwave Symposium, IEEE/MTT-S International,
    Honolulu, Hawaii, USA, pp. 319-322, Jun. 2007.

  1376. Vertical Silicon-on-Nothing FET: Threshold Voltage Calculation Using Compact Capacitance Model
    Boris Svili�?ic; Vladimir Jovanovic; Tomislav Suligoj;
    In Proc. ISDRS 2007,
    College Park, MD, Dec. 2007.

  1377. Characterization of a Nozzle-Integrated Capacitive Sensor for Microfluidic Jet Systems
    M. van der Velden; J.W. Spronck; R.H. Munnig Schmidt; J. Wei; P.M. Sarro;
    In B.Mizaikoff; P.J. French (Ed.), Proc. IEEE Sensors 2007 Conf,
    Atlanta, Georgia, USA, IEEE, pp. 1241-1244, Oct. 2007.

  1378. Technological constrains of bulk FinFET structure in comparison with SOI FinFET
    Mirko Poljak; Vladimir Jovanovic; Tomislav Suligoj;
    In Proc. ISDRS 2007,
    College Park, MD, Dec. 2007.

  1379. Integrated Silicon-polymer laterally stacked bender for sensing microgrippers
    T. Chu Duc; G.K.Lau; J.F.L Goosen; F. van Keulen; P.M. Sarro;
    In S.Lee; M. Esashi (Ed.), Proc. IEEE Sensors 2006 Conf,
    Daegu, Korea, IEEE, pp. 662-665, Oct. 2007.

  1380. Local Sealing of High Aspect Ratio Vias for Single Step Bottom-up Copper Electroplating of Through Wafer Interconnects
    M. Saadaoui; W. Wien; H. V. Zeijl; H. Schellevis; M. Laros; P. M. Sarro;
    In B.Mizaikoff; P.J. French (Ed.), Proc. IEEE Sensors 2007 Conf,
    Atlanta, Georgia, USA, IEEE, pp. 974-977, Oct. 2007.

  1381. Nano-hole arrays in thin Au/Pd film on glass for high speed molecular analysis
    O. Piciu; M van der .Krogt; M.Docter; P.M. Sarro; A.Bossche;
    In S.Lee; M. Esashi (Ed.), Proc. IEEE Sensors 2006 Conf,
    Daegu, Korea, IEEE, pp. 608-611, Oct. 2007.

  1382. Electro-thermally actuated polymeric stack for linear in-plane actuation
    G.K. Lau; T .Chu Duc; J.F.L Goosen; F. van Keulen; P.M. Sarro;
    In S.Lee; M. Esashi (Ed.), Proc. IEEE Sensors 2006 Conf,
    Daegu, Korea, IEEE, pp. 538-541, Oct. 2007.

  1383. Silicon laser annealing by a two-pulse laser system with variable pulse offsets
    V. Gonda; J. Slabbekoorn; L. K. Nanver;
    In Proc. IEEE RTP 2007,
    Catania, Italy, pp. 257-262, Oct. 2007.

  1384. A Low-Loss Compact Linear Varactor Based Phase-Shifter
    J. H. Qureshi; S. Kim; K. Buisman; C. Huang; M. J. Pelk; A. Akhnoukh; L. E. Larson; L. K. Nanver; L. C. N. de Vreede;
    In Proc. IEEE RFIC (Radio Frequency Integrated Circuits) Symposium,
    Honolulu, Hawaii,USA, pp. 453-456, Jun. 2007.

  1385. 2D electro-thermal microgripper with large clamping and rotation motion at low driving voltage
    T.Chu Duc; J.Wei; G.K.Lau; P.M. Sarro;
    In Proc. 20th IEEE International Conference on MicroElectroMechganical Systems (IEEE MEMS 2007),
    Kobe, Japan, pp. 687-690, Jan. 2007.

  1386. Characterization of PVD Aluminum Nitride for Heat Spreading in RF IC's
    L. La Spina; L. K. Nanver; E. Iborra; M. Clement; J. Olivares; H. Schellevis;
    In Proc. IEEE ESSDERC,
    Munich, Germany, pp. 354-357, Sep. 2007.

  1387. Electrothermal Effects in Bipolar Differential Pairs
    L. La Spina; V. d'Alessandro; F. Santagata; N. Rinaldi; L. K. Nanver;
    In Proc. IEEE BCTM,
    Boston, USA, pp. 131-134, Oct. 2007.

  1388. Simulation and measurement of a comb-structure silicon-polymer thermally actuated microgripper
    F. Krecinic; T.Chu Duc; G.K. Lau; P.M. Sarro;
    In Proc. 18th MicroMechanics Europe (MME 2006),
    Guimares, Portugal, Univ. Minho, pp. 215-218, Sept.16-18 2007.

  1389. Low-frequency noise characterization of ultra-shallow gate n-channel junction field effect transistors
    G. Piccolo; F. Sarubbi; L. J. K. Vandamme; M. Macucci; T. L. M. Scholtes; L. K. Nanver;
    In Proc. 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE),
    Veldhoven, The Netherlands, pp. 448-451, Nov. 2007.

  1390. Integrated Silicon-polymer laterally stacked actuators for out-of-plane bending motion
    J.Wei; T.Chu Duc; P.M. Sarro;
    In Proc. 18th MicroMechanics Europe (MME 2006),
    Guimares, Portugal, Univ. Minho, pp. 187-190, Sept.16-18 2007.

  1391. Straight sidewall controlling of high viscosity SU-8 photoresist patterning using UV lithography
    C. Olivadoti; H.T.M. Pham; P.M. Sarro;
    In Proc. 18th MicroMechanics Europe (MME 2006),
    Guimares, Portugal, Univ. Minho, Sept. 2007.

  1392. Oxide to oxide wafer bonding for three dimensional (3D) IC integration technologies
    M. Cannavo; H.W. van Zeijl; G. Pandraud; J. V. Driel; T. Alan; P.M. Sarro;
    In Proc SAFE & Prorisc 2004,
    Veldhoven, The Netherlands, STW, pp. 509-512, Nov. 2007.

  1393. Tuning of DRIE process for Capacitive Sensor in Inkjet Nozzle
    J.Wei; T. Chu Duc; M. van der Velden; P. M. Sarro;
    In Proc SAFE & Prorisc 2004,
    Veldhoven, The Netherlands, STW, pp. 625-628, Nov. 2007.

  1394. Roughness treatment of silicon surface after Deep Reactive Ion Etching
    H.T.M. Pham; Charles R. de Boer; P.M. Sarro;
    In Proc SAFE & Prorisc 2004,
    Veldhoven, The Netherlands, pp. 535-538, Nov. 2007.

  1395. A comparative study of the strength of Si, SiN and SiC used at nanoscales
    T. Alan; P.M. Sarro;
    In Proc SAFE & Prorisc 2004,
    Veldhoven, The Netherlands, STW, pp. 395-398, Nov. 2007.

  1396. Improvement of wettability of silicon nitride in PECVD environment for copper electrodeposition in HAR vias
    M. Saadaoui; W. Wien; H. van Zeijl; A. van den Bogaard; P.M. Sarro;
    In Proc SAFE & Prorisc 2004,
    Veldhoven, The Netherlands, STW, pp. 543-546, Nov. 2007.

  1397. Smart etch or plasma hydrogenation-assisted high aspect ratio etching of silicon
    S. Azimi; A. Sammak; B. Khadem Hosseinieh; S. Mohajerzadeh; R. Faez; N. Izadi;
    In ICEE 2007,
    ITRC, Iran, 2007.

  1398. Integrated silicon optical sensors based on hollow core waveguide
    R. Bernini; E. De Nuccio; A. Minardo; L. Zeni; P.M. Sarro;
    In A. Kubby; G.T. Reed (Ed.), Photonics West, Proc. SPIE: Silicon Photonics II,
    San Jose, California, USA, SPIE, Jan. 2007.

  1399. Vertical Silicon-on-Nothing FET: Capacitance-Voltage Compact Modeling
    B. Svili�?ic; V. Jovanovic; T. Suligoj;
    In MIPRO 2007 International Conference,
    Opatija, Croatia, pp. 84-88, May 2007.

  1400. Sub-100 nm silicon-nitride hard-mask for high aspect-ratio silicon fins
    V. Jovanovic; S. Milosavljevic; L. K. Nanver; T. Suligoj; P. Biljanovic;
    In MIPRO 2007 International Conference,
    Opatija, Croatia, pp. 62-66, May 2007.

  1401. Vertical Silicon-on-Nothing FET: Analytical Model of Subthreshold Slope
    B. Svili�?iC; V. Jovanovic; T. Suligoj;
    In MIDEM 2007 International Conference,
    Bled, Slovenia, pp. 71-74, Sep. 2007.

  1402. Phase Control and Stability of Thin Silicon Films Deposited from Silane Diluted with Hydrogen
    G. van Elzakker; P. ?�utta; F. D. Tichelaar; M. Zeman;
    In Material Research Society Symposium Proceedings,
    San Francisco, CA, USA, 2007.

  1403. Preparation of large, location-controlled Si grains by excimer-laser crystallization of a-Si films sputtered at 100oC
    M. He; R Ishihara; C. I. M. Beenakker;
    In Mater. Res. Soc. Proc.,
    2007.

  1404. Defect States in Excimer-Laser Crystallized Single-Grain TFTs Studied with Isothermal Charge Deep-level Transient Spectroscopy
    V. Nadazdy; V. Rana; R. Ishihara; S. Lanyi; R. Durny; J.W. Metselaar; C.I.M. Beenakker;
    In Mater. Res. Soc. Proc.,
    2007.

  1405. Silicon Nanowire Fabrication Using Novel Hydrogenation-Assisted Deep Reactive Ion Etching
    A. Sammak; S. Azimi; B. Khadem Hosseinieh; S. Mohajerzadeh; E. Asl Soleimani;
    In ISDRS 2007,
    College Park MD, USA, Dec. 2007.

  1406. DC modeling of Single-Grain Si TFTs using BSIMSOI
    A. Baiano; R. Ishihara; N. Karaki; S. Inoue; W. Metselaar; K. Beenakker;
    In International TFT Conference,
    pp. 200-203, Jan. 2007.

  1407. SPICE Modeling of Single-Grain Si TFTs using BSIMSOI
    A. Baiano; R. Ishihara; N. Saputra; J. Long; N. Karaki; S. Inoue; W. Metselaar; K. Beenakeer;
    In ECS Transactions-ULSI vs. TFT Conference,
    Jul. 2007.

  1408. A novel Carbon-Nanotube-based Nano-lithography technique to form nano-MOS devices
    J. Derakhshandeh; Y. Abdi; S. Mohajerzadeh;
    In International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication (EIPBN) 2007,
    2007.

  1409. Priberam's question answering system in a cross-language environment
    A. Cassan; H. Figueira; A. Martin; A. Mendes; P. Mendes; C. Pinto; D. Vidal;
    In CLEF 2006, Lecture Notes in Computer Science,
    pp. 300-309, 2007.

  1410. Distribution of the Collector Resistance of Planar Bipolar Transistors: Impact on Small Signal Characteristics and Compact Modeling
    R. van der Toorn; J.J. Dohmen; O. Hubert;
    In Bipolar/BiCMOS Circuits and Technology Meeting (BCTM 07),
    IEEE, pp. 184-187, Sept. 2007.

  1411. Local electrical properties of coincidence site lattice boundaries in location-controlled silicon islands by scanning capacitance microscopy
    Nobuyuki Matsuki; Ryoichi Ishihara; Chen Tao; Yasushi Hiroshima; J. W .Metselaar; C.I.M Beenakker;
    In AMFPD07,
    pp. 251-253, 2007.

  1412. Location and Orientation Control of Si Grains Through Combined MILC and �_-Czochralski process
    Chen Tao; Ryoichi Ishihara; J. W .Metselaar; C.I.M Beenakker;
    In AM-FPD07,
    pp. 271-273, 2007.

  1413. Single-grain Si TFTs fabricated at 100oC for microelectronics on a plastic substrate
    M. He; R. Ishihara; C. I. M. Beenakker;
    In 2007 MRS Proceedings: Amorphous and Polycrystalline Thin-Film Silicon Science and Technology,
    2007.

  1414. Integration of a hands-on research training course in a high-discipline IC-processing research cleanroom
    S. Milosavljevic; H. Schellevis; A. van d. Bogaard; T. L. M. Scholtes; J. M. W. Laros; C. R. de Boer; E. J. G. Goudena; L. K. Nanver;
    In 2nd Int. Conf. on Engineering Education and Training,
    Kuwait, Apr. 2007.

  1415. Monocrystalline Si-based microhotplate heater
    M. Mihailovic; J.F. Creemer; P.M. Sarro;
    In Proc. SAFE/STW,
    Veldhoven, The Netherlands, pp. 608-611, Nov. 2007.

  1416. Maskless Lithography Setup and Polymer Waveguide Fabrication
    A. Arslan; H. Urey;
    In 9th National Optics and Photonics Meeting,
    Ankara, Turkey, 2007.

  1417. Crystallographic orientation- and location-controlled Si single grains on an amorphous substrate for large area electronics
    M. He;
    PhD thesis, Delft University of Technology, Sept. 2007. ISBN 978-90-8559-306-5; Promotor: prof. C.I.M. Beenakker.

  1418. Micro-electro-mechanical actuators using confined polymers
    G.-K. Lau;
    PhD thesis, Delft University of Technology, Dec. 2007. ISBN 978-90-9022531-9; Promotors: prof. A. van Keulen, P.M. Sarro, J.F.L. Goossen.

  1419. Sensing microgripper for microparticle handling
    T. Chu Duc;
    PhD thesis, Delft University of Technology, Dec. 2007. ISBN 978-90-8559-158-0; Promotor: P.M. Sarro.

  1420. Thermally induced current bifurcation in bipolar transistors
    L. La Spina; N. Nenadovic; V. d'Alessandro; F. Tamigi; N. Rinaldi; L. K. Nanver; J. W. Slotboom;
    Solid-State Electronics,
    Volume 50, pp. 877-888, 2006.

  1421. Textured Self-assembled Square-shaped Poly-Si Grains by Multiple Shots Excimer Laser Crystallization
    Ming He; Ryoichi Ishihara; Wim Metselaar; Kees Beenakker;
    Journal of Applied Physics,
    Volume 100, 2006.

  1422. Lateral nanoNewton force sensing piezocantilevers for microparticle handling
    T. Chu Duc; J.F. Creemer; P.M. Sarro;
    J. Micromech and Microeng.,
    Volume 16, Issue 6, pp. 102-106, 2006.

  1423. Characteristics of AlN/Ni(111) heterostructures and their application to epitaxial growth of GaN
    T.W. Kim; N. Matsuki; J. Ohta; H. Fujioka;
    Jpn. J. Appl. Phys,
    Volume 45, Issue 14, pp. L396-L398, Mar. 2006.

  1424. Capping Layer on Thin Si Film for mu-Czochralski Process with Excimer Laser Crystallization
    Rana Vikas; Ryoichi Ishihara; Yasushi Hiroshima; Daisuke Abe; Satoshi Inoue; Tatsuya Shimoda; Wim Metselaar; Kees Beenakker;
    Japanese Journal of Applied Physics,
    Volume 45, Issue 5, pp. 4340-4343, 2006.

  1425. A Novel Selected Area Laser Assisted (SALA) System for Crystallization and Doping Processes in Low-Temperature Poly-Si Thin-Film Transistors
    R. Ishihara; A. Glazer; Y. Raab; P. Rusian; M. Dorfan; B. Lavi; I. Leizerson; A. Kishinevsky; Y. van Andel; X. Cao; J. W. Metselaar; C. I. M. Beenakker; S. Stolyarova; Y. Nemirovsky;
    Journal of IEICE,
    Volume E89-C, Issue 10, pp. 136-140, 2006.

  1426. Simulation of a tunable optically pumped terahertz intersubband laser with diluted magnetic semiconductors
    M. Popadic; V. Milanovic; Z. Ikonic; Dragan Indjin;
    Journal of Applied Physics,
    Volume 100, pp. 1-6, 2006.

  1427. In-package MEMS-based thermal actuators for micro-assembly
    V. Henneken; M. Tichem; P.M.Sarro;
    J. Micromech and Microeng.,
    Volume 16, Issue 6, pp. 107-115, 2006.

  1428. Effects of Capping Layer on Grain Growth with mu-Czochralski Process during Excimer Laser Crystallization
    Ming He; Ryoichi Ishihara; Yasushi Hiroshima; Satoshi Inoue; Tatsuya Shimoda; Wim Metselaar; Kees Beenakker;
    Japanese Journal of Applied Physics,
    Volume 45, Issue 1, 2006.

  1429. Epitaxial growth of AlN on Cu(111) substrates using pulsed laser deposition
    S. Inoue; K. Okamoto; N. Matsuki; T.W. Kim; H. Fujioka;
    J. Cryst. Growth,
    Volume 289, Issue 2, pp. 574-577, Apr. 2006.

  1430. New insights in microcrystalline silicon deposition with expanding thermal plasma chemical vapor deposition
    R.A.C.M.M. van Swaaij; R. Jiminez Zambrano; C. Smit; M. C. M. van de Sanden;
    J. Non-Cryst. Solids,
    Volume 352, Issue 933, 2006.

  1431. Silicon Micromachining of High Aspect Ratio, High-Density Through-Wafer Electrical Interconnects for 3-D Multichip Packaging
    Zheyao Wang; Lianwei Wang; N. T. Nguyen; Wim A. H. Wien; Hugo Schellevis; Pasqualina M. Sarro; Joachim N. Burghartz;
    IEEE Tr. Advanced Packaging,
    Volume 29, Issue 3, Aug. 2006.

  1432. A new approach in measuring Cu-EMC adhesion strength by AFM
    C. K. Y. Wong; H. Gu; B. Xu; M. M. F. Yuen;
    IEEE Transactions on Components and Packaging Technologies,
    Volume 29, pp. 543-550, 2006.

  1433. In-package MEMS-based thermal actuators for micro-assembly
    V.A. Henneken; M. Tichem; P.M. Sarro;
    J. Micromech. Microeng.,
    Volume 16, pp. S107-S115, 2006.

  1434. Diode/magnetic tunnel junction cell for fully scalable matrix-based biochip
    F.A. Cardoso; H.A. Ferreira; J.P. Conde; V. Chu; P.P. Freitas; D. Vidal; J. Germano; L. Sousa; M.S. Piedade; B.A. Costa; J.M. Lemos;
    J. Appl. Phys.,
    2006.

  1435. Restabilizing mechanisms after the onset of thermal instability in bipolar transistors
    N. Nenadovic; V. d'Alessandro; L. La Spina; N. Rinaldi; L. K. Nanver;
    IEEE Trans. Electron Devices,
    Volume 53, Issue 4, pp. 643-653, 2006. ISSN: 0018-9383.

  1436. Effect of Surface Morphology on the Fracture Strength of Silicon Nanobeams
    Tuncay Alan; Melissa Hines; Alan Zehnder;
    Appl. Phys. Lett.,
    Volume 89, 2006.

  1437. Sub-500C Solid-Phase Epitaxy of Ultra-Abrupt p+-Silicon Elevated Contacts and Diodes
    Y. Civale; L.K. Nanver; P. Hadley; E.J.G. Goudena; H. Schellevis;
    IEEE Electron Device Lett,
    Volume 27, Issue 5, pp. 341-343, May 2006. ISSN 0741-3106.

  1438. Adaptive Multi-Band Multi-mode power amplifier using integrated varactor-based tunable matching networks
    W. C. E. Neo; Y. Lin; X.-D. Liu; L. C. N. de Vreede; L. E. Larson; M. Spirito; M. J. Pelk; K. Buisman; A. Akhoukh; A. De Graauw; L. K. Nanver;
    IEEE Journal of Solid-State Circuits,
    Volume 41, Issue 9, pp. 2166-2176, Sept. 2006. ISSN 0018-9200.

  1439. Methyl monolayers improve the fracture strength and durability of silicon nanobeams
    Tuncay Alan; Alan Zehnder; Debodhonyaa Sengupta; Melissa Hines;
    Appl. Phys. Lett.,
    Volume 89, 2006.

  1440. Unusual hydrogen distribution and its change in hydrogenated amorphous silicon prepared using bias electric-field molecular beam deposition
    N. Matsuki���; S. Shimizu; M. Kondo; A. Matsuda;
    Appl. Phys. Lett,
    Volume 89, Issue 1, Jul. 2006.

  1441. Preferred <100> surface and in-plane orientations in self-assembled poly-Si by multiple excimer-laser irradiation
    M. He; R Ishihara; C. I. M. Beenakker;
    Electrochemical Society Transaction,
    Volume 3, Issue 8, pp. 167-172, Oct. 2006.

  1442. Epitaxial growth of GaN on copper substrates
    S.Inoue; K. Okamoto; N. Matsuki; T.W. Kim,H. Fujioka;
    Appl. Phys. Lett,
    Volume 88, Issue 26, Jun. 2006.

  1443. Epitaxial growth of AlN on single-crystal Ni(111) substrates
    T.W. Kim; N. Matsuki���; J. Ohta; H. Fujioka;
    Appl. Phys. Lett,
    Volume 88, Issue 12, Mar. 2006.

  1444. Development and characterization of an integrated silicon micro flow cytometer
    R.Bernini; E.De Nuccio; F.Brescia; A.Minardo; L.Zeni; P.M. Sarro; R.Palumbo; M.R.Scarfi;
    Analytical and Bioanalytical Chemistry,
    Volume 386, pp. 1267-1272, 2006.

  1445. Charge deep-level transient spectroscopy study of high-energy-electron-beam-irradiated hydrogenated amorphous silicon
    A. Klaver; V. N��da?_dy; M. Zeman; R.A.C.M.M. van Swaaij;
    Appl. Phys. Lett.,
    Volume 89, 2006.

  1446. Kinetic study of disulfide molecular film deposition for Cu-EMC adhesion promotion
    C. K. Y. Wong; M. Zheng; B. Xu; M. M. F. Yuen;
    In Proceedings of the IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium,
    Petaling Jaya, pp. 510-513, 2006.

  1447. Piezoresistive cantilever for nano-Newton sensing in two dimensions
    T. Chu Duc; J.F. Creemer; P.M. Sarro;
    In Proc. 19th IEEE International Conference on MicroElectroMechganical Systems (IEEE MEMS 2006),
    Istanbul, Turkey, pp. 586-589, 2006.
    document

  1448. Analysis of structure and defects in thin silicon films deposited from hydrogen diluted silane
    G. van Elzakker; V. N��da?_dy; F.D. Tichelaar; J.W. Metselaar; M. Zeman;
    In Thin Solid Films,
    pp. 511-512, 2006.

  1449. Profile Engineering of Decreasing Arsenic Doping in Silicon RPCVD
    Milos Popadic; Francesco Sarubbi; Tom L. M. Scholtes; Silvana Milosavljevic; Wiebe de Boer; Lis K. Nanver;
    In Proceedings of the 9th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors,
    Veldhoven, The Netherlands, pp. 475-478, 2006.

  1450. PECVD-grown vertically aligned carbon nanotubes suitable for inter-digital structures on (100) Si-based membranes
    H.Sedaghat-Pisheh; Y.Abdi; S.Mohajerzadeh; J.Derakhshandeh; A. Khodadadi;
    In The International Carbon 2006 Conference,
    Aberdeen, Scotland, Jul. 2006.

  1451. Layer-by-layer deposition of thin silicon films from hydrogen diluted silane
    G. van Elzakker; F. D. Tichelaar; M. Zeman;
    In Proceedings of SAFE 2006,
    Veldhoven, The Netherlands, pp. 465, 2006.

  1452. Influence of Surface Properties on the Fracture of MEMS Beams
    Tuncay Alan; Alan Zehnder;
    In Proceedings of The 2006 SEM (Society for Experimental Mechanics) Annual Conference and Exposition,
    St. Louis, Missouri, Jun. 2006.

  1453. Control of the ion-energy distribution and measurement of ion currents with a non-sinusoidal substrate bias
    M. A. Wank; I. Martin; M. A. Blauw; R.A.C.M.M. van Swaaij; M. C. M. van de Sanden;
    In Proceedings of SAFE2006,
    Veldhoven, The Netherlands, pp. 488, 2006.

  1454. Fourier Transform Photocurrent Spectroscopy on hydrogenated amorphous silicon
    M. Verbaan; G. van Elzakker; M. Zeman;
    In Proceedings of SAFE 2006,
    Veldhoven, The Netherlands, pp. 444, 2006.
    document

  1455. Advanced silicon micromachining for 3D micro and nanostructuring
    P.M. Sarro; J.Wei;
    In Proc. IWOFM-IWONN Conference,
    Halong, Vietnam, Dec. 2006.
    document

  1456. Properties of Thin-Film Silicon in the Transition Region from the Amorphous to Nanocrystalline Phase
    G. van Elzakker; M. Zeman;
    In Proceedings of QUANTSOL Workshop,
    Rauris, Austria, 2006.
    document

  1457. Electrical Characterization of Residual Bulk Defects after Laser Annealing��of Implanted Shallow Junctions
    S. Liu; V. Gonda; T. L. M. Scholtes; L. K. Nanver;
    In Proc. IEEE-IWJT,
    Shanghai, China, IEEE, pp. 112-115, 2006. ISBN 1-4244-0047-3.
    document

  1458. Versatile wire configuration for independent actuation of bending and torsion displacements of microcantilevers
    W.J. Venstra; M. van der Velden; J.W. Spronck; J. van Eijk; P.M. Sarro;
    In Proc. IEEE Sensors 2005,
    Irvine, California, USA, pp. 584-587, Oct. 2006.
    document

  1459. Improving Fracture Properties of Si Nanobeams with Self Assembled Monolayers
    Tuncay Alan; Debodhonyaa Sengupta; Melissa Hines; Alan Zehnder;
    In Proceedings of Eurosensors 20,
    Goteborg, Sweden, Sep. 2006.
    document

  1460. Interfacial strength assessment of Cu-epoxy system by atomic force microscope
    C. K. Y. Wong; E. V. Kuznetsov; B. Xu; M. M. F. Yuen;
    In Proceedings-Electronic Components and Technology Conference,
    San Diego, CA, pp. 491-495, 2006.
    document

  1461. MEMS Hotplates with TiN as a Heater Material
    J.F. Creemer; D. Briand; W. van der Vlist; C. de Boer; H.W. Zandbergen; P.M. Sarro;
    In Proc. IEEE Sensors 2005,
    Irvine, California, USA, pp. 330-333, Oct. 2006.

  1462. ATTO-Liter Periodical Cavities for Optical BIO-Molecular Detection
    O. Piciu; M. van der Krogt; M. Docter; P.M. Sarro; A. Bossche;
    In Proc. IEEE Sensors 2005,
    Irvine, California, USA, pp. 452-456, Oct. 2006.

  1463. Reliability issues related to laser-annealed implanted back-wafer contacts��in bipolar silicon-on-glass processes
    G. Lorito; V. Gonda; S. Liu; T. L. M. Scholtes; H. Schellevis; L. K.�� Nanver;
    In Proc. IEEE International Conference on Microelectronics, MIEL,
    Belgrade, Serbia and Montenegro, IEEE, pp. 369-372, 2006. ISBN 1-4244-0116-x.

  1464. Ring-gate MOSFET test structures for measuring surface-charge-layer sheet resistance on high-resistivity-silicon substrates
    S. B. Evseev; L. K. Nanver; S. Milosavljevic;
    In Proc. IEEE International Conference on Microelectronic Test Structures, ICMTS,
    Austin, USA, pp. 3-8, 2006. ISBN 1-4244-0167-4.

  1465. PVD Aluminium Nitride as Heat Spreader in Silicon-On-Glass Technology,��? in Proc. IEEE International Conference on Microelectronics, MIEL
    L. La Spina; H. Schellevis; N. Nenadovic; L. K. Nanver;
    In Proc. IEEE International Conference on Microelectronics, MIEL,
    Belgrade, Serbia and Montenegro, IEEE, pp. 365-368, 2006. ISBN 1-4244-0116-x.

  1466. Uniformity of Chemical Vapor Deposited Boron-Silicide Layers on Silicon
    F. Sarubbi; L. K. Nanver; T. L. M. Scholtes;
    In Proc. 9th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE),
    Veldhoven, The Netherlands, pp. 479-482, Nov. 2006.
    document

  1467. MEMS test structure for measuring thermal conductivity of thin films
    L. La Spina; N. Nenadovic; A. W. van Herwaarden; H. Schellevis; W. H. A. Wien; L. K. Nanver;
    In Proc. IEEE International Conference on Microelectronic Test Structures, ICMTS,
    Austin, USA, pp. 137-142, 2006. ISBN 1-4244-0167-4.
    document

  1468. Improved thermal U-beam actuators for micro-assembly
    V. Henneken; M. Tichem; P.M. Sarro;
    In P.Enoksson (Ed.), Proc. Eurosensors XX,
    Goteborg, Sweden, Sept. 2006.
    document

  1469. Silicon bulk micromachining: from sub-mm to nm 3D structuring
    P.M. Sarro;
    In P.Enoksson (Ed.), Proc. Eurosensors XX,
    Goteborg, Sweden, Sept. 2006.
    document

  1470. A novel dual-side fabrication method for silicon plate springs with high out-of plane stiffness
    H.W. van Zeijl; J. Su; S.L. Paalvast; P.M. Sarro; J. van Eijk;
    In H. Morgan (Ed.), Proc. 17th MicroMechanics Europe (MME 2006),
    Southampton, UK, pp. 209-212, Sept. 2006.
    document

  1471. In-plane thermal unimorph using confined polymers
    G.K.Lau; T.Chu Duc; J.F.L Goosen; F. van Keulen; P.M. Sarro;
    In H. Morgan (Ed.), Proc. 17th MicroMechanics Europe (MME 2006),
    Southampton, UK, pp. 117-120, Sept. 2006.

  1472. Study on 2-lever DRIE for 3D MEMS structures
    J.Wei; T.ChuDuc; P.M. Sarro;
    In Proc SAFE & Prorisc 2004,
    Veldhoven, pp. 494-497, Nov. 2006.
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  1473. Copper electroplating for 3D interconnects
    M.Saadaoui; W.Wien; H.van Zeijl; P.M. Sarro;
    In Proc SAFE & Prorisc 2004,
    Veldhoven, pp. 523-526, Nov. 2006.
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  1474. Silicon-polymer laterally stacked bimorph micro-gripper
    T. Chu Duc; G.K. Lau; J. Wei; P.M. Sarro;
    In H. Morgan (Ed.), Proc. 17th MicroMechanics Europe (MME 2006),
    Southampton, UK, pp. 197-200, Sept. 2006.

  1475. Fabrication of porous anodic aluminum oxide templates and pattern transfer
    B.Yan; V.Vespini; H.T.M.Pham; H.Schellevis; P.M. Sarro;
    In Proc SAFE & Prorisc 2004,
    Veldhoven, pp. 498-501, Nov. 2006.
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  1476. A novel dual-side fabrication method for silicon plate springs with high out-of plane stiffness
    J.Su; H.W.van Zeijl; S.L.Paalvast; P.M. Sarro; J.van Eijk;
    In Proc SAFE & Prorisc 2004,
    Veldhoven, pp. 394-397, Nov. 2006.
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  1477. Defect States in Excimer-Laser Crystallized Single-Grain TFTs Studied with Isothermal Charge Deep-level Transient Spectroscopy
    V. Nadazdy; V. Rana; R. Ishihara; S. Lanyi; R. Durny; J.W. Metselaar; C.I.M. Beenakker;
    In Polycrystalline Thin-Film Silicon Science and Technology,
    2006.
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  1478. Nano-scale MOSFET Devices Fabricated Using a Novel Carbon-Nanotube-based Lithography
    J. Derakhshandeh; Y. Abdi; S. Mohajerzadeh; M. Beikahmadi; E.Arzi; M.D. Robertson; J.C.Bennett;
    In Material Research Society (MRS) spring meeting,
    San Francisco, CA, Mar. 2006.
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  1479. Low-Temperature Solid-Phase Epitaxy of Defect-Free Aluminum p+-doped Silicon for Nanoscale Device Applications
    Y. Civale; L.K. Nanver; P. Hadley; H.W. van Zeijl; E.J.G. Goudena; H. Schellevis;
    In Material Research Society Symposium Proc.,
    San Francisco, CA, 2006.
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  1480. Electrical Characterization of Residual Implantation-Induced Defects in the Vicinity of Laser-Annealed Implanted Ultrashallow Junctions in Doping Engineering for Device Fabrication
    V. Gonda; S. Liu; T. L. M. Scholtes; L. K. Nanver;
    In Mater. Res. Soc. Symp. Proc.,
    Warrendale, PA, 2006.
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  1481. Selective Solid-Phase Epitaxy of Ultra-Shallow p+ Aluminum-Doped Silicon Junctions for Integration in Nanodevices
    Y. Civale; L.K. Nanver; P. Hadley;
    In IEEE Silicon Nanoelectronics Workshop Proceedings,
    Honolulu, USA, pp. 55-56, Jun. 2006.
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  1482. Hot-carrier degradation analysis based on ring oscillators
    Jingchao Wang; Edgar Olthof; Wim Metselaar;
    In ESREF: European Symposium Reliability of electron devices, failure physics and analysis,
    Wuppertal, Germany, Oct. 2006.
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  1483. Integrated Silicon-Polymer Laterally Stacked Bender for Sensing Microgrippers
    T. Chu Duc; J. Wei; P. M. Sarro; G. K. Lau;
    In IEEE SENSORS 2006, EXCO,
    Daegu, Korea, Oct. 2006.
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  1484. Versatile n-type profile engineering by controlling arsenic surface segregation in silicon RPCVD
    M. Popadic; F. Sarubbi; T. L. M. Scholtes; L. K. Nanver;
    In ECS Transactions,
    2006.
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  1485. Fabrication of 100nm Gate length MOSFET's using a novel carbon-nanotube-based nano-lithography
    J. Derakhshandeh; M. Beikahmadi; K. Baghban; Y. Abdi; S. Mohajerzadeh;
    In ICEE2006,
    Amirkabir University, Tehran, 2006.
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  1486. Material-Inversion Solid-Phase Epitaxy of p+ Si for Elevated Junctions
    Y. Civale; L. K. Nanver; H. Schellevis;
    In Electrochemical Society Transactions, 210th ECS Meeting Proceedings,
    Cancun, Mexico, pp. 97-103, Oct. 2006.

  1487. Preparation of Large Poly-Si Grains by Excimer Laser Crystallization of Sputtered a-Si film with Processing Temperature of 100 �C
    M. He; R. Ishihara; E.J.J. Neihof; Y. van Andel; H. Schellevis; C.I.M. Beenakker;
    In Proc. AM-FPD 06,
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  1488. Compact Modeling of GaAs Heterojunction Bipolar Transistors using the new Mextram 3500 model
    R. van der Toorn; J.C.J. Paasschens; J.J. Dohmen; R.M.T. Pijper; B.N. Balm;
    In Bipolar/BiCMOS Circuits and Technology Meeting,
    pp. 1-4, Oct. 2006.
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  1489. Preparation of large, location-controlled Si grains by excimer laser crystallization of �-Si film sputtered at 100 �C
    M. He; E.J.J. Neihof; Y. van Andel; H. Schellevis; R. Ishihara; J.W. Metselaar; C.I.M. Beenakker;
    In Amorphous and Polycrystalline Thin-Film Silicon Science and Technology 2006,
    2006.
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  1490. Automated Digital Circuits Design Based on Single-Grain Si TFTs Fabricated Through mu-Czochralski (Grain Filter) Process
    W. Fang; A. van Genderen; R. R. Ishihara Vikas; N. Karaki; Y. Hiroshima; S. Inoue; T. Shimoda; J.W. Metselaar; C.I.M. Beenakker;
    In Proc. AM-FPD 06,
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  1491. Electrostatically squeezed elastometers for out-of-plane microactuation
    G.K.Lau; J.F.L Goosen; F. van Keulen; P.French; P.M. Sarro;
    In APCOT 2006,
    Singapore, Jun. 2006.
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  1492. Qualification Of A System-in-Package (SiP): A Physics-of-Failure (PoF) Perspective
    D. Farley; A. Dasgupta; J. Caers;
    In ASME International Mechanical Engineering Congress and Exposition,
    Chicago, Illinois, USA, 2006.
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  1493. Schottky Barrier Height Modulation by Ultra-Shallow Low-Dose Dopant Diffusion
    M. Popadic; Lis K. Nanver; Tom L. M. Scholtes;
    In 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings ICSICT-2006,
    Shanghai, China, pp. 469-471, 2006. ISBN 1-4244-0160-7.

  1494. CVD delta-doped boron surface layers for ultra-shallow junction formation
    F. Sarubbi; L. K. Nanver; T. L. M. Scholtes;
    In Advanced Gate Stack, Source/Drain, and Channel Engineering for Si-Based CMOS 2: New Materials, Processes, and Equipment, 210th Meeting of The Electrochemical Society,
    Cancun, Mexico, Oct. 2006.
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  1495. Silicon-on-glass technology for RF and microwave device fabrication
    Lis K. Nanver; H. Schellevis; T.L.M. Scholtes; L. La Spina; G. Lorito; F. Sarubbi; V. Gonda; M. Popadic; K. Buisman; L.C.N. de Vreede; H. Cong; S. Milosavljevic; E.J.G. Goudena;
    In 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings ICSICT-2006,
    Shanghai, China, pp. 162-165, 2006. ISBN 1-4244-0160-7.
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  1496. Flexible a-Si/�_c-Si tandem modules in the Helianthos project
    A. Gordijn; M. N. van den Donker; F. Finger; E. A. G. Hamers; G. J. Jongerden; W. M. M. Kessels; R. Klein; A. M. B. van Mol; J. K. Rath; B. Rech; R. Schlatmann; R. E. I. Schropp; B. Stannowski; H;
    In 4th WCPEC,
    Hawaii, U. S. A., May 2006.
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  1497. Preferred <100> Surface and In-Plane Orientations in Self-Assembled Poly-Si by Multiple Excimer Laser Irradiation
    M. He; R. Ishihara; W. Metselaar; Kees Beenakker;
    In 2006 Joint International Meeting of the Electrochemical Society, Symposium Thin Film Transistors 8 (TFT8),
    Cancun, Mexico, Oct. 2006.
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  1498. Single-Grain Si TFTs and Circuits for Flexible Electronics and 3D-ICs
    Ryoichi Ishihara; Vikas Rana; Ming He; Wim Metselaar; Kees Beenakker;
    In 2006 8th International Conference on Solid-State and Integrated Circuit Technology (ICSICT),
    Shanghai, China, pp. 174-177, Oct. 2006.
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  1499. Single Grain TFTs and Circuits by m-Czochralski Process
    Vikas Rana;
    PhD thesis, Delft University of Technology, 2006.

  1500. Wafer-level packaging technology for RF applications based on a rigid low-loss spacer substrate
    A. Polyakov;
    PhD thesis, Delft University of Technology, Oct. 2006. ISBN 978-90-9021110-7; Promotor: prof. J.N. Burghartz.

  1501. Single grain Si TFT's and circuits based on the �-Czochralski process
    V. Rana;
    PhD thesis, Delft University of Technology, Oct. 2006. ISBN 90-6464-038-6; Promotor: prof. C.I.M. Beenakker.

  1502. Field-effect a-Si:H solar cells with transparent conductive oxide comb-shaped electrode
    N. Matsuki; Y. Abiko; M. Kobayashi; K. Miyazaki; H. Fujioka; H. Koinuma;
    Thin Solid Films,
    Volume 486, Issue 1-2, pp. 210-213, Aug. 2005.

  1503. High-rate deposition of microcrystalline silicon with an expanding thermal plasma
    C. Smit; A. Klaver; B. A. Korevaar; A. M. H. N. Petit; D. L. Williamson; R.A.C.M.M. van Swaaij; M. C. M. van de Sanden;
    Thin Solid Films,
    Volume 491, pp. 280, 2005.

  1504. Characteristics of single-crystal AlN films grown on ferromagnetic metal substrates
    K. Okamoto; S. Inoue; N. Matsuki; T.-W. Kim; H. Fujioka; M. Oshima;
    Phys. Stat. Sol. (a),
    Volume 202, Issue 14, pp. R149-R151, Nov. 2005.

  1505. Electrical property of coincidence site lattice grain boundary in location-controlled Si island by excimer-laser crystallization
    R. Ishihara; M. He; V. Rana; Y. Hiroshima; S. Inoue; T. Shimoda; J.W. Metselaar; C. I. M. Beenakker;
    Thin Solid Films,
    Volume 487, Issue 1-2, pp. 97-101, Sep. 2005.

  1506. Heteroepitaxitial growth of gallium nitride on muscovite mica plates by pulsed laser depo
    N. Matsuki; T.-W. Kim; J. Ohta; H. Fujioka;
    Solid State Commun,
    Volume 136, Issue 6, pp. 338-341, Nov. 2005.

  1507. Comparing the costs of photoresist coating using spin, spray or electrodeposition systems
    N. P. Pham; J. Bertens; L. van d.Brekel; P. M.Sarro;
    Micromagazine Apr.,
    pp. 45-49, 2005.

  1508. Particle filters integrated inside a silicon wafer
    W.Venstra; N.P. Pham; P.M. Sarro; J. van Eijk;
    Microlelectronic Engineering,
    Volume 78-79, 2005.

  1509. Fabrication of nanofluidic devices in glass with polysilicon electrodes
    V. G. Kutchoukov; L. Pakula; G. O. F Parikesit; Y. Garini; L. K. Nanver; A. Bossche;
    Sensors and Actuators A,
    Volume 123-124, pp. 602-607, 2005.

  1510. All electrical resistivity profiling technique for ion implanted semiconductor materials
    S. Daliento; L. Mele; P. Spirito; B. N. Limata;
    Materials Science and Engineering B,
    pp. 310-313, 2005.

  1511. Application of Encapsulated PECVED-grown Carbon Nano-Structure Field-Emission Devices in Nanolithography
    J. Koohsorkhi; Y. Adbi; S. Mohajerzadeh; J. Derakhshandeh; H. Hosseinzadegan; A. Khakifirooz;
    Nanotech,
    2005.

  1512. Electrothermal Characterization of Silicon-on-Glass VDMOSFETs
    N. Nenadovic; V. Cuoco; S.J.C.H. Theeuwen; L.K. Nanver; H. Schellevis; G. Spierings; H.F.F. Jos; J.W. Slotboom;
    Microelectronics Reliability,
    pp. 541-550, Mar. 2005.

  1513. PECVD-grown Carbon-nano-tubes on Silicon Substrates with an anomalous Nickel-seeded Tip-growth structure
    Y. Abdi; J. Koohsorkhi; J. Derakhshandeh; S. Mohajerzadeh; H. Hoseinzadegan; M.D. Robertson; C. Benet;
    Journal of Materials and Science Engineering C,
    2005.

  1514. Fabrication of 100nm Gate length MOSFET's using a novel carbon-nanotube-based nano-lithography
    J. Derakhshandeh; Y. Abdi; S. Mohajerzadeh; H. Hosseinzadegan; E. Asl. Soleimani; H. Radamson;
    Journal of Materials and Science Engineering B,
    2005.

  1515. Switch-on undershoot current observed in thin film transistors
    Feng Yan; Piero Migliorato; Yi Hong; V. Rana; R. Ishihara; Y. Hiroshima; D. Abe; S. Inoue; T. Shimoda;
    Journal of Applied Physics,
    Volume 87, Issue 1, 2005.

  1516. Light Emitting Nano-porous silicon structures fabricated using a plasma hydrogenation technique
    Y. Abdi; J. Derakhshandeh; S. Mohajerzadeh; F. Nayeri; E. Arzi; M.D. Robertson;
    Journal of Materials and Science Engineering B,
    2005.

  1517. Surface-passivated high-resistivity silicon as a true microwave substrate
    M. Spirito; F. de Paola; L. K. Nanver; E. Valletta; B. Rong; B. Rejaei; L. C. N. de Vreede; J. N. Burghartz;
    IEEE Transactions on Microwave Theory and Techniques,
    Volume 53, Issue 7, pp. 2340-2347, Jul. 2005.

  1518. Evaluation of an empirical mdel to estimate and optimize mechanical properties of PECVD SiC films
    H.T.M.Hoa; C.de Boer; P.M. Sarro;
    Journal of the Electrochemical Society,
    Volume 152, Issue 11, 2005.

  1519. Electrothermal characterization of silicon-on-glass VDMOSFETs
    N. Nenadovic; V. Cuoco; A. Griffo; H. Schellevis; L. K. Nanver; J. W. Slotboom; S. J. C. H Theeuwen; H. F. F. Jos;
    IEEE-Microelectronics Reliability,
    Volume 45, Issue 3-4, pp. 541-550, Mar. 2005.

  1520. Analysis of the Kirk effect in silicon-based bipolar transistors with a nonuniform collector profile
    R.J.E. Hueting; R. van der Toorn;
    IEEE Trans. Electron Devices,
    Volume 52, Issue 11, pp. 2489-2495, 2005.

  1521. Spray coating of photoresist for pattern transfer on high topography surfaces
    N P Pham; J.N.Burghartz; P.M. Sarro;
    J. Micromech. Microeng.,
    Volume 15, pp. 691-697, 2005.

  1522. Dependence of Single-Crystalline Si Thin-Film Transistor Characteristics on the Channel Position inside a Location-Controlled Grain
    V. Rana; R. Ishihara; Y. Hiroshima; D. Abe; S. Inoue; T. Shimoda; J.W.Metselaar; C. I.M. Beenakker;
    IEEE Transactions on Electron Devices,
    Volume 52, Issue 12, Dec. 2005.

  1523. Fabrication of 100nm Gate length MOSFET's using a novel carbon-nanotube-based nano-lithography
    18) J. Derakhshandeh; Y. Abdi; S. Mohajerzadeh; H. Hosseinzadegan; E. Asl. Soleimani; H. Radamson;
    In EMRS spring meeting 2005,
    2005.

  1524. Characterizing Non-Conductive Adhesives using Finite Element Analysis: Residual Stress Determination
    D. Farley; A. Dasgupta; J. F. J. M. Caers;
    In Society of Experimental Mechanics Annual Conference & Exposition,
    Portland, OR, USA, 2005.
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  1525. PECVD-grown Carbon-nano-tubes on Silicon Substrates with an anomalous Nickel-seeded Tip-growth structure
    Y. Abdi; J. Koohsorkhi; J. Derakhshandeh; S. Mohajerzadeh; H. Hoseinzadegan; M.D. Robertson; C. Benet;
    In EMRS spring meeting 2005,
    2005.

  1526. Plasma-assisted atomic layer deposition of TiN films at low deposition temperature for high-aspect ratio applications, Materials
    S.B.S. Heil; E. Langereis; F. Roozeboom; A. Kemmeren; N.P. Pham; P.M. Sarro; M.C.M. van de Sanden; W.M.M. Kessels;
    In Technology and Reliability of Advanced Interconnects 2005,
    pp. B6.4.1-B6.4.6, 2005.
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  1527. A Precise Model for Leakage Power Estimation in VLSI Circuits
    J. Derakhshandeh; Nasser Masoumi; B.kasiri; Y.Farazmand; Akbarzadeh; S. Aghnoot;
    In Proceedings of the 9th International Database Engineering & Application Symposium (IDEAS'05),
    2005.
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  1528. Investigation of adhesion properties of Cu-EMC interface by molecular dynamic simulation
    C. K. Y. Wong; H. Fan; M. M. F. Yuen;
    In Proceedings of the 6th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Micro-Electronics and Micro-Systems-EuroSimE 2005,
    Berlin, pp. 31-35, 2005.
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  1529. External RF substrate biasing as a tool to improve the material properties of hydrogenated amorphous silicon at high deposition rates by means of the expanding thermal plasma
    A. H. M. Smets; A. M. H. N. Petit; V. N��da?_dy; W. M. M. Kessels; R.A.C.M.M. van Swaaij; M. C. M. van de Sanden;
    In Proceedings of the 31st IEEE-PVSC,
    Orlando, Florida, pp. 1389, Jan. 2005.
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  1530. Defect-creation mechanisms in high-energy electron irradiated a-Si:H solar cells
    A. Klaver; J. W. Metselaar; M. Zeman; R.A.C.M.M. van Swaaij;
    In Proceedings of SAFE2005,
    Veldhoven, The Netherlands, 2005.
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  1531. STM/SEM Method to Test Bending Strength of MEMS Materials
    Tuncay Alan; Colin Shepherd; Maxim Zalalutdinov; Alan Zehnder; Harold Craighead;
    In Proceedings of the 11th International Conference on Fracture,
    Turin, Italy, Mar. 2005.
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  1532. Structural and Electro-Optical Properties of Thin Silicon Films Deposited in the Protocrystalline Growth Regime
    G. van Elzakker; F. D. Tichelaar; M. Zeman;
    In Proceedings of SAFE 2005,
    Veldhoven, The Netherlands, 2005.
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  1533. Fabrication and numerical analysis of nanoscale silicon pillars for IC applications
    Y. Civale; P. Hadley; L. K. Nanver; E. J. G. Goudena; J. Slabbekoorn;
    In Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE,
    Veldhoven, The Netherlands, pp. 79-82, 2005.
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  1534. Study on thermal interface material with carbon nanotubes and carbon black in high-brightness LED packaging with flip-chip technology
    K. Zhang; G. W. Xiao; C. K. Y. Wong; H. W. Gu; M. M. F. Yuen; P. C. H. Chan; B. Xu;
    In Proceedings-Electronic Components and Technology Conference,
    Lake Buena Vista, FL, pp. 60-65, 2005.

  1535. Lateral nanoNewton force sensing piezocantilevers for microparticle handling
    C.D.Trinh; J.F. Creemer; P.M. Sarro;
    In Proc. MME,
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  1536. In-package MEMS-based thermal actuators for micro-assembly
    V. Henneken; M. Tichem; P.M. Sarro;
    In Proc. MME,
    2005.

  1537. Non-Catalyst and Low Temperature Growth of Vertically Aligned Carbon Nanotubes for Nanosensor Arrays
    H.T.M. Hoa; C. de Boer; P.M. Sarro;
    In Proc. Transducers 2005,
    pp. 97-100, 2005.
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  1538. Lithographic alignment offset compensation for substrate transfer processes
    H. W. van Zeijl; J. Su; J. Slabbekoorn; F. G. C Bijnen;
    In Proc. STW/SAFE,
    Veldhoven, The Netherlands, pp. 121-126, 2005.
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  1539. PVD aluminium nitride as heat-spreader in IC technology
    L. La Spina; H. Schellevis; N. Nenadovic; S. Milosavljevic; W. H. A. Wien; A. W. van Herwaarden; L. K. Nanver;
    In Proc. STW/SAFE,
    Veldhoven, The Netherlands, pp. 113-116, 2005.
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  1540. The effect of the contact window edges on the perimeter currents of shallow junction diodes
    V. Gonda; T. L. M. Scholtes; L. K. Nanver;
    In Proc. STW/SAFE,
    Veldhoven, The Netherlands, pp. 88-91, 2005.
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  1541. Analytical modeling and numerical simulations of the offset voltage in silicon-on-glass vertical PNP's
    G. Lorito; L. K. Nanver; N. Nenadovic;
    In Proc. STW/SAFE,
    Veldhoven, The Netherlands, pp. 32-36, 2005.
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  1542. Architecture of a Portable System Based on a Biochip for DNA Recognition
    M. Piedade; L. Sousa; J. Germano; J. Lemos; B. Costa; P. Freitas; H. Ferreira; F. Cardoso; D. Vidal;
    In Proc. of the XX Conference on Design of Circuits and Integrated Systems,
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  1543. Liquid crystal wavefront corrector on silicon
    M. Loktev; G. Vdovin; L. K. Nanver;
    In Proc. SPIE: Opto-Ireland 2005: Optoelectronics, Photonic Devices and Optical Networks,
    pp. 195-202, 2005.
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  1544. FEAT- a simulation tool for electrothermal analysis of multifinger bipolar transistors
    L. La Spina; N. Nenadovic; V. d'Alessandro; L. K. Nanver; N. Rinaldi;
    In Proc. IEEE-EUROCON,
    Serbia and Montenegro, pp. 879-882, Nov. 2005.
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  1545. Base-contact proximity effects in bipolar transistors with nitride-spacer technology
    H. W. van Zeijl; L. K. Nanver;
    In Proc. of the 35th European Solid-State Device Research Conference (ESSDERC),
    Grenoble, France, pp. 461-464, Sep. 2005.
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  1546. 3D align overlay verification using glass wafers
    E. M. J. Smeets; F. G. C. Bijnen; J. Slabbekoorn; H. W. van Zeijl;
    In Proc. SPIE,
    pp. 152-162, 2005.

  1547. High-Performance Varactor Diodes Integrated in a Silicon-on-Glass Technology
    K. Buisman; L. K. Nanver; T. L. M. Scholtes; H. Schellevis; L. C. N. de Vreede;
    In Proc. of the 35th European Solid-State Device Research Conference (ESSDERC),
    Grenoble, France, pp. 117-120, Sep. 2005.
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  1548. Near-ideal implanted shallow-junction diode formation by excimer laser annealing
    V. Gonda; A. Burtsev; T. L. M. Scholtes; L. K. Nanver;
    In Proc. IEEE Rapid Thermal Processing,
    pp. 93-100, 2005.
    document

  1549. Low-distortion, low-loss varactor-based adaptive matching networks, implemented in a silicon-on-glass technology
    K. Buisman; L.C.N de Vreede; L.E. Larson; M. Spirito; A. Akhnoukh; Y. Lin; X. Liu; L.K. Nanver;
    In Proc. IEEE Radio Frequency Integrated Circuits Symposium,
    pp. 389-392, 2005.
    document

  1550. Distortion-free varactor diode topologies for RF adaptivity
    K. Buisman; L.C.N de Vreede; L.E. Larson; M. Spirito; A. Akhnoukh; T.L.M. Scholtes; L.K. Nanver;
    In Proc. IEEE MTT-S International Microwave Symposium,
    pp. 157-160, 2005.
    document

  1551. Highly Controllable Electrochemical Deep Etching Process On Silicon
    Y.Chen; L.Wang; P.M. Sarro;
    In Proc. IEEE MEMS 2005 Conf,
    2005.
    document

  1552. Electrothermal stability of bipolar transistors at medium- and high-current operation regimes
    N. Nenadovic; L. La Spina; V. d'Alessandro; L. K. Nanver;
    In Proc. IEEE Bipolar/BiCMOS Circuits and Technology Meeting BCTM,
    pp. 45-49, 2005.
    document

  1553. Porous silicon layeras a conformal insulator layer for high aspect ratio through wafer interconnects
    N.P. Pham; G.P. Salvador; P.M. Sarro;
    In Proc. Eurosensors XIX,
    2005.

  1554. Offset voltage of Schottky-collector silicon-on-glass vertical PNP's
    G. Lorito; L. K. Nanver; N. Nenadovic;
    In Proc. IEEE Bipolar/BiCMOS Circuits and Technology Meeting BCTM,
    pp. 22-25, 2005.

  1555. Improved hybrid SiGe HBT class-AB power amplifier efficiency using varactor-based tunable matching networks
    W. C. E Neo; X. Liu; Y. Lin; L. C. N. de Vreede; M. Spirito; A. Akhnoukh; L. K. Nanver; L. E. Larson; A. de Graauw;
    In Proc. IEEE Bipolar/BiCMOS Circuits and Technology Meeting BCTM,
    pp. 108-111, 2005.

  1556. Fabrication of nanofluidic devices in glass with polysilicon electrodes
    V. G. Kutchoukov; L. Pakula; G. O. F. Parikesit; Y. Garini; L. K. Nanver; A. Bossche;
    In Proc. Eurosensors XVIII-18th European Conference on Solid-State Sensors,
    Rome, Italy, pp. 32-35, Sep. 2005.

  1557. Front-to back-side overlay optimization after wafer bonding for 3D integration
    L. Marinier; W. van Noort; R. Pellens; B. Sutedja; R. Dekker; H. W. van Zeijl;
    In Proc. 31st International Conference on Micro- and Nano-Engineering 2005,
    Vienna, Austria, Sep. 2005.
    document

  1558. Integrated antiresonant hollow core waveguids as platforms for microoptical microfluidic TAS applications
    R. Bernini; E. De Nuccio; F. Mottola; A. Minardo; P.M. Sarro; L. Zeni;
    In Proc. Eurosensors XIX,
    2005.

  1559. LPCVD silicon nitride-on-silicon spacer technology
    H. W. van Zeijl; L. K. Nanver;
    In Proc. 20th International Symposium on Microelectronics Technology and Devices,
    Florianapolis, Brazil, Sep. 2005.
    document

  1560. The fabrication of optical hole-arrays for use in the atto-liter plate device for single molecule detection
    O.M. Piciu; M.C. van der krogt; M. Docter; P.M. Sarro; A.Bossche;
    In Proc. Eurosensors XIX,
    2005.

  1561. Influence of anodization parameters on the pore size and shape of anodic aluminum oxide nanotemplates
    S.H. Le; A. Camerlingo; H.T.M. Pham; P.M. Sarro;
    In Proc. Eurosensors XIX,
    2005.
    document

  1562. Self-Defined PECVED-grown Carbon Field-Emission Transistors with Applications in Electron Diffraction
    J.Koohsorkhi; Y.Abdi; S.Mohajerzadeh; J.Derakhshandeh; L.Rezaee; M.D. Robertson;
    In Material Research Society (MRS) spring meeting,
    San Francisco, CA, Mar. 2005.

  1563. Low Temperature Metal-Free Fabrication of polycrystalline Si and Ge TFT's by PECVD Hydrogenation
    P. Hashemi; J. Derakhshandeh; B. Hekmatshoar; S. Mohajerzadeh; Y. Abdi; M.D. Robertson;
    In Material Research Society conference (MRS 2005),
    San Francisco CA, USA, pp. A22.2.1-A22.2.6, 2005.
    document

  1564. Low temperature growth of nano-crystalline silicon and germanium using Rf hydrogen plasma with application in thin film transistors
    P. Hashemi; Y. Abdi; S. Mohajerzadeh; J. Derakhshandeh; B. Hekmatshoar; E. Arzi; M. D. Robertson;
    In Iran Phys. Conf.,
    Iran, Aug. 2005.

  1565. Characterization of low temperature stress-induced crystallization of a-si on flexible glass substrate by Raman and transmission electron microscopy
    P. Hashemi; J. Derakhshandeh; S. Mohajerzadeh; M. D. Robertson; A. Shayan Arani; A. Afzali Kusha;
    In IEEE 17th Intl. Conf. on Microelectronics,
    Islamabad, Dec. 2005.

  1566. High Performance Single Grain Si TFTs Inside a Location-Controlled Grain by �_-Czochralski Process with Capping Layer
    Rana Vikas; Ryoichi Ishihara; Yasushi Hiroshima; Daisuke Abe; Satoshi Inoue; Tatsuya Shimoda; J.W. Metselaar; C.I.M. Beenakker;
    In IEDM 2005,
    2005.

  1567. A Precise Model for Leakage Power Estimation in VLSI Circuits
    J. Derakhshandeh; B. kasiri; Y. Farazmand; N. Masoumi; Akbarzadeh;
    In International Workshop on System on chip,
    Banff, Alberta-Canada, Jul. 2005.

  1568. Process Simulation of Laser Crystallization and Analysis of Crystallization Process of Si films
    M. Kimura; R. Saito; S. Tsukamoto; Y. Hiroshima; S. Inoue; T. Shimoda; R. Ishihara;
    In IDW05,
    2005.

  1569. A Novel Selected Area Laser Assisted (SALA) System for Crystallization and Doping Processes in Low-Temperature Poly-Si Thin-Film Transistors
    R. Ishihara; A. Glazer; Y. Raab; P. Rusian; M. Dorfan; B. Lavi; I. Leizerson; A. Kishinevsky; Y. van Aandel; X. Cao; J. W. Metselaar; C. I. M. Beenakker; S. Stolyarova; Y. Nemirovsky;
    In IDW05,
    2005.

  1570. Emitting Nano-porous silicon structures fabricated using a plasma hydrogenation technique
    Y. Abdi; J. Derakhshandeh; S. Mohajerzadeh; F. Nayeri; E. Arzi; M.D. Robertson;
    In EMRS spring meeting 2005,
    2005.

  1571. Capping Layer on Thin Si Film for micro-Czochralski Process with Excimer Laser Crystallization
    R. Vikas; R. Ishihara; Y. Hiroshima; D. Abe; S. Inoue; T. Shimoda; J.W. Metselaar; C.I.M. Beenakker;
    In AMLCD05,
    2005.

  1572. Reactive sputter deposition of aluminium nitride thin films as heat spreaders in IC processes
    H. Schellevis; L. La Spina; N. Nenadovic; L. K. Nanver;
    In Conference Reactive Sputter Processes and Related Phenomena,
    2005.

  1573. Temperature Simulation and Control of a Biochip for DNA Analysis
    B.A. Costa; J.M. Lemos; M.S. Piedade; L. Sousa; P.P. Freitas; F.A. Cardoso; D. Vidal;
    In 44th IEEE Conference on Decision and Control,
    2005.

  1574. Improvement of the material properties by employing external RF substrate bias during a-Si:H deposition by a remote expanding thermal plasma
    A. H. M. Smets; A. M. H. N. Petit; V. N��da?_dy; W. M. M. Kessels; R.A.C.M.M. van Swaaij; M. C. M. van de Sanden;
    In 20th EPVSEC,
    Barcelona, Spain, pp. 1639, Jun. 2005.

  1575. Improvement of expanding thermal plasma amorphous silicon solar cell by means of substrate rf-biasing
    A. M. H. N. Petit; V. Nadazdy; A. H. M. Smets; M. Zeman; M. C. M. van de Sanden; R.A.C.M.M. van Swaaij;
    In 20th EPVSEC,
    Barcelona, Spain, pp. 1616, Jun. 2005.

  1576. Characterization of non-conductive adhesives
    D. Farley; A. Dasgupta; J. F. J. M. Caers;
    In ASME InterPACK2005, Proceedings of,
    San Francisco, California, USA, pp. 471-477, 2005.
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  1577. Correlation between surface-textured tin- and zinc oxide substrates and current generation in amorphous silicon solar cells
    T. R. Dekker Schlatmann; B. Stannowski; R.A.C.M.M. van Swaaij; J. W. Metselaar; M. Zeman;
    In 20th EPVSEC,
    Barcelona, Spain, pp. 1517, Jun. 2005.

  1578. Development of a model to predict EOL efficiency of amorphous silicon solar cells for space applications
    A. Klaver; J. W. Metselaar; M. Zeman; R.A.C.M.M. van Swaaij;
    In 20th EPVSEC,
    Barcelona, Spain, pp. 1612, Jun. 2005.

  1579. Simulations on 1-MeV electron-beam irradiated amorphous silicon solar cells with varying thickness
    A. Klaver; J. W. Metselaar; M. Zeman; R.A.C.M.M. van Swaaij;
    In Proceedings of the 31st IEEE-PVSC,
    Orlando, Florida, pp. 1440, Jan. 2005.

  1580. Semiconductor device and method of manufacturing such a device
    W. van Noort; P. Magnee; L. K. Nanver; C. Detcheverry; R. Havens;
    Patent Number: WO2005104232, 2005.

  1581. Electrical characterisation of matched pairs for evaluation of integrated circuit technologies
    H.P. Tuinhout;
    PhD thesis, Delft University of Technology, Dec. 2005. ISBN 90-744-4570-5; Promotor: prof. C.I.M. Beenakker.

  1582. Bipolar transistors with self-aligned emitter-base metallization and back-wafer-aligned collector contacts
    H.W. van Zeijl;
    PhD thesis, Delft University of Technology, Apr. 2005. ISBN 90-8559-045-0; Promotors: prof. L.K. Nanver, prof. J.W. Slotboom.

  1583. Electro-deposition of high-quality conformal resist layers for MEMS, Advances in electronics manufacturing Technology
    C.M.A.Ashruf; L.D.M. van d.Brekel; G.J.Bertens; E.Boellard; N.P.Pham; M.Heschel;
    V-EMT,
    Volume 1, Issue 19, pp. 1-4, Sep. 2004.

  1584. Filter-protected photodiodes for high-throughput enzymatic analysis
    V.P. Iordanov; J.Bastermeijer; R.Ishihara; P.M. Sarro; A.Bossche; M.Vellekoop;
    IEEE Sensors Journal,
    Volume 4, Issue 5, pp. 584-588, Oct. 2004.

  1585. Optical modelling of thin-film silicon solar cells deposited on textured substrates
    J. Krc; M. Zeman; F. Smole; M. Topic;
    Thin Solid Films,
    Jan. 2004.

  1586. Integrated Coulter counter based on 2-dimensional liquid aperture control
    J.H. Nieuwenhuis; F. Kohl; J. Bastemeijer; P.M. Sarro; M.J. Vellekoop;
    Sensors and Actuators B: Chemical,
    2004.

  1587. Metal patterning on high topography surface for 3D RF devices fabrication
    N.P. Pham; E. Boellaard; W. Wien; L.D.M. van den Brekel; J.N. Burghartz; P.M. Sarro;
    Sensors and Actuators A,
    Volume 115, pp. 557-562, Mar. 2004.

  1588. Microfluidic sensor based on integrated optical hollow waveguides
    S.Campopiano; R.Bernini; L.Zeni; P.M. Sarro;
    Optics letters,
    Volume 29, Issue 16, pp. 1894-1896, Aug. 2004.

  1589. Optimization of a-SiGe:H solar cells with graded intrinsic layers using integrated optical and electrical modeling
    B.E. Pieters; M. Zeman; R.A.C.M.M. van Swaaij; W.J. Metselaar;
    Thin Solid Films,
    Volume 451, pp. 294, 2004.

  1590. Integrated Coulter counter based on 2-dimensional liquid aperture control
    J. H. Nieuwenhuis; F. Kohl; J. Bastemeijer; P. M. Sarro; M. J. Vellekoop;
    Sensors and Actuators B,
    Volume 102, Issue 1, pp. 44-50, 2004.

  1591. Arrow optical waveguides based sensors
    R.Bernini; S.Campopiano; L.Zeni; P.M. Sarro;
    Sensors and Actuators B,
    Volume 100, Issue 1-2, pp. 143-146, 2004.

  1592. Organized structures obtained from urethane/urea elastomers
    M.H. Godinho; A.C. Trindade; J.L. Figueirinhas; D. Vidal; L.V. Melo; P. Brogueira;
    Metals,
    Volume 147, Issue 1-3, pp. 209-213, Dec. 2004.

  1593. Concept and performance of field-effect amorphous silicon solar cell
    N. Matsuki; Y. Abiko; K. Miyazaki; M. Kobayashi; H.Fujioka; H. Koinuma;
    Semicond. Sci. Technol,
    Volume 19, Issue 1, pp. 61-64, Jan. 2004.

  1594. Novel low-temperature processing of low noise SDDs with on-detector electronics
    J. Sonsky; R. Koornneef; J. Huizenga; R.W. Hollander; L.K. Nanver; T. Scholtes; F. Roozeboom; C.W.E. van Eijk;
    Nuclear Instruments and Methods Physics Research Section A,
    Volume 517, Issue 1-3, pp. 301-312, Jan. 2004.

  1595. Limit Cycle Oscillations in CW Laser Driven NEMS
    Keith Aubin; Maxim Zalalutdinov; Tuncay Alan; Robert Reichenbach; Richard Rand; Alan Zehnder; Jeevak Parpia; Harold Craighead;
    J. Microelectromech. Syst.,
    Volume 13, pp. 1018, 2004.

  1596. Stress-assisted nickel-induced crystallization of silicon on glass
    P. Hashemi; J. Derakhshandeh; S. Mohajerzadeh; M. Robertson; A. Tonita;
    Journal of Vacuum Science and Technology A (JVSTA),
    Volume 22, Issue 3, pp. 966-970, May 2004.

  1597. Photoresist Coating Methods for the Integration of Novel 3-D RF Microstructures
    N.P. Pham; E. Boellaard; J.N. Burghartz; P.M. Sarro;
    Journal of Microelectromechanical Systems,
    Volume 13, Issue 3, pp. 491-499, Jun. 2004. ISSN 1057-7157.

  1598. Novel network control in hydrogenated amorphous silicon by molecular beam deposition method
    N. Matsuki; M. Kondo; A. Matsuda;
    J. Non-Cryst. Solid,
    Volume 338-340, pp. 382-385, Jun. 2004.

  1599. Polymer interconnections for 3D-chip stacking technology: directional volume patterning of flexible substrates with conducting polymer wires
    C.Videlot; J. Ackermann; F.Fages; T.N.Nguyen; L.Wang; P.M. Sarro; D.Crawley; K.Nikolic; M.Forshaw;
    J. Micromech. Microeng.,
    Volume 14, pp. 1618-1624, 2004.

  1600. The role of the silyl radical in plasma deposition of microcrystalline silicon
    C. Smit; R.A.C.M.M. van Swaaij; E. A. G. Hamers; M. C. M. van de Sanden;
    J. Appl. Phys.,
    Volume 96, pp. 4076, 2004.

  1601. Electrothermal Limitations on the Current Density of High-Frequency Bipolar Transistors
    Nebojsa Nenadovic; Lis K. Nanver; Jan W. Slotboom;
    IEEE Transactions on Electron Devices,
    Volume 51, Issue 12, pp. 2175-2180, Dec. 2004.

  1602. A Back-Wafer Contacted Silicon-On-Glass Integrated Bipolar Process - Part II: A Novel Analysis of Thermal Breakdown
    N. Nenadovic; V. d Alessandro; L.K. Nanver; F. Tamigi; N. Rinaldi; J.W. Slotboom;
    IEEE Transactions on Electron Devices,
    Volume 51, Issue 1, pp. 51-62, Jan. 2004.

  1603. A Back-Wafer Contacted Silicon-On-Glass Integrated Bipolar Process - Part I: The Conflict Electrical Versus Thermal Isolation
    L.K. Nanver; N. Nenadovic; V. d Alessandro; H. H. Schellevis; W. van Zeijl; R. Dekker; D.B. de Mooij; V. Zieren; J.W. Slotboom;
    IEEE Trans. on Electron Devices,
    Volume 51, Issue 1, pp. 42-50, Jan. 2004.

  1604. Extraction and Modeling of Self-Heating and Mutual Thermal Coupling Impedance of Bipolar Transistors
    N. Nenadovic; S. Mijalkovic; L.K. Nanver; L.J.K. Vandamme; V. Alessandro; H. Schellevis; J.W. Slotboom;
    IEEE Journal of Solid-State Circuits,
    Volume 39, Issue 10, pp. 1764-1772, Oct. 2004. ISSN 0018-9200.

  1605. High-speed wavefront sensor compatible with standard CMOS technology
    D. W. de Lima Monteiro; G. Vdovin; P. M. Sarro;
    Sensors and Actuators A,
    Volume 109, Issue 3, pp. 220-230, Jan. 2004.

  1606. A pulsed laser ablation / plasma chemical vapor deposition cluster system for combinatorial device fabrication
    N. Matsuki; Y. Abiko; M. Kobayashi; K. Miyazaki; H. Fujioka; H. Koinuma;
    Applied Physics A,
    Volume 79, Issue 4-6, pp. 1413-1416, Sep. 2004.

  1607. RF power silicon-on-glass VDMOSFETs
    N. Nenadovic; V. Cuoco; S.J.C.H. Theeuwen; H. Schellevis; G. Spierings; A. Griffo; M. Pelk; L.K. Nanver; R.F.F. Jos; J.W. Slotboom;
    IEEE Electron Device Letters,
    Volume 25, Issue 6, pp. 424-426, Jun. 2004.

  1608. Gel-layer- assisted, directional electropolymerization: a versatile method for high resolution volume and/or surface patterning of flexible substrates with conjugated polymers
    J. Ackermann; C.Videlot; T.N.Nguyen; L.Wang; P.M. Sarro;
    Advanced Materials,
    Volume 16, Issue 19, 2004.

  1609. M3: the third dimension of silicon, Advanced Micro and Nanosystems
    P.M. Sarro;
    In Enabling Technologies for MEMS and Nanodevices,
    Wiley, 2004.

  1610. On the reproducibility of a-Si:H deposited with an expanding thermal plasma
    A. M. H. N. Petit; A. H. M. Smets; R.A.C.M.M. van Swaaij; M. C. M. van de Sanden;
    In Proceedings of SAFE2004,
    Veldhoven, The Netherlands, pp. 714, 2004.

  1611. Particle discrimination with an improved projection cytometer
    J.H. Nieuwenhuis; P. Svasek; P.M. Sarro; M.J. Vellekoop;
    In Proceed. MicroTAS 2004,
    Malmo, Sweden, pp. 419-421, Sep. 2004.

  1612. Nanostructure formation on anodic aluminum oxide nanotemplates
    H. T.M. Pham; C.R. de Boer; P. M. Sarro;
    In The Second International Workshop on Nanophysics and Nanotechnology,
    Hanoi, Vietnam, pp. 91-98, Oct. 2004.

  1613. Characterization Waferstepper and Process Related Front- to Backwafer Overlay Errors in Bulk Micro Machining using Electrical Overlay Test Structures
    H.W. van Zeijl; F.G.C. Bijnen; J. Slabekoorn;
    In Proc. SPIE, MEMS, MOEMS and Micromachining,
    pp. 398-406, Apr. 2004. ISBN 0-8194-5378-1.

  1614. Aspects of Silicon Nanowire Synthesis by Aluminum-Catalyzed Vapor-Liquid-Solid Mechanism
    Y. Civale; L.K. Nanver; P. Hadley; E.J.G. Goudena;
    In Proceedings of 7th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE, Veldhoven,
    The Netherlands, pp. 692-696, 2004.

  1615. Integrated antiresonant hollow waveguide liquid sensor
    S. Campopiano; R.Bernini; L.Zeni; P.M. Sarro;
    In Proc. Eurosensors XVIII,
    Rome, pp. 765-766, Sept. 2004. ISBN: 88-7621-282-5.

  1616. A new approach in measuring Cu-EMC adhesion strength by AFM
    C. K. Y. Wong; H. Gu; B. Xu; M. M. F. Yuen;
    In Proceedings-Electronic Components and Technology Conference,
    Las Vegas, NV, pp. 491-495, 2004.

  1617. Nanochannels in glass with poly-silicon electrodes
    V.G. Kutchoukov; L. Pakula; G.O.F. Parikesit; Y. Garini; L.K. Nanver; A. Bossche;
    In Proc. Eurosensors XVIII,
    Rome, Italy, Sep. 2004.

  1618. TiN for MEMS hotplate heaters
    J.F. Creemer; P.M. Sarro; M. Laros; H. Schellevis; L. Steenweg; H.W. Zandbergen;
    In Proc. Eurosensors XVIII,
    Rome, pp. 706-707, Sept. 2004. ISBN 88-7621-282-5.

  1619. Particle size discrimination with a liquid aperture coulter counter
    J. Nieuwenhuizen; P. Svasek; P.M. Sarro; M.J. Vellekoop;
    In Proc. Eurosensors XVIII,
    Rome, pp. 317-320, Sept. 2004. ISBN: 88-7621- 282-5.

  1620. The Electro-Thermal Smoothie Database Model for LDMOS Devices
    V. Cuoco; W.C.E. Neo; M. Spirito; O.Yanson; N. Nenadovic; L.C.N. de Vreede; H.F.F. Jos; J.N. Burghartz;
    In Proc. ESSDERC,
    Leuven, Belgium, pp. 457-460, Sep. 2004. ISBN 0-7803-8479-2.

  1621. A New Extraction Technique for the Series Resistances of Semiconductor Devices Based on the Intrinsic Properties of Bias-Dependent Y-Parameters
    V. Cuoco; W.C.E. Neo; L.C.N de Vreede; H.C de Graaff; L.K. Nanver; H.C. Wu; H.F.F Jos; J.N. Burghartz;
    In Proc. Bipolar/BiCMOS Circuits and Technology Meeting 2004 (BCTM 2004),
    Montreal, Canada, pp. 148-151, Sep. 2004.

  1622. A Novel SPICE Macromodel of BJTs Including the Temperature Dependence of High-Injection Effects
    V. Alessandro; N. Nenadovic; F. Tamigi; N. Rinaldi; L.K. Nanver; J.W. Slotboom;
    In Proc. 24th International Conference on Microelectronics (MIEL 04), Nis,
    pp. 253-256, May 2004. ISBN 0-7803-8166-1.
    document

  1623. Modeling of thermal resistance dependence on design parameters in silicon-on-glass bipolar transistors
    F. Tamigi; N. Nenadovic; V. Alessandro; L.K. Nanver; N. Rinaldi; J.W. Slotboom;
    In Proc. 24th International Conference on Microelectronics (MIEL 04),
    Nis, Serbia and Montenegro, pp. 257-260, May 2004. ISBN 0-7803-8166-1.
    document

  1624. Electrothermal Characterization of Silicon-on-Glass VDMOSFETs
    N. Nenadovic; H. Schellevis; V. Cuoco; A. Griffo; S.J.C.H. Theeuwen; L.K. Nanver; R.F.F. Jos; J.W. Slotboom;
    In Proc. 24th International Conference on Microelectronics (MIEL 04), Nis,
    pp. 145-148, May 2004. ISBN 0-7803-8166-1.
    document

  1625. Integrated Sensors Arrays For Bioluminescence And Fluorescence Bio-Chemical Analysis
    V.Iordanov; B. Iliev; A.Bossche; J. Bastemeijer; P.M. Sarro; I.T.Young; G. van Dedem; M.Vellekoop;
    In Proc. IEEE Sensors 2004 Conf.,
    2004.

  1626. High-aspect-ratio bulk micromachined vias contacts
    N.P. Pham; P.M. Sarro;
    In Proc SAFE, & Prorisc 2004,
    Veldhoven, pp. 657-661, Nov. 2004. ISBN 90-73461-43X.
    document

  1627. Electrothermal limitations on the current density of high-frequency bipolar transistors
    N. Nenadovic; L.K. Nanver; J.W. Slotboom;
    In Proc. 19th International Symposium on Microelectronics Technology and Devices,
    Porto de Galinhas, Brazil, pp. 3-8, Sep. 2004. ISBN 1-56677-416-0.

  1628. Design of in-package MST-based actuators for micro-assembly
    V. Henneken; S. van der Bedem; M. Tichem; B. Karpuschewski; P.M. Sarro;
    In Proc SAFE & Prorisc 2004,
    Veldhoven, pp. 747-752, Nov. 2004. ISBN 90-73461-43X.

  1629. Titanium Nitride for MEMS Hotplates
    J.F. Creemer; P.M. Sarro; M. Laros; H. Schellevis; T. Nathoeni; L. Steenweg; V. Svetchnikov; H.W. Zandbergen;
    In Proc SAFE & Prorisc 2004,
    Veldhoven, pp. 742-746, Nov. 2004. ISBN 90-73461-43X.

  1630. Hydrogen Injection in ETP Plasma Jet for Fast-Deposition of High-Quality a-Si:H
    A. M. H. N. Petit; R.A.C.M.M. van Swaaij; M. C. M. van de Sanden;
    In Mater. Res. Soc. Symp. Proc.,
    pp. 359, 2004.
    document

  1631. Low-Temperature Stress-Assisted Nickel-Induced Crystallization of Silicon on Glass
    J. Derakhshandeh; P. Hashemi; S. Mohajerzadeh; A. Khajooeizadeh;
    In Iran Physics Conference,
    Tehran, Iran, Sep. 2004.

  1632. Characterization of ferroelectric thin films materials for FeRAM
    S.H. Le; B. R. Salmassi; J. N. Burghartz; P.M. Sarro;
    In Proc SAFE & Prorisc 2004,
    Veldhoven, pp. 710-713, Nov. 2004. ISBN 90-73461-43X.

  1633. Study of 3-MeV electron irradiation damage in amorphous silicon with TRMC
    A. Klaver; J. M. Warman; M. P. de Haas; J. W. Metselaar; R.A.C.M.M. van Swaaij;
    In Mater. Res. Soc. Symp. Proc.,
    pp. 165, 2004.

  1634. Design and Characterization of a High-Resistivity Silicon Traveling Wave Amplifier for 10 Gb/s Optical Communucation Systems
    F.M. De Paola; L.C.N. de Vreede; L.K. Nanver; N. Rinaldi; J.N. Burghartz;
    In J.D. Cressler; J. Papapolymerou (Ed.), 2004 Topical Meeting on Silicon Monolithic Integrated Circuits RF Systems,
    Atlanta, USA, pp. 69-7, Sep. 2004. ISBN 0-7803-8703-1.

  1635. Physically based analytical modeling of base-collector charge, capacitance and transit time of III-V HBTs
    R. van der Toorn; J.C.J. Paasschens; R.J. Havens;
    In Compound Semiconductor Integrated Circuit Symposium,
    IEEE, pp. 283-286, Oct. 2004.
    document

  1636. Dependence of thermal resistance on ambient and actual temperature
    J.C.J. Paasschens; S. Harmsma; R. van der Toor;
    In Bipolar/BiCMOS Circuits and Technology. Proceedings of the 2004 Meeting 13-14 Sept. 2004,
    pp. 96-99, 2004.
    document

  1637. The Investigation of Stress-Assisted Nickel-Induced Crystallization of Silicon on Glass by TEM and SEM
    P. Hashemi; J. Derakhshandeh; S. Mohajerzadeh; M. Robertson; A. Tonita;
    In The 31st Annual Meeting of the Microscopical Society of Canada May,
    2004.

  1638. A quantitative evaluation of pattern transfer across (111) surfaces in a (100) silicon wafer by contact masking and over-exposure
    W. Venstra; M. Laros; J.W. Spronck; P.M. Sarro; J. van Eijk;
    In Proc. Eurosensors XVIII,
    Rome, pp. 313-316, Sept. 2004. 88-7621-282-5.

  1639. Substrate Transfer Technology
    R. Dekker;
    PhD thesis, Delft University of Technology, Jun. 2004. ISBN 90-74445-61-6; Promotors: prof. J.W. Slotboom, prof. J.N. Burghartz.

  1640. Electrothermal behavior of high-frequency silicon-on-glass transistors
    N. Nenadovic;
    PhD thesis, Delft University of Technology, Nov. 2004. ISBN 90-6464-114-5; Promotors: prof. L.K. Nanver, prof. J.W. Slotboom.

  1641. PECVD silicon carbide: A structural material for surface micromachined devices
    H.T.M. Pham;
    PhD thesis, Delft University of Technology, Dec. 2004. ISBN 90-9018856-8; Promotor: prof. P.M. Sarro.

  1642. Phase-Field Modelling of Excimer Laser Lateral Crustallization of Silicon Thin Films
    A. Burtsev; M. Apel; R. Ishihara; C.I.M. Beenakker;
    Thin Solid Films,
    Volume 427, Issue 1-2, pp. 309-313, Mar. 2003.

  1643. Photoluminescence properties of a-Si:H based thin films and corresponding solar cells
    E. Pincik; H. Kobayashi; et al;
    Thin Solid Films,
    Volume 433, Issue 1-2, pp. 344-351, Jun. 2003.

  1644. Effect of surface roughness of ZnO:Al films on light scattering in hydrogenated amorphous silicon solar cells
    J. Krc; M. Zeman; O. Kluth; F. Smole; M. Topic;
    Thin Solid Films,
    Volume 426, Issue 1-2, pp. 296-304, Feb. 2003.

  1645. Advanced excimer-laser crystallization process for single-crystalline thin film transistors
    R. Ishihara; P.Ch. van der Wilt; B.D. van Dijk; A. Burtsev; J.W. Metselaar; C.I.M. Beenakker;
    Thin Solid Films,
    Volume 427, Issue 1-2, pp. 77-85, Mar. 2003.

  1646. Spatial light modulators based on micromachined reflective membranes on viscoelastic layers
    S. Sakarya; G. Vdovin; P.M. Sarro;
    Sensors and Actuators A,
    Volume 108, Issue 1-3, pp. 271-275, Nov. 2003.

  1647. Three terminals optoelectronics devices integrated into a silicon on silicon waveguide
    G. Coppola; A. Irace; G. Breglio; M. Iodice; L. Zeni; A. Cutolo; P.M. Sarro;
    Optics and Lasers Engineering,
    Volume 39, Issue 3, pp. 317-332, Mar. 2003. ISSN 0143-8166.

  1648. Photoluminescence properties of a-Si:H based thin films and corresponding solar cells
    E. Pincik; H. Kobayashi; H. Gleskova; M. Kucera; L. Ortega; M. Jergel; C. Falcony; R. Brunner; T. Shimizu; V. Nadazdy; M. Zeman; M. Mikula; M. Kumeda; R.A.C.M.M. van Swaaij;
    Thin Solid Films,
    Volume 433, 2003.

  1649. X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires
    A. Daniel; Y. Zhuang; V. Holy; J. Stangl; S. Zerlauth; F. Schaffler; G. Bauer; N. Darowski; U. Pietsch;
    Nuclear Instruments and Methods Physics Research B,
    Volume 200C, pp. 267-272, 2003.

  1650. Determining the material structure of microcrystalline silicon from Raman spectra
    C. Smit; R.A.C.M.M. van Swaaij; H. Donker; A.M.H.N. Petit; W.M.M. Kessels; M.C.M. van de Sanden;
    J. Appl. Phys.,
    Volume 94, 2003.

  1651. Transient analysis of a high-speed thermo-optic modulator integrated in an all-silicon waveguide
    M. Iodice; F.G. Della Corte; I. Rendina; P.M. Sarro; M. Bellucci;
    Optical-Engineering,
    Volume 42, Issue 1, pp. 169-175, Jan. 2003.

  1652. Electrical Characteristics of Plasma-Enhanced Chemical Vapor Deposited Silicon Carbide Thin Films
    H.T.M. Pham; T. Akkaya; C.R. de Boer; P.M. Sarro;
    Material Science Forum,
    Volume 433-436, pp. 451-454, 2003. ISSN 0255-5476.

  1653. Fabrication of crystalline membranes oriented in the (111) plane in a (100) silicon wafer
    W.J. Venstra; P.M. Sarro;
    Microelectronic Engineering,
    Volume 67-68, pp. 502-507, Jun. 2003.

  1654. Characterization of front- to backwafer bulk micromachining using electrical overlay test structures
    H. W. van Zeijl; J. Slabbekoorn;
    J. Micromech. Microeng,
    Volume 13, Issue 4, pp. S108-S112, Jul. 2003. ISSN 0960-1317.

  1655. On the Design of RF Spiral Inductors on Silicon
    J.N. Burghartz; B. Rejaei;
    IEEE Transactions on Electron Devices,
    Volume 50, Issue 3, pp. 718-729, 2003.

  1656. 3D molecular interconnection technology
    D. Crawley; K. Nikolic; M. Forshaw; J. Ackermann; C. Videlot; T.N. Nguyen; L. Wang; P.M. Sarro;
    J. Micromech. Microeng,
    Volume 13, Issue 5, pp. 655-662, Jun. 2003.

  1657. Patterned FeNi thin film for RF and microwave components
    M. Vroubel; Y. Zhuang; B. Rejaei; J.N. Burghartz;
    Journal of Magnetism and Magnetic Materials,
    Volume 258-259, pp. 167-169, Mar. 2003. ISSN 0304-8853.

  1658. Substrate Transfer for RF Technologies
    R. Dekker; P.G.M. Baltus; H.G.R. Maas;
    IEEE Transactions on Electron Devices,
    Volume 50, Issue 3, pp. 747-757, Mar. 2003.

  1659. One chip photovoltaic water electrolysis device
    Y. Yamada; N. Matsuki; T. Ohmori; H. Mametsuka; M. Kondo; A. Matsuda; E. Suzuki;
    Int. J. Hydrogen Energy,
    Volume 28, Issue 11, pp. 1167-1169, Nov. 2003.

  1660. Planar antiresonant reflecting optical waveguides as integrated optical refractometer
    R. Bernini; S. Campopiano; L. Zeni; C. de Boer; P.M. Sarro;
    IEEE Sensors Journal,
    Volume 3, Issue 5, pp. 652-657, Oct. 2003.

  1661. Power amplifier PAE and ruggedness optimization by second-harmonic control
    M. Spirito; L.C.N. de Vreede; L.K. Nanver; S. Weber; J.N. Burghartz;
    IEEE Journal of Solid-State Circuits,
    Volume 38, Issue 9, pp. 1575-1583, 2003.

  1662. Self-Adjustment of Micro-mechatronic Systems
    M. Tichem; B. Karpuschewski; P.M. Sarro;
    Annals of the CIRP,
    Volume 52, Issue 1, pp. 17-20, 2003.

  1663. Integrated Solenoid Inductors with Patterned Sputter-Deposited Cr/Fe10Co90/Cr Ferromagnetic Cores
    Y. Zhuang; B. Rejaei; E. Boullaard; M. Vroubel; J.N. Burghartz;
    IEEE Electron Device Letters,
    Volume 24, Issue 4, pp. 224-226, 2003.

  1664. Miniaturized analytical assays in biotechnology
    R.A. Guijt-van Duijn; et al;
    Biotechnology Advances,
    Volume 21, Issue 5, pp. 431-444, Aug. 2003.

  1665. Micro-patterning of self-supporting layers with conducting polymer wires for 3D-chip interconnection applications
    J. Ackermann; C. Videlot; T.N. Nguyen; L. Wang; P.M. Sarro; D. Crawley; K. Nikoli; M. Forshaw;
    Applied Surface Science,
    Volume 212-213, pp. 411-416, May 2003.

  1666. Polymeric amorphous carbon as p-type window within amorphous silicon solar cells
    R.U.A. Khan; S.R.P. Silva; R.A.C.M.M. van Swaaij;
    Appl. Phys. Lett.,
    Volume 82, pp. 3979, 2003.

  1667. On optical, electrical and structural properties of amorphous silicon based semiconductors
    E. Pincik; H. Kobayashi; J. Mullerov�; K. Gmucov�; M. Jergel; R. Brunner; M. Zeman; M. Zahoran;
    Acta Physica Slovaca,
    Volume 53, Issue 4, pp. 267-278, 2003.

  1668. Respect for Quantity
    L.K. Nanver;
    Delft University of Technology: , Apr. 2003.
    document

  1669. M3: the third dimension of silicon
    P.M. Sarro;
    Delft University of Technology: , Apr. 2003. ISBN 90-75774-02-8.

  1670. Poly-Si TFT Structures
    R. Ishihara;
    In Thin Film Transistors, Materials and Processes,
    Boston, Kluwer Academic Publishers, 2003.

  1671. Extraction of Thermal Network Function for Bipolar RF Devices and Circuits
    N. Nenadovic; S. Mijalkovic; F. Tamigi; V. dAlessandro; L.K. Nanver; H. Schellevis; J.W. Slotboom;
    In XLVII ETRAN Conference,
    Herceg Novi, Serbia-Montenegro, pp. 225-228, Jun. 2003. ISBN 86-80509-48-5.
    document

  1672. Simulations of buffer layers in a-Si:H solar cells deposited with an expanding thermal plasma
    A.M.H.N. Petit; M. Zeman; R.A.C.M.M. van Swaaij; M.C.M. van de Sanden;
    In WCPEC-3,
    Osaka, Japan, May 2003.
    document

  1673. Light scattering properties of SnO2 and ZnO surface textured substrates
    J. Krc; M. Zeman; O. Kluth; F. Smole; M. Topic;
    In WCPEC-3,
    Osaka, Japan, May 2003.
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  1674. Effect of charged gap states on light induced degradation of a-Si:H single junction solar cells
    M. Zeman; V. Nadazdy; R.A.C.M.M. van Swaaij; J.W. Metselaar;
    In WCPEC-3,
    Osaka, Japan, May 2003.

  1675. Fabrication of Nanochannels Using Glass to Glass Anodic Bonding
    V.G. Kutchoukov; F. Laugere; W. van der Vlist; L. Pakula; Y. Garini; P.F.A. Alkemade; A. Bossche;
    In Transducers,
    Boston, Massachuesetts, USA, pp. 1327-1330, Jun. 2003. ISBN 0-7803-7731-1.

  1676. Integrated 5.7 GHz Chip-Size Antenna for Wireless Sensor Networks
    P.M. Mendes; A. Polyakov; M. Bartek; J.N. Burghartz; J.H. Correia;
    In Transducers,
    Boston, Massachuesetts, USA, pp. 49-52, Jun. 2003. ISBN 0-7803-7731-1.

  1677. Low-Cost Microfilter for Red Blood Cell Membrane Stiffness Measurement Using Photosensitive BCB
    P. Turmezei; A. Polyakov; J.R. Mollinger; M. Bartek; A. Bossche; J.N. Burghartz;
    In Transducers,
    Boston, Massachuesetts, USA, pp. 107-110, Jun. 2003. ISBN 0-7803-7731-1.
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  1678. Single-crystalline Si TFTs fabricated by the µ-Czochralski (grain-filter) process
    Y. Hiroshima; R. Ishihara; V. Rana; D. Abe; S. Inoue; T. DShimoda; J.W. Metselaar; C.I.M. Beenakker;
    In 2003 Int. Workshop on Active-Matrix Liquid-Crystal Displays,
    Tokyo, Japan, pp. 157-158, Jul. 2003.
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  1679. Dependence of single-crystalline Si TFT characteristics on the channel position in a location-controlled grain
    V. Rana; R. Ishihara; Y. Hiroshima; D. Abe; S. Higashi; S. Inoue; T. Shimoda; J.W. Metselaar;
    In 2003 Int. Workshop on Active-Matrix Liquid-Crystal Displays - TFT Technologies and Related Materials,
    Tokyo, pp. 17-20, Jul. 2003.
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  1680. Shell Type Micromechanical Oscillator, Smart Sensors, Actuators, and MEMS
    Maxim Zalalutdinov; Keith L. Aubin; Christopher Michael; Robert B.Reichenbach; Tuncay Alan; Alan T. Zehnder; Brian H. Houston; Jeevak M. Parpia; Harold G. Craighead;
    In Proc. SPIE,
    pp. 229-236, 2003.
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  1681. Hopf Bifurcation in a Disk-Shaped NEMS
    Maxim Zalalutdinov; Jeevak Parpia; Keith Aubin; Harold Craighead; Tuncay Alan; Alan Zehnder; R. Richard;
    In Proceedings of the 2003 ASME Design Engineering Technical Conferences,
    Chicago, IL, 2003.

  1682. Using PDMS microtransfer molding (uTM) for polymer flip chip
    C. K. Y. Wong; O. C. T. Cheung; B. Xu; M. M. F. Yuen;
    In Proceedings - Electronic Components and Technology Conference,
    New Orleans LA, pp. 652-657, 2003.

  1683. Role of charged defects in the light-induced degradation of single junction a-Si:H solar cells
    M. Zeman; V. Nadazdy; R.A.C.M.M. van Swaaij; J. W. Metselaar;
    In Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion,
    pp. 1623, 2003.
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  1684. Technological approaches for fabrication of elastomer based spatial light modulators
    S. Sakarya; G. Vdovin; P.M. Sarro;
    In Proc. SPIE,
    pp. 279-286, 2003. ISSN 0277-786X.

  1685. Race-free CMOS pass-gate charge recycling logic (FCPCL) for low power applications
    A. Abbasian; S.H. Rasouli; J. Derakhshandeh; A. Afzali-Kusha; M. Nourani;
    In Proceeding of the 2003 south west symposium on mixed signal design,
    Las Vegas, USA, pp. 87-89, Feb. 2003.

  1686. Through-Wafer Electrical Vias for RF Silicon technology
    Z. Wang; L. Wang; H. Schellevis; W. Wien; J.N. Burghartz; P.M. Sarro;
    In Proc. SAFE 2003,
    Veldhoven, The Netherlands, pp. 761-765, Nov. 2003. ISBN 90-73461-39-1.

  1687. Dynamic behavior of polycrystalline and single grain silicon TFTs
    P. Migliorato; F. Yan; S. Inoue; T. Shimoda; R. Ishihara;
    In Proc. 10th International Display Workshop,
    Fukuoka, Japan, Dec. 2003.

  1688. Analysis and Optimization of Via-Connected Spiral Inductors in RF Silicon Technology
    S.M. Sinaga; M. Bartek; J.N. Burghartz;
    In Proc. SAFE 2003,
    Veldhoven, The Netherlands, pp. 757-760, Nov. 2003. ISBN 90-73461-39-1.
    document

  1689. Extended Mextram Model To Wide Frequency Range
    H.-C. Wu; S. Mijalkovic; J.N. Burghartz;
    In Proc. SAFE 2003,
    Veldhoven, The Netherlands, pp. 668-671, Nov. 2003. ISBN 90-73461-39-1.
    document

  1690. Characterization of Front- to Backwafer Alignment and Bulk Micromachining Using Electrical Overlay Test Structures
    H.W. van Zeijl; J. Slabbekoorn;
    In Proc. SPIE, Smart Sensors, Actuators and MEMS,
    pp. 617-626, May 2003.

  1691. Thermal Impedance Extraction and Modeling for Different Silicon-on-Glass BJT Designs
    A. Rossi; V. Moschiano; F. Tamigi; N. Nenadovic; L.K. Nanver; J.W. Slotboom;
    In Proc. SAFE 2003,
    Veldhoven, The Netherlands, pp. 643-647, Nov. 2003. ISBN 90-73461-39-1.

  1692. A Wideband Distributed Silicon Driver for 10 Gb/s External Modulators
    F.M. De Paola; L.C.N. de Vreede; N. Rinaldi; J.N. Burghartz;
    In Proc. ProRISC 2003,
    Veldhoven, The Netherlands, pp. 186-189, Nov. 2003. ISBN 90-73461-39-1.
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  1693. Thermal Management of Silicon-On-Glass MOS Field-Effect Transistors for RF-Power Applications
    A. Griffo; N. Nenadovic; V. Cuoco; L.K. Nanver; J.W. Slotboom;
    In Proc. SAFE 2003,
    Veldhoven, The Netherlands, pp. 1-8, Nov. 2003. ISBN 90-73461-39-1.

  1694. Experimental results of a three-terminal optical modulator based on a BMFET device
    A. Irace; G. Breglio; M. Tordi; G. Coppola; C.R. de Boer; P.M. Sarro;
    In Proc. of SPIE,
    Brugge, Belgium, pp. 125-132, Oct. 2003. ISSN 0277-786X.
    document

  1695. Folded-Patch Chip-Size Antennas for Wireless Microsystems using Wafer-Level Chip-Scale Packaging
    P.M. Mendes; A. Polyakov; M. Bartek; J.N. Burghartz; J.H. Correia;
    In Proc. MME 2003,
    Delft, The Netherlands, pp. 77-80, Nov. 2003. ISBN 90-808266-1-8.
    document

  1696. Liquid crystal wavefront corrector with modal response
    M. Loktev; G. Vdovin; P.M. Sarro;
    In Proc. Eurosensors XVII,
    University of Minho, Guimaraes, Portugal, pp. 598-599, Sep. 2003.

  1697. Wafer thinning for high-density, through-wafer interconnects
    L. Wang; C.C.G. Visser; C.R. de Boer; M. Laros; W. van der Vlist; J. Groeneweg; G. Craciun; P.M. Sarro;
    In Proc. of SPIE,
    San Jose, CA, pp. 532-539, Jan. 2003. ISSN 0277-786X.
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  1698. Fabrication of a microfluidic chip for PCR applications
    M. Bu; B. Husband; T. Melvin; G. ensell; N.P. Pham; P.M. Sarro; J.S. Wilkinson; A.G.R. Evans;
    In Proc. MME 2003,
    Delft, The Netherlands, pp. 119-122, Nov. 2003. ISBN 90-808266-1-8.
    document

  1699. Efficiency Improvement of a Chip-Size Antenna for Wireless Microsystems
    P.M. Mendes; D.A. Duraes; M. Bartek; J.H. Correia;
    In Proc. Eurosensors XVII,
    University of Minho, Guimaraes, Portugal, pp. 725-726, Sep. 2003.

  1700. A model for film thickness using direct spray coating
    N.P. Pham; J.N. Burghartz; P.M. Sarro;
    In Proc. IEEE EPTC conference,
    Singapore, Dec. 2003.
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  1701. Metal patterning on high topography surface for 3-D RF devices fabrication
    N.P. Pham; E. Boellaard; W. Wien; L.D.M. van den Brekel; J.N. Burghartz; P.M. Sarro;
    In Proc. Eurosensors XVII,
    University of Minho, Guimaraes, Portugal, pp. 440-443, Sep. 2003.

  1702. Microfluidic device constructed from photosensitive BCB for erythrocyte membrane deformability measurement
    P. Turmezei; A. Polyakov; J.R. Mollinger; M. Bartek; A. Bossche; J.N. Burghartz;
    In Proc. Eurosensors XVII,
    University of Minho, Guimaraes, Portugal, pp. 193-196, Sep. 2003.

  1703. Thermal Instability in Two-Finger Bipolar Transistors
    N.Nenadovic; V.dAlessandro; F. Tamigi; A. Rossi; A. Griffo; L.K. Nanver; J.W. Slotboom;
    In J. Franca; P. Freitas (Ed.), Proc. ESSDERC 2003,
    Estoril, Portugal, pp. 203-206, Sep. 2003. ISBN 0-7803-7999-3.

  1704. C-V Characterization of MOS Capacitors on High Resistivity Silicon Substrate
    B. Rong; L.K. Nanver; J.N. Burghartz; A.B.M. Jansman; A.G.R. Evans; B. Rejaei;
    In J. Franca; P. Freitas (Ed.), Proc. ESSDERC 2003,
    Estoril, Portugal, pp. 489-492, Sep. 2003. ISBN 0-7803-7999-3.

  1705. Processability and Electrical Characteristics of Glass Substrates for RF Wafer-Level Chip-Scale Packages
    A. Polyakov; P.M. Mendes; S.M. Sinaga; M. Bartek; B. Rejaei; J.H. Correia; J.N. Burghartz;
    In Proc. 53rd Electronic Components and Technology Conference,
    New Orleans, Louisiana, USA, pp. 875-880, May 2003. ISBN 0-7803-7430-4.
    document

  1706. High-performance TFTs fabricated inside a location-controlled grain by µ-Czochralski (grain-filter) process
    V. Rana; R. Ishihara; Y. Hiroshima; D. Abe; S. Higashi; S. Inoue; T. Shimoda; J.W. Metselaar; C.I.M. Beenakker;
    In Proc. 3rd International Meeting on Information Display,
    Deagu, Korea, pp. 1-4, Jul. 2003.
    document

  1707. Design and Analysis of a 6 GHz Chip Antenna on Glass Substrates for Integration with RF/Wireless Microsystems
    P.M. Mendes; J. H. Correia; M. Bartek; J.N. Burghartz;
    In Proc. 2003 IEEE AP-S,
    Columbus, Ohio, USA, pp. 667-670, Jun. 2003. ISBN 0-7803-7846-6.
    document

  1708. Electrical characterization of silicon diodes formed by laser annealing of implanted dopants
    L.K. Nanver; J. Slabbekoorn; A. Burtsev; T.L.M. Scholtes; R. Surdeanu; F. Simon; H.J. Kalhert; J.W. Slotboom;
    In Proc. 203rd ECS,
    Paris, France, pp. 119-130, Apr. 2003. ISBN 1-56677-396-2.
    document

  1709. Area-Selective Adhesive Bonding Using Photosensitive BCB for WLCSP Applications
    A. Polyakov; M. Bartek; J.N. Burghartz;
    In Polytronic 2003, 3rd International IEEE Conference on Polymers and Adhesives Microelectronics and Photonics,
    Montreux, Switzerland, Lab. TIMA, France, Oct. 2003. ISBN 2-84813-023.
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  1710. Integrated optical refractometer based on rib-ARROW waveguide
    R. Bernini; S. Campopiano; L.Zeni; P.M. Sarro;
    In Proc Eurosensors XVII,
    University of Minho, Guimaraes, Portugal, pp. 139-142, Sep. 2003.
    document

  1711. High Aspect Ratio through-Wafer Interconnections for 3D-Microsystems
    L. Wang; A. Nichelatti; H. Schellevis; C. de Boer; C. Visser; T.N. Nguyen; P.M. Sarro;
    In Proc. 16th IEEE International MEMS conference,
    Kyoto, Japan, pp. 634-637, Jan. 2003.
    document

  1712. Simulations of buffer layers in a-Si:H thin-film solar cells deposited with an expanding thermal plasma
    A.M.H.N. Petit; M. Zeman; R.A.C.M.M. van Swaaij; M.C.M. van de Sanden;
    In MRS,
    San Francisco, USA, Apr. 2003.
    document

  1713. On-Chip Isolation in Wafer-Level Chip-Scale Packages: Substrate Thinning and Circuit Partitioning by Trenches
    S.M. Sinaga; A. Polyakov; M. Bartek; J.N. Burghartz;
    In IMAPS 2003,
    Boston, USA, IMAPS, pp. 768-773, Nov. 2003. ISBN 0-930815-71-8.

  1714. Field Aided Germanium Induced Crystallization of Silicon on glass
    J. Derakhshandeh,��S. Mohajerzadeh; N. Golshani; M.D.Robertson;
    In MRS,
    2003.
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  1715. A physically based analytical model of the collector charge of III-V heterojunction bipolar transistors
    R. van der Toorn; J.C.J. Paasschens; R.J. Havens and;
    In Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2003. 25th Annual 2003. IEEE 2003,
    pp. 111-114, 2003.

  1716. Material structure of microcrystalline silicon deposited by an expanding thermal plasma
    C. Smit; D. L. Williamson; M. C. M. van de Sanden; R.A.C.M.M. van Swaaij;
    In Mater. Res. Soc. Symp. Proc.,
    pp. 527, 2003.

  1717. Design of a Folded-Patch Chip-Size Antenna for Short-Range Communications
    P.M. Mendes; A. Polyakov; M. Bartek; J.N. Burghartz; J. H. Correia;
    In European microwave conference 2003,
    Munich, Germany, pp. 723-726, Oct. 2003. ISBN 1-58053-839-8.

  1718. Low-loss passives for 2nd-harmonic termination control in power amplifiers for mobile applications
    M. Spirito; L.C.N. de Vreede; L.K. Nanver; J. Mueller; J.N. Burghartz;
    In 4th Topical Meeting on Silicon Monolithic Integrated Circuits RF Systems,
    Garmisch, Southern Germany, pp. 49-52, Apr. 2003.

  1719. Simulation of buffer layers in a-Si:H thin film solar cells deposited with and expanding thermal plasma
    A. M. H. N. Petit; M. Zeman; R.A.C.M.M. van Swaaij; M. C. M. van de Sanden;
    In Mater. Res. Soc. Symp. Proc.,
    pp. 369, 2003.

  1720. Extraction of Glass-Wafers Electrical Properties Based on S-Parameters Measurements of Coplanar Waveguides
    P.M. Mendes; A. Polyakov; M. Bartek; J.N. Burghartz; J. H. Correia;
    In ConfTele 2003,
    Aveiro, Portugal, Instituto de Telecom, pp. 51-54, Jun. 2003. ISBN 972-98368-2-5.

  1721. A 2 GHz high-gain differential InGaP HBT driver amplifier matched for high IP3
    M.P. van der Heijden; M. Spirito; L.C.N. de Vreede; F. van Straten; J.N. Burghartz;
    In 2003 IEEE MTT-S International Microwave Symposium,
    Philadelphia, PA, USA, pp. 235 -238, Jun. 2003.

  1722. Assessment of ferromagnetic integrated inductors for Si-technology
    B. Rejaei; M. Vroubel; Y. Zhuang; J.N. Burghartz;
    In 4th Topical Meeting on Silicon Monolithic Integrated Circuits RF Systems,
    Garmisch, Southern Germany, pp. 100-103, Apr. 2003.

  1723. A Calibration Procedure for On-Wafer Differential Load-Pull Measurements
    M. Spirito; M.P. van der Heijden; M. de Kok; L.C.N. de Vreede;
    In 61st ARFTG,
    Philadelphia, Pennsylvania, USA, Jun. 2003.

  1724. Design and characterization of integrated passive elements on high ohmic silicon
    E. Valletta; J. van Beek; A. Den Dekker; N. Pulsford; H.F.F. Jos; L.C.N. de Vreede; L.K. Nanver; J.N. Burghartz;
    In 2003 IEEE MTT-S International Microwave Symposium,
    Philadelphia, PA, USA, pp. 1235 -1238, Jun. 2003.

  1725. Mixed Compact and Behavior Modeling Using AHDL Verilog-A
    H.-C. Wu; S. Mijalkovic; J.G. Macias; J.N. Burghartz;
    In 2003 IEEE International Workshop on Behavioral Modeling and Simulation (BMAS 2003),
    San Jose, CA, USA, pp. 139-143, Oct. 2003.

  1726. Characterization of Anisotropic Conductive Adhesives
    P. Iyer; P. Baumgaertner; D. Farley; A. Dasgupta;
    In ASME International Mechanical Engineering Congress and RD&D Expo,
    Washington, DC, USA, 2003.

  1727. Extraction and Modeling of Self-Heating and Mutual Thermal Coupling Impedance of Bipolar Transistors
    N. Nenadovic; S. Mijalkovic; L.K. Nanver; Vandamme; H. Schellevis; V. Alessandro; J. W. Slotboom;
    In 2003 BCTM,
    Toulouse, France, Sep. 2003.

  1728. The Shrinking Bipolar Transistor
    J.W. Slotboom;
    In 2003 BCTM,
    Toulouse, France, Sep. 2003.

  1729. Design and Tolerance Analysis of a 5.7 GHz Chip-Size Microstrip Antenna on High Resistivity Silicon
    P.M. Mendes; J. H. Correia; M. Bartek; J.N. Burghartz;
    In 2003 IEEE AP-S,
    Columbus, Ohio, USA, Jun. 2003.

  1730. Stress-assisted Nickel-Induced Crystallization of Silicon on Glass
    P. Hashemi; A. Khajooeizadeh; S. Mohajerzadeh; J. Derakhshandeh; M. Robertson; J.C. Bennett;
    In 11th Canadian Semiconductor Technology Conference (CSTC),
    Ottawa, Canada, Aug. 2003.

  1731. A High Performance Unilateral 900 MHz LNA with Simultaneous Noise, Impedance, and IP3 Match
    M.P. van der Heijden; L.C.N. de Vreede; F. van Straten; J.N. Burghartz;
    In 2003 BCTM,
    Toulouse, France, Sep. 2003.

  1732. The ASCA simulation program: Integrated optical and electrical modeling of thin-film Si devices
    B.E. Pieters; M. Zeman; J.W. Metselaar;
    In 2nd aSiNet workshop,
    Lisbon, Portugal, Feb. 2003.

  1733. Thin-film silicon solar cells
    M. Zeman;
    In 13th Conference of Slovak Physical Society,
    Smolenice, Slovakia, Aug. 2003.

  1734. Evolution of charged gap states in a-Si:H under light exposure
    M. Zeman; V. Nadazdy; R.A.C.M.M. van Swaaij; R. Durny; J. W. Metselaar;
    In Mater. Res. Soc. Symp. Proc.,
    San Francisco, USA, pp. 39, Apr. 2003.

  1735. Integrated Chip-Size Antenna for Wireless Microsystems: Fabrication and Design Considerations
    P.M. Mendes; A. Polyakov; M. Bartek; J.N. Burghartz; J.H. Correia;
    In Proc. Eurosensors XVII,
    University of Minho, Guimaraes, Portugal, pp. 438-439, Sep. 2003. ISBN 90-73461-39-1.

  1736. High Performance P-Channel Single-Crystalline Si TFTs Fabricated Inside a Location-Controlled Grain by mu-Czochralski Process
    V. Rana; R. Ishihara; Y. Hiroshima; D. Abe; S. Inoue; T. Shimoda; J.W. Metselaar; C. I.M. Beenakker;
    In Proc. SAFE 2003,
    Veldhoven, The Netherlands, pp. 639-642, Nov. 2003. ISBN 90-73461-39-1.
    document

  1737. Formation of crystalline-silicon islands for thin-film transistors by excimer-laser-induced lateral growth
    P.C. van der Wilt;
    PhD thesis, Delft University of Technology, Jan. 2003. ISBN 90-6464-066-1; Promotor: prof. C.I.M. Beenakker.

  1738. Modeling and Characterization of RF Power Bipolar Transistors
    R.Tinti;
    PhD thesis, Delft University of Technology, Feb. 2003. ISBN 90-9016621-1; Promotors: prof. J.W. Slotboom, prof. J.L. Tauritz, dr. H. de Graaff.

  1739. Location-controlled large Si islands by excimer-laser annealing on glass substrate
    A.A. Burtsev;
    PhD thesis, Delft University of Technology, Oct. 2003. ISBN 90-6734-019-7; Promotor: prof. C.I.M. Beenakker.

  1740. Silicon micromachining for RF technology
    P.N. Pham;
    PhD thesis, Delft University of Technology, May 2003. ISBN 90-6734-235-1; Promotors: prof. J.N. Burghartz, P.M. Sarro.

  1741. Investigation of Microstrips with NiFe Magnetic Thin Film (II): Modelling
    M. Vroubel; Y. Zhuang; B. Rejaei; J.N. Burghartz;
    Transactions of The Magnetic Society of Japan,
    Volume 2, Issue 5, pp. 371-376, Dec. 2002.

  1742. Properties of semiconductor surfaces covered with very thin insulating overlayers prepared by impacts of low-energy particles
    E. Pincic; H. Gleskovic; J. Mllerovic; V. Nadazdy; S. Mric; L. Ortega; M. Jergel; C. Falcony; R. Brunner; K. Gmucovic; M. Zeman; R.A.C.M.M. van Swaaij; M. Kucera; R. Juric; M. Zahoran;
    Vacuum,
    Volume 67, 131 (2002), 2002.

  1743. Technology of reflective membranes for spatial light modulators
    S. Sakarya; G. Vdovin; P.M. Sarro;
    Sensors and Actuators A,
    Volume 97-98, pp. 468-472, Apr. 2002.

  1744. Investigation of Microstrips with NiFe Magnetic Thin Film (I): Experiment
    Y. Zhuang. M. Vroubel; B. Rejaei; E. Boellaard; J.N. Burghartz;
    Transactions of The Magnetic Society of Japan,
    Volume 2, Issue 5, pp. 367-370, Dec. 2002.

  1745. Correlation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon
    V. N�dazdy; R. Durn_; I. Thurzo; E. Pinc�k; A. Nishida; J. Shimizu; M. Kumeda; T. Shimizu;
    Physical Review B,
    Volume 66, Issue 19, pp. 195211/1-195211, 2002. ISSN 0163-1829.

  1746. Silicon thin-film UV filter for NADH fluorescence analysis
    V.P. Iordanov; G.W. Lubking; R. R. IshiharaF. Wolffenbuttel; P.M. Sarro; M.J. Vellekoop;
    Sensors and Actuators A,
    Volume 97-98, pp. 161-166, Apr. 2002.

  1747. Mechanical Reliability of Silicon Wafers with Through-Wafer Vias for Wafer-Level Packaging
    A. Polyakov; M. Bartek; J.N. Burghartz;
    Microelectronics Reliability,
    Volume 42, Issue 9-11, pp. 1783-1788, 2002. ISSN 0026-2714.

  1748. X-ray spectroscopy with a Multi-anode Sawtooth Silicon Drift Detector: the diffusion process
    J. Sonsky; R.W.Hollander; P.M. Sarro; C.W.E. van Eijk;
    Nucl. Instr. and Meth. A,
    Volume 477, pp. 93-98, 2002. ISSN 0168-9002.

  1749. Current Assisted Germanium Induced Crystallization of amorphous silicon on glass
    J. Derakhshandeh; N. Golshani; S. Mohajerzadeh;
    Journal of Thin Solid Films,
    2002.

  1750. Through-wafer copper electroplating for 3-D interconnects
    N.T. Nguyen; E. Boellaard; N.P. Pham; V.G. Kutchoukov; G. Craciun; P.M. Sarro;
    Journal of Micromechanics and Microengineering,
    Volume 12, Issue 4, pp. 395-399, Jul. 2002. ISSN 0960-1317.

  1751. Substrate effects in monolithic RF transformers on silicon
    K.T. Ng; B. Rejaei; J.N. Burghartz;
    IEEE Transactions on Microwave Theory and Techniques,
    Volume 50, Issue 1, pp. 377-383, Jan. 2002.

  1752. Structural characterization of highly boron doped SiGe/Si heterostructures
    J.F. Woitok; C.C.G. Visser; T.L.M. Scholtes;
    Materials Science and Engineering B,
    Volume 89, Issue 1-3, pp. 216-220, Feb. 2002. ISSN 0921-5107.

  1753. Optical modeling of a-Si:H solar cells deposited on textured glass/SnO2 substrates
    J. Krc; M. Zeman; F. Smole; M. Topic;
    Journal of Applied Physics,
    Volume 92, Issue 2, pp. 749-755, Jul. 2002.

  1754. Fast deposition of microcrystalline silicon with an expanding thermal plasma
    C. E. Smit.A.G. Hamers; B.A. Korevaar; R.A.C.M.M. van Swaaij; M.C.M. van de Sanden;
    J. Non-Cryst. Solids,
    Volume 299, pp. 98, 2002.

  1755. Photo carrier generation in bipolar transistors
    J.H. Klootwijk; J.W. Slotboom; M.S. Peter; V. Zieren; D.B. de Mooy;
    IEEE Trans. on Electron Devices,
    Volume 49, Issue 9, pp. 1628-1631, Sept. 2002.

  1756. Theory and design of an ultra-linear square-law approximated LDMOS power amplifier in class-AB operation
    M.P van der Heijden; H.C. de Graaff; L.C.N. de Vreede; J.R. Gajadharsing; J.N. Burghartz;
    IEEE Trans. Microwave Theory and Techniques,
    Volume 50, Issue 9, pp. 2176-2184, Sep. 2002.

  1757. A novel frequency-independent third-order intermodulation distortion cancellation technique for BJT amplifiers
    M.P. van der Heijden; H.C. de Graaff; L.C.N. de Vreede;
    IEEE Journal of Solid-State Circuits,
    Volume 37, Issue 9, pp. 1176-1183, Sep. 2002. ISSN 0018-9200.

  1758. GHz Band-Stop Microstrip Filter Using Patterned Ni78Fe22 Ferromagnetic Film
    Y. Zhuang; B. Rejaei; E. Boellaard; M. Vroubel; J.N. Burghartz;
    IEEE Microwave and Wireless Components Letters,
    Volume 12, Issue 12, pp. 473-475, Dec. 2002.

  1759. Gain and Threshold-Current Calculation of V-Groove Quantum-Wire InGaAs-InP Laser
    D. M. Gvozdic; N. M. Nenadovic; A. Schlachetzki;
    IEEE Journal of Quantum Electronics,
    Volume 38, Issue 12, pp. 1565-1579, Dec. 2002.

  1760. A Single-Chip CMOS Optical Microspectrometer with Light-to-Frequency Converter and Bus Interface
    J.H. Correia; G. de Graaf; M. Bartek; R.F. Wolffenbuttel;
    IEEE Journal of Solid-State Circuits,
    Volume 37, Issue 10, pp. 1344-1347, Oct. 2002. ISSN 0018-9200.

  1761. Through-silicon-chip transmission lines
    K.T. Ng; E. Boellaard; N.P. Pham; J.N. Burghartz;
    Electronics Letters,
    Volume 38, Issue 13, pp. 640-641, Jun. 2002.

  1762. Fabrication of a glass-implemented microcapillary electrophoresis device with integrated contactless conductivity detection
    A. Berthold; F. Laugere; H. Schellevis; C.R. de Boer; M. Laros; R.M. Guijt; P.M. Sarro; M.J. Vellekoop;
    Electrophoresis,
    Volume 23, Issue 20, pp. 3511-3519, Oct. 2002. ISSN 0173-0835.

  1763. Ferromagnetic RF Inductors and Transformers for Standard CMOS/BiCMOS
    Y. Zhuang; M. Vroubel; B. Rejaei; J. Burghartz;
    In IEDM 2002,
    San Francisco, CA, USA, pp. 18.06/1-18.06/4, Dec. 2002. ISBN 0-7803-7463-0.

  1764. Energy Density Window for Location-Controlled Si Grains by Dual-Beam Excimer-Laser
    A. Burtsev; R. Ishihara; C. I. M. Beenakker;
    In Thin Solid Films,
    pp. 199-206, Nov. 2002. ISSN 0040-6090.

  1765. Agile beams and micromachined membrane deformable mirrors
    G. Vdovin; P.M. Sarro;
    In The 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society (LEOS 2002),
    pp. 576-577, 2002. ISBN 0-7803-7500-9.

  1766. Single-Crystalline Si Thin-Film Transistors Fabricated with mu-Czochralski (Grain-Filter) Process
    R. Ishihara; P.Ch. van der Wilt; B.D. van Dijk; A. Burtsev; J.W. Metselaar; C.I.M. Beenakker;
    In M. Matsumura (Ed.), Tech Dig. 2002 Intern. Workshop on Active-Matrix LCDs - TFT Technologies and Rel. Materials,
    Tokyo, Japan, pp. 53-56, Jul. 2002 2002.

  1767. Saddle Add-On Metallisation (SAM) for RF Inductor Implementation in Standard IC Interconnects
    B. Rejaei; J. Burghartz; H. Schellevis;
    In IEDM 2002,
    San Francisco, CA, USA, pp. 18.04/1-18.04/4, Dec. 2002. ISBN 0-7803-7463-0.

  1768. Analysis of Light Scattering in a-Si:H-based Solar Cells with Rough Interfaces
    J. Krc; M. Zeman; F. Smole; J.W. Metselaar; M. Topic;
    In Solar Energy Materials and Solar Cells,
    pp. 401-406, Oct. 2002. ISSN 0927-0248.

  1769. New Trends in Thin Film Silicon Solar Cell Technology
    M. Zeman;
    In Proc. 4th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM 2002),
    Smolenice Castle, Slovakia, pp. 353-362, Oct. 2002. ISBN 0-7803-7276-X.

  1770. Self-adjustment of optical interconnects using in-package MEMS-based actuators
    K.J. van Nielen; W.J. Venstra; M. Tichem; M. Laros; P.M. Sarro; B. Karpuschewski;
    In J. Saneistr; P. Ripka (Ed.), Proceedings Eurosensors XVI,
    Prague, Czech Republic, Czech Technical University, pp. 794-797, Sep. 2002.

  1771. High Performance P-Channel Single-Crystalline Si Thin Film Transistors
    V. Rana; R. Ishihara;
    In SAFE 2002,
    Veldhoven, The Netherlands, pp. 35, Nov. 2002. ISBN 90-73461-32-4.

  1772. Development of a silicon-based modal liquid crystal wavefront corrector
    M.Y. Loktev; G.V. Vdovin; P.M. Sarro;
    In Proc. SPIE: Photonics, Devices, and Sytems II,
    Prague, Czech Republic, pp. 558-564, May 2002.

  1773. CV doping profiling of boron out-diffusion using an abrupt and highly doped arsenic buried epilayer
    C.J. Ortiz; L.K. Nanver; W.D van Noort; T.L.M. Scholtes; J.W Slotboom;
    In Proc. 2002 International Conference on Microelectronic Test Structures (ICMTS 2002),
    Cork, Ireland, pp. 83-88, Apr. 2002. ISBN 0-7803-7464-9.

  1774. Substrate Options and Add-On Process Modules for Monolithic RF Silicon Technology
    J.N. Burghartz; M. Bartek; B. Rejaei; P.M. Sarro; A. Polyakov; N.P. Pham; E. Boullaard; K.T. Ng;
    In Proc. 2002 Bipolar/BiCMOS Circuits and Technology Meeting (BCTM 2002),
    Monterey, CA, pp. 17-23, Sept. 2002. ISBN 0-7803-7562-9.

  1775. Characterization of Front to Backwafer Bulk Micromachining using Electrical Overlay Test Structures
    H.W. van Zeijl; J. Slabbekoorn;
    In Proc. 13th Micromechanics Europe Workshop (MME 2002),
    Sinaia, Romania, pp. 343-346, Oct. 2002. ISBN 973-0-02472-3.

  1776. Sensitive measurement method for evaluation of high thermal resistance in bipolar transistors
    N. Nenadovic; L.K. Nanver; H. Schellevis; D. de Mooij; V. Zieren; J.W. Slotboom;
    In Proc. 2002 Int. Conference on Microelectronic Test Structures (ICMTS 2002),
    pp. 77-82, Apr. 2002. ISBN 0-7803-7464-9.

  1777. Technological aspects of a custom CMOS sensor for adaptive optics
    D. de Lima Monteiro; G.V. Vdovin; P.M. Sarro;
    In Proc. SPIE: Photonics, Devices, and Sytems II,
    Prague, Czech Republic, pp. 31-36, May 2002.

  1778. Arrays of spherical micromirrors and molded microlenses fabricated with bulk Si micromachining
    G.V. Vdovin; O. Akhzar Mehr; P.M. Sarro; D.W. de Lima Monteiro; M.Y. Loktev;
    In Proc. SPIE: MEMS/MOEMS: Advances Photonic Communications, Sensing, Metrology, Packaging and Assembly,
    Brugge, Belgium, pp. 107-111, Oct. 2002.

  1779. Low-cost technological approaches to micromachined spatial light modulators
    S. Sakarya; G. Vdovin; P.M. Sarro;
    In Proc. SPIE: High-Resolution Wavefront Control: Methods, Devices, and Applications IV,
    Seattle, WA, USA, pp. 264-271, Jul. 2002.

  1780. Modal corrector integrated in silicon: possibilities for implementation
    M.Y. Loktev; G.V. Vdovin; P.M. Sarro;
    In Proc. SPIE: Optics Atmospheric Propagation and Adaptive Systems V,
    Agia Pelagia, Greece, pp. 196-205, Sept. 2002.

  1781. Fabrication technology for micromachined spatial light modulators
    S. Sakarya; G. Vdovin; P.M. Sarro;
    In Proc. SPIE: Integrated Optical Devices: Fabrication and Testing,
    Brugge, Belgium, pp. 219-226, Oct. 2002.

  1782. CMOS-compatible wells for integrated high-speed screening arrays
    B.L. Gray; R. Moerman; L.R. van den Doel; H.R. Dietrich; V.P. Iordanov; N.P. Pham; L.M. Sarro; A. Bossche; M.J. Vellekoop;
    In Proc. SPIE: Biomedical Nanotechnology Architectures and Applications,
    pp. 103-108, Jan. 2002.

  1783. Technology for integrated spatial light modulators based on reflective membranes
    S. Sakarya; G.V. Vdovin; P.M. Sarro;
    In J.D. Gonglewski; M.A. Vorontsov; M.T. Gruneisen (Ed.), Proc. SPIE: High-Resolution Wavefront Control: Methods, Devices, and Applic. III,
    pp. 21-28, Feb. 2002.

  1784. Technology for Integrated Spatial Light Modulators based on Viscoelastic Layers
    S. Sakarya; G. Vdovin; P.M. Sarro;
    In Proc. SeSens 2002,
    Veldhoven, The Netherlands, STW, pp. 672-675, Nov. 2002. ISBN 90-73461-33-2.

  1785. Electrical and Optical Properties of PECVD SiC Thin Films for Surface Micromachined Devices
    H.T.M. Pham; T. Akkaya; C. de Boer; C.C.G. P. Visser.M. Sarro;
    In Proc. SeSens 2002,
    Veldhoven, The Netherlands, STW, pp. 662-666, Nov. 2002. ISBN 90-73461-33-2.

  1786. Customized CMOS wavefront sensor
    D.W. de Lima Monteiro; G.V. Vdovin; J.G. Rocha; V.P. Iordanov; M.Y. Loktev; P.M. Sarro;
    In J.D. Gonglewski; M.A. Vorontsov; M.T. Gruneisen (Ed.), Proc. SPIE: High-Resolution Wavefront Control: Methods, Devices, and Applic. III,
    pp. 88-99, Feb. 2002.

  1787. Photoresist wells for integrated high-speed screening arrays
    B.L. Gray; R. Moerman; L.R. van den Doel; V.P. Iordanov; N.P. Pham; P.M. Sarro; A. Bossche; M.J. Vellekoop;
    In Proc. SESENS 2002,
    Veldhoven, The Netherlands, pp. 791-794, Nov. 2002. ISBN 90-73461-28-6.

  1788. Filtered Photodiode Arrays for NADH Fluorescence Analysis
    V.P. Iordanov; J. Bastemeijer; R. Ishihara; P.M. Sarro; A. Bossche; M. Vellekoop;
    In Proc. SeSens 2002,
    Veldhoven, The Netherlands, STW, pp. 627-630, Nov. 2002. ISBN 90-73461-33-2.

  1789. Wafer-Level Chip-Scale Packaging for RF Applications
    A. Polyakov; M. Bartek; J.N. Burghartz;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, STW, pp. 87-90, Nov. 2002. ISBN 90-73461-33-2.

  1790. Calibration of Process parameters for Boron Post-Implant Transient Enhanced Diffusion (TED)
    J. Fu; W. Crans; W.J. Eijsenga;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, Nov. 2002.

  1791. TCAD Investigation of Vertical SiGe Base HBT with Lateral Collector Contact on Thin SOI
    B. D'Isanto; S. Mijalkovic; N. Rinaldi; J.N. Burghartz;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, Nov. 2002.

  1792. Optimization of Ground Shield Patterning for Spiral Inductors in Integrated Circuits
    L. Rossi; B. Rejaei; J.N. Burghartz;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, Nov. 2002.

  1793. Fluorescence Measurements in Thick-Film Polymer Wells
    B.L. Gray; V.P. Iordanov; R. van den Doel; P.M. Sarro; A. Bossche;
    In Proc. SeSens 2002,
    Veldhoven, The Netherlands, STW, pp. 622-626, Nov. 2002. ISBN 90-73461-33-2.

  1794. Spin, Spray and Eloctroplating of Photoresist for MEMS Structures: A Comparison
    N.P. Pham; E. Boellaard; P.M. Sarro; J.N. Burghartz;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, STW, pp. 81-86, Nov. 2002. ISBN 90-73461-33-2.

  1795. Analysis of Chip-Size Antennas on Lossy Substrates for Short-Range Wireless Micro Systems
    P. Mendes; J.H. Correia; M. Bartek; J.N. Burghartz;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, STW, pp. 51-54, Nov. 2002. ISBN 90-73461-33-2.

  1796. Modeling and Analysis of Substrate Coupling in Silicon Integrated Circuits
    S.M. Sinaga; M. Bartek; J.N. Burghartz;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, STW, pp. 704-707, Nov. 2002. ISBN 90-73461-33-2.

  1797. CV-Doping Profiling of Shallow Junctions with an abrupt and Highly Doped Arsenic Doped Epilayer
    Ch.J. Ortiz; L.K. Nanver; T.L.M. Scholtes; J.W. Slotboom;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, STW, pp. 75-80, Nov. 2002. ISBN 90-73461-33-2.

  1798. VDMOS and LDMOS Transistors for RF-power Applications
    N. Nenadovic; V. Cuoco; V. Alessandro; S.J.C.H. Theeuwen; L.K. Nanver; H.F.F. Jos; J.W. Slotboom;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, STW, pp. 61-68, Nov. 2002. ISBN 90-73461-33-2.

  1799. A 1.8 GHz Integrated LNA using a Novel RF Si Technology
    F.M. De Paola; L.C.N. de Vreede; L. Nanver; B. Rejaei; N. Rinaldi; J.N. Burghartz;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, STW, pp. 30-34, Nov. 2002. ISBN 90-73461-33-2.

  1800. Integrated Transmission Lines on High Resistivity Silicon Considering Biasing Effects
    N. Bhargava Baratula; S. Farris; B. Rejaei; S. Colpo; J.N. Burghartz;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, STW, pp. 5-8, Nov. 2002. ISBN 90-73461-33-2.

  1801. Verification of the IMD Behavior of the Smoothie Database Model for FET Devices
    V. Cuoco; M.P. van der Heijden; M. Pelk; L.C.N. de Vreede;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, STW, pp. 14-21, Nov. 2002. ISBN 90-73461-33-2.

  1802. Parameter Extraction for Electro-Thermal Modeling of Bipolar Transistors
    F. Tamigi; S. Mijalkovic; N. Rinaldi; H.C. de Graaff; J.N. Burghartz;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, STW, pp. 112-116, Nov. 2002. ISBN 90-73461-33-2.

  1803. Thinning of Micromachined Wafers for High-Density, Through-Wafer Interconnects
    L. Wang; C.C.G. Visser; C. de Boer; M. Laros; W. van der Vlist; J. Groeneweg; G. Craciun; P.M. Sarro;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, STW, pp. 121-126, Nov. 2002. ISBN 90-73461-33-2.

  1804. Power Amplifier Optimization for Mobile Application by Second Harmonic Control
    M. Spirito; L.N.C. de Vreede; L.K. Nanver; S. Weber; J.N. Burghartz;
    In Proc. ProRISC 2002,
    Veldhoven, The Netherlands, pp. 471-475, Nov. 2002.

  1805. Microstrips with Micro-patterned Ni78Fe22 Ferromagnetic Film for RF Passives
    Y. Zhuang; M. Vroubel; B. Rejaei; E. Boellaard; J.N. Burghartz;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, pp. 136-140, Nov. 2002.

  1806. Design of Planar Mar.and Balun for MMIC Applications
    E. Valletta; L.C.N. de Vreede; J.N. Burghartz;
    In Proc. SAFE 2002,
    Veldhoven, The Netherlands, STW, Nov. 2002. ISBN 90-73461-33-2.

  1807. DIMES: a success story of microelectronics research, education and industry cooperation
    C.I.M. Beenakker;
    In Proc. International Conference on Microelectronics and Nanotechnology,
    Beijing, China, pp. 11-15, Sep. 2002.

  1808. Planar Antiresonant Reflecting Optical Waveguides as Sensors for Liquid Substances
    R. Bernini; S. Campopiano; L. Zeni; C. de Boer; P.M. Sarro;
    In Proc. IEEE Sensors 2002,
    Orlando, Florida, USA, pp. 13.4/1-13.4/4, Jun. 2002. ISBN 0-7803-7455-X.

  1809. High-performance Silicon-On-Glass VDMOS transistor for RF-power applications
    N. Nenadovic; V. Cuoco; M.P. van der Heijden; L.K. Nanver; J.W. Slotboom; S.J.C.H. Theeuwen; H.F. Jos;
    In Proc. ESSDERC 2002,
    Firenze, Italy, University of Bologna, pp. 379-382, Sep. 2002. ISBN 88-900847-8-2.

  1810. Single-crystalline Si thin film transistors with electron cyclotron resonance plasma enhanced chemical vapor deposited gate SiO2
    R. Ishihara; Y. Hiroshima; D. Abe; B.D. van Dijk; P.Ch. van der Wilt; S. Higashi; S. Inoue; T. Shimoda; J.W. Metselaar; C.I.M. Beenakker;
    In Proc. Eurodisplay 2002,
    Nice, France, pp. 407-409, Oct. 2002. ISBN 2-9507804-3-1.

  1811. Single-Crystalline Si TFTs Fabricated with Micro-Czochralski (grain-filter) process
    R. Ishihara; B.D. van Dijk; P.Ch. van der Wilt; J.W. Metselaar; C.I.M. Beenakker;
    In Y.B. Kim; I.G. Kang (Ed.), Proc. 2nd International Meeting on Information Display,
    Daegu, Korea, pp. 159-162, Aug. 2002. ISSN 1598-3196.

  1812. Through-Wafer Copper Electroplating for RF Silicon Technology
    N.T. Nguyen; K. Ng; E. Boellaard; N.P. Pham; G. Craciun; P.M. Sarro; J.N. Burghartz;
    In Proc. ESSDERC 2002,
    Firenze, Italy, University of Bologna, pp. 255-258, Sep. 2002. ISBN 88-900847-8-2.

  1813. Dynamic characteristics of single grain silicon TFTs
    F. Yan; N. Bavidge; P. Migliorato; R. Ishihara;
    In Proc. 202nd Meeting of the Electrochemical Societey, Thin Film Transistor Technologies VI,
    pp. 75-81, 2002.

  1814. The Effect on Non-Saturated Electron Drift Velocity on Bipolar Device Linearity
    L.C.N. de Vreede; H.C. de Graaff; B. Rejeai;
    In Proc. 2002 IEEE BCTM,
    Monterey, CA, USA, pp. 88-91, Sep. 2002. ISBN 0-7803-7562-9.

  1815. QUBiC4G: A fT/fmax=70/100GHz 0.25µm Low Power SiGe-BiCMOS Production Technology with High Quality Passives for 12.5Gb/s Optical Networking and ...
    P. Deixler; et al;
    In Proc. 2002 IEEE BCTM,
    Monterey, CA, USA, pp. 201-204, Sept. 2002. ISBN 0-7803-7562-9.

  1816. Location-control of large grains by micro-Czochralski (grain filter) process and its application to single-crystalline silicon thin-film transistors
    R. Ishihara; P.C. van der Wilt; B.D. van Dijk; J.W. Metselaar; C.I.M. Beenakker;
    In Proc. 202nd Meeting of the Electrochemical Societey, Thin Film Transistor Technologies VI,
    pp. 63-74, 2002.

  1817. Power Amplifier PAE and Ruggedness Optimization by Second Harmonic Control
    M. Spirito; L.C.N. de Vreede; L.K. Nanver; S. Weber; J.N. Burghartz;
    In Proc. 2002 IEEE BCTM,
    Monterey, CA, USA, pp. 173-176, Sept. 2002. ISBN 0-7803-7562-9.

  1818. Integration of expanding thermal plasma deposited hydrogen amorphous silicon in solar cells
    B.A. Korevaar; C. Smit; A.M.H.N. Petit; R.A.C.M.M. van Swaaij; M.C.M. van de Sanden;
    In D. Cohen, et al. (Ed.), MRS Proc. Amorphous and Heterogeneous Silicon-based Films,
    San Francisco, CA, pp. 595, 2002. ISBN 1-55899-651-6.

  1819. Waferstepper Alignment for MEMS Applications using Diffraction Gratings
    H.W. van Zeijl; K. Simon; J. Slabbekoorn; W. van Buel; C.Q. Gui;
    In R.P. Manginell et al. (Ed.), MRS Symposium Proc,
    San Francisco, CA, pp. 235-240, Apr. 2002. ISBN 1-55899-665-6.

  1820. Mechanical Reliability of Silicon Wafers with Through-Wafer Vias for Wafer-Level Packaging
    A. Polyakov; M. Bartek; J.N. Burghartz;
    In F. Fantini; M. Vanzi (Ed.), Proc. 13th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis,
    Bellaria (Rimini), Italy, Oct. 2002. ISBN 0-08-044181-5.

  1821. CMOS-Compatible Optical Filter for High-Throughput Enzymatic-Analysis Devices
    V.P. Iordanov; R. Ishihara; P.M. Sarro; J. Bastemeijer; A. Bossche; M.J. Vellekoop;
    In IEEE Sensors 2002,
    Hyatt Orlando, Orlando, Florida, USA, pp. 9.6/1-9.6/4, Jun. 2002. ISBN 0-7803-7455-X.

  1822. Fabrication of Crystalline Membranes Oriented in the (111) plane in a (100) Silicon Wafer
    W.J. Venstra; P.M. Sarro;
    In Micro- and NanoEngineering 2002 International Conference,
    Lugano, Switzerland, pp. 226-227, Sep. 2002.

  1823. Integration of Expanding Thermal Plasma deposited hydrogenated amorphous silicon in solar cells
    B.A. Korevaar;
    In Mater. Res. Soc. Symp. Proc. 715, 595,
    2002.

  1824. Metal free Germanium Induced Crystallization of a-Si on glass
    A. Akhavan; L. Rezaee; S. Mohajerzadeh; J. Derakhshandeh;
    In MRS,
    2002.

  1825. Electronic baseline-suppression for liquid conductivity detection in a capillary electrophoresis microchip
    F. Laugere; J. Bastemeijer; G. van der Steen; M.J. Vellekoop; P.M. Sarro; A. Bossche;
    In IEEE Sensors 2002,
    Hyatt Orlando, Orlando, Florida, USA, pp. 20.3/1-20.3/4, Jun. 2002. ISBN 0-7803-7455-X.

  1826. Self-adjustment of optical interconnects using in-package MEMS-based actuators
    K.J. van Nielen; W.J. Venstra; M. M. Tichem. Laros; P.M. Sarro; B. Karpuschewski;
    In Eurosensors XVI - Part 2,
    Prague, Czech Republic, Czech Technical University, pp. 457-458, Sep. 2002. ISBN 80-01-02576-4.

  1827. Electrical characteristics of plasma enhanced chemical vapor deposition silicon carbide thin films
    H.T.M. Pham; T. Akkaya; C.R. de Boer; P.M. Sarro;
    In Fourth European Conference on Silicon Carbide and Related Materials (ECSCRM 2002),
    Linkoping, Sweden, Sep. 2002.

  1828. Experimental Verification of the Smoothie Database Model for Third and Fifth Order Intermodulation Distortion
    V. Cuoco; M.P. van d. Heijden; M. Pelk; L.C.N. de Vreede;
    In ESSDERC 2002,
    Firenze, Italy, University of Bologna, pp. 635-638, Sep. 2002. ISBN 88-900847-8-2.

  1829. Implementation of an isothermal non-linear device characterization system using the ICCAP program
    V. Cuoco; M. Pelk; M.P. van d. Heijden; M. de Kok; L.N.C. de Vreede;
    In European IC-CAP Workhop,
    Berlin, Germany, Mar. 2002.

  1830. Low temperature Germanium Induced Crystallization of silicon in the presence of electric current
    J. Derakhshandeh; N. Golshani; S. Mohajerzadeh;
    In EMRS,
    2002.

  1831. Laser Annealing for Ultra-shallow Junction Formation in Advanced CMOS
    R. Surdeanu; et al;
    In Electrochemical Society 201st Meeting,
    Philadelphia, PA, May 2002.

  1832. High-rate microcrystalline silicon for solar cells produced with an expanding thermal plasma
    C. Smit; B.A. Korevaar; A.M.H.N. Petit; R.A.C.M.M. van Swaaij; M.C.M. van de Sanden;
    In 29th IEEE Photovoltaic Specialists Conference,
    New Orleans, USA, pp. 1170-1173, May 2002.

  1833. Effect of buffer layers on p-i-n a-Si:H solar cells deposited at high rate utilising an expanding thermal plasma
    B.A. Korevaar; A.M.H.N. Petit; C. Smit; R.A.C.M.M. van Swaaij; M.C.M. van de Sanden;
    In 29th IEEE Photovoltaic Specialists Conference,
    New Orleans, USA, pp. 1230-1233, May 2002.

  1834. Analyzing the defect density of states of intrinsic a-Si:H layers with Q-DLTS
    J.J.G. van den Heuvel; M. Zeman;
    In Book of Abstracts, The 1st aSiNet workshop and *th Euroregional Workshop on ThSilicon Devices,
    Salerno, Italy, pp. 19, Mar. 2002.

  1835. Analytical formulation and electrical measurements of self-heating in silicon BJTs
    N. Nenadovic; V. ]Alessandro; L.K. Nanver; N. Rinaldi; H. Schellevis; J.W. Slotboom;
    In BCTM 2002,
    Monterey, CA, USA, pp. 24-27, Sept. 2002. ISBN 0-7803-7562-9.

  1836. Comparative study of the degradation kinetics of a-Si:H p-i-n solar cells made from hydrogen diluted and pure silane
    G. Munyeme; J.J.G. van den Heuvel; R.E.I. Schropp; M. Zeman; F. van der Weg;
    In Book of Abstracts, The 1st aSiNet workshop and *th Euroregional Workshop on ThSilicon Devices,
    Salerno, Italy, pp. 26, Mar. 2002.

  1837. A novel vertical DMOS transistor in SOA technology for RF power applications
    N. Nenadovic; V. Cuoco; S.J.C.H. Theeuwen; L.K. Nanver; H.F.F. Jos; J.W. Slotboom;
    In 23rd International Conference on Microelectronics,
    Nis, Yugoslavia, pp. 159-162, May, 2002 2002. ISBN 0-7803-7235-2.

  1838. Experimental Investigation and Modeling of Light Scattering in a-Si:H Solar Cells Deposited on Glass/ZnO:Al Substrates
    J. Krc; M. Zeman; O. Kluth; F. Smole; M. Topic;
    In J.R. Abelson; e.a. (Ed.), Proc. MRS: Amorphous and Heterogeneous Silicon-Based Films-2002,
    San Francisco, CA, pp. A13.3.1-6, Apr. 2002.

  1839. High-rate microcrystalline silicon for solar cells
    C. Smit; B.A. Korevaar; A.M.H.N. Petit; R. A. C. M.M. van Swaaij; M.C.M. van de Sanden;
    In 1st aSiNet workshop,
    Salerno, Italy, 2002.
    document

  1840. Integrated Coulter counter with non-coaxial sheath-flow and dynamic aperture control
    J.H. Nieuwenhuis; J. Bastemeijer; P.M. Sarro; M.J. Vellekoop;
    In J. Saneistr; P. Ripka (Ed.), Eurosensors XVI - Part 1,
    Prague, Czech Republic, Czech Technical University, pp. 699-700, Sep. 2002. ISBN 80-01-02576-4.

  1841. The smoothie data base model for the correct modeling of non-linear distortion in FET devices
    V. Cuoco; M.P. van d. Heijden; L.C.N. de Vreede;
    In 2002 IEEE MTT-S International Microwave Symposium,
    Seattle, USA, pp. 2149-2152, Jun. 2002. ISBN 0-7803-7239-5.

  1842. In-situ doped PECVD SiC for surface micromachined devices
    H.T.M. Pham; C.R. de Boer; L.S. Pakula; P.M. Sarro;
    In J. Saneistr; P. Ripka (Ed.), Eurosensors XVI - Part 1,
    Prague, Czech Republic, Czech Technical University, pp. 119-120, Sep. 2002. ISBN 80-01-02576-4.

  1843. Direct spray coating of photoresist - a new method for patterning 3-D structures
    N.P. Pham; T.L.M. Scholtes; R. Klerks; E. Boellaard; P.M. Sarro; J.N. Burghartz;
    In J. Saneistr; P. Ripka (Ed.), Eurosensors XVI - Part 1,
    Prague, Czech Republic, Czech Technical University, pp. 89-90, Sep. 2002. ISBN 80-01-02576-4.

  1844. Mechanical Reliability of Micromachined Silicon Wafers with Deep Rectangular Recesses and Via-Hole Fences
    A. Polyakov; M. Bartek; J.N. Burghartz;
    In Eurosensors XVI - Part 2,
    Prague, Czech Republic, Czech Technical University, pp. 255-256, Sep. 2002. ISBN 80-01-02576-4.

  1845. Realization of High Aspect Ratio Interconnections Based on Macroporous Silicon
    A. Nichelatti; T. Nguyen; P.M. Sarro;
    In J. Saneistr; P. Ripka (Ed.), Eurosensors XVI - Part 1,
    Prague, Czech Republic, Czech Technical University, pp. 97-98, Sep. 2002. ISBN 80-01-02576-4.

  1846. The Effect of Mechanical Stress on Bipolar transistor Characteristics
    J.F. Creemer;
    PhD thesis, Delft University of Technology, Jan. 2002. ISBN 90-5166-883-X; Promotors: prof. P.J. French, prof. S. Middelhoek.

  1847. Fused silicon devices
    M.R. van den Berg;
    PhD thesis, Delft University of Technology, Oct. 2002. ISBN 90-9016141-4; Promotors: prof. J.W. Slotboom, prof. L.K. Nanver.

  1848. Novel contacts and diodes for advanced silicon technology
    Q. Ren;
    PhD thesis, Delft University of Technology, Jun. 2002. ISBN 90-9015824-3; promotors: Prof.dr.ir. J.W. Slotboom, Prof.dr. L.K. Nanver.

  1849. Nov.el contacts and diodes for advanced silicon technology
    Q.W. Ren;
    PhD thesis, Delft University of Technology, Jun. 2002. ISBN 90-9015824-3; Promotors: prof. J.W. Slotboom, prof. L.K. Nanver.

  1850. The inverse SiGe heterojunction bipolar transistors
    L.C.M. van den Oever;
    PhD thesis, Delft University of Technology, Mar. 2002. ISBN 90-9015612-7; Promotors: prof. J.W. Slotboom, prof. L.K. Nanver.

  1851. Electrical characterization of c-Si TFTs fabricated by location-controlled laser crystallization
    B.D. van Dijk;
    PhD thesis, Delft University of Technology, Nov. 2002. ISBN 90-9016338-7; Promotor: prof. C.I.M. Beenakker.

  1852. Improved compact modeling of output conductance and cutoff frequency of bipolar transistors
    J.C.J. Paasschens; W.J. Kloosterman; R.J. Havens; H.C. de Graaff;
    IEEE J. Solid-State Circuits,
    Volume 36, Issue 9, pp. 1390-1398, Sept. 2001.

  1853. A Combined TEM and Time-Resolved Optical Reflectivity Investigation Into The Excimer-Laser Crystallization of a-Si Films
    F. Voogt; R. Ishihara;
    Thin Solid Films,
    Volume 383, pp. 45-47, 2001.

  1854. Effect of Front and Back Contact Roughness on Optical Properties of Single Junction a-Si:H Solar Cells
    M. Zeman; R.A.C.M.M. van Swaaij; M. Zuiddam; J.W. Metselaar; R.E.I. Schropp;
    Solar Energy Materials and Solar Cells,
    Volume 66, Issue 1-4, pp. 353-359, 2001.

  1855. Molecular-hydrogen interaction with a-SiC (100)3x2 and c(4x2) surfaces and with Si atomic lines
    V. Derycke; P. Fonteneau; N.P. Pham; P. Soukiassian;
    Physical Review B,
    Volume 63, Issue 20, pp. 201305/1-201305, May 2001. ISSN 0163-1829.

  1856. Combinatorial fabrication process for a-Si:H thin film transistors
    H. Aiyer; and R. Maruyama; H. Shinno; N. Matsuki; K. Miyazaki; H. Fujioka; H. Koinuma;
    Jpn. J. Appl. Phys,
    Volume 40, Issue 1A/B, pp. L81-L83, Jan. 2001.

  1857. Epitaxy and device behaviour of collector-up SiGe HBTs with a partial p-type collector
    L.C.M. van den Oever; L.K. Nanver; T.L.M. Scholtes; H.W. van Zeijl; W. van Noort; Q.W. Ren; J.W. Slotboom;
    Solid-State Electronics,
    Volume 45, Issue 11, pp. 1899-1904, 2001. ISBN: 0038-1101.

  1858. Introduction to the 2000 bipolar/BiCMOS circuits and technology meeting
    L.C.N. de Vreede;
    IEEE J. Solid-State Circuits,
    Volume 36, Issue 9, pp. 1371-1372, Sept. 2001.

  1859. Structural and electronic properties of ZnSe/AlAs heterostructures
    S. Rubini; E. Milocco; L. Sorba; E. Pelucchi; A. Franciosi; A. Garulli; A. Parisini; Y. Zhuang; G. Bauer;
    Physical Review B,
    Volume 63, Issue 15, pp. 155312, 2001.

  1860. GID study of strains in Si due to patterned SiO2
    A. Daniel; V. Holy; Y. Zhuang; T. Roch; J. Grenzer; Z. Bochnicek; G. Bauer;
    Journal of Physics D (Applied Physics),
    Volume 34, Issue 10, pp. 197-202, 2001.

  1861. Diffusion of single quantum well Si1-xGex/Si layers under vacancy supersaturation
    M. Griglione; T.J. Anderson; M.E. Law; K.S. Jones; A. van den Bogaard; M. Puga-Lambers;
    Journal of Applied Physics,
    Volume 89, Issue 5, pp. 2904-2906, Mar. 2001. ISSN 0021-8979.

  1862. Spatial effects on ideality factor of amorphous silicon pin diodes
    M.A. Kroon; R.A.C.M.M. van Swaaij;
    J. Appl. Phys.,
    Volume 90, Issue 2, pp. 994, 2001.

  1863. Status and Trends of Silicon RF Technology
    J.N. Burghartz;
    Microelectronics Reliability,
    Volume 41, Issue 1, pp. 13-19, Jan. 2001.

  1864. Structure of thin polycrystalline silicon films on ceramic substrates
    A.J.M.M. van Zutphen; P. Zutta; F.D. Tichelaar; A. von Keitz; M. Zeman; J.W. Metselaar;
    Journal of Crystal Growth,
    Volume 223, pp. 332-340, 2001.

  1865. Thin photodiodes for a neutron scintillator silicon-well detector
    C.P. Allier; R.W. Hollander; C.W.E. van Eijk; P.M. Sarro; M. de Boer; J.B. Czirr; J.P. Chaminade; C. Fouassier;
    IEEE Transactions on Nuclear Science,
    Volume 48, Issue 4, pp. 1154-1157, Aug. 2001.

  1866. Al/Si contacting of ultra-shallow epitaxially grown Si and SiGe junctions
    Q.W. Ren; L.K. Nanver; C.C.G. Visser; J.W. Slotboom;
    Journal of Materials Science: Materials Electronics,
    Volume 12, Issue 4-6, pp. 313-316, Apr. 2001. ISBN 0957-4522.

  1867. Electrical Detection and Simulation of Stress in Silicon Nitride Spacer Technology
    H.W. van Zeijl; S. Mijalkovic; L.K. Nanver;
    Journal of Material Science: Materials Electronics,
    Volume 12, pp. 339-341, 2001. ISBN: 0957-4522.

  1868. Arsenic-spike epi-layer technology applied to bipolar transistors
    W.D. van Noort; L.K. Nanver; J.W. Slotboom;
    IEEE Tr. Electr. Dev.,
    Volume 48, Issue 11, pp. 2500-2505, 2001.

  1869. A CMOS optical microspectrometer with light-to-frequency converter, bus interface, and stray-light compensation
    J.H. Correia; G. de Graaf; M. Bartek; R.F. Wolffenbuttel;
    IEEE Trans. on Instrumentation and Measurement,
    Volume 50, Issue 6, pp. 1530-1537, Dec. 2001.

  1870. Bulk micromachined electrostatic RMS-to-DC converter
    G. de Graaf; M. Bartek; Z. Xiao; C.J. van Mullem; R.F. Wolffenbuttel;
    IEEE Trans. on Instrumentation and Measurement,
    Volume 50, Issue 6, pp. 1508-1512, Dec. 2001.

  1871. Multi-anode sawtooth SDD for X-ray spectroscopy fabricated on NTD wafers
    J. Sonsky; R.W. Hollander; C.W.E. van Eijk; P.M. Sarro; V. Kouchpil;
    IEEE Trans. on Nuclear Science,
    Volume 48, pp. 258-261, 2001. ISSN 0018-9499.

  1872. IC-compatible two-level bulk micromachining process module for RF silicon technology
    N.P. Pham; P.M. Sarro; K.T. Ng; J.N. Burghartz;
    IEEE Tr. Electron Devices,
    Volume 48, Issue 8, pp. 1756-1764, Aug. 2001.

  1873. Reduction of UHF power transistor distortion with a nonuniform collector doping profile
    W.D. van Noort; H.F.F. Jos; L.C.N. de Vreede; L.K. Nanver; J.W. Slotboom;
    IEEE Journal of Solid-State Circuits,
    Volume 36, Issue 9, pp. 1399-1406, Sept. 2001.

  1874. Hydrogen production from solar light energy by photovoltaic water electrolysis
    T. Ohmori; H. Go; Y. Yamada; N. Matsuki; N. Yamaguchi; A. Nakayama; H. Mametsuka; E. Suzuki;
    Chem. Ind. Chem. Eng. Qualt,
    Volume 7, Issue 4, pp. 535-540, Dec. 2001.

  1875. Integrated silicon microspectrometers
    S.-H. Kong; J.H. Correia; G. de Graaf; M. Bartek; R.F. Wolffenbuttel;
    IEEE Instrumentation & Measurement Magazine,
    Volume 4, Issue 3, pp. 34-38, Sept. 2001.

  1876. Formation of location-controlled crystalline islands using substrate-embedded-seeds in excimer-laser crystallization of silicon films
    P.Ch. van der Wilt; B.D. van Dijk; G.J. Bertens; R. Ishihara; C.I.M. Beenakker;
    Appl. Phys. Lett.,
    Volume 72, Issue 12, pp. 1819, 2001.

  1877. Improved performance of amorphous silicon thin film transistors by cyanide treatment
    H. Aiyer; D. Nishioka; N. Matsuki; H. Shinno; V. P. S. Perera; T. Chikyow; H. Kobayashi; H. Koinuma;
    Appl. Phys. Lett,
    Volume 78, Issue 6, pp. 751-753, Feb. 2001.

  1878. Heterogeneous Nucleation from Molten-Si Induced by Excimer-Laser Melting of Si Thin-Films
    R. Ishihara; F. C. Voogt;
    In Polycrystalline Semiconductors VI - Bulk Materials, Thin Films, and Devices,
    Switzerland, Scitech Publ., 2001.

  1879. Si Based Thin-Film Filter with High Visible-Over-UV Selectivity for Biochemical Fluorescence Analysis
    V.P. Iordanov; G.W. Lubking; R. R. Ishihara; R.F. Wolffenbuttel; P.M. Sarro; M.J. Vellekoop;
    In The 11th Intern. Conf. on Solid-State Sensors and Actuators (Transducers 01),
    Munich, Germany, pp. 1182-1185, Jun. 2001. ISBN 3-540-42150-5.

  1880. Thermophysical Characterisation of PolySi0.7Ge0.3 for Use in Thermoelectric Devices
    D.D.L. Wijngaards; S.H. Kong; P.M. Sarro; R.F. Wolffenbuttel;
    In The 11th International Conference on Solid-State Sensors and Actuators (Transducers 01),
    Munich, Germany, pp. 1010-1013, Jun. 2001. ISBN 3-540-42150-5.
    document

  1881. Experimental verification of an improved method for conductivity detection in on-chip capillary electrophoresis systems
    F. Laugere; A. Berthold; et al;
    In The 11th Intern. Conf. on Solid-State Sensors and Actuators (Transducers 01),
    Munich, Germany, pp. 1178-1181, Jun. 2001. ISBN 3-540-42150-5.
    document

  1882. Technology of reflective membranes for spatial light modulators
    S. Sakarya; G.Vdovin; P.M. Sarro;
    In The 11th Intern. Conf. on Solid-State Sensors and Actuators (Transducers 01),
    Munich, Germany, pp. 1336-1339, Jun. 2001. ISBN 3-540-42150-5.
    document

  1883. Permeability and Resonance Frequency of Patterned Magnetic Thin Films
    M. Vroubel; B. Rejaei; Y. Zhuang; J.N. Burghartz;
    In SAFE 2001,
    Veldhoven, The Netherlands, pp. 1-5, Nov. 2001.

  1884. Linearity optimization of a distributed base station amplifier using an automated high-speed measurement protocol
    M.P. van der Heijden; J.R. Gajadharsing; B. Rejaei; L.C.N. de Vreede;
    In B. Sigmon (Ed.), 2001 IEEE MTT-S International Microwave Symposium,
    Phoenix, AZ, USA, pp. 1679-1682, May 2001. ISBN: 0-7803-6538-0.
    document

  1885. Modelling and analysis of light scattering in a-Si:H based PIN solar cells with rough interfaces
    J. Krc; M. Zeman; M. Topic; F. Smole; J.W. Metselaar;
    In PVSEC-12 conf.,
    Cheju Island, Korea, pp. 253-254, Jun. 2001. ISSN 1598-2173.
    document

  1886. Optimization of Microstrip Transmission Lines on Silicon
    S. Colpo; B. Rejaei; N. Rinaldi; J.N. Burghartz;
    In SAFE 2001,
    Veldhoven, The Netherlands, pp. 20-23, Nov. 2001.
    document

  1887. Design of optimised RF integrated inductors
    J. Sieiro; B. Rejaei; J. Cabanillas; J.M. Lopez-Villegas; J.N.Burghartz;
    In SAFE 2001,
    Veldhoven, The Netherlands, pp. 178-181, Nov. 2001.
    document

  1888. Power Amplifier PAE and Ruggedness Optimization by Second Harmonic Control
    M. Spirito; L.N.C. de Vreede; L.K. Nanver; S. Weber; J.N. Burghartz;
    In ProRISC 2001,
    Veldhoven, The Netherlands, pp. 623-629, Nov. 2001.
    document

  1889. A Single Chip 1.8 GHz LNA and Power Amplifier with Improved Isolation Using Micromachining
    F.M. De Paola; L.C.N de Vreede; L.K. Nanver; B. Rajaei; N.P. Pham; N. Rinaldi; J.N. Burghartz;
    In SAFE 2001,
    Veldhoven, The Netherlands, pp. 35-41, Nov. 2001.

  1890. Isothermal Non-Linear Device Characterization
    V. Cuoco; M. de Kok; M.P. van d. Heijden; L.C.N. de Vreede;
    In ProRISC 2001,
    Veldhoven, The Netherlands, pp. 338-341, Nov. 2001.
    document

  1891. Direct Spray Coating of Photoresist for MEMS applications
    N.P.Pham; T.M.L.Scholtes; R.Klerk; B.Wieder; P.M. Sarro; J.N.Burghartz;
    In Proceedings of the SPIE,
    San Fransisco, USA, pp. 312-319, Oct. 2001. ISBN 0-8194-4285-2.
    document

  1892. Temperature Optical Sensor based on all silicon Bimodal Waveguide
    G. Coppola; C. R. de Boer; G. Breglio; M. Iodice; A. Irace; P. M. Sarro;
    In Proceedings of SESENS 2001,
    Veldhoven, The Netherlands, pp. 777-782, 2001. ISBN 90-73461-29-4.
    document

  1893. Evaluation of In-Situ Doped PECVD SiC Thin Films for Surface Micromachining
    H.T.M. Pham; C.R. de Boer; C. Kwakernaak; W.G. Sloof; P.M. Sarro;
    In Proceedings of SESENS 2001,
    Veldhoven, The Netherlands, pp. 856-860, 2001. ISBN 90-73461-29-4.
    document

  1894. A novel frequency independent third-order intermodulation distortion cancellation technique for BJT amplifiers
    M.P. van der Heijden; H.C. de Graaff.; L.C.N. de Vreede;
    In Proceedings of the 2001 Bipolar/BiCMOS Circuits and Technology Meeting,
    Minneapolis, MN, USA, pp. 163-166, Sept. 2001. ISBN 0-7803-7019-8.
    document

  1895. Dry Etching Release of Structures in Post-Process Surface Micromachining using Polyimide as a Sacrificial Layer
    A. Bagolini; H.T.M. Pham; T.L.M. Scholtes; L. Pakula; P.M. Sarro;
    In Proceedings of SESENS 2001,
    Veldhoven, The Netherlands, pp. 769-772, 2001. ISBN 90-73461-29-4.
    document

  1896. Analysis of Dual-Beam Photoconductivity Measurements on Light-Soaked a-Si:H Material
    J.J.G. van den Heuvel; C.S. Kartha; M. Zeman; J.W. Metselaar;
    In Proceedings of SAFE 2001,
    Veldhoven, The Netherlands, pp. 66-71, Nov. 2001. ISBN 90-73461-29-4.
    document

  1897. High Quality Hydrogenated Amorphous Silicon-Germanium Alloys for Grading Purposes at the Intrinsic Layer Tandem Solar Cells
    D. Tahir; R.A.C.M.M. van Swaaij;
    In Proceedings of SAFE 2001,
    Veldhoven, The Netherlands, pp. 191-194, Nov. 2001. ISBN 90-73461-29-4.
    document

  1898. High temperature CVD deposition of thin polycrystalline silicon layers
    A. Petit; M. Zeman;
    In Proceedings of SAFE 2001,
    Veldhoven, The Netherlands, pp. 150-153, Nov. 2001. ISBN: 90-73461-29-4.
    document

  1899. Fast deposition of microcrystalline silicon with an expanding thermal plasma
    C. E. Smit.A.G. Hamers; B.A. Korevaar; R.A.C.M.M. van Swaaij; M.C.M. van de Sanden;
    In Proceedings of SAFE 2001,
    Veldhoven, The Netherlands, pp. 182-185, Nov. 2001. ISBN 90-73461-29-4.
    document

  1900. Shallow trench insulation for SiGe heterojunction bipolar transistors with 25 0e epitaxial base
    H.W. van Zeijl; L.K. Nanver;
    In Proceedings of SAFE 2001,
    Veldhoven, The Netherlands, pp. 224-228, 2001. ISBN: 90-73461-29-4.
    document

  1901. Optoelectronic Modulator Realized by a Fully Compatible Bipolar Process
    G. Coppola; C.R. de Boer; G. Breglio; A. Irace; P. M. Sarro;
    In Proceedings of SAFE 2001,
    Veldhoven, The Netherlands, pp. 24-29, 2001. ISBN 90-73461-29-4.

  1902. Optical Modeling of a-Si:H Thin Film Solar Cells with Rough Interfaces
    H.P. Pillai; J. Krc; M. Zeman;
    In Proceedings of SAFE 2001,
    Veldhoven, The Netherlands, pp. 159-162, Nov. 2001. ISBN 90-73461-29-4.
    document

  1903. Wafer Thinning for Highly Dense 3D Electronic Structures
    L. Wang; P.M. Sarro;
    In Proceedings of SAFE 2001,
    Veldhoven, The Netherlands, pp. 214-219, 2001. ISBN 90-73461-29-4.
    document

  1904. Electrothermal characterization of NPNs fabricated in a backwafer contacted silicon-on-glass integrated bipolar process
    N. Nenadovic; L.K. Nanver; H. H. SchellevisW. van Zeijl; J.W. Slotboom;
    In Proceedings of SAFE 2001,
    Veldhoven, The Netherlands, pp. 123-131, 2001. ISBN: 90-73461-29-4.
    document

  1905. Through-wafer Copper plug formation for 3-dimensional ICs
    T.Nguyen Nhu; E Boellard; N.P.Pham; V.G.Kutchukov; G.Craciun; P.M. Sarro;
    In Proceedings of SAFE 2001,
    Veldhoven, The Netherlands, pp. 141-144, 2001. ISBN 90-73461-29-4.

  1906. RF-devices realised in MEMS by using electrodepositable photoresist
    E. Boellaard; P.N. Pham; L.D.M. van den Brekel; J.N. Burghartz;
    In Proceedings of SAFE 2001,
    Veldhoven, The Netherlands, 2001. ISBN 90-73461-28-6.

  1907. Through-wafer copper electroplating for 3-D interconnects
    N.T.Nguyen; E. Boellaard; N.P.Pham; G.Craciun; V.G.Kutchoukov; P.M. Sarro;
    In M.Hill; B.Lane (Ed.), Proceedings MME 2001,
    Cork-Ireland, pp. 74-77, Sept. 2001.

  1908. Spray coating of AZ4562 photoresist for MEMS applications
    N.P.Pham; P.M. Sarro; J.N.Burghartz;
    In Proceedings of SAFE 2001,
    Veldhoven, The Netherlands, 2001. ISBN 90-73461-28-6.

  1909. Excimer-Laser Lateral Crystallization Scenario of Silicon Thin Films by Phase-Field Modelling
    A. Burtsev; M. Apel; R. Ishihara;
    In Proceeding for 4th Annual Workshop on Semiconductor Advances for Future Electronics (SAFE),
    Veldhoven, pp. 8-12, 2001.
    document

  1910. Investigation and modelling of light scattering properties of a-Si:H solar cells
    J. Krc; M. Zeman; M. Topic; F. Smole;
    In Proceedings MIDEM conference,
    Slovenia, pp. 219-224, Oct., 2001 2001.
    document

  1911. Optical Properties of a-Si:H-Based Solar Cells with Rough Interfaces
    J. Krc; M. Zeman; M. Topic; F. Smole; J.W. Metselaar;
    In B. McNelis; W. Palz; H.A. Ossenbrink; P. Helm (Ed.), Proc. 17th European Photovoltaic Solar Energy Conference,
    Munich, Germany, pp. 2865-2868, Oct. 2001. ISBN 3-936338-07-8.
    document

  1912. Technology for Spatial Light Modulators based on Reflective Silicon Structures
    S. Sakarya; G.Vdovin; P.M. Sarro;
    In Proc. Sensor Technology Conference,
    The Netherlands, pp. 25-30, 2001.
    document

  1913. Experimental and simulation studies of the effect of the buffer layer on long-term stability of p-i-n a-Si:H solar cells
    G. Munyeme; R.E.I. Schropp; M. Zeman; J.K. Rath; W.F. van der Weg;
    In B. McNelis; W. Palz; H.A. Ossenbrink; P. Helm (Ed.), Proc. 17th European Photovoltaic Solar Energy Conf.,
    Munich, Germany, pp. 3035-3038, Oct. 2001. ISBN 3-936338-07-8.
    document

  1914. Flexible silicon micromachined structures for use in integrated spatial light modulators
    S. Sakarya; G. Vdovin; P.M. Sarro;
    In Proc. SeSens 2001,
    Veldhoven, The Netherlands, STW, pp. 861-864, Nov., 2001 2001. ISBN 90-73461-?.
    document

  1915. Micromachined Si-well scintillator pixel sensors for thermal neutron detection
    C.P. Allier; R.W. Hollander; C.W.E. van Eijk; M. de Boer; J.G.E. Gardeniers; P.M. Sarro; J.B. Czirr;
    In M. Elwenspoek (Ed.), Proc. Sensor Technology Conf,
    Enschede, The Netherlands, pp. 191-196, May 2001. ISBN 0-7923-7012-0.
    document

  1916. Study of Magnetic On-chip Inductors
    Y. Zhuang; B. Rejaei; E. Boellaard; M. Vroubel; J.N. Burghartz;
    In Proc. SAFE 2001,
    Veldhoven, The Netherlands, pp. 229-233, 2001.
    document

  1917. An Investigation into Mechanical Strength of Silicon Wafers with Bulk-Micromachined Structures
    A. Polyakov; M. Bartek; J.N. Burghartz;
    In Proc. SAFE 2001,
    Veldhoven, The Netherlands, pp. 163-166, Nov. 2001. ISBN 90-73461-29-4.
    document

  1918. Properties of a Poly-Si Film Grown from a Grid of Grain Filters by Excimer-Laser Crystallization
    P.Ch. van der Wilt; B.D. van Dijk; G.J. Bertens; R. Ishihara;
    In Proc. SAFE 2001,
    Veldhoven, The Netherlands, pp. 1-8, Nov. 2001.
    document

  1919. Yield improvement in High-Frequency BJT with Self-Aligned Metallization
    H.W. van Zeijl; L.K. Nanver;
    In Proc. of SAFE 99,
    Mierlo, pp. 607-610, 2001. ISBN 90-73461-18-9.

  1920. Optimized Geometrical Features of Monolithic Spiral RF Transformers on Silicon
    K.T. Ng; B. Rejaei; N.O. Ormando; J.N. Burghartz;
    In Proc. SAFE 2001,
    pp. 132-135, Nov. 2001.
    document

  1921. Design of 200 GHz SiGe HBTs
    L.C.M. van den Oever; L.K. Nanver; J.W. Slotboom;
    In Proc. 2001 Bipolar/BiCMOS Circuits and Technology Meeting,
    pp. 78-81, Sept. 2001. ISBN 0-7803-7019-8.

  1922. Ultra shallow boron base profile with carbon implantation
    Magnee; P.H.C.; Kemmeren; A.L.A.M.; Cowern; N.E.B.; J.W. Slotboom; R.J. Havens; Huizing; H.G.A;
    In Proc. of the 2001 Bipolar/BiCMOS Circuits and Technology Meeting,
    pp. 64-67, 2001.
    document

  1923. Polyimide sacrificial layer for post-processing surface micromachining
    A. Bagolini; T.L.M. Scholtes; H.T.M. Pham; L. Pakula; P.M. Sarro;
    In M.Hill; B.Lane (Ed.), Proc. MME 2001,
    Cork, Ireland, pp. 58-61, Sept. 2001.

  1924. Integrated high rejection filter for NADH fluorescence measurements
    V.P. Iordanov; G.W. Lubking; P.M. Sarro; R.F. Wolffenbuttel; M.J. Vellekoop;
    In Proc. Sensor2001,
    Nurnberg, Germany, May 2001.

  1925. A Micromachining Post-Process Module with Pattern Transfer in Deep Cavities for RF Silicon Technology
    N.P. Pham; P.M. Sarro; K. Ng; J.N. Burghartz;
    In Proc. MEMS 2001,
    Interlaken, Switzerland, pp. 345-348, Jan. 2001. ISBN 0-7803-5998-4.

  1926. Influence of deposition parameters and temperature on stress and strain of in-situ doped PECVD Silicon carbide
    H.T.M. Pham; C.R. de Boer; L. Pakula; P.M. Sarro;
    In S. Yoshida et al. (Ed.), Proc. International Conference on Silicon Carbide and Related Materials 2001 (ICSCRM2001),
    Tsukuba, Japan, pp. 759-762, Oct. 2001. ISBN 0-87849-X.

  1927. Effects of Grain-Boundaries in Excimer-Laser Crystallized Poly-Si Thin-Film Transistors
    R. Ishihara;
    In Proc. 31st Euro. Solid State Device Res. Conf.,
    Nuremberg, Germany, pp. 479-482, Sep. 2001.

  1928. Integrated Hartmann-Shack wavefront sensor
    D.W. de Lima Monteiro; A. Vilaca; G. Vdovin; M. Loktev; P.M. Sarro;
    In Proc. 3rd Adaptive optics conference for Industry and Medicine,
    Albuquerque, USA, pp. 179-183, 2001.

  1929. A Robust Implementation of Stress Governing Equations for Next Generation Process Simulators
    S. Mijalkovic; W. Crans;
    In Proc. 2nd International Conference on Benefiting from Thermal and Mechanical Simulations (Micro)-Electronics,
    Paris, Europia Publications, pp. 303-307, Apr. 2001. ISBN 0-7803-9806-8.

  1930. Varying Characteristics of Bipolar Transistors with Emitter Contact Window Width
    J. Fu; S. Mijalkovic; W.J. Eysenga; H.W. van Zeijl; W. Crans;
    In Proc. 2001 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 01),
    Athens, Sep. 2001. ISBN 3-211-83708-6.

  1931. Front- to back-wafer overlay accuracy in substrate transfer technologies
    H.W. van Zeijl; J. Slabbekoorn;
    In M. Yang, The Electrochemical Society, Inc. (Ed.), Proc. 1st International Conference on Semiconductor Technology ISTC2001, Proc,
    Shanghai, China, pp. 356-367, 2001. ISBN: 1-56677-324-5..

  1932. Modelling of Optical Properties of Quantum Wire Laser in InGaAs/InP
    D. Gvozdic; A. Schlahetzki; N. Nenadovic;
    In Proc. 11th International Workshop on Physics of Semiconductor Devices,
    Delhi, pp. 317-325, Dec. 2001.

  1933. Mechanical and structural properties of in-situ doped PECVD SiC layers for post-processing surface micromachining
    H.T.M. Pham; C.R. de Boer; C. Kwakernaak; W.G. Sloof; P.M. Sarro;
    In Proc of SPIE Micromachining and Microfabrication,
    San Francisco, CA, pp. 272-279, 2001. ISBN 0-8194-4285-2.

  1934. Measurement and fabrication of sub-monolayer As and P concentrations on Si 100
    W.D. van Noort; C. Nieuwenhuizen; Q.W. Ren; L.K. Nanver; J.W. Slotboom;
    In Poster presentation 7th European Conference on Surface Crystallography and Dynamics,
    Leiden, The Netherlands, Aug. 2001.

  1935. Effect of annealing on mechanical and optical properties of in-situ doped sic thin films
    H.T.M. Pham; C.R. de Boer; C.C.G. P. Visser.M. Sarro;
    In Proc of SPIE International Symposium on Optoelectronics and Microelectronics,
    Nanjing, China, pp. 59-66, 2001. ISBN 0-8194-4340-9.

  1936. Importance of defect density near the p-i interface for a-Si:H solar cell performance
    B.A. Korevaar; C. Smit; R.A.C.M.M. van Swaaij; D.C. Schram; M.C.M. van de Sanden;
    In Mater. Res. Soc. Symp. Proc.,
    2001.

  1937. Design and Optimization of Monolithic RF Transformers on Silicon
    K.T. Ng; B. Rejaei; N.O. Ormando; J.N. Burghartz;
    In IEEE European Microwave Conference,
    pp. 121-124, Sep. 2001. ISBN 0-86213-148-0.

  1938. Advanced Excimer-Laser Crystallization Techniques of Si Thin-Film for Location Control of Large Grain on Glass
    R. Ishihara; P.Ch. van der Wilt; B.D. van Dijk; A. Burtsev; F.C. Voogt; G.J. Bertens; J.W. Metselaar; C.I.M. Beenakker;
    In Proc. SPIE Flat Panel Display Technology and Display Metrology II,
    pp. 14-23, 2001.

  1939. Integrated Optical and Electrical modeling of a-Si:H based solar cells
    M. Zeman; R.A.C.M.M. van Swaaij; J. van den Heuvel; J.W. Metselaar;
    In Mater. Res. Soc. Symp. Proc.,
    2001.

  1940. Base current tuning in SiGe HBTs by SiGe in the emitter
    Huizing; H.G.A.; Klootwijk; J.H.; Aksen; E.; J.W. Slotboom;
    In IEDM 2001,
    Washington DC, USA, pp. 40.5.1 -40.5.4, Dec. 2001.

  1941. Ground Pattern for Improved Characteristics of Spiral RF Transformers on Silicon
    K.T. Ng; B. Rejaei; J.N. Burghartz;
    In IEEE Topical Meeting on Silicon Monolithic Integrated Circuits RF Systems,
    Ann Arbor, Michigan, USA, pp. 75-78, Sep. 2001.

  1942. Concentric Ring Model of Monolithically Integrated Circuilar Spiral Transformers
    B. Rejeai; N. Ormando; J.N. Burghartz;
    In European Microwave Conference,
    Londen, pp. 193-196, 2001.

  1943. Thermal issues in a backwafer contacted silicon-on-glass integrated bipolar process
    N. Nenadovic; L.K. Nanver; H. H. SchellevisW. van Zeijl; J.W. Slotboom;
    In G.E. Ponchak (Ed.), 2001 Topical Meeting on Silicon Monolithic Integrated Circuits RF Systems,
    Ann Arbor, MI, USA, pp. 114-121, Sep. 2001. ISBN 0-7803-7129-1.
    document

  1944. Isothermal Large Signal Device Characterization
    V. Cuoco; M. de Kok; M.P. van d. Heijden; L.C.N. de Vreede;
    In ARFTG Conference,
    San Diego, Nov. 2001.

  1945. Integrated RF passive components - discrete vs. distributed
    J.N. Burghartz; K.T. Ng; N.P. Pham; B. Rejaei; P.M. Sarro;
    In Device Research Conference,
    pp. 113-114, 2001.
    document

  1946. Material properties and growth process of microcrystalline silicon with growth rates in excess of 1 nm/s
    E.A.G. Hamers; A.H.M. Smets; C. Smit; J.P.M. Hoefnagels; W.M.M. Kessels; M.C.M. van de Sanden;
    In J.B. Joyce; J.D. Cohen; R. Collins; et al. (Ed.), Proc. MRS: Amorphous and Heterogeneous Silicon-Based Films 2001,
    San Francisco, pp. A4.2.1-6, 2001.

  1947. A Novel Method for Characterizing RF Automated Tuners
    M. Spirito; P. Valk; R. Mohmoudi; M. de Kok; J.L. Tauritz;
    In ARFTG Conference,
    San Diego, Nov. 2001.
    document

  1948. Study of Crystal Growth in Grain-Filters for Location-Controlled Excimer-Laser Crystallization
    P.C. van der Wilt; B.D. van Dijk; G.J. Bertens; R. Ishihara;
    In Advanced Materials and Devices for Large-Area Electronics (Mat. Res. Soc. Proc.),
    2001.

  1949. Mechanical stability and handling-induced failure of micromachined wafers for RF applications
    A. Polyakov; M. Bartek; J.N. Burghartz;
    In 2001 Topical Meeting on Silicon Monolithic Integrated Circuits RF Systems, Digest of Papers,
    Ann Arbor, Michigan, USA, pp. 102-109, Sep. 2001. ISBN 0-7803-7129-1.

  1950. Single-Crystal Thin Film Transistor by Grain-Filter Location-Controlled Excimer-Laser Crystallization
    B.D. van Dijk; P.Ch. van der Wilt; G.J. Bertens; L.K. Nanver; R. Ishihara;
    In Advanced Materials and Devices for Large-Area Electronics (Mat. Res. Soc. Proc.),
    2001.

  1951. Parameter Calibration for dopant Post-implant Diffusions
    J. Fu; W.J. Eysenga; W. Crans;
    In 4th Sem. Advances for Fut. Electronics (4th SAFE) Workshop,
    Veldhoven, The Netherlands, Nov 2001, pp. 52-57, 2001. ISBN: 90-73461-29-4.

  1952. Tailoring logic CMOS for RF applications
    J.N. Burghartz;
    In 2001 International Symposium on VLSI Technology, Systems, and Applications,
    pp. 150-153, 2001.

  1953. Ultra-linear distributed class-AB LDMOS RF power amplifier for base stations
    M.P. van der Heijden; H.C. de Graaff; L.C.N. de Vreede R. Gajadharsing; J.N. Burghartz;
    In Bernard Sigmon (Ed.), 2001 IEEE MTT-S International Microwave Symposium Digest,
    pp. 1363-1366, May 2001. ISBN: 0-7803-6538-0.

  1954. Buffer layers for improving the cell performance of hydrogenated amorphous silicon solar cells deposited with an expanding thermal plasma
    B.A. Korevaar; C. Smit; R.A.C.M.M. van Swaaij; D.C. Schram; M.C.M. van de Sanden;
    In MRS 2001 Spring Meeting,
    San Francisco, USA, Apr. 2001.

  1955. Signal Sensor for RF Integrated Systems
    Joachim N. Burghartz;
    Patent No. US 6,177,806, Jan. 2001.

  1956. Bipolar transistors with an arsenic spike epi layer: technology and characterization
    W.D. van Noort;
    PhD thesis, Delft University of Technology, Oct. 2001. ISBN 90-9015229-6; Promotors: prof. J.W. Slotboom, dr. L.K. Nanver.

  1957. Low-temperature wafer-to-wafer bonding for microchemical systems
    A. Berthold;
    PhD thesis, Delft University of Technology, Feb. 2001. ISBN 90-75095-78-3; Promotors: prof. C.I.M. Beenakker, dr. P.M. Sarro.

  1958. Optical and structural properties of Si/SiGe wires grown on patterned Si substrates
    Y. Zhuang; A. Daniel; C. Schelling; F. Sch�ffler; G. Bauer; J. Grenzer; S. Senz;
    Thin Solid films,
    Volume 380, pp. 51, 2000.

  1959. Structural and optical properties of Si/Si1-x Gex wires
    Y. ZC. Huang Schelling; J. Stangl; C. Penn; S. Senz; F. Sch�ffler; A. Daniel; U. Pietsch; G. Bauer;
    Thin Solid films,
    Volume 369, pp. 409, 2000.

  1960. Defect related photoluminescence of SiGe/Si heterostructures grown by APCVD
    J.L. L. ShiK. Nanver; K. Grimm; C.C.G. Visser;
    Thin Solid Films,
    Volume 364, pp. 254-258, 2000.

  1961. Silicon carbide as a new MEMS technology
    P.M. Sarro;
    Sensors and Actuators A,
    Volume 82, pp. 210-218, 2000. ISSN 0924-4247.

  1962. Spectral analysis through electromechanical coupling
    E. Cretu; M. Bartek; R.F. Wolffenbuttel;
    Sensors and Actuators A,
    Volume 85, Issue 1-3, pp. 23-32, 2000. ISSN 0924-4247.

  1963. Effect of Surfactant on Surface Quality of Silicon Microstructures Etched in Saturated TMAHW Solutions
    P.M. Sarro; D. Brida; W. van der Vlist; S. Brida;
    Sensors and Actuators A,
    Volume 85, pp. 340-345, 2000. ISSN 0924-4247.

  1964. Glass-to-glass anodic bonding with standard IC technology thin films as intermediate layers
    A. Berthold; L. Nicola; P.M. Sarro; M.J. Vellekoop;
    Sensors and Actuators A,
    Volume 82, Issue 1-3, pp. 224-228, 2000.

  1965. Design and fabrication of infrared detector arrays for satellite attitude control
    A.W. van Herwaarden; F.G. van Herwaarden; S.A. Molenaar; E.J.G. Goudena; M. Laros; P.M. Sarro; C.A. Schot; W. van der Vlist; L. Blarre; J.P. Krebs;
    Sensors and Actuators A,
    Volume 83, pp. 101-108, 2000.

  1966. Single-chip CMOS optical microspectrometer
    J.H. Correia; G. de Graaf; S.H. Kong; M. Bartek; R.F. Wolffenbuttel;
    Sensors and Actuators A,
    Volume 82, Issue 1-3, pp. 191-197, 2000. ISSN 0924-4247.

  1967. Ultraviolet-selective avalanche photodiode
    A. Pauchard; P.-A. Besse; M. Bartek; R.F. Wolffenbuttel; R.S. Popovic;
    Sensors and Actuators A,
    Volume 82, Issue 1-3, pp. 128-134, 2000. ISSN 0924-4247.

  1968. Strong effects of weak localization in charge-density-wave/normal-metal hybrids
    M.K. Visscher; B.Rejaei; G.E.W. Bauer;
    Physical Review B,
    Volume 62, Issue 11, Sept. 2000.

  1969. Fabrication of gate-oxide thin-film transistors using PECVD/PLD multichamber system
    N. Matsuki; J. Ohta; H. Fujioka; M. Oshima; M. Yoshimoto; H. Koinuma;
    Sci. Tech. Adv. Mat,
    Volume 1, Issue 1, pp. 187-190, Mar. 2000.

  1970. Kinetics of light-induced degradation in a-Si:H films investigated by computer modeling
    M.N. Meytin; M. Zeman; B.G. Budaguan; J.W. Metselaar;
    Semiconductors,
    Volume 34, pp. 742-747, 2000.

  1971. Micro-CAT with redundant electrodes (CATER)
    F.D. van den Berg; C.W.E. van Eijk; R.W. Hollander; P.M. Sarro;
    Nuclear Instruments and Methods Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment,
    Volume 453, Issue 3, pp. 530-535, Oct. 2000.

  1972. In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction
    Y. Zhuang; V. Hol_; J. Stangl; N. Darowski; J. Grenzer; U. Pietsch; S. Zerlauth; F. Schaffler; G. Bauer;
    Physica B,,
    Volume 283, Issue 130, 2000.

  1973. Optical Modeling of a-Si:H Solar Cells: Effect of Back Contact and Interface Roughness
    M. Zeman; R.A.C.M.M. van Swaaij; J.W. Metselaar; R.E.I. Schropp;
    Journal of Applied Physics,
    Volume 88, Issue 11, pp. 6436-6443, Dec. 2000.

  1974. Location-Control of Large Si Grains by Dual-Beam Excimer-Laser and Thick Oxide Portion
    R. Ishihara; A. Burtsev; P. F. A. Alkemade;
    Jpn. Journal of Applied Physics,
    Volume 39, pp. 3872-3878, 2000. ISSN 0021-4922.

  1975. Powder formation in germane-silane plasmas
    R.A.C.M.M. van Swaaij; B.S. Girwar; J.W. Metselaar;
    J. Vac. Sci. Technol. A.,
    Volume 18, Issue 5, pp. 2116, 2000.

  1976. ZnSe/CdTe/ZnSe heterostructures
    S. Rubini; B. Bonanni; E. Pelucchi; A. Franciosi; A. Garulli; A. Parisini; Y. Zhuang; G. Bauer; V. Holy;
    J. Vac. Sci. Technol. (B),
    Volume 18, Issue 4, pp. 2263, 2000.

  1977. Defect re-distribution in amorphous silicon below equilibration temperature
    R.A.C.M.M. van Swaaij; V. N�dazdy; M. Zeman; E. Pinc�k; J.W. Metselaar;
    Journal of Non-Crystalline Solids,
    Volume 266-269, pp. 553-557, 2000.

  1978. Scintillation light read-out by low-gain thin avalanche photodiodes in silicon wells
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  1979. Control of Arsenic Doping during Low-Temperature CVD Epitaxy of Silicon (100)
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  1980. RF potential of a 0.18 µm CMOS Logic Device Technology
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  1981. High-selectivity single-chip spectrometer in silicon for operation in visible part of the spectrum
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  1982. X-ray Detection With Multi-anode Sawtooth Silicon Drift Detectors
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  1983. A better insight into the performance of silicon BJTs featuring highly nonuniform collector doping profiles
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  1984. Self-organized 1D nanostructures on the b-SiC(100) surface: silicon atomic lines and dimer vacancy chains
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  1985. Investigation of beta -SiC precipitation in Si/sub 1-y/C/sub y/ epilayers by X-ray scattering at grazing incidence
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  1986. Silicon drift detector with reduced lateral diffusion: experimental results
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  1987. 7781af6e4ower added efficiency surface-mounted bipolar power transistors for low-voltage wireless applications
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  1988. Enlargement of Location Controlled Si Grain by Dual-Beam Excimer-Laser Melting with Bump Structure
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  1989. Scintillation light read-out by thin photodiodes in silicon wells
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  1990. Challenges in amorphous silicon solar cell technology
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  1991. Influence of the plasma pretreatment of GaAs(100) and Si(100) surfaces on the optical and structural properties of Si3N4/GaAs and a-SiGe/Si interfaces
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  1992. Quo vadis microelectronics?
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  1993. Spread Spectrum Communication System Perfor-mance Optimization Based on Collector Epilayer Engineering
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  1994. Low-loss small cross-section silicon-on-silicon rib waveguides with high-confining ion-implanted lower cladding
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  1995. A Micromachining Post-Process Module for RF Silicon Technology
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  1996. Bulk-micromachined electrostatic RMS-to-DC converter: Design and fabrication
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  1997. A low-cost BiCMOS process with metal gates
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  1998. Infrared Thermal Imaging of SiNx membranes
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  1999. Direct Mextram Parameter Computation Based on Transistor Layout and Doping Profile
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  2000. Fluorescence analysis in subnanoliter reactor wells: evaluation of different possible illumination configurations
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  2001. Technology of reflective micromachined pixelated membranes for use in spatial light modulators
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  2002. A High Speed Measurement Protocol for Optimizing Amplifier Linearity
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  2003. Reduction of distorsion with a non-uniform BJT collector doping profile
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  2004. Transport mechanisms of a polysilicon emitter bipolar transistor with 8 nm gate oxide between emitter and base
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    In Proceedings of the 30th ESSDERC,
    Cork, Ireland, pp. 612-615, Sept. 2000.

  2005. High efficiency HF power amplifiers with integrated transformer feedback
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    pp. 285-292, 2000. ISBN 90-73461-24-3.

  2006. A Bipolar Structure with a Tunnelling Emitter
    M.R. van den Berg; L.K. Nanver; C.R. de Boer; C.C.G. Visser; J.W. Slotboom;
    In Proceedings SAFE 2000,
    Veldhoven, pp. 11-14, 2000.

  2007. Analysis of the emitter charge storage in SiGe heterojunction bipolar transistors with a lightly doped emitter
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    In Proceedings of the 30th ESSDERC,
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  2008. Temperature dependence at various intrinsic a-Si:H growth rates of p-i-n deposited solar cells
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    In Proceedings of the 28th IEEE-PVSC,
    Anchorage, Alaska, pp. 916, Sep. 2000.

  2009. Performance dependence on grading width of a-SiGe:H component solar cells
    R.A.C.M.M. van Swaaij; M. Zeman; S. Arnoult; J. W. Metselaar;
    In Proceedings of the 28th IEEE-PVSC,
    Anchorage, Alaska, pp. 869, Sep. 2000.

  2010. Reduction of UHF power distortion with a non-uniform collector doping profile
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    In Proceedings of the 2000 BCTM,
    Minneapolis, Minnesota, Sept 24-26, 2000, pp. 126-129, 2000. ISBN 0-7803-6384-1/-X/-8.

  2011. Al/Si contacting of ultra-shallow epitaxially grown Si and SiGe junctions
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    In Proceedings 3rd Int. Conf. on Materials for Micro-electronics,
    Dublin, Ireland, pp. 97-100, Oct., 2000 2000.

  2012. Effect of ionizing and neutron radiation on SiGe HBTs
    J. Basak; A.T. Mahfooz; A. Mitra; V. Pangracious; J. Vasi; L. Nanver; A.M. Shaikh;
    In Proceedings Int. Conf. on Communications, Computers and Devices (ICCCD-2000),
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  2013. Multisensing in Subnanoliters High-Speed Screning (HSS) Arrays
    M.J. Vellekoop; K.T. Hjelt; G.W. Lubking; J. Bastermeijer; P.M. Sarro; et al;
    In Proc. XIV Eurosensors Conf.,
    Copenhagen, Denmark, pp. 39-42, Aug. 2000. ISBN 87-89935-50-0.

  2014. Micromachined membrane deformable mirrors for space applications
    G. Vdovin; P.M. Sarro; S. Manhart; Z. Sodnik;
    In Proc. XIV Eurosensors Conf.,
    Copenhagen, Denmark, pp. 559-560, Aug. 2000.

  2015. Integrated shape sensor for particles and cells based on optical projection
    J.H. Nieuwenhuis; G.W. Lubking; A. Berthold; P.M. Sarro; M.J. Vellekoop;
    In Proc. XIV Eurosensors Conf.,
    Copenhagen, Denmark, pp. 891-894, Aug. 2000.

  2016. Two-step glass-etching for microfluidic devices
    A. Berthold; P.M. Sarro; M.J. Vellekoop;
    In Proc. SeSens 2000 workshop,
    Veldhoven, pp. 613-616, Dec. 2000.

  2017. Front- to backwafer alignment, overlay and wafer distortion in substrate transfer technologies
    H.W. van Zeijl; J. Slabbekoorn; L.K. Nanver; P.W.L. van Dijk; T. Machielsen;
    In Proc. SAFE,
    Veldhoven, pp. 163-167, 2000.

  2018. Reflective 2D pixelated membranes for micromachined spatial light modulators
    S. Sakarya; G. Vdovin; P.M. Sarro;
    In Proc. XIV Eurosensors Conf.,
    Copenhagen, Denmark, pp. 333-336, Aug. 2000. ISBN 87-89935-50-0.

  2019. Current transport in the ultra-shallow abrupt Si and SiGe diodes
    Q.W. Ren; L.K. Nanver; J.W. Slotboom;
    In Proc. SAFE 2000,
    Veldhoven, The Netherlands, pp. 113-118, Nov. 2000.

  2020. Energy Density Window for Location-Controlled Si Grains by Dual-Beam Excimer-Laser
    A. Burtsev; R. Ishihara;
    In Proc. SAFE 2000,
    Veldhoven, 29 november-1 december, pp. 15-22, 2000. ISBN 90-73461-24-3.

  2021. A novel micromachining process using pattern transfer over large topography for RF components
    N.P. Pham; P.M. Sarro; K.T. Ng; R. Behzad; J.N. Burghartz;
    In Proc. SAFE,
    Veldhoven, pp. 125-128, 2000. ISBN 90-73461-24-3.

  2022. Temperature-Gradient Driven Directional Solidification of Si thin-film by Excimer-Laser Melting
    R. Ishihara;
    In Proc. of The Int. Workshop on Active-Matrix Liquid-Crystal Displays - TFT Technologies and Related Materials,
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  2023. Integrated Transmission Lines on High-Resistivity Silicon: Coplanar Waveguides or Microstrips?
    B. Rejaei; K.T. Ng; C. Floerkemeier; N.P. Pham; L.K. Nanver; J.N. Burghartz;
    In Proc. of ESSDERC 2000,
    Cork, Ireland, pp. 460-463, Sept. 2000. ISBN 2-86332-248-6.

  2024. Processing window for location-controlled Si grains by dual-beam excimer-laser
    A. Burtsev; R. Ishihara;
    In Proc. SAFE 2000,
    Veldhoven, The Netherlands, 2000.

  2025. Improved modeling of Output Conductance and Cut-off Frequency of Bipolar Transistors
    J.C.J. Paasschens; W.J. Kloosterman; R.J. Havens; H.C. de Graaff;
    In Proc. IEEE BCTM,
    Minneapolis, pp. 62-65, Sept. 25-27 2000.

  2026. Effects of Grain-Boundaries on Excimer-Laser Crystallized Poly-Si Thin-Film Transistors
    R. Ishihara;
    In Proc. International Workshop on Active-Matrix Liquid-Crystal Displays - TFT Technologies and Related Materials,
    Tokyo, Japan, pp. 259-260, Jul. 2000.

  2027. A Sub-Surface Metallization Post-Process IC Module for RF Technology
    K.T. Ng; N.P. Pham; B. Rejaei; P.M. Sarro; J.N. Burghartz;
    In Proc. of IEEE BCTM,
    Minneapolis, pp. 195-198, Sept. 25-27 2000. ISBN 0-7803-6384-1.

  2028. IC-compatible Two-level Bulk Micromachining for RF Silicon Technology
    N.P. Pham; P.M. Sarro; K.T. Ng; J.N. Burghartz;
    In Proc. ESSDERC,
    Cork, Ireland, pp. 204-207, Sept. 2000. ISBN 2-86332-248-6.

  2029. Infrared Micro-Spectrometer Based on a Diffraction Grating
    S.H. Kong; D.D.L. Wijngaards; M. Bartek; R.F. Wolffenbuttel;
    In R. de Reus; S. Bouwstra (Ed.), Proc. Eurosensors XIV,
    Copenhagen, Denmark, pp. 321-324, Aug., 2000 2000. ISBN 87-89935-50-0.

  2030. Mechanical integrity failure of bulk-micromachined Si wafers: Influence of structure geometry and wafer handling
    M. Bartek;
    In Proc. ASDAM 2000,
    Smolenice Castle, Slovakia, pp. 227-230, Oct. 2000. ISBN 0-7803-5939-9.

  2031. The Influence of Mechanical Stresses on the Characteristics of Bipolar Transistors
    J. Fu; S. Mijalkovic; W. Eijsenga; H.W. van Zeijl; W. Crans;
    In Proc. 3rd Workshop on Semiconductor Advances for Future Electronics,
    Veldhoven, pp. 79-85, 2000.

  2032. A Mixed Level Simulator for the Large Signal Optimization of LDMOS Devices
    V. Cuoco; M.P. van der Heijden; S. Mijalkovic; N. Rinaldi; H.C. de Graaff; L.C.N. de Vreede;
    In Proc. 3rd Workshop on Semiconductor Advances for Future Electronics,
    Veldhoven, pp. 42-47, 2000.

  2033. IC-compatible process for pattern transfer in deep wells for integration of RF components
    N.P.Pham; P.M. Sarro; J.N.Burghartz;
    In J.M.Karam; Y.Yasitis (Ed.), Proc of SPIE Micromachining and Microfabrication Process Technology VI,
    Santa Clara, pp. 390-397, Sept. 2000. ISSN 0277-786X.

  2034. Electrical and Physical Properties of Polysilicon Film Resistors Modified by Excimer Laser Annealing
    F.M. Soares; M.R. van den Berg; L.K. Nanver; C.C.G. Visser; K. Grimm; J.W. Slotboom;
    In Proc. 3rd Int. Conf. on Materials for Microelectronics,
    Ireland, pp. 235-238, Oct. 2000.

  2035. I-V characteristics of a-Si:H p-i-n diodes with uniform and non-uniform defect distributions
    M.A. Kroon; R.A.C.M.M. van Swaaij; J.W. Metselaar;
    In Mater. Res. Soc. Symp. Proc.,
    2000.

  2036. Electrical detection and simulation of stress in silicon nitride spacer technology
    H.W. van Zeijl; S. Mijalkovic; L.K. Nanver;
    In Proc. 3rd Int. Conf. on Materials for Microelectronics,
    Dublin, Ireland, pp. 231-234, Oct. 2000. ISBN 1-86125-129-7.

  2037. Investigation of inhomogeneous in-plane strain relaxation in Si/SiGe quantum wires by high resolution x-ray diffraction
    Y. ZC. Huang Schelling; T. Roch; A. Daniel; F. Schaffler; G. Bauer; J. Grenzer; U. Pietsch; S. Senz;
    In Mat. Res. Soc. Symp. Proc.,
    pp. 207, 2000.

  2038. Location Control of Laterally Columnar Si Grains by Dual-Beam Excimer-Laser Melting of Si Thin-Film
    R. Ishihara;
    In Proc. Mat. Res. Soc.: Electron-Emissive Materials, Vacuum Microelectronics and Flat-Panel Displays,
    2000.

  2039. Characterization of a Bullk-Micromachined Post-Process Module for Silicon RF Technology
    K.T. Ng; N.P. Pham; P.M. Sarro; B. Rejaei Salmassi; J.N. Burghartz;
    In IEEE topical meeting on Silicon Monolithic integrated Circuits RF systems,
    pp. 99-102, Apr. 2000.

  2040. Annealing experiments on supercritical Si[1-x]Ge[x] layers grown by RPCVD
    K. Grimm; L. Vescan; C.C.G. Visser; L.K. Nanver; H. Lueth;
    In Materials Science and Engineering,
    pp. 261-265, 2000. ISSN 0921-5107.

  2041. Analysis of Generic Spiral-Coil RF Transformers on Silicon
    K.T. Ng et al;
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    pp. 103-107, Apr. 2000.

  2042. Modelling and Characterization of HF Large-signal Device Operation
    L.C.N. de Vreede;
    In Europractice workshop High Speed Devices and Circuits for Analog Applications Beyond 3 GHz,
    Germany, Feb. 2000.

  2043. On the reliability of SiGe microwave power heterojunction bipolar transistor
    Jinshu Zhang; Pei-Hsin Tsien; Peiyi Chen; L.K. Nanver; J.W. Slotboom;
    In 2000 IEEE Hong Kong Electron Devices Meeting,
    pp. 90-93, 2000.

  2044. SixGe1-x island formation by post-growth anneal on supercritical layers grown by RPCVD
    K. Grimm; L. Vescan; L. Nanver; C.C.G. Visser; H. Lueth;
    In Abstracts of Spring MRS Meeting,
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  2045. Low Noise p-channel JFETs for X-ray Spectroscopy with Silicon Drift Detectors
    J. Sonsky; R. Koornneef; J. Huizenga; L. Nanver; G.W. Lubking; R.W. Hollander; C.W.E. van Eijk;
    In 2000 IEEE NSS-MIC,
    Lyon, France, pp. 109, Oct. 2000.

  2046. Metal/silicon Schottky barrier lowering by RTCVD interface passivation
    Q.W. Ren; W. van Noort; L.K. Nanver; J.W. Slotboom;
    In 197th Meeting of the Electrochemical Society,
    Toronto, Canada, pp. 161-166, May 2000.

  2047. Thin-Film Silicon Solar Cells on Ceramic Substrates
    A.J.M.M. van Zutphen; M. Zeman; J.W. Metselaar; A. von Keitz; C.J.J. Tool; G. Beaucarne; J. Poortmans;
    In H. Scheer; e.a. (Ed.), 16th Europ. Photovoltaic Solar Energy Conf.,
    Glasgow, UK, 2000. ISBN 1 902916 19 0.

  2048. Location-Controlled Large-Grains in Near-Agglomeration Excimer-Laser Crystallized Silicon Films
    P.C. van der Wilt; R. Ishihara; J. Bertens;
    In Proc. Mat. Res. Soc.: Electron-Emissive Materials, Vacuum Microelectronics and Flat-Panel Displays,
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  2049. Sensitivity of optical constants to the spectral absorption in a-Si:H solar cells
    J. Daey Ouwens; M. Zeman; J. Loeffler; R.E.I. Schropp;
    In H. Scheer; e.a. (Ed.), 16th European Photovoltaic Solar Energy Conference,
    Glasgow, UK, 2000. ISBN 1 902916 19 0.

  2050. Solar cells with intrinsic a-Si:H deposited at tates larger than 5 ̅/s by the expanding thermal plasma
    B. A. Korevaar; C. Smit; R.A.C.M.M. van Swaaij; A. H. M. Smets; W. M. M. Kessels; J. W. Metselaar; D. C. Schram; M. C. M. van de Sanden;
    In H. Scheer; e.a. (Ed.), 16th Europ. Photovoltaic Solar Energy Conf.,
    Glasgow, UK, 2000. ISBN 1 902916 19 0.

  2051. A-C:H antireflection coatings for a-Si:H solar cells
    R.U.A. Khan; R.A.C.M.M. van Swaaij; A. Vonsovici; S.R.P. Silva;
    In H. Scheer; e.a. (Ed.), 16th Europ. Photovoltaic Solar Energy Conf.,
    Glasgow, UK, 2000. ISBN 1 902916 19 0.

  2052. Miniature high-voltage a-Si:H solar cell for integration in micro-electronic devices
    M.A. Kroon; R.A.C.M.M. van Swaaij; J.W. Metselaar;
    In H. Scheer; e.a. (Ed.), 16th Europ. Photovoltaic Solar Energy Conf.,
    Glasgow, UK, 2000. ISBN 1 902916 19 0.

  2053. Challenges in amorphous silicon solar cell technology
    R. van Swaaij; M. Zeman; B. Korevaar; Ch. Smit; W. Metselaar; R. van de Sanden;
    In Solid State Surfaces and Interfaces 2 Conference,
    Bratislava, Slovakia, Jun. 2000.

  2054. Integrated Electrical and Optical modeling of a-Si:H solar cells
    M. Zeman;
    In European Research Conference, Photovoltaic Devices - Thin Film Technology,
    Berlin, Mar. 2000.

  2055. Study of the defect distribution in a-Si:H during degradation
    J. van den Heuvel; M. Zeman; J.W. Metselaar;
    In Proc. of the SAFE/IEEE workshop,
    Mierlo, The Netherlands, pp. 53-59, 2000. ISBN: 90-73461-24-3.

  2056. Integrated Circuit Spiral Inductor
    Joachim N. Burghartz; Daniel C. Edelstein; Christopher V. Jahnes; Cypriian E. Uzoh;
    Patent No. US 6,114,937, Sep 2000.

  2057. Method of Forming an Integrated Circuit Spiral Inductor with Ferromagnetic Liner
    Joachim N. Burghartz; Daniel C. Edelstein; Christopher V. Jahnes; Cyprian E. Uzoh;
    Patent No. US 6,054,329, Apr 2000.

  2058. Measurement of thermal conductivity and diffusivity of single and multilayer membranes
    A. Irace; P.M. Sarro;
    Sensors and Actuators,
    Volume A76, Issue 1-3, pp. 323-328, 1999.

  2059. Bipolar transistor epilayer design using the MAIDS mixed-level simulator
    L.C.N. de Vreede; H.C. de Graaff; Willemen; J.A.; W. van Noort; Jos; R.; Larson; L.E.; J.W. Slotboom; J.L. Tauritz;
    IEEE J. Solid-State Circuits,
    Volume 34, Issue 9, pp. 1331-1338, Sept. 1999.

  2060. In-plane structure of an arsenic-absorbed Si(100) surface probed with grazing-angle x-ray standing wave
    O. Sakata; N. Matsuki; H. Hashizume;
    Phys. Rev. B,
    Volume 60, Issue 23, pp. 15546-15549, Dec. 1999.

  2061. Linking insulator-to-metal transitions at zero finite magnetic fields
    Y. Hanein; N. Nenadovic; D. Shahar; H. Shtrinkman; J. Yoon; C.C. Li; D.C. Tsui;
    Nature,
    Volume 400, pp. 735-737, Aug. 1999.

  2062. The Role of Front and Back Contact Roughness in the Performance Enhancement of Single Junction a-Si:H Solar Cells
    M. Zeman; R.A.C.M.M. van Swaaij; M. Zuiddam; J. W. Metselaar; R. E. I. Schropp;
    Sol. Energy Mater. Sol. Cells,
    Volume 66, 353 (2001), 1999.

  2063. X-ray diffraction from quantum wires and quantum dots
    Y. Zhuang; J. Stangl; A. A. Darhuber; G. Bauer; P. Mikulik; V. Holy; N. Darowski; U. Pietsch;
    Journal of Materials Science: Materials Electronics,
    Volume 10, pp. 215, 1999.

  2064. Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction
    Y. Zhuang; V. Holy; J. Stangl; A.A. Darhuber; P. Mikulik; S. Zerlauth; F. Schaffler; G. Bauer; N. Darowski; D. L�bbert; U. Pietsch;
    Journal of Physics D: Applied Physics,
    Volume 32, pp. 224, 1999.

  2065. New Developments in Amorphous Thin Film Silicon Solar Cells
    R.E.I. Schropp; M. Zeman;
    IEEE Transactions on Electron Devices,
    Volume 46, Issue 10, pp. 2086-2092, Oct. 1999. ISSN 0018-9383.

  2066. CdTe epitaxial layers in ZnSe-based heterostructures
    S. Rubini; B. Bonanni; E. Pelucchi; A. Franciosi; Y. Zhuang; G. Bauer;
    Journal of Crystal Growth,
    Volume 201, pp. 465, 1999.

  2067. Technology and applications of micromachined adaptive mirrors
    G,Vdovin; P.M. Sarro; S.Middelhoek;
    J.Micromech. Microeng.,
    Volume 9, pp. 8-20, 1999. ISSN-0960-1317.

  2068. Measurement of the Switching Speed of Single FETs
    K.A. Jenkins; J.N. Burghartz;
    IEEE Transactions on Electron Devices,
    Volume 45, Issue 6, pp. 1369-1373, 1999.

  2069. Defect re-distribution in amorphous silicon below equilibration temperature
    R.A.C.M.M. van Swaaij; V. N��_da��_dy; M. Zeman; E. Pin��_ik; J.W. Metselaar;
    J. Non-Cryst. Solids,
    Volume 266-269, pp. 553, 1999.

  2070. Device simulation and fabrication of field effect solar cells
    K. Miyazaki; N. Matsuki; H. Shinno; H. Fujioka; M. Oshima; H. Koinuma;
    Bull Mater. Sci,
    Volume 22, Issue 3, pp. 729-733, May 1999.

  2071. Electron confinement in multi-anode saw tooth silicon drift detectors with an anode pitch of 250µm
    J. Sonsky; H.Valk; J.Huizenga; and R.W.Hollander; C.W.E. van Eijk; P.M. Sarro;
    IEEE Trans on Nucl. Science,
    Volume 46, Issue 3, pp. 271-274, 1999. ISSN 0018-9499.

  2072. Thin photodiodes for a scintillator-silicon well detector
    C.P. Allier; R.W. Hollander; P.M. Sarro; C.W.E. van Eijk;
    IEEE Trans. on Nuclear Science,
    Volume 46, Issue 6, pp. 1948-1951, 1999.

  2073. Investigation of periodicity fluctuations in strained (GaNAs)1/(GaAs)m superlattices by the kinematical simulation of X-ray diffraction
    Z. Pan; Y.T. Wang; Y. ZY. Huang. W. Lin; Z.Q. Zhou; L.H. R. LiH. Wu; Q.M. Wang;
    Applied Physics Letter,
    Volume 75, Issue 2, pp. 223, 1999.

  2074. Diminished electron cloud broadening in a silicon drift detector by sawtooth p+ strips
    J. Sonsky; H.Valk; C. P. Allier; R.Hollander; C.W.E. van Eijk; P.M. Sarro;
    IEEE Trans on Nucl. Science,
    Volume 46, Issue 1, pp. 53-58, 1999. ISSN 0018-9499.

  2075. Micromachined RF Passive Components and their Application in MMICs
    Y. Sun; J.L. Tauritz; R.G.F. Baets;
    International Journal of RF and Microwave Computer-Aided Engineering,
    Volume 9, Issue 4, pp. 310-325, Jul. 1999.

  2076. Pulsed laser deposition of photosensitive a-Si films
    S. Yasuda; T. Chikyow; S. Inoue; N. Matsuki; K. Miyazaki; S. Nishio; M. Kakihana; H. Koinuma;
    Appl. Phys. A,
    Volume 69, pp. S925-S927, Dec. 1999.

  2077. Ion Implantation
    L.K. Nanver; E.J.G. Goudena;
    In Wiley Encyclopeadia of Electrical and Electronics Engineering,
    Wiley, 1999. ISBN 0471-13951-3.

  2078. New approaches for wireless systems on silicon
    J.N. Burghartz;
    In Perspectives on Radio Astronomy, Technologies for Large Antenna Arrays,
    NFRA, Dwingeloo, Apr. 1999. ISBN 90-805434-2-X.

  2079. Optimization of Si-Based Circular Spiral Inductors for Use in RFICs
    B. Rejaei; J.L. Tauritz;
    In URSI GA 99,
    Toronto, pp. 236, Aug. 1999.

  2080. One- and two-dimensional CMOS position-sensitive detectors
    D.W. de Lima Monteiro; G.Vdovin; P.M. Sarro;
    In Topical meeting on Adaptive Optics, US Air Force,
    Albuquerque, USA, 1999.

  2081. Status and Trends of Silicon RF Technology
    J. N. Burghartz;
    In ESSDERC 99,
    pp. 56-63, 1999.

  2082. Thermal CVD of film-silicon on ceramic substrates for photovoltaic applications
    A.J.M.M. van Zutphen; A. von Keitz; M. Zeman; J.W. Metselaar;
    In J.H. Werner, H.P. Strunk, H.W. Schock (Ed.), Solid State Phenomena, Proc. Polyse 98,
    Schwabisch Gmund, Germany, pp. 161-166, 1999. ISBN 3-908450-43-8.

  2083. Defect related photoluminescense of SiGe/Si heterostructures grown by APCVD
    J.L. L. ShiK. Nanver; K. Grimm; C.C.G. Visser;
    In The European Materials Conference Spring Meeting,
    Strasbourg, France, Jun. 1999.

  2084. As peaks in Si 100 films fabricated with rapid thermal epitaxy
    W. van Noort; L.K. Nanver; C.C.G. Visser; A. van den Bogaard; J.W. Slotboom;
    In F. Roozeboom; e.a. (Ed.), Symp. Advances Rapid Thermal Processing,
    New Jersey, The Electrochemical Society, pp. 335-342, 1999. ISBN 1-56677-232-X.

  2085. Annealing experiments on supercritical Si1-xGex layers grown by RPCVD
    K. Grimm; L. Vescan; C.C.G. Visser; L.K. Nanver; H. L�th;
    In The European Materials Conference Spring Meeting,
    Strasbourg, France, Jun. 1999.

  2086. Thermal CVD of film-silicon on SiAlON based ceramic substrates
    A.J.M.M. van Zutphen; A. von Keitz; M. Zeman; J.W. Metselaar;
    In Jean Pierre Veen (Ed.), SAFE workshop,
    Mierlo, The Netherlands, STW Technology Foundation, pp. 625-630, Nov. 1999. ISBN 90-73461-18-9.

  2087. Light scattering at rough interfaces of thin film solar cells to improve the efficiency and stability
    R. Schuitema; W. Metselaar; M. Zeman;
    In Jean Pierre Veen (Ed.), SAFE workshop,
    Mierlo, The Netherlands, STW Technology Foundation, pp. 399-404, Nov. 1999. ISBN 90-73461-18-9.

  2088. Analyzing the defect states in a-Si:H with charge deep level transient spectroscopy and the defect pool model
    J. van den Heuvel; M. Zeman; W. Metselaar;
    In Jean Pierre Veen (Ed.), SAFE workshop,
    Mierlo, The Netherlands, STW Technology Foundation, pp. 193-198, Nov. 1999. ISBN 90-73461-18-9.

  2089. Dual-beam Excimer-Laser Induced Si Grain Size Enlargement in an a-Si/Structured SiO2/Metal Stack
    A. Burtsev; R. Ishihara;
    In Jean Pierre Veen (Ed.), SAFE 99,
    Mierlo, The Netherlands, 24, STW Technology Foundation, pp. 665-670, 1999. ISBN 90-73461-18-9.

  2090. Status and trends of silicon RF technology
    J.N. Burghartz;
    In SAFE 99,
    Mierlo, The Netherlands, pp. 1-9, 1999.

  2091. Various layouts of analog CMOS optical position-sensitive detectors
    D.W. de Lima Monteiro; G. Vdovin; P.M. Sarro;
    In Proc. SPIE Materials and Electronics for High-Speed and Infrared Detectors,
    Denver, pp. 134-142, Jul. 1999. ISBN 0-8194-3280-6.

  2092. Micro-injection of b-D-glucose standards and Amplex Red reagent on micro-arrays
    R. Moerman; L.R. van den Doel; S. Picioreanu; J. Frank; J.C.M. Marijnissen; G. van Dedem; K.T. Hjelt; M J Vellekoop; P M Sarro; I.T. Young;
    In Proceedings SPIE,
    San Jose, pp. 119-128, Jan. 1999. ISBN 0-8194-3076-5.

  2093. As peaks in Si 100 films fabricated with rapid thermal epitaxy
    W. van Noort; L.K. Nanver; C.C.G. Visser; A. van den Bogaard; J.W. Slotboom;
    In D.J. Meyer (Ed.), Proceedings of the Second International Epsilon Users Group Meeting: Si1-xGex and Low Temperature Si Epitaxy,
    San Jose, CA, May 1999.

  2094. Fluorescence detection in (sub-)nanoliter microarrays
    L.R. van d. Doel; M.J. Vellekoop; P.M. Sarro; S. Picioreanu; R. Moerman; H. Frank; G. van Dedem; K. Hjelt; L.J. van Vliet; I.T. Young;
    In Proceedings SPIE,
    San Jose, pp. 28-39, Jan. 1999. ISBN 0-8194-3076-5.

  2095. Recent progress in technology and applications of membrane micromachined deformable mirrors
    G. Vdovin; P.M. Sarro;
    In Proc. SPIE High-resolution wavefront control: methods, devices and applications,
    Denver, pp. 2-11, Jul. 1999. ISBN 0-8194-3246-6.

  2096. IC-Compatible Two-level Bulk Micromachining for RF components
    N.P.Pham; K.T. Ng; J.M.W. Laros; T.L.M. Scholtes; P.M. Sarro; J.N. Burghartz;
    In J.P.Veen (Ed.), Proc.SAFE 99,
    Mierlo, The Netherlands, pp. 359-362, 1999. ISBN 90-73461-18-9.

  2097. Thermal Conductivity Measurement on a SiC Thin Film
    A. Irace; P.M. Sarro;
    In Proc. XIII Eurosensors Conf.,
    The Hague, The Netherlands, pp. 809-812, Sept. 1999.

  2098. All-Glass Microstructures for Biochemical Analysis Systems
    A. Berthold; L. Nicola; P.M. Sarro; M.J. Vellekoop; G. Pignatel;
    In Proc. XIII Eurosensors Conf.,
    The Hague, The Netherlands, pp. 975-978, Sept. 1999.

  2099. Technology of Pixelated Flexible Silicon Structures for Spatial Light Modulators
    S. Sakarya; G. Vdovin; P.M. Sarro;
    In Proc. XIII Eurosensors Conf.,
    The Hague, The Netherlands, pp. 737-740, Sept. 1999.

  2100. Piezoelectric ZnO Membrane Resonators for Liquid Property Sensing
    S. Koller; O. Brand; P.M. Sarro; M.J. Vellekoop; H. Baltes;
    In Proc. XIII Eurosensors Conf.,
    The Hague, The Netherlands, pp. 677-680, Sept. 1999.

  2101. Design of Infrared Detector Arrays for Satellite Attitude Control
    A.W. van Herwaarden; F.G. van Herwaarden; S.A. Molenaar; B. Goudena; M. Laros; P.M. Sarro; C.A.Schot; W. van der Vlist; L. Blarre; J.P. Krebs;
    In Proc. XIII Eurosensors Conf.,
    The Hague, The Netherlands, pp. 309-316, Sept. 1999.

  2102. Micromachined SLM based on pixelated reflective membranes
    S. Sakarya; G. Vdovin; P.M. Sarro;
    In Proc. SPIE Conf. on High-Resolution Wavefront Control,
    Denver, USA, pp. 23-31, Jul. 1999.

  2103. Effect of Surfactant on Surface Quality of Silicon Microstructures Etched in Saturated TMAHW Solutions
    P.M. Sarro; D. Brida; W. van der Vlist; G. Pignatel; S.Brida;
    In Proc. XIII Eurosensors Conf.,
    The Hague, The Netherlands, pp. 389-392, Sept. 1999.

  2104. Application of excimer laser annealing in the formation of implanted shallow junctions
    L.K. Nanver; E.J.G. Goudena; Q.W. Ren; M. van den Berg; R.J.M. Mallee; J. Slabbekoorn;
    In Proc. Symposium Advances Rapid Thermal Processing,
    New Jersey, pp. 171-178, 1999. ISBN 1-56677-232-X.

  2105. Comparison of numerical simulations and experimental results on Ridge Wave guide Lasers
    P. Tettelaar; P.J. Harmsma; R.G. Broeke; Y.S. Oei; W. Crans;
    In Proc. Symp. IEEE/LEOS Benelux Chapter,
    Mons, Belgium, pp. 183-186, 1999. 2-9600 2260-0-2.

  2106. Technology of pixelated reflective membranes for spatial light modulators
    S. Sakarya; G.Vdovin; P.M. Sarro;
    In J.P.Veen (Ed.), Proc. SAFE 99,
    Mierlo, The Netherlands, pp. 671-676, 1999. ISBN 90-73461-18-9.

  2107. Performance of Generic Spiral-Coil RF Transformers
    K. T. Ng; B. Rejaei; M. Soyuer; J. N. Burghartz;
    In Proc. SAFE 99,
    pp. 323-327, 1999.

  2108. Position-sensitive detectors for a wavefront sensor
    D.W. de Lima Monteiro; G.Vdovin; P.M. Sarro;
    In J.P.Veen (Ed.), Proc. SAFE 99,
    Mierlo, The Netherlands, pp. 287-294, 1999. ISBN 90-73461-18-9.

  2109. Glass-To-Glass Anodic Bonding
    A.Berthold; L.Nicola; P.M. Sarro; M.J.Vellekoop;
    In J.P.Veen (Ed.), Proc. SAFE 99,
    Mierlo, The Netherlands, pp. 33-36, 1999. ISBN 90-73461-18-9.

  2110. Design and Characterization of Passive RF Structures on Reduced-Thickness Conductor-Backed Substrates
    K.T. Ng; B. Rejaei; N. Pham; J.N. Burghartz;
    In Proc. SAFE 99,
    Mierlo, The Netherlands, pp. 329-331, Nov. 1999. ISBN 90-73461-18-9.

  2111. Modelling of the maximum programming current of anti-fuses
    M.R. van den Berg; V.E. Houtsma;
    In Proc. of SAFE 99,
    Mierlo, pp. 643-648, 1999. ISBN: 90-73461-18-9.

  2112. Al contacts to very shallow junctions
    Q.W. Ren; L.K. Nanver; C.C.G. Visser; J.W. Slotboom;
    In Proc. SAFE 1999,
    Mierlo, The Netherlands, pp. 719-722, Nov. 1999.

  2113. Modelling of Thin-Film Transistors in a Polycrystalline Silicon Layer with Large Grains
    A.J.G. Spiekerman; B.D. van Dijk; R. Ishihara;
    In Proc. of the fourth Symposium on Thin Film Transistor Technologies, the Electrochemical Society,
    Pennington, New Jersey, pp. 249-255, 1999. ISBN 1-56677-216-8.

  2114. Epitaxial Arsenic Doping of Si BJT Collectors
    W.D. van Noort; L. K. Nanver; J.W. Slotboom;
    In Proc. of SAFE 99,
    Mierlo, pp. 747-752, 1999. ISBN 90-73461-18-9.

  2115. Integration of a Hartmann-Shack wavefront sensor
    D.W. de Lima Monteiro; G. Vdovin; P.M. Sarro;
    In Proc. 2nd International Workshop on Adaptive Optics for Industry and Medicine,
    Durham, World Scientific, pp. 215-220, Jul. 1999. ISBN 981-02-4115-1.

  2116. Lamb wave sensor with tensile ZnO Liquid Property Sensing
    S. Koller; O. Brand; H. Baltes; B.Jakoby; P.M. Sarro; M.J. Vellekoop;
    In Proc. 10th Int. Conf. Solid-State Transducers,
    Sendai, Japan, pp. 1512-1515, Jun. 1999.

  2117. Silicon carbide as a new MEMS technology
    P.M. Sarro;
    In Proc. 10th Int. Conf. Solid-State Transducers,
    Sendai, Japan, The Institute of Electr. Eng. of Japan, pp. 186-189, Jun. 1999.

  2118. A novel technological process for glaas-to-glass anodic bonding
    A. Berthold; L. Nicola; P.M. Sarro; M.J. Vellekoop;
    In Proc. 10th Int. Conf. Solid-State Transducers,
    Sendai, Japan, pp. 1324-1327, Jun. 1999.

  2119. A new model for Si-based circular spiral inductors
    B. Rejaei; J.L. Tauritz; J.N. Burghartz;
    In New Semi-Conductor Materials for Telecommunications and Microwave Applications,
    Saint-Malo, France, Nov. 1999.

  2120. Fabrication of a focal plane array infrared detector for a satellite attitude control system
    A.W. van Herwaarden; F.G. van Herwaarden; S.A. Molenaar; B. Goudena; M. Laros; P.M. Sarro; C.A.Schot; W. van der Vlist; L. Blarre; J.P. Krebs;
    In Proc. 10th Int. Conf. Solid-State Transducers,
    Sendai, Japan, pp. 394-397, Jun. 1999.

  2121. Simulation of hydrogenated amorphous silicon germanium alloys for bandgap grading
    E. Schroten; M. Zeman; R.A.C.M.M. van Swaaij; L.L.A. Vosteen; J.W. Metselaar;
    In Mater. Res. Soc. Symp. Proc.,
    pp. 773, 1999.

  2122. Effect of interface roughness on light scattering and optical properties of a-Si:H solar cells
    M. Zeman; R.A.C.M.M. van Swaaij; M. Zuiddam; J.W. Metselaar; R.E.I. Schropp;
    In Mater. Res. Soc. Symp. Proc. 557, 725,
    1999.

  2123. Defect re-distribution in amorphous silicon below equilibration temperature
    R.A.C.M.M. van Swaaij; V. N��dazdy; M. Zeman; E. Pincik; J. W. Metselaar;
    In International Conference on Amorphous and Micro-crystalline Semiconductors 18,
    Snowbird, UT, Aug. 1999.

  2124. Large signal Modeling and Verification of Silicon RF Power Transistors
    R. Tinti; K. Mouthaan; H.C. de Graaff; R. Tuijtelaars; M. Versleijen; J. Slotboom; J.L. Tauritz;
    In ESSDERC,
    Leuven, pp. 664-667, Sept. 1999.

  2125. Potential use of laser annealing in semiconductor processing
    L.K. Nanver; Q.W. Ren; R. Mallee; J. Slabbekoorn; G.J. Bertens; E.J.G. Goudena; M.R. van den Berg; H. H. SchellevisW. van Zeijl; T.L.M. Scholtes; L.C.M. van den Oever;
    In G. Zweier (Ed.), Europ. Ion Implant User Seminar,
    Bad Aibling, Germany, Sept. 1999.

  2126. RF potential of a 0.18-µm CMOS logic technology
    J.N. Burghartz; M. Hargrove; C. Webster; R. Groves; M. Keene; K. Jenkins; D. Edelstein; R. Logan; E. Nowak;
    In IEDM 1999,
    pp. 853-856, Dec. 1999.

  2127. Characterization and Verification of WCDMA Power Amplifiers
    R. Mahmoudi; M. Spirito; J.L. Tauritz;
    In IEEE Topical Workshop on Power Amplifiers for Wireless Communications,
    San Diego, Sep. 1999.

  2128. Analysis of circular spiral inductors on CMOS substrates
    B. Rejaei; D.C. van der Pol; J.L. Tauritz;
    In ESSDERC,
    Leuven, pp. 672-675, Sept. 1999.

  2129. Novel amorphous silicon solar cell using a manufacturing procedure with a temporary superstrate
    R.E.I. Schropp; C.H.M. van der Werf; M. Zeman; et al;
    In Mat. Res. Soc. Proc.: Amorphous and Heterogeneous Silicon Thin Films-Fundamentals to Devices 1999,
    San Francisco, CA, pp. 713- 718, 1999. ISBN 1-55899-465-5.

  2130. Impact ionization and neutral base recombination in SiGe HBTs
    Peter; M.S.; J.W. Slotboom; Terpstra; D;
    In BCTM,
    pp. 58-61, 1999.

  2131. The properties of a-SiC:H and a SiGe:H films deposited by 55 kHz PECVD
    B.G. Budaguan; A.A. Sherchenkov; A.E. Berdnikov; J.W.Metselaar; A.A. Aivazov;
    In Amorphous and Heterogeneous Silicon Thin Films - Fundamentals to Devices 1999, Mat. Res. Soc. Proc,
    San Francisco, CA 1999, pp. 43-48, 1999. ISBN 1-55899-465-5.

  2132. A Novel Load and Source Tuning System for Balanced and Unbalanced WCDMA Power Amplifiers
    R. Mahmoudi; M. Spirito; P. Valk; J.L. Tauritz;
    In 54th ARFTG Conference,
    Atlanta, Dec. 1999.

  2133. Effects of Gate Oxide Deposition Methods on Excimer Laser Crystallized poly-Si Thin Film Transistors
    B. van Dijk; J. Bertens; R. Ishihara;
    In E. Lueder (Ed.), 19th International Display Research Conference, Euro Display 99,
    Berlin, Germany, Society for Information Display, pp. 335-338, Sep. 1999. 3-8007-2478-2.

  2134. The impact of silicon MMICs on system designs
    L.E. Larson; L.C.N. de Vreede;
    In 29th European Microwave Conference 1999,
    Munich, pp. 166-169, Oct. 1999.

  2135. Ultra-low-temperature low-ohmic contacts for SOA applications
    L.K. Nanver; H.W. van Zeijl; H. Schellevis; R.J.M. Mallee; J. Slabbekoorn; R. Dekker; J.W. Slotboom;
    In 1999 Bipolar/BiCMOS Circuits and Technology Meeting,
    Minneapolis, pp. 137-140, Sept. 1999. ISBN 0-7803-5712-4.

  2136. The influence of growth kinetics on the relaxation of epitaxially grown LPCVD Si1-xGex
    K. Grimm; C.C.G. Visser; L.K. Nanver; L. Vescan; H. L�th;
    In E. Fitzgerald (Ed.), Proc. 1st International Workshop on Lattice-Mismatched an Heterovalent Thin Film Epitaxy,
    Barga, Italy, The Minerals, Metals \& Materials Society, pp. 25-32, Sept. 1999. ISBN: 0-87339-444-5.

  2137. Microtexture Analysis of Location Controlled Large Si Grain Formed by Excimer-Laser Crystallization Method
    R. Ishihara; P.F.A. Alkemade;
    In 1999 International Workshop on Active-Matrix Liquid-Crystal Displays - TFT Technologies and Related Materials -,
    Tokyo, Japan, The Japan Societies of Applied, pp. 99-102, Jul. 1999.

  2138. Substrate Contact for Integrated Spiral Inductor
    Joachim N. Burghartz; Keith A. Jenkins; Mehmet Soyuer;
    Patent No. US 5,936,299, Aug 1999.

  2139. Werkwijze voor het vervaardigen van dunne films polykristallijn silicium en volgens die werkwijze vervaardigde films
    P.C. van der Wilt; R. Ishihara;
    Nederlandse Octrooiaanvraag nr. 1013790, Dec 1999.

  2140. Integrated Circuit Inductor
    Joachim N. Burghartz; Daniel C. Edelstein; Christopher V. Jahnes; Cyprian E. Uzoh;
    Patent No. US 5,884,990, Mar 1999.

  2141. Method for Making Three Dimensional Circuit Integration
    Charles T. Black; Joachim N. Burghartz; Sandip Tiwari; Jeffrey J. Welser;
    Patent No. US 5,998,292, Dec 1999.

  2142. Integrated Circuit Compatible Photo Detector Device and Fabrication Process
    Joachim N. Burghartz; Mark B. Ritter; Uli Klepser;
    Patent No. US 5,994,162, Nov 1999.

  2143. Monolithically Integrated Silicon Bipolar RF Oscillators
    Y. Sun;
    PhD thesis, Delft University of Technology, Feb. 1999. ISBN 90-9012303; Promotor: prof. R.G.F. Baets.

  2144. X-ray scattering study of quantum wires and lateral periodic heterostructures
    L. Tapfer; L. De Caro; Y. Zhuang; P. Sciacovelli; A. Sacchetti;
    Thin Solid Films,
    Volume 319, Issue 49, 1998.

  2145. Offset reduction of Hall plates in three different crystal planes
    S. Bellekom; P.M. Sarro;
    Sensors and Actuators A,
    Volume 66, Issue 1-3 (1998), pp. 23-28, 1998.

  2146. Epitaxial growth at high rates with LEPECVD
    C. Rosenblad; T. Graf; J. Stangl; Y. Zhuang; G. Bauer; J. Schulze; H. von K�nel;
    Thin Solid Films,
    Volume 336, Issue 89, 1998.

  2147. Relaxation processes and metastability in amorphous hydrogenated silicon investigated with differential scanning calorimetry
    B.G. Budaguan; A.A. Aivazov; M.N. Meytin; A. Yu. Sazonov; J.W. Metselaar;
    Physical Review B,
    Volume 252, pp. 198-206, 1998.

  2148. Anisotropic etching of silicon in saturated TMAHW solutions for IC-compatible micromachining
    P.M. Sarro; S. Brida; C.M.A. Ashruf; W. van d. Vlist; H. van Zeijl;
    Sensors and Materials,
    Volume 10, Issue 4, pp. 201-212, 1998.

  2149. Thermo-optic effect exploitation in Silicon microstructures
    G. Cocorullo; F.G. Della Corte; I. Rendina; P. M. Sarro;
    Sensors and Actuators A,
    Volume 71, Issue 1-2, pp. 19-26, 1998. ISSN-0924-4247.

  2150. Magnetic-field meassurement using an integrated resonant magnetic-field sensor
    Zs.Kadar; A.Bossche; P.M. Sarro; J.R.Mollinger;
    Sensors and Actuators A,
    Volume 70, pp. 225-232, 1998. ISSN-0924-4247.

  2151. Low stress PECVD thin film SiC for IC compatible microstructures
    P.M. Sarro; C.R. de Boer; E. Korkmaz; J.W.M. Laros;
    Sensors and Actuators A,
    Volume 67, pp. 175-180, 1998.

  2152. Double crystal X-ray diffraction study of MBE self-organized INAS quantum dots
    W. Yutian; Y. Zhuang; M. Wenquan; W. Wie; Y. Xiaoping; C. Zonggui; J. Desheng; Z. Houzhi;
    Science China, Series A (Mathematics, Physics, Astronomy),
    Volume 41, Issue 2, pp. 172, 1998.

  2153. Grain Location-Control in Excimer-Laser Crystallised Thin Silicon Films
    P. Ch. van der Wilt; R. Ishihara;
    Physica Status Solidi (a),
    Volume 166, Issue 2, pp. 619-627, 1998.

  2154. A microgap photomultiplier for the read-out of LaF3 : Nd (10%) scintillator
    J. van der Marel; V.R.Bom; C.W.E. van Eijk; R.W. Hollander; P.M Sarro;
    Nucl. Instr. and Meth. Phys.Res. A,
    Volume 410, pp. 229-237, 1998. ISSN 0168-9002.

  2155. An Anisotropic U-shape SF6 Based Plasma Silicon Trench Etching Investigation
    A. Burtsev; X.Y. Li; H.W. van Zeijl; C.I.M. Beenakker;
    Microelectronic Engineering,
    Volume 40, pp. 85-97, 1998. ISSN 0167-9317.

  2156. Collective charge density wave motion in inhomogeneous mesoscopic systems
    M.I. Visscher; B. Rejaei; G.E.W. Bauer;
    Physica B: Condensed Matter,
    Volume 249-251, pp. 490-495, Jun. 1998.

  2157. Design and characterization of MicroGap Counters on silicon
    F.D. van d. Berg; J. van d. Marel; C.W.E. van Eijk; R.W. Hollander; P.M. Sarro;
    Nucl Instr and Meth. A.,
    Volume 409, pp. 90-94, 1998.

  2158. Optical properties of a-SiGe:H solar cells on textured substrates
    J.H. van den Berg; M. Zeman; J.W. Metselaar;
    Journal of Non-Crystalline Solids,
    Volume 227-230, pp. 1262-1266, 1998.

  2159. Optical absorption edge in structure-inhomogeneous a-Si:H based alloys
    B.G. Budaguan; A.A. Aivazov; D.A. Stryahilev; J.W. Metselaar;
    Journal of Non-Crystalline Solids,
    Volume 226, pp. 217-224, 1998.

  2160. Location Control of Crystal Si Grain Followed by Excimer-Laser Melting of Si Thin-Films
    R. Ishihara; P.Ch. van der Wilt;
    Jpn.J.Appl.Phys.,
    Volume 37, pp. L15-L17, Jan. 1998.

  2161. Location Control of Large Grain Following Excimer-Laser Melting of Si Thin-Films
    R. Ishihara; A. Burtsev;
    Japan. J. Appl. Phys,
    Volume 37, Issue 1, pp. 1071-1075, 1998.

  2162. Spiral Inductors on Silicon - Status and Trends
    J.N. Burghartz;
    International Journal on Microwave and Millimeter Wave CAD,
    Volume 8, Issue 6, pp. 422-432, 1998.

  2163. Characteristics of field effect a-Si:H solar cells
    H. Fujioka; M. Oshima; C. Hu; M. Sumiya; N. Matsuki; H. Koinuma;
    J. of Non-Cryst. Solids,
    Volume 227-230, pp. 1287-1290, May 1998.

  2164. Amorphous Hydrogenated Silicon Films for Solar Cell Application Obtained with 55 kHz Plasma Enhanced Chemical Vapour Deposition
    B.G. Budaguan; A. Sherchenkov; D.A. Stryahilev; A.Y. Sazonov; A.G. Radoselsky; V.D. Chernomordic; A.A. Popov; J.W. Metselaar;
    J. Electrochem. Soc.,
    Volume 145, pp. 2508-2512, 1998.

  2165. Strain and surface morphology in lattice-matched ZnSe/InxGa1-xAs heterostructures
    S. Heun; J.J. Paggel; L. Sorba; S. Rubini; A. Bonanni; R. Lantier; M. Lazzarino; B. Bonanni; A. Franciosi; J.-M. Bonard; J.-D. Ganiere; Y. Zhuang; G. Bauer;
    J. Appl. Phys.,
    Volume 83, Issue 5, pp. 2504, 1998.

  2166. Modelling and fabrication of Geiger mode avalanche photodiodes
    W.J. Kindt; H.W. van Zeijl;
    IEEE Transactions on Nuclear Science,
    Volume 45, Issue 3, pp. 715-719, 1998.

  2167. Analysis and modeling of small-signal bipolar transistor operation at arbitrary injection levels
    N. Rinaldi; H.C. de Graaff; J.L. Tauritz;
    IEEE Trans. Electron Devices,
    Volume 45, pp. 1817-1825, Aug. 1998.

  2168. Two silicon optical modulators realizable with a fully compatible bipolar process
    G. Breglio; A. Cutolo; A. Irace; P. Spirito; L. Zeni; M. Iodice; P.M. Sarro;
    IEEE Journal of Quantum Electronics vol. 4,
    Issue 6, pp. 1003-1010, 1998.

  2169. RF Circuit Design Aspects of Spiral Inductors on Silicon
    J.N. Burghartz; D.C. Edelstein; M. Soyuer; H.A. Ainspan; K.A. Jenkins;
    IEEE Journal of Solid-State Circuits,
    Volume 33, Issue 12, pp. 2028-2034, 1998.

  2170. Silicon-on-silicon rib waveguides with a high-confining ion-implanted lower cladding
    G. Cocorullo; F.G. Della Corte; M. Iodice; I. Rendina; P.M. Sarro;
    IEEE Journal of Quantum Electronics,
    Volume 4, Issue 6, pp. 983-989, 1998.

  2171. SiGe Power HBTs for Low-Voltage, High-Performance RF Applications
    J.N. Burghartz; J.-O. Plouchart; K.A. Jenkins; C.S. Webster; M. Soyuer;
    IEEE Electron Device Letters,
    Volume 19, Issue 4, pp. 103-105, 1998.

  2172. In-plane strain and strain relaxation in laterally patterned periodic arrays of Si/SiGe quantum wires and dot arrays
    N. Darowski; U. Pietsch; Y. Zhuang; S. Zerlauth; G. Bauer; D. L�bbert; T. Baumbach;
    Appl. Phys. Lett.,
    Volume 73, Issue 6, pp. 806, 1998.

  2173. Extension of the collector charge description for compact bipolar epilayer models
    L.C.N. de Vreede; H.C. de Graaff; J.L. Tauritz; Baets; R.G.F;
    IEEE Tr. Electron Devices,
    Volume 45, Issue 1, pp. 277-285, Jan. 1998.

  2174. Hydrogenated amorphous silicon transverse junction solar cell
    M.A. Kroon; R.A.C.M.M. van Swaaij; M. Zeman; V.I. Kuznetsov; J.W. Metselaar;
    Appl. Phys. Lett.,
    Volume 72, pp. 209, 1998.

  2175. Amorphous and Microcrystalline Silicon Solar Cells: Modelling, Materials and Device Technology
    R.E.I. Schropp; M. Zeman;
    Kluwer Academic Publishers, , 1998. ISBN 0-7923-8317-6, 207 p.

  2176. Radiation-induced degradation of bipolar transistors
    A.Topkar; T. Mathew; R. Lal; J. Vasi; L.K. Nanver;
    In Physics of Semiconductor Devices,
    Narosa Publishing House, New Delhi, 1998.

  2177. Impact of CDMA Specifications on Circuit Design
    R. Mahmoudi; H.C. de Graaff; L.C.N. de Vreede; J.L. Tauritz;
    In Workshop on Low Cost Si-based Technology for Wireless Applications IEEE RFIC Symposium,
    Baltimore, Jun. 1998.

  2178. Thermal CVD Film-Silicon On Ceramic Substrates for photovoltaic applications
    A.J. van Zutphen; A. von Keitz; J.W. Metselaar;
    In Proceedings SAFE98,
    Mierlo, pp. 631-634, 1998.

  2179. Progress in RF Inductors on Silicon - Understanding Substrate Losses
    J.N.Burghartz;
    In Tech. digest 1998 IEEE International Electron Device Meeting,
    San Francisco, CA, USA, pp. 523-526, Dec. 1998. ISBN 0-7803-4774-9.

  2180. Enhancement of propagation characteristics in all-silicon waveguide by ion implantation
    G. Cocorullo; F.G. Della Corte; M. Iodice; I. Rendina; P.M. Sarro;
    In OSA Intern. Symposium on Integrated Photonics Research,
    Victoria, Canada, pp. 339-341, 1998.

  2181. Location Controlled Large Silicon Grains for New Large Area Applications
    R. Ishihara;
    In Jean Pierre Veen (Ed.), SAFE 98,
    Mierlo, The Netherlands, STW Technology Foundation, pp. 225-234, 1998. ISBN 90-73461-15-4.

  2182. Integrated Multilayer RF Passives in Silicon Technology
    J.N. Burghartz;
    In Proceedings of the Workshop on Integrated Passive Components, MTT Integrated Microwave Symposium,
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  2183. 1.8 GHz Active Microwave Filter realized in SiGe for Mobile Communications
    M.J.M. Martinez; L.C.N. de Vreede; J.L. Tauritz;
    In Proceedings of XIII Conference on Design of Circuits and Integrated Systems (DCIS'98),
    Madrid, Nov. 1998.

  2184. Determination of Optical Properties of a-Si:H Alloys
    D. B�c; M. Zeman; J.W. Metselaar;
    In Proceedings of the 43rd International Scientific Colloquium,
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  2185. Spiral and Soleniodal Inductor Structures on Silicon Using Cu-Damascene Interconnects
    D.C. Edelstein; J.N. Burghartz;
    In Proceedings of the IEEE Interconnect Technology onference (IITC),
    1998.

  2186. Low Deposition Temperature Hydrogenated Amorphous Silicon Germanium for Tandem Solar Cells
    L. L. A. Vosteen; E. Schroten; R.A.C.M.M. van Swaaij; M. Zeman; J. W. Metselaar;
    In Proceedings of SAFE98,
    Mierlo, pp. 599-602, Nov. 1998.

  2187. New developments in Solar Cells
    R.E.I. Schropp; M. Zeman;
    In Proceedings of SAFE98,
    Mierlo, pp. 497-505, Nov. 1998.

  2188. Structural and photoelectric studies on double barrier quantum well IR detectors
    D.S. Jiang; L.Q. Cui; W.G. Wu; C.Y. Song; Y. ZY. Huang. ZY. Huang.T. Wang; R.Z. Wang;
    In Proceedings of the Eighth International Conference on Narrow Gap Semiconductors, World Scientific,
    Singapore, pp. 172, 1998.

  2189. A-Si:H Transverse Junction Solar Cells with Interdigitated Finger Pattern: Calculations of Efficiency and Series Resistance
    M. A. Kroon; R.A.C.M.M. van Swaaij; J. W. Metselaar;
    In Proceedings of SAFE98,
    Mierlo, pp. 319-322, Nov. 1998.

  2190. A novel technique to measure the thermal conductivity of thin film membranes
    A. Irace; P.M. Sarro;
    In Proc.SPIE Micromachining and Microfabrication 1998 Symposium,
    Santa Clara, USA, SPIE, pp. 367-373, Sep. 1998.

  2191. Band Gap States in a-SiGe:H Alloys Determined from Charge DLTS Experiments
    M. Zeman; V. N��dazdy; E. Pincik; R.A.C.M.M. van Swaaij;
    In Proceedings of ASDAM 98,
    Smolenice Castle, Slovakia, pp. 19-22, Oct. 1998.

  2192. New High Rate Deposition Tool for Hydrogenated Amorphous Silicon (a-Si:H) Thin Film Solar Cells
    B. A. Korevaar; W. M. M. Kessels; A. H. M. Smets; B. S. Girwar; M. J. F. van de Sande; J. W. Metselaar; M. C. M. van de Sanden; R.A.C.M.M. van Swaaij; D. C. Schram;
    In Proceedings of SAFE 98,
    Mierlo, pp. 295-299, Nov. 1998.

  2193. Fluorescence Detection in (sub)-nanoliter Microarrays
    L.R. van d. Doel; M.J. Vellekoop; P.M. Sarro; S. Picioreanu; R. Moerman; H. Frank; G. van Dedem; K. Hjelt; I.T. Young;
    In Proc. 4th Annual Conference of the Advanced School for Computing and Imaging (ASCI 98),
    Lommel, Belgium, pp. 58-62, Jun. 1998.

  2194. Optimisation of the base-collector doping profile for high-frequency distortion
    W. van Noort; L.C.N. de Vreede; L.K. Nanver; H.C. de Graaff; J.W. Slotboom;
    In Proc. 28th ESSDERC,
    France, pp. 496-499, Sep. 1998.

  2195. Determination of mechanical properties of piezoelectric ZnO films
    S. Koller; V.Ziebart; O. Paul; O. Brand; H. Baltes; P.M. Sarro; M.J. Vellekoop;
    In Proc. SPIE Smart Electronics and MEMS Symposium,
    San Diego, USA, SPIE, pp. 102-109, Mar. 1998.

  2196. Low temperature quartz-to-silicon bonding for SAW applications
    A.Berthold; P.M. Sarro; M.J.Vellekoop;
    In Proc. SPIE Smart Electronics and MEMS Symposium,
    San Diego, USA, SPIE, pp. 81-85, Mar. 1998.

  2197. An Integrated RF Transceiver for Short-Range, High-Speed Digital Communications in the U-NII 5.x GHz Band
    M. Soyuer; H. Ainspan; J. Burghartz; J.-O. Plouchart; B. Gaucher; T. Beukema; F. Canora; E. Pilmanis; M. Oprysko;
    In Proc. RAWCON,
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  2198. Copper Electroplating for Integrated RF Devices
    E. Boelaard; J. N. Burghartz; C.I.M. Beenakker;
    In Proc. SAFE99,
    pp. 733-738, 1998.

  2199. Doping of polysilicon emitters by excimer laser-annealing
    M.R. van den Berg; L.K. Nanver; Q.W. Ren; C.C.G. Visser; R.J.M. Mallee; J.W. Slotboom;
    In Proc. SAFE 1998,
    Mierlo, The Netherlands, pp. 27-30, Nov. 1998.

  2200. Study of the design of the a-Si:H transverse junction solar cell
    M.A. Kroon; R.A.C.M.M. van Swaaij; M. Zeman; J.W. Metselaar;
    In Proc. of the 2nd World Conference and Exhibition on Photovoltaic Solar Energy Conversion (WPSEC-2),
    Vienna, Austria, pp. 914-917, Jul. 1998. ISBN 92-828-5179-6.

  2201. Study of design of the a-Si:H transverse junction solar cell
    M.A. Kroon; R.A. van Swaaij; M. Zeman; J.W. Metselaar;
    In Proc. of WPSEC-2,
    Vienna, Austria, pp. 914-917, Jul. 1998.

  2202. Film-silicon deposition followed by phosphorus diffusion for photovoltaic application
    A.J.M.M. van Zutphen; A. von Keitz; M. Zeman; J.W. Metselaar;
    In Proc. of the 2nd World Conference and Exhibition on Photovoltaic Solar Energy Conversion (WPSEC-2),
    Vienna, Austria, pp. 1762-1765, Jul. 1998. ISBN 92-828-5179-6.

  2203. Novel superstrate process for textured SnO2:F/p+-i-n+ amorphous silicon solar cells suitable for roll-to-roll deposition
    R.E.I. Schropp; et al.;
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    Vienna, Austria, pp. 820-822, Jul. 1998. ISBN 92-828-5179-6.

  2204. Defects analysis in Si/Si0.7Ge0.3 heterostructures deposited by APCVD
    J. L. ShiK. Nanver; K. Grimm; C.C.G. Visser;
    In Proc. of SAFE '98,
    Mierlo, pp. 515-519, 1998.

  2205. New temporary superstrate process for roll-to-roll production of thin-film solar cells
    E. Middelman; E. van Andel; R.E.I. Schropp; et al;
    In Proc. of the 2nd World Conference and Exhibition on Photovoltaic Solar Energy Conversion (WPSEC-2),
    Vienna, Austria, pp. 816-819, Jul. 1998. ISBN 92-828-5179-6.

  2206. Buried boron layers as extrinsic base in inverse SiGe HBTs
    L.C.M. van den Oever; T.L.M. Scholtes; L.K. Nanver; H. Lifka; J.W. Slotboom;
    In Proc. of SAFE,
    Mierlo, pp. 435-439, 1998.

  2207. The influence of growth kinetics on the relaxation of epitaxially grown RPCVD Si1-xGex
    K. Grimm; C.C.G. Visser; L.K. Nanver; L. Vescan; H. Loth;
    In Proc. of SAFE '98,
    Mierlo, pp. 195-199, 1998.

  2208. Location Single-Crystalline Silicon Thin Film Transistors Inside a Single, Location Controlled Grain
    B.D. van Dijk; R. Ishihara;
    In Proc. of SAFE '98,
    Mierlo, pp. 143-145, 1998.

  2209. Quartz-to-silicon fusion bonding for micro acoustic wave applications
    A. Berthold; P.M. Sarro; M.J. Vellekoop;
    In Proc. Dutch Sensor Conf,
    Twente, pp. 213-218, Mar. 1998.

  2210. Measurement of thermal conductivity and diffusivity on single and multi-layer membranes
    A. Irace; P.M. Sarro;
    In Proc. Eurosensors XII Conf.,
    Southampton, UK, pp. 27-30, Sep. 1998.

  2211. A neutron detector based on the Micro Gap Counter
    F.D. van den Berg; V.R. Bom; C.W.E. van Eijk; R.W. Hollander; M. Bartek; P.M. Sarro; H. Schellevis; M.W. Johnson; N.J. Rhodes;
    In C.W.E. van Eijk (Ed.), Proc. Neudess 98,
    Delft, The Netherlands, Oct. 1998. ISBN 90-73861-42.

  2212. Low-ohmic contacts by excimer laser annealing of implanted polysilicon
    Q.W. Ren; M.R. van den Berg; L.K. Nanver; J. Slabbekoorn; C.C.G. Visser;
    In Proc. ICSICT 1998,
    Beijing, China, pp. 102-105, Oct. 1998.

  2213. Fabrication technology of Geiger mode avalanche photodiodes
    W.J. Kindt; H.W. van Zeijl;
    In Proc. Dutch Sensor Conf,
    Twente, pp. 143-146, Mar. 1998. ISBN 0-7923-5010-3.

  2214. Optical crosstalk in Geiger mode avalanche photodiode arrays: modeling, prevention and measurement
    W.J. Kindt; H.W. van Zeijl; S. Middelhoek;
    In Proc. 28th ESSDERC,
    France, pp. 192-195, Sep. 1998.

  2215. Microwave modelling and measurement of prematch circuitry for RF power transistors
    K. Mouthaan; R. Tinti; H.C. de Graaff; J.L. Tauritz; J. Slotboom;
    In MTT-S European Wireless 98,
    Amsterdam, pp. 198-203, Oct. 1998.

  2216. Grain Matrix Made with Excimer-Laser Crystallization of Thin Silicon Films
    P. Ch. van der Wilt; R. Ishihara;
    In Polycrystalline Semiconductors V, - Bulk Materials, Thin Films and Devices-, Proceedings of the Fifth International Conference,
    Schwabisch Gmund, Germany, Sept. 1998.

  2217. Suspended Broad-Band Active Inductors on Silicon
    Y. Sun; J.L. Tauritz; R.G.F. Baets;
    In MTT-S European Wireless 98,
    Amsterdam, pp. 116-121, Oct. 1998.

  2218. Device modelling of a-Si:H alloy solar cells: Calibration procedure for determination of model input parameters
    M. Zeman; R.A.C.M.M. van Swaaij; E. Schroten; L.L.A. Vosteen; J.W. Metselaar;
    In Mater. Res. Soc. Symp. Proc.,
    pp. 409, 1998.

  2219. The properties of a-Si:H/c-Si heterostructures prepared by 55 kHz PECVD for solar cell application
    B.G. Budaguan; A.A. Aivazov; A.A. Sherchenkov; A.V. Biriukov; V.D. Chernomordic; J.W. Metselaar;
    In Mat. Res. Soc. Symp. Proc.,
    Boston, pp. 303-308, 1998.

  2220. Silicon Micromachining Technologies
    P.M. Sarro;
    In INSEL 98 Conf.,
    Naples, Italy, Oct. 1998.

  2221. Active Microwave Filters realized in SiGe Technology
    M.J.M. Martinez; L.C.N. de Vreede; J.L. Tauritz;
    In MTT-S European Wireless 98,
    Amsterdam, pp. 110-115, Oct. 1998.

  2222. Modelling and measurement of electro-thermal interaction in RF bipolar power transistors
    K. Mouthaan; R. Tinti; H.C. de Graaff; J.L. Tauritz; J. Slotboom;
    In IEEE Silicon Monolithic Integrated Circuits RF Systems Meeting,
    Ann Arbor, pp. 47-56, Sep. 1998.

  2223. Energy dependent electron and hole impact ionization in Si bipolar transistors
    P. Palestri; L. Selmi; G.A.M. Hurkx; J.W. Slotboom; E. Sangiorgi;
    In IEDM 1998,
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  2224. Experimental results of electron confinement in a silicon drift detector with saw tooth shaped p+ strips
    J. Sonsky; H. Valk; J. Huizenga; and R.W. Hollander; C.W.E. van Eijk; P.M. Sarro;
    In IEEE Nuclear Science Symposium 98,
    Toronto, Canada, Nov. 1998.

  2225. A predictive model for Si-based circular spiral inductors
    B. Rejaei; J.L. Tauritz; P. Snoeij;
    In IEEE Silicon Monolithic Integrated Circuits RF Systems Meeting, Ann Arbor,
    pp. 148-154, Sep. 1998.

  2226. Performance of MEXTRAM and its Comparison with VBIC 95
    H.C. de Graaff; W.J. Kloosterman; L.C.N. de Vreede;
    In Hewlett-Packard SCCT Modelling Seminar,
    Tokyo, May 1998.

  2227. Optimization guidelines for epitaxial collectors of advanced BJTs with improved breakdown voltage and speed
    P. Palestri; C. Fiegna; L. Selmi; G.A.M. Hurkx; J.W. Slotboom; E. Sangiorgi;
    In IEDM 1998,
    pp. 741-744, 1998.

  2228. Optical modelling of Single Junction a-Si:H Solar Cells with Textured Interfaces
    D. B�c; M. Zeman; J.W. Metselaar;
    In Conference on Advanced Semiconductor Devices and Microsystems (ASDAM 98),
    Smolenice Castle, Slovakia, pp. 203-206, Oct. 1998.

  2229. Optimum dimensions of the epilayer for third-order intermodulation distortion
    L.C.N. de Vreede; W. van Noort; H.F.F. Jos; H.C. de Graaff; J.W. Slotboom; J.L. Tauritz;
    In Proc. Bipolar/BiCMOS Circuits and Technology Meeting,
    pp. 168-171, Sept. 1998.

  2230. Silicon Microsensors and Optical Switches Based on the Thermo-Optic Effect
    G. Cocorullo; F. G. Della Corte; M. Iodice; I. Rendina; P.M. Sarro;
    In CIMTEC 98,
    Florence, Italy, Jun. 1998.

  2231. Silicon Monolithic Balanced Oscillators Using On-Chip Suspended Active Resonators
    Y. Sun; J.L. Tauritz; R.G.F. Baets;
    In 1998 IEEE RFIC Symposium,
    Baltimore, pp. 149-152, Jun. 1998.

  2232. Integrated Circuit Toroidal Inductor
    Joachim N. Burghartz; Daniel C. Edelstein; Christopher V. Jahnes; Cyprian E. Uzoh;
    Patent No. US 5,793,272, Aug 1998.
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  2233. MOS High Frequency Switch Circuit using a Variable Well Bias
    Joachim N. Burghartz;
    Patent No. US 5,818,099, Oct 1998.

  2234. Stability of oriented silicalite- 1 films in view of zeolite membrane preparation
    M.J. den Exter; F. Kapteijn; C.J.M. Rijn; H. van Bekkum; J.A. Moulijn; H. Schellevis; C.I.M. Beenakker;
    Zeolites,
    Volume 1997, Issue 19, pp. 13-20, 1997. ISSN: 0144-2449/97.

  2235. An integrated silicon interferometric temperature sensor
    G. Cocorullo; F.G. Della Corte; M. Iodice; I. Rendina; P.M. Sarro;
    Sensors and Actuators A,
    Volume 61, Issue 1-3, pp. 267-272, 1997.

  2236. Transport through mesoscopic charge density wave junctions
    Tanaka; M.I. Visscher; B. Rejaei; G.E.W. Bauer;
    Synthetic Metals,
    Volume 86, Issue 1-3, pp. 2217-2218, Feb. 1997.

  2237. Computer modelling of current matching in a-Si:H/a-Si-H tandem solar cells on textured TCO substrates
    M. Zeman; J.A. Willemen; L.L.A. Vosteen; G. Tao; J.W. Metselaar;
    Solar Energy Materials and Solar Cells,
    Volume 46, pp. 81-99, 1997.

  2238. Integrated RF Components in a SiGe Bipolar Technology
    J.N. Burghartz; M. Soyuer; K.A. Jenkins; M. Kies; M. Dolan; K. Stein; J. Malinowski; D.L. Harame;
    IEEE Journal of Solid-State Circuits,
    Volume 32, Issue 9, pp. 1440-1445, 1997.

  2239. Low-Power SiGe C-Band Low-Noise Amplifiers for Wireless Applications
    M. Soyuer; J.-O. Plouchart; H.A. Ainspan; J.N. Burghartz; K.A. Jenkins; A.P. Kalinowski;
    IEEE Journal of Solid-State Circuits,
    1997.

  2240. An 11 GHz 3-V SiGe Voltage Controlled Oscillator with Integrated Resonator
    M. Soyuer; J.N. Burghartz; H.A. Ainspan; K.A. Jenkins; P. Xiao; A.R. Shahani; M.S. Dolan; D.L. Harame;
    IEEE Journal of Solid-State Circuits,
    Volume 32, Issue 9, pp. 1451-1454, 1997.

  2241. Backside-illuminated silicon photodiode array in an integrated spectrometer
    T.A. Kwa; . P.M. Sarro; R.F. Wolffenbuttel;
    IEEE Transactions on Electron Devices,
    Volume 44, Issue 5 (1997), pp. 761-765, 1997.

  2242. Excimer-laser-produced single-crystal silicon thin-film transistors
    R. Ishihara; M. Matsumura;
    Japanese Journal of Applied Physics,
    Volume 36, pp. 6167-6170, 1997.

  2243. A temperature all-silicon micro-sensor based on the thermo-optic effect
    G. Cocorullo; F.G. Della Corte; M. Iodice; I. Rendina; P.M. Sarro;
    IEEE Transactions on Electron Devices,
    Volume 44, Issue 5 (1997), pp. 766-774, 1997.

  2244. Electrostatic aluminum micromirrors using double pass metallization
    J. B�hler; J. Funk; J.G. Korvink; F.-P. Steiner; P.M. Sarro; H. Baltes;
    Journal of Microelectromechanical Systems,
    Volume 6, Issue 2, pp. 126-135, 1997.

  2245. Spiral Inductors and Transmission Lines in Silicon Technology Using Cu-Damascene Interconnects and Low-Loss Substrates
    J.N. Burghartz; D.C. Edelstein; K.A. Jenkins; Y.H. Kwark;
    IEEE Transactions on Microwave Theory and Techniques,
    Volume 45, Issue 2, pp. 1961-1968, 1997.

  2246. Lateral periodicity in high-strained (GaIn)As/Ga(PAs) superlattices investigated by x-ray scattering techniques
    Y. ZC. Huang Giannini; L. Tapfer; T. Marschner; W. Stolz;
    Nuovo Cimento,
    Volume 19, pp. 377, 1997.

  2247. Electronic effects of ion damage in hydrogenated amorphous silicon alloys
    R.A.C.M.M. van Swaaij; A.D. Annis; B.J. Sealy;
    J. Appl. Phys.,
    Volume 82, pp. 4800, 1997.

  2248. Mechanical behaviour during thermal cycling of AlVPd line patterns
    J.P. Lokker; A.J. Kalkman; H. Schellevis; G.C.A.M. Janssen; S. Radelaar;
    Microelectronic Engineering,
    Volume 33, pp. 129-135, 1997.

  2249. Technology and applications of micromachined silicon adaptive mirrors
    G. Vdovin; S. Middelhoek; P.M. Sarro;
    Opt. Eng.,
    Volume 36, Issue 5, pp. 1382-1390, 1997.

  2250. Silicon nitride as dielectric in low temperature SiGe HBT processing
    Q.W. Ren; L.K. Nanver; C.R. de Boer; H.W. van Zeijl;
    Microelectronic Engineering,
    Volume 36, Issue 1-4, pp. 179-182, Jun. 1997.

  2251. Josephson Current through Charge Density Waves
    M.I. Visscher; B. Rejaei;
    Phys. Re. Lett.,
    Volume 79, pp. 4461-4464, 1997.

  2252. Structural ordering and interface morphology in symmetrically strained(GaIn)As/Ga(PAs) superlattices grown off-oriented GaAs(100)
    C. Giannini; L. Tapfer; Y. Zhuang; L. De Caro; T. Marschner; W. Stolz;
    Phys. Re. B,
    Volume 55, Issue 1, 1997.

  2253. A silicon avalanche photodiode for single optical photon counting in the geiger mode
    W.J. Kindt; N.H. Shahrjerdy; H.W. van Zeijl;
    Sensors and Actuators A,
    Volume 60, pp. 98-102, 1997.

  2254. Structures of an asymmetrically coupled double-well superlattice by double crystal X-ray diffraction
    M. Wenquan; Y. Zhuang; W. Yutian; J. Desheng;
    Science China, Series A (Mathematics, Physics, Astronomy),
    Volume 40, Issue 9, pp. 1004, 1997.

  2255. An integrated charge amplifier for a pyroelectric sensor
    D. Setiadi; A. Armitage; T.D. Binnie; P.P.L. Regtien; P.M. Sarro;
    Sensors and Actuators A,
    Volume 61, Issue 1-3, pp. 421-426, 1997.

  2256. Spiral Inductors and Transmission Lines in Silicon Technology
    J.N. Burghartz; K.A. Jenkins; M. Soyuer; D.C. Edelstein; Y. Kwark;
    In Proceedings PIERS, Symposium on Passive Elements and Transmission Lines on Silicon,
    1997.

  2257. Location Control of Large Grain Following Excimer-Laser Melting of Si Thin-Films
    R. Ishihara;
    In the 1997 International Conference on Solid State Devices and Materials,
    Hamamatsu, Japan, pp. 360-361, Sep. 1997.

  2258. Novel Substrate Contact Structure for High-Q Silicon-Integrated Inductors
    J.N. Burghartz; A.E. Ruehli; K.A. Jenkins; M. Soyuer; D. Nguyen-Ngoc;
    In IEEE International Electron Devices Meeting (IEDM),
    pp. 55-58, 1997.

  2259. Self-aligned metallization of high-frequency BJTs with low-stress silicon-nitride spacers
    H.W. van Zeijl; L.K. Nanver;
    In Proceedings of the 27th ESSDERC,
    Stuttgart, Germany, pp. 248-251, 22-24 1997.

  2260. A 5.8-GHz 1-V Low-Noise Amplifier in SiGe Bipolar Technology
    M. Soyuer; J.-O. Plouchart; H.A. Ainspan; J. N. Burghartz;
    In Proceedings of the Symposium on Radio Frequency Integrated Circuits (RFIC),
    pp. 19-22, 1997.

  2261. Silicon RF Technology - The Two Generic Approaches
    J.N. Burghartz;
    In Proceedings of the European Solid-State Device Research Conference (ESSDERC),
    pp. 143-153, 1997.

  2262. Inverse SiGe heterojunction bipolar transistor
    L.C.M. van den Oever; L.K. Nanver; C.C.G. Visser; T.L.M. Scholtes; R.J.E. Hueting; J.W. Slotboom;
    In Proceedings of the 27th ESSDERC,
    Stuttgart, Germany, pp. 450-453, Sept. 1997.

  2263. Deposition of thin film-silicon by thermal CVD processes for application in solar cells
    A.J. van Zutphen; M. Zeman; F.D. Tichelaar; J.W. Metselaar;
    In Proceedings of the 14th European Photovoltaic Solar Energy Conference and Exhibition,
    Barcelona, pp. 1440-1443, Jun. 1997.

  2264. MAIDS: A microwave active integral device simulator
    L. de Vreede; W. van Noort; H.C. de Graaff; J.L. Tauritz; J. Slotboom;
    In Proceedings of the 27th ESSDERC,
    Stuttgart, Germany, pp. 108-111, Sept. 1997.

  2265. Silicon thermooptic micromodulators for low-cost low-performance fiber-in-the-loop applications
    G. Cocorullo; F.G. Della Corte; I. Rendina; P.M. Sarro;
    In Proc.SPIE Integrated Optic Devices '97 Symposium,
    San Jose, California, USA, SPIE, pp. 312-337, 1997.

  2266. Computer modelling of a-Si:H alloy tandem cells: determination of current matching with light scattering
    M. Zeman; R.E.I. Schropp; J.W. Metselaar;
    In Proceedings of the 14th European Photovoltaic Solar Energy Conference and Exhibition,
    Barcelona, pp. 586-589, Jun. 1997.

  2267. Fabrication of Geiger mode Avalanche Photodiodes
    W.J. Kindt; H.W. van Zeijl;
    In Proc. of the Nuclear Methods and Physics 1997. Nuclear Methods and Physics 1997,
    Austin, Sep. 1997.

  2268. Low stress PECVD thin film SiC for IC compatible microstructures
    P.M. Sarro; C.R. de Boer; M. Laros; E. Korkmaz;
    In Proc. Eurosensors '97 Conf.,
    Warsaw, Poland, pp. 920-932, Sep. 1997.

  2269. Temperature dependence and drift of a thermal accelerometer
    U.A. Dauderstadt; P.M. Sarro; S. Middelhoek;
    In Proc. 9th Int. Conf. Solid-State Transducers,
    Chicago, USA, pp. 1209-1212, Jun. 1997.

  2270. Development of a 128 channel silicon drift detector for spectroscopic purposes
    H. Valk; J. Huizenga; C.W. van Eijk; R.W.Hollander; L.K. Nanver; P.M. Sarro; A. van den Bogaard;
    In Proc. 4th International Conference on Position-Sensitive Detectors,
    Manchester, UK, pp. 169-172, Sept. 1997.

  2271. Two-dimensional location confinement of crystal Si grain followed by excimer-laser melting of Si thin films
    R. Ishihara; P.C. van der Wilt;
    In International Conference on Advanced Materials and European Materials Research Society Spring Meeting,
    Strasbourg, Jun. 1997.

  2272. Temperature Analysis and On-Chip Compensation for an UHF VCO
    Y. Sun; H.G. van Veenendaal; J.L. Tauritz;
    In IEEE RFIC Symposium Digest,
    Denver, pp. 229-232, Jun. 1997.

  2273. Electronic effects of ion damage in hydrogenated amorphous silicon alloys
    R.A.C.M.M. van Swaaij; J. M. Shannon; A. D. Annis; B. J. Sealy;
    In Chelsea Meeting on Amorphous Semiconductors,
    London, UK, Apr. 1997.

  2274. Temperature Analysis and On-Chip Compensation for an UHF VCO
    Y. Sun; H.G. van Veenendaal; J.L. Tauritz;
    In IEEE MTT-S Digest,
    Denver, pp. 757-760, Jun. 1997.

  2275. Dual-beam excimer-laser irradiation of a-Si film on glass substrate
    R. Ishihara; A. Burtsev;
    In Ext. Abstr. 1997, Int. Conference on Solid State Devices and Materials,
    Hamamatsu, pp. 360-365, 1997.

  2276. Thermal resistance modelling of RF high power bipolar transistors
    K. Mouthaan; R. Tinti; A. Arno; H.C. de Graaff; J.L. Tauritz; J. Slotboom;
    In ESSDERC 97,
    Stuttgart, pp. 184-187, Sep. 1997.

  2277. A 4 b 8 GSample/s A/D Converter in SiGe Bipolar Technology
    P. Xiao; K.A. Jenkins; M. Soyuer; H.A. Ainspan; J.N. Burghartz; H. Shin; M. Dolan; D.L. Harame;
    In IEEE International Solid-State Circuits Conference (ISSCC),
    pp. 124-125, 1997.

  2278. Microwave modelling and measurement of the self- and mutual inductance of coupled bondwires
    K. Mouthaan; R. Tinti; M. de Kok; H.C. de Graaff; J.L. Tauritz; J.W. Slotboom;
    In Proc. Bipolar/BiCMOS Circuits and Technology Meeting,
    Minneapolis, USA, pp. 166-169, Sep. 1997.

  2279. Modelling of a-Si:H alloy solar cells on textured substrates
    M. Zeman; J.H. van den Berg; L.L.A. Vosteen; J.A. Willemen; J.W. Metselaar; R.E.I. Schropp;
    In S.Wagner et al.), MRS Proceedings 467, Spring Meeting (Ed.), Amorphous Silicon Technology-1997,
    San Francisco, pp. 671-680, Mar.Apr. 1997.

  2280. Structural and photoelectric studies on double barrier quantum well infrared detectors
    W.G. Wu; D.S. Jiang; L.Q. Cui; C.Y. Song; Y. Zhuang;
    In 1997 IEEE Hong Kong Electron Devices Meeting,
    1997.

  2281. Fabrication of Geiger mode Avalanche Photodiodes
    W.J. Kindt; H.W. van Zeijl;
    In 1997 IEEE Nuclear Science Symposium and Medical Imaging Conference,
    Albuquerque, New Mexico, USA, Nov. 1997.

  2282. State-of-the-Art in Compact Modelling with Emphasis on Bipolar RF Circuit Design
    H.C. de Graaff;
    In ESSDERC 97,
    Stuttgart, pp. 14-23, Sep. 1997.

  2283. 2~3 Ghz Silicon MMIC Balanced Oscillators Using On-chip Active Resonators
    Y. Sun; M. de Kok; J.L. Tauritz; R.G.F. Baets;
    In 27th European Microwave Conference,
    Jerusalem, pp. 749-754, Sep. 1997.

  2284. Two-Level Spiral Inductor Structure Having a High Inductance to Area Ratio
    Joachim N. Burghartz; Keith A. Jenkins; Saila Ponnapalli; Mehmet Soyuer;
    Patent No. US 5,656,849, Aug 1997.

  2285. Geometry, Angular Momentum and the Intrinsic Drift of Oceanic Monopolar Vortices
    Ramses van der Toorn;
    PhD thesis, Nederlands Instituut voor Onderzoek der Zee, Texel / Faculteit Natuur- en Sterrenkunde, Universiteit Utrecht, 1997.

  2286. Ultrafast interstitial injection during transient enhanced diffusion of boron in silicon
    H.G.A. Huizing; C.C.G. Visser; N.E.B. Cowern; P.A.Stolk; R.C.M. de Kruif;
    Appl. Phys. Lett,
    Volume 69, Issue 9, pp. 1211-1213, 1996.

  2287. Study of double barrier superlattice by synchrotron radiation and double-crystal x-ray diffraction
    Y. ZY. Huang.T. Wang; D.S. Jiang; Y.P. Yang; X.M. Jiang; J.Y. Wu; L.S. Xiu; W.L. Zheng;
    Appl. Phys. Lett.,
    Volume 68, Issue 8, pp. 1147, 1996.

  2288. Advanced modeling of distortion effects in bipolar transistors using the Mextram model
    L.C.N. de Vreede; H.C. de Graaff; Mouthaan; K.; de Kok; M.; J.L. Tauritz; Baets; R.G.F;
    J. Solid-State Circuits,
    Volume 31, Issue 1, pp. 114-121, Jan. 1996.

  2289. Bipolar integrated Kelvin test structure for contact resistance measurement of self-aligned implantations
    L.K. Nanver; E.J.G. Goudena; J. Slabbekoorn;
    IEEE Trans. on Semiconductor Manufacturing,
    Volume 9, Issue 3, pp. 455-460, 1996.

  2290. Microwave Inductors and Capacitors in Standard Multilevel Interconnect Silicon Technology
    J.N. Burghartz; M. Soyuer; K.A. Jenkins;
    IEEE Transactions on Microwave Theory and Techniques,
    Volume 44, Issue 1, pp. 100-104, 1996.

  2291. Determination of the density of states in amorphous silicon-carbon alloys using a Fourier transformation of transient photocurrent data
    P. A. Bayley; J. M. Marshall; C. Main; D. P. Webb; R.A.C.M.M. van Swaaij; J. Bezemer;
    J. Non-Cryst. Solids,
    Volume 161, 1996.

  2292. Identification of Gate Electrode Discontinuities in Submicron CMOS Technologies, and Effect on Circuit Performance
    K.A. Jnkins; J.N. Burghartz; P.D. Agnello;
    IEEE Transactions on Electron Devices,
    Volume 43, Issue 5, pp. 759-765, 1996.

  2293. A 3-V 4-GHz nMOS Voltage-Controlled Oscillator with Integrated Resonator -
    M. Soyuer; K.A. Jenkins; J.N. Burghartz; M.D. Hulvey;
    IEEE Journal of Solid-State Circuits,
    Volume 31, Issue 12, pp. 2042-2045, 1996.

  2294. A 2.4-GHz Silicon Bipolar Oscillator with Integrated Resonator
    M. Soyuer; K.A. Jenkins; J.N. Burghartz; H.A. Ainspan; F.J. Canora; S. Ponnapalli; J.F. Ewen; W.E. Pence;
    IEEE Journal of Solid-State Circuits,
    Volume 31, Issue 2, pp. 268-270, 1996.

  2295. BiCMOS Process Integration and Device Optimization: Basic Concepts and New Trends
    J.N. Burghartz;
    Electronic Engineering,
    Volume 79, pp. 313-327, 1996.

  2296. Recombination centers identification in very thin silicon epitaxial layers via lifetime measurements
    S. Daliento; A. Sanseverino; P. Spirito; P.M. Sarro; L. Zeni;
    IEEE Electr. De van Lett,
    Volume 17, Issue 3, pp. 148-150, 1996.

  2297. Multi-Level Spiral Inductors Using VLSI Interconnect Technology
    J.N. Burghartz; K.A. Jenkins; M. Soyuer;
    IEEE Electron Device Letters,
    Volume 17, Issue 9, pp. 428-430, 1996.

  2298. Plasma_enhanced chemical vapor deposition of thick silicon nitride films with low stress on InP
    L. Shi; C. A. M. Steenbergen; A. H. de Vreede; M. K. Smit; T. L. M. Scholtes; F. H. Groen; J. W. Pedersen;
    J. Vac. Sci. Technol. A,
    Volume 14, pp. 471, 1996.

  2299. Ultra fast interstitial injection during transient enhanced boron diffusion in silicon
    H.G. A. Huizing; C.C.G. Visser; N.E.B. Cowern; P.A. Stolk; R.C.M. de Kruif;
    Appl. Phys. Letters,
    Volume 68, pp. 409-411, 1996.

  2300. Collective transport through charge-density-wave heterostructures
    B. Rejaei; G.E.W. Bauer;
    Phys. Re. B,
    Volume 54, pp. 8487-8490, 1996.

  2301. Equivalence of the transmission-eigenvalue density in supersymmetric and scaling theories of disordered wires without time-reversal symmetry
    B. Rejaei;
    Phys. Re. B,
    Volume 53, pp. R13235-R13238, 1996.

  2302. LPCVD silicon-rich silicon nitride films for applications in micromechanics, studied with statistical experimental design
    Gardeniers; H.A.C. Tilmans; C.C.G. Visser;
    J. Vac. Sci. Technol. A,
    Volume 14, Issue 5, pp. 2879-2892, 1996.

  2303. De ontlading van een fotogeleider
    R.A.C.M. van Swaaij;
    Ned. Tijdschr. v. Natuurkunde,
    Volume 62, Issue 5, pp. 77, 1996.

  2304. Electrical and optical properties of plasma-deposited a-SiGe:H alloys: Role of growth temperature and postgrowth anneal
    V.I. Kuznetsov; M. Zeman; L.L.A. Vosteen; B.S. Girwar; J.W. Metselaar;
    Journal of Applied Physics,
    Volume 80, pp. 6496-6504, 1996.

  2305. Theory of tunneling conductance of CDW junctions
    Yukio Tanaka; Mark I. Visscher; Behzad Rejaei; Gerrit E. W. Bauer;
    Physica B: Condensed Matter,
    Volume 227, Issue 1-4, pp. 339-341, Sep. 1996.

  2306. Silicon three-axial tactile sensor
    Z.Chu; P.M. Sarro; S. Middelhoek;
    Sensors and Actuators A,
    Volume 54, pp. 505-510, 1996.

  2307. The PhotoElectroMagnetic Effect in planar silicon structures
    J.F. Creemer; S. Middelhoek; P.M. Sarro;
    Sensors and Actuators A,
    Volume 55, pp. 115-120, 1996.

  2308. Low temperature surface passivation for silicon solar cells
    C. Leguijt; P. L�lgen; A.R. Burgers; J.A. Eikelboom; A.W. Weeber; F.M. Schuurmans; W.C. Sinke; P.F.A. Alkemade; P.M. Sarro; C.H.M. Mar�e; L.A. Verhoef;
    Solar Energy Materials and Solar Cells,
    Volume 40 (1996), pp. 297-345, 1996.

  2309. A 3x1 integrated pyroelectric sensor based on VDF/TrFE copolymer
    D. Setiadi; P.M. Sarro; P.P.L. Regtien;
    Sensors and Actuators A,
    Volume 52, pp. 103-109, 1996.

  2310. Tunneling spectroscopy of mesoscopic charge density wave systems
    Yukio Tanaka; Mark I. Visscher; Behzad Rejaei; G.E.W. Bauer;
    Solid State Communications, Volume 100, Issue 1,
    pp. 37-41, Oct. 1996.

  2311. Simulation aspects of a thermal accelerometer
    U.A. Dauerstadt; P.H.S. de Vries; R. Hiratsuka; J.G. Korvink; P.M. Sarro; H. Baltes; S. Middelhoek;
    Sensors and Actuators A,
    Volume 55 (1996), pp. 3-6, 1996.

  2312. Suspended membrane inductors and capacitors for application in silicon MMICs
    Y. Sun; H.W. van Zeijl; J.L. Tauritz; R.G.F. Baets;
    In IEEE 1996 Microwave and Millimeter-wave Monolithic Circuits Symposium,
    San Francisco, pp. 99-102, Jun. 1996.

  2313. Integrated ultraviolet sensor system with on-chip 1 Gohm Transimpedance Amplifier
    D. Bolliger; P. Malcovati; A. Haberli; P.M. Sarro; F. Malobert; H. Baltes;
    In ISSC 96 Digest of Technical Papers,
    San Francisco, CA, pp. 328-329, Feb. 1996.

  2314. Anisotropic etching of silicon in saturated TMAHW solutions for IC-compatible micromachining
    P.M. Sarro; S.Brida; C.M.A.Ashruf; W. van d.Vlist; H. van Zeijl;
    In Proc. ASDAM '96 Conf.,
    Smolenice, Slovakia, pp. 293-296, Oct. 1996.

  2315. A LaF3:Nd(10%) scintillator detector with microgap gas chamber read-out for the detection of x- rays
    J. van der Marel; V.R. Bom; C.W.E. van Eijk; R.W. Hollander; P.M. Sarro;
    In Proc. 4th International Conference on Position-Sensitive Detectors,
    Manchester, UK, Sept. 1996.

  2316. RF Components Implemented in an Analog SiGe Bipolar Technology
    J.N. Burghartz; M. Soyuer; K.A. Jenkins; M. Kies; P. Dolan; K. Stein; J. Malinowski; D.L. Harame;
    In Proc. Bipolar/BiCMOS Circuit and Technology Meeting (BCTM),
    pp. 138-141, 1996.

  2317. An 11-GHz 3-V SiGe Voltage-Controlled Oscillator with integrated Resonator
    M. Soyuer; J.N. Burghartz; H.A. Ainspan; K.A. Jenkins; P. Xiao; A. Shahani; D.L. Harame;
    In Proc. Bipolar/BiCMOS Circuits and Technology Meeting (BCTM),
    pp. 169-172, 1996.

  2318. A new method for determining the propagation delay in CML bipolar switching
    R. Tinti; H.C. de Graaff; E. Klinkenberg; J.L. Tauritz;
    In Proc. ESSDERC 96,
    Sept. 1996.

  2319. An integrated silicon interferometric temperature sensor
    G. Cocorullo; F.G. Della Corte; M. Iodice; I. Rendina; P.M. Sarro;
    In Proc. Eurosensors '96 Conf.,
    Leuven, Belgium, pp. 1413-1416, Sep. 1996.

  2320. An integrated charge amplifier for a pyroelectric sensor
    D. Setiadi; A. Armitage; T.D. Binnie; P.P.L. Regtien; P.M. Sarro;
    In Proc. Eurosensors '96 Conf.,
    Leuven, Belgium, pp. 355-358, Sep. 1996.

  2321. Role of plasma deposition temperature and post-deposition annealing in fabrication of high quality a-SiGe:H alloys
    V.I. Kuznetsov; M. Zeman; L.L.A. Vosteen; B.S. Girwar; J.W. Metselaar;
    In International PVSEC-9,
    Miyasaki, Japan, pp. 707-708, 1996.

  2322. Monolithic narrow-band active inductors using suspended membrane passive components on silicon substrate
    Y. Sun; F.E. van Vliet; J.L. Tauritz; R.G.F. Baets;
    In The 4th IEEE International Workshop on High Performance Devices for Microwave and Optoelectronic Applications (EDMO 96),
    Leeds, UK, pp. 79-83, Nov. 1996.

  2323. Current matching in a-Si:H alloy tandem cells on textured substrates
    M. Zeman; V.I. Kuznetsov; L.L.A. Vosteen; J.A. Willemen; J.W. Metselaar; R.E.I. Schropp;
    In International PVSEC-9,
    Miyasaki, Japan, pp. 647-648, 1996.

  2324. Sensitivity study of a-Si:H solar cell model parameters
    J.A. Willemen; M. Zeman; J.W. Metselaar;
    In International PVSEC-9,
    Miyasaki, Japan, pp. 359-360, 1996.

  2325. Monolithic Spiral Inductors fabricated using a VLSI Cu-Damascene Interconnect Technology and Low-Loss Substrates
    J.N. Burghartz; D.C. Edelstein; K.A. Jenkins; C. Jahnes; C. Uzoh; E.J. O Sullivan; K.K. Chan; M. Soyuer; P. Roper; S. Cordes;
    In IEEE International Electron Devices Meeting (IEDM),
    pp. 99-102, 1996.

  2326. RF and Microwave Building Blocks in a Standard BiCMOS Technology
    M. Soyuer; J.N. Burghartz; K.A. Jenkins; H.A. Ainspan,F.J. Canora;
    In Proceedings of the IEEE Symposium on Circuits and Systems (ISCAS),
    pp. 89-92, 1996.

  2327. Micromachined mirror with a variable focal distance
    G.Vdovin; S. Middelhoek; P.M. Sarro;
    In Tech. Digest EOS Free Space Micro-Optical Systems,
    Engelberg, Switzerland, pp. 28-29, Apr. 1996.

  2328. Thin-film free-space optical components micromachined in silicon
    G.Vdovin; S. Middelhoek; P.M. Sarro;
    In Techn Digest IEEE/LEOS Summer Topical Meeting Optical MEMS and Their Applications,
    Keystone, Colorado, USA, pp. 5-6, Aug. 1996.

  2329. Kelvin test structure for measuring contact resistance of shallow junctions
    L.K. Nanver; E.J.G. Goudena; J. Slabbekoorn;
    In Proceedings IEEE Intl. Conf. on Microelectronics Test Structures, ICMTS 1996,
    Trento, Italy, Mar. 1996.

  2330. NMOS Voltage-Controlled Oscialltor with Integrated Resonator
    M. Soyuer; J.N. Burghartz; H. Ainspan; K. Jenkins; P. Xiao; A. Shahani; M. Dolan; D. Harame;
    In Proceedings of the Bipolar/BiCMOS Circuit and Technology Meeting (BCTM),
    pp. 169-172, 1996.

  2331. System performance of a 4-channel PHASAR WDM receiver operating at 1.2 Gbit/s
    C.A.M. Steenbergen; M.O. van Deventer; L.C.N. de Vreede; C. van Dam; M.K. Smit; B.H. Verbeek;
    In Proc. OFC 1996,
    San Jose, CA, USA, pp. 310-311, Feb. 1996.

  2332. X ray diffraction analysis of self-organized InAs quantum dots
    Y. ZY. Huang.T. Wang; W.Q. Ma; W. Wang; X.P. Yang; Z.G. Chen; D.S. Jiang; H.Z. Zheng;
    In Proc.SPIE,
    pp. 75, 1996.

  2333. Silicon drift detectors for the detection of X- and g- rays
    H.Valk; E.A.Hijzen; J.Huizenga; C.W. van Eijk; R.W.Hollander; L.K.Nanver; P.M. Sarro; A. van d.Bogaard; J.Slabbekoorn;
    In Proc. National Sensor Conference,
    Delft, The Netherlands, pp. 103-107, Mar. 1996.

  2334. Aluminum passivation in saturated TMAHW solutions for IC-compatible microstructures and device isolation
    P.M. Sarro; S. Brida; W. van der Vlist;
    In Proc.SPIE Micromachining and Microfabrication �96 Symposium,
    Austin, Texas, USA, SPIE, pp. 242-250, Oct. 1996.

  2335. Temperature monitoring with a fully integrable on chip interferometric silicon micro-sensor based on the thermo-optic effect
    G. Cocorullo; F.G. Della Corte; M. Iodice; I. Rendina; P.M. Sarro;
    In Proc. MELECON '96,
    Bari, Italy, pp. 1321-1323, May 1996.

  2336. Fabrication of SiGe Base HBT with Lateral Colector Contact on ThSOI
    Joachim N. Burghartz;
    Patent No. US 5,583,059, Dec 1996.

  2337. HF Silicon ICs for Wide-band Communication Systems
    L.C.N. de Vreede;
    PhD thesis, Delft University of Technology, Jun 1996.
    document

  2338. The role of surface charge in low-voltage electrophotography
    W. P. M. Willems; P. L. J. Welten; F. W. Marland; R.A.C.M.M. van Swaaij;
    J. Electrochem. Soc.,
    Volume 142, pp. 1615, 1995.

  2339. Realization of an integrated VDF/TrFE copolymer-on-silicon pyroelectric sensor
    D. Setiadi; P.P.L. Regtien; P.M. Sarro;
    Microelectronic Engineering,
    Volume 29, Issue 1-4, pp. 85-88, Dec. 1995.

  2340. Silicon accelerometer based on thermopiles
    U.A. Dauderstadt; P.H.S. de Vries; R. Hiratsuka; P.M. Sarro;
    Sensors and Actuators A: Physical,
    Volume 46, Issue 1-3, pp. 201-204, Jan.-Feb. 1995.

  2341. In-plane x-ray scattering of epitaxial structures
    S.F. Cui; Y.T. Wang; Y. Zhuang; M. Li; Z.H. Mai;
    Journal of Crystal Growth,
    Volume 152, pp. 354, 1995.

  2342. Electrophotographic discharge of CdS explained by a surface-depletion discharge model
    R.A.C.M.M. van Swaaij; W. P. M. Willems; J. P. Lokker; J. Bezemer; W. F. van der Weg;
    J. Appl. Phys.,
    Volume 77, pp. 1635, 1995.

  2343. Multilevel Monolithic Inductors in Silicon Technology
    M. Soyuer; J.N. Burghartz; K.A. Jenkins; S. Ponnapalli; J.F. Ewen; W.E. Pence;
    Electronics Letters,
    Volume 31, Issue 5, pp. 359-360, 1995.

  2344. Dopant Interaction During Diffusion of Arsenic and Boron in Opposite Directions in Polycrystalline/Monocrystalline Silicon Structures
    J.N. Burghartz; C.L. Stanis; P.A. Ronsheim;
    Applied Physics Letters,
    Volume 67, Issue 21, pp. 3156-3158, 1995.

  2345. 4-channel wavelength flattened demultiplexer integrated with photodetectors
    C. A. M. Steenbergen; C van Dam; T. L. M. Scholtes; A. H. de Vreede; L. Shi; J.J.G.M van der Tol; P. Demeester; M.K. Smit;
    In Proc. 7th Eur. Conf. on Int. Opt. (ECIO �95),
    1995.

  2346. Integrated 1 GHz 4-channel InP phasar based WDM-receiver with Si bipolar frontend array
    C.A.M. Steenbergen; L.C.N. de Vreede; C. van Dam; T.L.M. Scholtes; M.K. Smit; J.L. Tauritz; J.W. Pedersen; I. Moerman; B.H. Verbeek; R.G.F. Baets;
    In Proc. ECOC 1995,
    Brussels, Belgium, pp. 211-214, Sept. 1995.

  2347. CAD-tool for integrated optics
    X.J.M. Leijtens; L.H. Spiekman; C. van Dam; L.C.N. de Vreede; M.K. Smit; J.L. Tauritz;
    In Proc. ECIO 1995,
    Delft, The Netherlands, pp. 463-466, Apr. 1995.

  2348. Extension of the collector charge description for compact bipolar epilayer models
    L.C.N. de Vreede; H.C. de Graaff; J.L. Tauritz; R.G.F. Baets;
    In Proc. ESSDERC 1995,
    The Hague, The Netherlands, pp. 229-232, Sep. 1995.

  2349. Opportunities for Standard Silicon Technology in RFµwave Applications
    J.N. Burghartz; M. Soyuer; K.A. Jenkins; Y.H. Kwark; S. Ponnapalli; J.F. Ewen; W.E. Pence;
    In Proceedings of the European Solid-State Device Research Conference (ESSDERC),
    pp. 363-367, 1995.

  2350. Technology characterization and application of adaptive mirrors fabricated with IC-compatible micromachining
    G. Vdovin; S. Middelhoek; M. Bartek; P.M. Sarro; D. Solomatine;
    In Proc. SPIE,
    San Diego, CA, USA, pp. 116-129, Jun. 1995.

  2351. X-ray diffraction studies of quantum wire heterostructures
    L. Tapfer; L. De Caro; Y. Zhuang; P. Sciacovelli;
    In Semiconductor Heteroepitaxy Growth, Characterization and Device Applications,
    1995.

  2352. High-Q Inductors in Standard Silicon Interconnect Technology and Applicationn to an Integrated RF Power Amplifier
    J.N. Burghartz; M. Soyuer; K.A. Jenkins; M.D. Hulvey;
    In IEEE International Electron Devices Meeting (IEDM),
    pp. 1015-1018, 1995.

  2353. SiGe Thin Film or SOI MOSFET and Method for Making the Same
    Joachim N. Burghartz; Bernard S. Meyerson; Yuan-Chen Sun;
    Patent No. US 5,461,250, Oct 1995.

  2354. Accurate generation rate profiles in a-Si :H solar cells with textured TCO substrates
    G. Tao; M. Zeman; J.W. Metselaar;
    Solar Energy Materials and Solar Cells,
    Volume 34, Issue 1-4, pp. 359-366, Sep. 1994.

  2355. Evaluation of liquid properties using a silicon lamb wave sensor
    M.J. Vellekoop; G.W. Lubking; P.M. Sarro;
    Sensors and Actuators A: Physical,
    Volume 43, Issue 1-3, pp. 175-180, May 1994.

  2356. Integrated-circuit-compatible design and technology of acoustic-wave-based microsensors
    M.J. Vellekoop; G.W. Lubking; P.M. Sarro;
    Sensors and Actuators A: Physical,
    Volume 44, Issue 3, pp. 249-263, Sep. 1994.

  2357. Liquid and gas micro-calorimeters for (bio)chemical measurements
    A. W. van Herwaarden; P.M. Sarro; J.W. Gardner; P. Bataillard;
    Sensors and Actuators A: Physical,
    Volume 43, Issue 1-3, pp. 24-30, May 1994.

  2358. Application of electrostatic feedback to critical damping of an integrated silicon capacitive accelerometer
    R.P. van Kampen; M.J. Vellekoop; P.M. Sarro; R.F. Wolffenbuttel;
    Sensors and Actuators A: Physical,
    Volume 43, Issue 1-3, pp. 100-106, May 1994.

  2359. A silicon-silicon nitride membrane fabrication process for smart thermal sensors
    P.M. Sarro; A.W. van Herwaarden; W. van der Vlist;
    Sensors and Actuators A: Physical,
    Volume 42, Issue 1-3, pp. 666-671, Apr. 1994.

  2360. Application of VDF/TrFE copolymer for pyroelectric image sensors
    D. Setiadi; P.P.L. Regtien; P. M. Sarro;
    Sensors and Actuators A: Physical,
    Volume 42, Issue 1-3, pp. 585-592, Apr. 1994.

  2361. Random-matrix theory of parametric correlations in the spectra of disordered metals and chaotic billiards
    C.W.J. Beenakker; B. Rejaei;
    Physica A: Statistical and Theoretical Physics,
    Volume 203, Issue 1, pp. 61-90, Feb. 1994.

  2362. X-ray scattering from a rough surface and damaged layer of polished wafer
    M. Li; Z.H. Mai; S.F. Cui; J.H. Li; Y.S. Gu; Y.T. Wang; Y. Zhuang;
    J. Phys. D,
    Volume 27, Issue 9, pp. 1929, 1994.

  2363. Exact solution for the distribution of transmission eigenvalues in a disordered wire and comparison with random-matrix theory
    C.W.J. Beenakker; B. Rajaei;
    Phys. Re. B,
    pp. 7499-7510, 1994.

  2364. Determination of surface roughness of InP (001) wafers by x-ray scattering
    S.F. Cui; J.H. Li; M. Li; C.R. Li; Y.S. Gu; Z.H. Mai; Y. ZY. Huang.T. Wang;
    J. Appl. Phys.,
    Volume 76, Issue 7, pp. 4154, 1994.

  2365. Scaling theory of conduction through a normal-superconductor microbridge
    C.W.J. Beenakker; B. Rejaei; J.A. Melsen;
    Phys. Re. Lett.,
    Volume 72, pp. 2470-2473, 1994.

  2366. A high gain silicon AGC amplifier with a 3 dB bandwidth of 4 GHz
    L.C.N. de Vreede; A.C. Dambrine; J.L. Tauritz; R.G.F. Baets;
    IEEE Transactions on Microwave Theory and Techniques,
    Volume 42, Issue 4, pp. 546-552, Apr. 1994.

  2367. Local structure and bonding states in a-Si1-xCx:H
    R.A.C.M.M. van Swaaij; A. J. M. Berntsen; W. G. J. H. M. van Sark; H. Herremans; J. Bezemer; W. F. van der Weg;
    J. Appl. Phys.,
    Volume 76, Issue 251, 1994.

  2368. A Low-Capacitance Bipolar/BiCMOS Isolation Technology, II - Circuit Performance and Device Self-Heating
    J.N. Burghartz; A.O. Cifuentes; J.D. Warnock;
    IEEE Transactions on Electron Devices,
    Volume 41, Issue 8, pp. 1388-1395, 1994.

  2369. A Low-Capacitance Bipolar/BiCMOS Isolation Technology, II - Concept, Fabrication Process, and Characterization
    J.N. Burghartz; R.C. McIntosh; C.L. Stanis;
    IEEE Transactions on Electron Devices,
    Volume 41, Issue 8, pp. 1379-1387, 1994.

  2370. High-Performance Emitter-Up/Down SiGe HBTs
    J.N. Burghartz; K.A. Jenkins; D.A. Grutzmacher; T.O. Sedgwick; C.L. Stanis;
    IEEE Electron Device Letters,
    Volume 15, Issue 9, pp. 360-362, 1994.

  2371. Extraction of amorphous silicon solar cell parameters by inverse modelling
    M. Zeman; J.A. Willemen; S. Solntsev; J.W. Metselaar;
    Acta Physica Slovaca,
    Volume 50, Issue 4, pp. 559, 1994.

  2372. A figure of merit for the high-frequency noise behavior of bipolar transistors
    L.C.N. de Vreede; H.C. de Graaff; G.A.M. Hurkx; J.L. Tauritz; R.G.F. Baets;
    IEEE Journal of Solid State Circuits,
    Volume 29, Issue 10, pp. 1220-1226, Oct. 1994.

  2373. Surface scattering of x-ray from InP (001) wafers
    J.H. Li; S.F. Cui; M. Li; C.R. Li; Z.H. Mai; Y. ZY. Huang.T. Wang;
    Appl. Phys. Lett.,
    Volume 65, Issue 26, pp. 3317, 1994.

  2374. Optical modeling of a-Si:H based solar cells on textured substrates
    G. Tao; M. Zeman; J.W. Metselaar;
    In 1994 IEEE First World Conference on Photovoltaic Energy Conversion,
    pp. 666-669, 1994.

  2375. Supporting Early Development of Advanced High-Performance Logic with Synchroton Orbital Radiation Lithography
    L.W. Liebmann; A.T. Pomerene; D. deMayand T. Donohue; A. Lamberti; J.N. Burghartz;
    In Advanced Technology Proceedings SPIE, Symposium on Microlithography,
    1994.

  2376. Low Temperature Atmospheric Pressure Chemical Vapour Desposition for Epitaxial Growth of SiGe Bipolar Transistors
    T.O. Sedgwick; J.N. Burghartz; D.A. Gruetzmacher;
    In Electrochemical Society Proceedings Series, 7th Symposium on Silicon Materials, Science and Technology,
    1994.

  2377. Advanced modelling of distortion effects in bipolar transistors using the Mextram model
    L.C.N. de Vreede; H.C. de Graaff; K. Mouthaan; M. de Kok; J.L. Tauritz; R.G.F. Baets;
    In Proc. IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM 1994),
    Minneapolis, MN, USA, pp. 48-51, Oct. 1994.

  2378. Monte Carlo modelling of electrophotographic dark discharge
    S. J. Elmer; J. M. Marshall; R.A.C.M.M. van Swaaij; J. Bezemer; A. R. Hepburn;
    In Mater. Res. Soc. Symp. Proc.,
    1994.

  2379. Hole carrier drift mobility and valence band tail states in amorphous silicon carbide
    P. A. Bayley; J. M. Marshall; A. R. Hepburn; R.A.C.M.M. van Swaaij; J. Bezemer;
    In proceedings of the 8th International School on Condensed Matter Physics,
    Varna, Bulgaria, 1994.

  2380. Amorphous Silicon Photoconductive Films for Electrophotography
    R.A.C.M. van Swaaij;
    PhD thesis, Utrecht University, 1994.

  2381. Single-electron tunneling in the fractional quantum Hall effect regime
    C.W.J. Beenakker; B. Rejaei;
    Physica B: Condensed Matter,
    Volume 189, Issue 1-4, pp. 147-156, Jun. 1993.

  2382. Nonlogarithmic repulsion of transmission eigenvalues in a disordered wire
    C.W.J. Beenakker; B. Rejaei;
    Phys. Re. Lett.,
    Volume 71, pp. 3689-3692, 1993.

  2383. Reliability Imposed Design Aspects of Submicrometer Polysilicon Bipolar Transistors
    J.N. Burghartz; Y.-J. Mii;
    IEEE Electron Devices Letters,
    Volume 14, Issue 7, pp. 363-365, 1993.

  2384. A pyroelectric matrix sensor using PVDF on silicon containing FET readout circuitry
    P.C.A. Hammes; P.P.L. Regtien; P.M. Sarro;
    Sensors and Actuators A: Physical,
    Volume 37-38, pp. 290-295, Jun.-Aug. 1993.

  2385. Quasi-Landau-level structure in the fractional quantum Hall effect
    B. Rejaei;
    Phys. Re. B,
    Volume 48, pp. 18016-18023, 1993.

  2386. A transmission electron microscopy study of interphase dislocation between decagonal quasicrystalline and crystalline phase in Al75Ni10Fe15 alloy
    Y. Zhuang; Z. Zhang; D.B. Williams;
    Journal of Non-crystalline Solids,
    1993.

  2387. A High-Speed Complementary Silicon Bipolar Technology with 12-fJ Power-Delay Product
    J.D. Cressler; J. Warnock; D.L. Harame; J.N. Burghartz; K.A. Jenkins; C.T. Chuang;
    IEEE Electron Device Letters,
    Volume 14, Issue 11, pp. 523-526, 1993.

  2388. Optimisation of base-link in fully-implanted NPNs
    L.K. Nanver; E.J.G. Goudena; H.W. van Zeijl;
    Electronics Letters,
    Volume 29, Issue 16, pp. 1451-1452, Aug. 1993.

  2389. Investigation of the interface properties of hydrogenated amorphous silicon p-i junctions
    M. Trijssenaar; M. Zeman; J.W. Metselaar;
    Journal of Non-Crystalline Solids,
    Volume 164-166, pp. 667-670, Dec. 1993.

  2390. Experimental dark discharge of a-Si1-xCx:H films and its comparison to Monte Carlo simulations
    R.A.C.M.M. van Swaaij; S. J. Elmer; W. P. M. Willems; J. Bezemer; J. M. Marshall; A. R. Hepburn;
    J. Non-Cryst. Solids,
    Volume 164-166, pp. 533, 1993.

  2391. Study of the temperature and field dependence of electron drift mobility in a-Si1-xCx:H using the time-of-flight technique
    P. A. Bayley; A. K. Browne; J. M. Marshall; R.A.C.M.M. van Swaaij; A. R. Hepburn;
    J. Non-Cryst. Solids,
    Volume 164-166, pp. 521, 1993.

  2392. Submicron Gate Electrode Discontinuity: Electrical Signature and Effect on Circuit Speed
    K.A. Jenkins; J.N. Burghartz; P.D. Agnello; D.F. Heidel; C.Y. Wong;
    In IEEE International Electron Devices Meeting (IEDM),
    pp. 891-894, 1993.

  2393. Degradation of amorphous silicon based photoconductors by corona discharge
    R.A.C.M.M. van Swaaij; W. P. M. Willems; J. Bezemer; H. J. P. Lokker; W. F. van der Weg;
    In MRS Spring Meeting,
    San Francisco CA, Apr. 1993.

  2394. APCVD-Grown Self-Aligned SiGe-Base HBTs
    J.N. Burghartz; T.O. Sedgwick; D.A. Grutzmacher; D. Nguyen-Ngoc; K.A. Jenkins;
    In Proceedings Bipolar/BiCMOS Circuit and Technology Meeting (BCTM),
    pp. 55-62, 1993.

  2395. A figure of merit for the high-frequency noise behaviour of bipolar transistors
    H.C. de Graaff; L.C.N. de Vreede; G.A.M. Hurkx; J.L. Tauritz; R.G.F. Baets;
    In Proc. 1993 IEEE BCTM,
    Minneapolis, USA, pp. 118-121, Oct. 1993.

  2396. A High-Performance 0.15 um CMOS
    G.G. Shahidi; J. Warnock; A. Acovic; P. Agnello; C. Blair; A. Burghartz; et al;
    In Symposium on VLSI Technology,
    pp. 93-94, 1993.

  2397. The density of states in a-Si:C:H revealed by electrophotography
    R.A.C.M.M. van Swaaij; W. P. M. Willems; J. Bezemer; M. B. von der Linden; W. F. van der Weg;
    In Mater. Res. Soc. Symp. Proc.,
    1993.

  2398. Degradation of amorphous silicon based photoconductors by corona discharge
    R.A.C.M.M. van Swaaij; W. P. M. Willems; J. Bezemer; H. J. P. Lokker; W. F. van der Weg;
    In Mater. Res. Soc. Symp. Proc.,
    1993.

  2399. High-Performance Complementary Bipolar Technology
    J. Warnock; J.D. Cressler; J.N. Burghartz; D.L. Harame; K.A. Jenkins; C.T. Chuang;
    In Symposium on VLSI Technology,
    pp. 75-76, 1993.

  2400. An Ultra-Low Thermal Budget SiGe-Base Bipolar Technology
    J.N. Burghartz; D.A. Grutzmacher; T.O. Sedgwick; K.A. Jenkins; A.C. Megdanis; J.M. Cotte; D. Nguyen-Ngoc; S.S. Iyer;
    In Symposium on VLSI Technology,
    pp. 59-60, 1993.

  2401. SPIRIT - A Bipolar/BiCMOS Isolation Technology for High-Performance VLSI
    J.N. Burghartz; A.O. Cifuentes; J. Warnock; R.C. McIntosh; C.L. Stanis; J.D. Warnock; J.Y.-C. Sun; J.H. Comfort; K.A. Jenkins;
    In Symposium on VLSI Technology,
    pp. 143-144, 1993.

  2402. Design considerations for the thermal accelerometer
    R. Hiratsuka; D.C. van Duyn; T. Otaredian; P. de Vries; P.M. Sarro;
    Sensors and Actuators A: Physical,
    Volume 32, Issue 1-3, pp. 380-385, Apr. 1992.

  2403. Vector-mean-field theory of the fractional quantum Hall effect
    B. Rejaei; C.W.J. Beenakker;
    Phys. Re. B,
    Volume 46, pp. 15566-15569, 1992.

  2404. Sensor technology strategy in silicon
    P.M. Sarro;
    Sensors and Actuators A: Physical,
    Volume 31, Issue 1-3, pp. 138-143, Mar. 1992.

  2405. Identification of Perimeter Depletion and Emitter Plug Effects in Submicrometer Shallow-Junction Polysilicon Bipolar Transistors
    J.N. Burghartz; J.Y.C. Sun; C.L. Stanis; S.R. Mader; J.D. Warnock;
    IEEE Transactions on Electron Devices,
    Volume 39, Issue 6, pp. 1477-1489, 1992.

  2406. A high frequency model based on the physical structure of the ceramic multilayer capacitor
    de L.C.N. de Vreede Kok; M.; van Dam; C.; J.L. Tauritz;
    Microwave Theory and Techniques, IEEE Transactions on ,,
    Volume 40, Issue 7, pp. 1584-1587, Jul. 1992.

  2407. A transmission electron microscopy study of dislocations in Al70Ni10Co20 and Al75Ni10Fe15 decagonal quasicrystals
    Z. Zhang; Y. Zhuang;
    Philosophical Magazine Letters,
    Volume 65, Issue 4, pp. 2039, 1992.

  2408. Novel bipolar transistor isolation structure using combined selective epitaxial growth and planarization technique
    J.N. Burghartz; J. Warnock; J.D. Cressler; C.L. Stanis; R.C. McIntosh; J.Y.C. Sun; J.H. Comfort; J.M.C. Stork; K.A. Jenkins; E.F. Crabbe; et al.;
    Microelectronic Engineering,
    Volume 19, Issue 1-4, pp. 531-534, Sep. 1992.

  2409. Structural, compositional and optical properties of hydrogenated amorphous silicon-carbon alloys
    H. Herremans; W. Grevendonk; R.A.C.M.M. van Swaaij; W. G. J. M. van Sark; A. J. M. Berntsen; W. M. Arnold Bik; J. Bezemer;
    Philos. Mag. B,
    Volume 66, Issue 787, 1992.

  2410. A Scaled 0.25-um Bipolar Technology Using Full E-Beam Technology
    J.D. Cressler; J.D. Warnock; P.J. Coane; M.E. Rothwell; K.A. Jenkins; E.J. Petrillo; N.J. Mazzeo; A.C. Megdanis; F.J. Hohn; M.G.R. Thompson; J.Y.C. Sun; D.D. Tang;
    IEEE Electron Device Letters,
    Volume 13, Issue 5, pp. 956-958, 1992.

  2411. Partial SOI Isolation Structure for Reduced Bipolar Transistor Parasitics
    J.N. Burghartz; J.D. Cressler; J.D. Warnock; R.C. McIntosh; K.A. Jenkins; J.Y.C. Sun; J.H. Comfort; J.M.C. Stork; C.L. Stanis; W. Lee; D.D. Danner;
    IEEE Electron Device Letters,
    Volume 13, Issue 8, pp. 424-426, 1992.

  2412. A High-Performance Epitaxial SiGe-Base ECL BiCMOS Technology
    D.L. Harame; E.F. Crabbe; J.D. Cressler; J.H. Comfort; J.Y.-C. Sun; S.R. Stiffler; E. Kobeda; J.N. Burghartz; et al;
    In IEEE International Electron Devices Meeting (IEDM),
    pp. 19-22, 1992.

  2413. Novel Bipolar Transistor Isolation Structure Using Combined Selective Epitaxial Growth and Planarization Technique
    J.N. Burghartz; J. Warnock; J.D. Cressler; C.L. Stanis; R.C. McIntosh; et al;
    In Proceedings of the European Solid-State Device Research Conference (ESSDERC),
    pp. 531-534, 1992.

  2414. Thickness related effects in p-type amorphous silicon thin films
    W. G. J. H. M. van Sark; J. W. Smit; W. M. Arnold Bik; R.A.C.M.M. van Swaaij; M. B. von der Linden; R. E. I. Schropp; J. Bezemer; W. F. van der Weg;
    In Proceedings of the 11th European Photovoltaic Solar Energy Conference,
    Montreux, Switzerland, 1992.

  2415. nfluence on de DOS profile in a-Si:H of bandgap variations with and without carbon alloying
    M. B. von der Linden; R. E. I. Schropp; R. Balkema; R.A.C.M.M. van Swaaij; J. Daey Ouwens; W. G. J. H. M. van Sark; J. Bezemer; W. F. van der Weg;
    In Proceedings of the 11th European Photovoltaic Solar Energy Conference,
    Montreux, Switzerland, 1992.

  2416. Quantitative determination of Si��_Hx bonding configurations in a-Si:C:H
    R.A.C.M.M. van Swaaij; W. G. J. H. M. van Sark; W. M. Arnoldbik; J. Bezemer; W. F. van der Weg;
    In N. Kirov; J. M. Mars (Ed.), Electronic and Opto-electronic Materials into the 21st Century', proceedings of the 7th International School on Condensed Matter Physics,
    Varna, Bulgaria, 1992.

  2417. Design considerations for a permanent-rotor-charge-excited micromotor with an electrostatic bearing
    R.F. Wolffenbuttel; J.F.L. Goosen; P.M. Sarro;
    Sensors and Actuators A: Physical,
    Volume 27, Issue 1-3, pp. 597-603, May 1991.

  2418. Superconductivity in the mean-field anyon gas
    B. Rejaei; C.W.J. Beenakker;
    Phys. Re. B,
    Volume 43, pp. 11392-11395, 1991.

  2419. Device Design Issues for a High-Performance Bipolar Technology with Si or SiGe Base -
    J.N. Burghartz; J.D. Cressler; K.A. Jenkins; J.Y.C. Sun; J.M.C. Stork; J.H. Comfort; T.A. Brunner; C.L. Stanis;
    Microelectronic Engineering,
    Volume 15, Issue 1-4, pp. 11-14, Oct. 1991.

  2420. The effect of hydrogen on the plasma deposition and hydrogen plasma etching of a-SiGe:H thin films
    M. Zeman; M.J. Geerts; J. Siegl; J.W. Metselaar;
    Solar Energy Materials,
    Volume 23, Issue 2-4, pp. 265-272, Dec. 1991.

  2421. The effect of hydrogen dilution on glow discharge a-SiGe:H alloys
    M. Zeman; I. Ferreira; M.J. Geerts; J.W. Metselaar;
    Solar Energy Materials,
    Volume 21, Issue 4, pp. 255-265, Jan. 1991.

  2422. Self-Aligned Bipolar Epitaxial Base NPN Transistors with Selective Epitaxial Emitter Window (SEEW) Technology
    J.N. Burghartz; S.R. Mader; B.J. Ginsberg; B.S. Meyerson; J.M.C. Stork; C.L. Stanis; J.Y.C. Sun; M.R. Polcari;
    IEEE Transactions on Electron Devices,
    Volume 38, Issue 2, pp. 378-385, 1991.

  2423. Novel In-Situ Doped PolysiliconEmitter Process with Buried Diffusion Source (BDS)
    J.N. Burghartz; A.C. Megdanis; J.D. Cressler; J.Y.C. Sun; C.L. Stanis; J.H. Comfort; K.A. Jenkins; F. Cardone;
    IEEE Electron Device Letters,
    Volume 12, Issue 12, pp. 679-681, 1991.

  2424. Selective Epitaxial Growth of Silicon and Some Potential Applications
    B.J. Ginsberg; J.N. Burghartz; G.B. Bronner; S.R. Mader;
    IBM Journal of Research and Development,
    Volume 35, Issue 2, pp. 1-13, 1991.

  2425. Single Crystal Emitter Cap for Epitaxial Si- and SiGe-Base Transistors
    J.H. Comfort; E.F. Crabbe; J.D. Cressler; W. Lee; J.Y.-C. Sun; J. Malinowski; M.M. DAgostino; J.N. Burghartz; J.M.C. Stork; B.S. Meyerson;
    In IEEE International Electron Devices Meeting (IEDM),
    pp. 857-860, 1991.

  2426. Advanced Bipolar Technology for the 1990s
    J.Y.-C. Sun; J.H. Comfort; J.D. Warnock; J.D. Cressler; G. Patton; J.M.C. Stork; J.N. Burghartz; D.L. Harame; E.F. Crabbe; P.-F. Lu; M. Arienzo; B.S. Meyerson;
    In Proceedings of the Symposium on VLSI Technology, Systems, and Applications,
    pp. 269-273, 1991.

  2427. A Full E-Beam 0.25 um Bipolar Technology with Sub-25 ps ECL Gate Delay
    J. Warnock; J.D. Cressler; P.J. Coane; K.N. Chiong; M.E. Rothwell; K.A. Jenkins; J.N. Burghartz et al;
    In IEEE International Electron Devices Meeting (IEDM),
    pp. 956-958, 1991.

  2428. Ion-Implanted Base SiGe PNP Self-Aligned SEEW Transistors
    D. Nguyen-Ngoc; D.L. Harame; J.N. Burghartz; R.C. McIntosh; E.F. Crabbe; J.D. Warnock; C.L. Stanis; B.S. Meyerson; J.M. Cotte; J.H. Comfort;
    In Proc. Bipolar Circuit and Technology Meeting (BCTM),
    pp. 75-78, 1991.

  2429. Device Design for a High-Performance Bipolar Technology with Si or SiGe Epitaxial Base
    J.N. Burghartz; J.D. Cressler; K.A. Jenkins; J.Y.-C. Sun; J.M.C. Stork; J.H. Comfort; T.A. Brunner; C.L. Stanis;
    In Proceedings of the European Solid-State Device Research Conference (ESSDERC),
    pp. 11-14, 1991.

  2430. Method of Forming Bipolar Transistor having Self-Aligned Emitter-Base using Selective and Non-Selective Epitaxy
    Joachim N. Burghartz; Barry J. Ginsberg; Siegfried Mader;
    Patent No. US 5,059,544, Oct 1991.

  2431. Compatibility of zinc oxide with silicon IC processing
    M.J. Vellekoop; C.C.G. P. Visser.M. Sarro;
    Sensors and Actuators A: Physical,
    Volume 23, Issue 1-3, pp. 1027-1030, Apr. 1990.

  2432. 75 GHz f-sub-T SiGe-Base Heterojunction Bipolar Transistors
    G.L. Patton; J.H. Comfort; B.S. Meyerson; E.F. Crabbe; G.J. Scilla; E. de Fresart; J.M.C. Stork; J.Y.C. Sun; D.L. Harame; J.N. Burghartz;
    IEEE Electron Device Letters,
    Volume 11, Issue 4, pp. 171-173, 1990.

  2433. The influence of deposition parameters on the growth of a-SiGe:H alloys in a plasma CVD system
    M. Zeman; I. Ferreira; M. J. Geerts; J.W. Metselaar;
    Applied Surface Science,
    Volume 46, Issue 1-4, pp. 245-248, Dec. 1990.

  2434. Self-Aligned SiGe-Base Heterojunction Bipolar Transistors by Selective Epitaxy Emitter Window (SEEW) Technology
    J.N. Burghartz; J.H. Comfort; G.L. Patton; B.S. Meyerson; J.Y.C. Sun; J.M.C. Stork; C.L. Stanis; G.J. Scilla; B.J. Ginsberg;
    IEEE Electron Device Letters,
    Volume 11, Issue 7, pp. 288-290, 1990.

  2435. SiGe Heterojunction Bipolar Transistors
    J.H. Comfort; G.L. Patton; J.N. Burghartz; E.F. Crabbe; J.Y.-C. Sun; J.M.C. Stork; B.S. Meyerson;
    In Proceedings of the American Vacuum Society Meeting,
    1990.

  2436. Sub-30 ps ECL Circuits Using High-f-sub-T Si and SiGe Epitaxial Base Transistors
    J.N. Burghartz; J.H. Comfort; G.L. Patton; J.D. Cressler; B.S. Meyerson; B.S. Meyerson; J.Y.-C. Sun; G. Scilla; J. Warnock et al;
    In IEEE International Electron Devices Meeting (IEDM),
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  2437. Profile Leverage in Self-Aligned Epitaxial Si or SiGe Base Bipolar Transistors
    J.H. Comfort; G.L. Patton; J.D. Cressler; W. Lee; E.F. Crabbe; B.S. Meyerson; J.Y.-C. Sun; J.M.C. Stork; P.-F. Lu; J.N. Burghartz; et al;
    In IEEE International Electron Devices Meeting (IEDM),
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  2438. 63-75 GHz f-sub-T SiGe-Base Heterojunction Bipolar Technology
    G.L. Patton; J.H. Comfort; B.S. Meyerson; E.F. Crabbe; G.J. Scilla; E. de Fresart; J.M.C. Sork; J.Y.-C. Sun; D.L. Harame; J.N. Burghartz;
    In Symposium on VLSI Technology,
    pp. 49-50, 1990.

  2439. Perimeter and Plug Effects in Deep Submicrometer Polysilicon Emitter Transistors
    J.N. Burghartz; J.Y.-C. Sun; S.R. Mader; C.L. Stanis; B.J. Ginsberg;
    In Symposium on VLSI Technology,
    pp. 55-56, 1990.

  2440. Exchange interaction in type-II quantum wells
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  2441. Integrated thermopile sensors
    A.W. van Herwaarden; D.C. van Duyn; B.W. van Oudheusden; P.M. Sarro;
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  2442. FM radio receiver front-end circuitry with on-chip SAW filters
    P.T.M. van Zijl; J.H. Visser; L.K. Nanver;
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  2443. Determination of the electric field at interfaces in amorphous-silicon devices using time-of-flight measurements
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  2444. Selective Epitaxial Refill for In-Trench Device Fabrication
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    Volume 25, Issue 20, pp. 1337-1338, 1989.

  2445. Sensor array with A/D conversion based on flip-flops
    W. Lian; S.E. Wouters; D.A. Aupers; P.M. Sarro;
    Sensors and Actuators A: Physical,
    Volume 22, Issue 1-3, pp. 592-597, Jun. 1989.

  2446. New Technology for Bipolar Emitters in the Deep Sub-Micron Range
    J.N. Burghartz; B.J. Ginsberg; S.R. Mader;
    In Symposium on VLSI Technology,
    pp. 57-58, 1989.

  2447. A 27 GHz 20 ps PNP Technology
    J. Warnock; P. Lu; T. Chen; K.Y. Toh; J.D. Cressler; K.A. Jenkins; D.D. Tang; J.N. Burghartz; J.Y.-C. Sun; C.T. Chuang; G.P. Li; T.H. Ning;
    In IEEE International Electron Devices Meeting (IEDM),
    pp. 903-905, 1989.

  2448. Self-Aligned Bipolar NPN Transistor with 60 nm Epitaxial Base
    J.N. Burghartz; S.R. Mader; B.S. Meyerson; B.J. Ginsberg; J.M.C. Stork; J.Y.-C. Sun;
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    pp. 229-232, 1989.

  2449. Design considerations for integrated high-frequency p-channel JFETs
    L.K. Nanver; E.J.G. Goudena;
    IEEE Transactions on Electron Devices,
    Volume 35, Issue 11, pp. 1924-1934, 1988.

  2450. Selective Epitaxy Base Transistor
    J.N. Burghartz; B.J. Ginsberg; S.R. Mader; T.-C. Chen; D.L. Harame;
    IEEE Electron Device Letters,
    Volume 9, Issue 5, pp. 259-261, 1988.

  2451. Selective Epitaxy Base for Bipolar Transistors
    J.N. Burghartz; B.J. Ginsberg; S.R. Mader; T.C. Chen; D.L. Harame;
    In Proceedings of the European Solid-State Device Research Conference (ESSDERC),
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